KR970018763A - 자기저항 소자 및 센서 - Google Patents
자기저항 소자 및 센서 Download PDFInfo
- Publication number
- KR970018763A KR970018763A KR1019960039944A KR19960039944A KR970018763A KR 970018763 A KR970018763 A KR 970018763A KR 1019960039944 A KR1019960039944 A KR 1019960039944A KR 19960039944 A KR19960039944 A KR 19960039944A KR 970018763 A KR970018763 A KR 970018763A
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- ferromagnetic
- cobalt
- magnetoresistive element
- nickel
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Materials of the active region
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3109—Details
- G11B5/3116—Shaping of layers, poles or gaps for improving the form of the electrical signal transduced, e.g. for shielding, contour effect, equalizing, side flux fringing, cross talk reduction between heads or between heads and information tracks
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3929—Disposition of magnetic thin films not used for directly coupling magnetic flux from the track to the MR film or for shielding
- G11B5/3932—Magnetic biasing films
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
- Magnetic Heads (AREA)
- Thin Magnetic Films (AREA)
Abstract
Description
Claims (14)
- 반강자성 층과, 제1 강자성 층과, 비자기 층 및, 연성 자기재료의 제2 강자성 층을 연속적으로 포함하고, 상기 반강자성 층은 5 내지 30㎚의 두께를 가지고 니켈 산화물, 니켈 산화물과 코발트 산화물의 혼합물 및, 니켈 산화물막과 코발트 산화물막을 포함하는 적층부중의 하나로 제조되며, 상기 제1 및 제2 강자성 층은 1 내지 10㎚의 두께를 가지는 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 제1 및 제2 강자성 층은 0.45 내지 0.55의 교차점을 제공하는 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 자기저항 소자는 0.1 내지 1㎜의 소자높이를 가지는 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 제1 강자성 층과 비자기 층사이의 제1 코발트 층과, 상기 비자기 층과 제2 강자성 층사이의 제2 코발트 층을 부가로 포함하는 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 반강자성 층에서 니켈과 코발트의 전체 원자에 대한 니켈 원자의 비는 0.25이상인 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 제1 및 제2 강자성 층중 하나 이상의 층은 주 구성품으로써, NiFe, NiFeCo, NiCo 및 Co 중 하나를 포함하는 것을 특징으로 하는 자기저항 소자.
- 제1항에 있어서, 상기 비자기 층은 주 구성품으로써 Cu와, Cu에 부가된 Ag 및, Cu에 부가된 Re를 포함하는 것을 특징으로 하는 자기저항 소자.
- 기판과; 상기 기판위에 연속적으로 형성되고 패턴을 가지는 저부 실드층과 저부 갭층과; 강자성 소자에 바이어스 자기장을 제공하기 위하여 강자성 소자의 모서리위에 형성된 종방향 바이어스 층과 강자성 소자를 포함하며 저부 갭층위에 형성된 활성층 및; 상기 활성층위에 연속적으로 형성된 상부 갭층과 상부 실드층을 포함하며, 반강자성 층과, 제1 강자성 층과, 비자기 층 및, 연성 자기재료의 제2 강자성 층을 연속적으로 포함하고, 상기 반강자성층은 5 내지 30㎚의 두께를 가지고 니켈 산화물, 니켈 산화물과 코발트 산화물의 혼합물 및, 니켈 산화물막과 코발트 산화물막을 포함하는 적층부중의 하나로 제조되며, 상기 제1 및 제2 강자성 층은 1 내지 10㎚의 두께를 가지는 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 제1 및 제2 강자성 층은 0.45 내지 0.55의 교차점을 제공하는 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 자기저항 소자는 0.1 내지 1㎜의 소자높이를 가지는 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 제1 강자성 층과 비자성층 사이의 제1 코발트 층과, 상기 비자기 층과 제2 강자성 층사이의 제2코발트 층을 부가로 포함하는 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 반강자성 층에서 니켈과 코발트의 전체 원자에 대한 니켈 원자의 비는 0.25 이상인 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 제1 및 제2 강자성 층중 하나 이상의 층은 주로 구성품으로써, NiFe, NiFeCo, NiCo 및 Co 중 하나를 포함하는 것을 특징으로 하는 자기저항 센서.
