[go: up one dir, main page]

KR970003563A - Wiring layer planarization method of semiconductor device with uneven wiring spacing - Google Patents

Wiring layer planarization method of semiconductor device with uneven wiring spacing Download PDF

Info

Publication number
KR970003563A
KR970003563A KR1019950019132A KR19950019132A KR970003563A KR 970003563 A KR970003563 A KR 970003563A KR 1019950019132 A KR1019950019132 A KR 1019950019132A KR 19950019132 A KR19950019132 A KR 19950019132A KR 970003563 A KR970003563 A KR 970003563A
Authority
KR
South Korea
Prior art keywords
wiring
semiconductor device
wiring layer
spacing
uneven
Prior art date
Application number
KR1019950019132A
Other languages
Korean (ko)
Inventor
유경동
Original Assignee
김주용
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019950019132A priority Critical patent/KR970003563A/en
Publication of KR970003563A publication Critical patent/KR970003563A/en

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

1. 청구범위에 기재된 발명이 속한 기술분야1. TECHNICAL FIELD OF THE INVENTION

반도체 소자의 제조방법Manufacturing method of semiconductor device

2. 발명이 해결하려고 하는 기술적 과제2. The technical problem to be solved by the invention

배선 간격이 일정하지 않은 배선층의 평탄화 공정의 수행시 발생되는 배선 간격이 좁은 부분과 배선 간격이 넓은 부분의 평탄화가 차이가 생긴다는 문제점을 해결하고자 함.The purpose of the present invention is to solve a problem in that planarization between a portion having a narrow wiring gap and a portion having a large wiring gap occurs when the wiring layer is flattened.

3. 발명의 해결방법의 요지3. Summary of Solution to Invention

배선에 이용되지 않은 더미(Dummy)배선을 넓은 간격을 유지하는 배선 영역에 배치하여 배선 간격을 일정하게 유지시킴으로써 양호하게 평탄화를 이룰 수 있도록 함.Dummy wiring that is not used for wiring is placed in the wiring area keeping a wide distance to keep the wiring gap constant so that the flatness can be well achieved.

4. 발명의 중요한 용도4. Important uses of the invention

반도체 소자의 제조에 이용됨.Used in the manufacture of semiconductor devices.

Description

배선 간격이 일정하지 않은 반도체 소자의 배선층 평탄화 방법Wiring layer planarization method of semiconductor device with uneven wiring spacing

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3A도 및 제3B도는 본 발명의 배선 간격이 일정하지 않은 반도체 소자의 배선층 평탄화 방법을 도시하는 도면.3A and 3B show a method of planarizing a wiring layer of a semiconductor device in which wiring intervals of the present invention are not constant.

Claims (1)

배선 간격이 일정하지 않은 반도체 소자의 배선층 평탄화 방법에 있어서, 상기 배선층의 배선 간격이 넓은 부분이 상기 배선층의 좁은 부분의 배선 간격을 유지하도록 배선 간격이 넓은 부분에 더미 배선층을 형성하는 단계 및, 전체 구조 상부에 평탄화용 절연막을 증착하는 단계를 포함해서 이루어진 배선 간격이 일정하지 않은 반도체 소자의 배선층 평탄화 방법.A method of planarizing a wiring layer of a semiconductor device in which wiring intervals are not constant, the method comprising: forming a dummy wiring layer in a portion having a large wiring interval such that a portion having a large wiring interval of the wiring layer maintains a wiring interval of a narrow portion of the wiring layer; A method of planarizing a wiring layer of a semiconductor device, wherein the wiring spacing is not constant, comprising depositing a planarization insulating film on the structure. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950019132A 1995-06-30 1995-06-30 Wiring layer planarization method of semiconductor device with uneven wiring spacing KR970003563A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950019132A KR970003563A (en) 1995-06-30 1995-06-30 Wiring layer planarization method of semiconductor device with uneven wiring spacing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950019132A KR970003563A (en) 1995-06-30 1995-06-30 Wiring layer planarization method of semiconductor device with uneven wiring spacing

Publications (1)

Publication Number Publication Date
KR970003563A true KR970003563A (en) 1997-01-28

Family

ID=66526532

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950019132A KR970003563A (en) 1995-06-30 1995-06-30 Wiring layer planarization method of semiconductor device with uneven wiring spacing

Country Status (1)

Country Link
KR (1) KR970003563A (en)

Similar Documents

Publication Publication Date Title
KR970067775A (en) Semiconductor devices
JPS52102690A (en) Semiconductor capacitance device
KR890013786A (en) Amorphous silicon thin film transistor array substrate and manufacturing method thereof
KR900005593A (en) Semiconductor device
KR890003000A (en) Manufacturing Method of Semiconductor Device
JPS5324277A (en) Semiconductor devic e and its production
KR970003563A (en) Wiring layer planarization method of semiconductor device with uneven wiring spacing
JPS5299085A (en) Production of semiconductor device
KR970030521A (en) Semiconductor device with new pad layer
KR910001889A (en) Semiconductor device
JPS5349964A (en) Manufacture of semiconductor device
JPS52123879A (en) Mos type semiconductor device and its production
KR970052374A (en) Layout of semiconductor devices
KR970052446A (en) Semiconductor device manufacturing method
JPS52117083A (en) Semiconductor device
KR900007116A (en) A thin film transistor having a plurality of gate insulating layers and a method of manufacturing the same
JPS5363986A (en) Production of semiconductor device
KR960019792A (en) Semiconductor device with ferroelectric film
KR940010309A (en) Thin film transistor and method for manufacturing same
KR940016735A (en) Method for manufacturing metal wiring of semiconductor device
KR970018704A (en) Semiconductor device having MOS transistor of vertical structure and manufacturing method thereof
KR960002560A (en) Contact manufacturing method of semiconductor device
JPS5317283A (en) Production of semiconductor device
KR940001400A (en) Word Line Structure and Formation Method
KR960002910A (en) Top Gate Thin Film Transistor for Liquid Crystal