- 제8항에 있어서, 상기 비자성층은 주 구성품으로써 Cu, Cu에 부가된 Ag 및, Cu에 부가된 Re를 포함하는 것을 특징으로 하는 자기저항 센서.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7236470A JPH0983039A (ja) | 1995-09-14 | 1995-09-14 | 磁気抵抗効果素子 |
JP95-236470 | 1995-09-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970018763A true KR970018763A (ko) | 1997-04-30 |
Family
ID=17001225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960039944A KR970018763A (ko) | 1995-09-14 | 1996-09-14 | 자기저항 소자 및 센서 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5889640A (ko) |
JP (1) | JPH0983039A (ko) |
KR (1) | KR970018763A (ko) |
CN (1) | CN1088917C (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010030439A (ko) * | 1999-09-22 | 2001-04-16 | 아끼구사 나오유끼 | 자기 센서, 자기 헤드 및 자기 디스크 장치 |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998001762A2 (en) * | 1996-07-05 | 1998-01-15 | Philips Electronics N.V. | A magnetic field sensor and a method of manufacturing such a sensor |
JP2950284B2 (ja) * | 1997-05-14 | 1999-09-20 | 日本電気株式会社 | 磁気抵抗効果素子、並びにこれを用いた磁気抵抗効果センサ、磁気抵抗検出システム及び磁気記憶システム |
JP2970590B2 (ja) * | 1997-05-14 | 1999-11-02 | 日本電気株式会社 | 磁気抵抗効果素子並びにこれを用いた磁気抵抗効果センサ、磁気抵抗検出システム及び磁気記憶システム |
JPH11161921A (ja) | 1997-12-01 | 1999-06-18 | Nec Corp | 磁気抵抗効果素子およびその製造方法 |
US6277505B1 (en) * | 1999-01-21 | 2001-08-21 | Read-Rite Corporation | Read sensor with improved thermal stability and manufacturing method therefor |
GB2363642B (en) * | 1999-04-20 | 2003-09-10 | Seagate Technology Llc | Spin valve sensor with specular electron scattering in free layer |
US6201672B1 (en) * | 1999-04-26 | 2001-03-13 | International Business Machines Corporation | Spin valve sensor having improved interface between pinning layer and pinned layer structure |
US6428657B1 (en) | 1999-08-04 | 2002-08-06 | International Business Machines Corporation | Magnetic read head sensor with a reactively sputtered pinning layer structure |
US6519117B1 (en) | 1999-12-06 | 2003-02-11 | International Business Machines Corporation | Dual AP pinned GMR head with offset layer |
US6430013B1 (en) | 1999-12-06 | 2002-08-06 | International Business Machines Corporation | Magnetoresistive structure having improved thermal stability via magnetic barrier layer within a free layer |
US6496334B1 (en) | 2000-05-26 | 2002-12-17 | Read-Rite Corportion | Data storage and retrieval apparatus with thin film read head having planarized extra gap and shield layers and method of fabrication thereof |
US6560078B1 (en) | 2000-07-13 | 2003-05-06 | International Business Machines Corporation | Bilayer seed layer for spin valves |
US6801408B1 (en) | 2000-11-02 | 2004-10-05 | Western Digital (Fremont), Inc. | Data storage and retrieval apparatus with thin film read head having a planar sensor element and an extra gap and method of fabrication thereof |
JP4487472B2 (ja) * | 2002-07-05 | 2010-06-23 | 株式会社日立製作所 | 磁気抵抗効果素子、及びこれを備える磁気ヘッド、磁気記録装置、磁気メモリ |
US6876525B2 (en) * | 2002-08-27 | 2005-04-05 | International Business Machines Corporation | Giant magnetoresistance sensor with stitched longitudinal bias stacks and its fabrication process |
CN100369117C (zh) * | 2002-12-31 | 2008-02-13 | 有研稀土新材料股份有限公司 | 一种氧化物巨磁电阻自旋阀及包含其的设备 |
KR100648143B1 (ko) * | 2004-11-03 | 2006-11-24 | 한국과학기술연구원 | 전류 인가 자기 저항 소자 |
JP4008478B2 (ja) * | 2005-07-13 | 2007-11-14 | Tdk株式会社 | 磁界検出素子、基体、ウエハ、ヘッドジンバルアセンブリ、ハードディスク装置、および磁界検出素子の製造方法 |
TWI394179B (zh) * | 2007-11-07 | 2013-04-21 | Nat Univ Chung Cheng | Structure and Method of Ultra - thin Ferromagnetic / Antiferromagnetic Coupling Thin Films |
CN104425708A (zh) * | 2013-09-06 | 2015-03-18 | 上海矽睿科技有限公司 | 两轴磁传感装置的制备工艺 |
Family Cites Families (19)
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DE3820475C1 (ko) * | 1988-06-16 | 1989-12-21 | Kernforschungsanlage Juelich Gmbh, 5170 Juelich, De | |
US5206590A (en) * | 1990-12-11 | 1993-04-27 | International Business Machines Corporation | Magnetoresistive sensor based on the spin valve effect |
US5591532A (en) * | 1992-06-16 | 1997-01-07 | The Regents Of The University Of California | Giant magnetoresistance single film alloys |
US5549978A (en) * | 1992-10-30 | 1996-08-27 | Kabushiki Kaisha Toshiba | Magnetoresistance effect element |
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US5576915A (en) * | 1993-03-15 | 1996-11-19 | Kabushiki Kaisha Toshiba | Magnetoresistive head with antiferromagnetic sublayers interposed between first and second spin-valve units to exchange bias inner magnetic films thereof |
JPH0766033A (ja) * | 1993-08-30 | 1995-03-10 | Mitsubishi Electric Corp | 磁気抵抗素子ならびにその磁気抵抗素子を用いた磁性薄膜メモリおよび磁気抵抗センサ |
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JP2743806B2 (ja) * | 1993-12-28 | 1998-04-22 | 日本電気株式会社 | 磁気抵抗効果膜およびその製造方法 |
JPH07220246A (ja) * | 1994-02-04 | 1995-08-18 | Hitachi Ltd | 磁気抵抗効果膜、磁気抵抗効果型ヘッド及び磁気記録再生装置 |
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JP2748876B2 (ja) * | 1995-01-27 | 1998-05-13 | 日本電気株式会社 | 磁気抵抗効果膜 |
JPH08235542A (ja) * | 1995-02-28 | 1996-09-13 | Sumitomo Metal Ind Ltd | 磁気抵抗効果素子 |
JP2778626B2 (ja) * | 1995-06-02 | 1998-07-23 | 日本電気株式会社 | 磁気抵抗効果膜及びその製造方法並びに磁気抵抗効果素子 |
US5654854A (en) * | 1995-11-30 | 1997-08-05 | Quantum Corporation | Longitudinally biased magnetoresistive sensor having a concave shaped active region to reduce Barkhausen noise by achieving a substantially single magnetic domain state |
-
1995
- 1995-09-14 JP JP7236470A patent/JPH0983039A/ja active Pending
-
1996
- 1996-09-12 US US08/711,909 patent/US5889640A/en not_active Expired - Lifetime
- 1996-09-14 KR KR1019960039944A patent/KR970018763A/ko active Search and Examination
- 1996-09-16 CN CN96109802A patent/CN1088917C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010030439A (ko) * | 1999-09-22 | 2001-04-16 | 아끼구사 나오유끼 | 자기 센서, 자기 헤드 및 자기 디스크 장치 |
Also Published As
Publication number | Publication date |
---|---|
US5889640A (en) | 1999-03-30 |
CN1161577A (zh) | 1997-10-08 |
CN1088917C (zh) | 2002-08-07 |
JPH0983039A (ja) | 1997-03-28 |
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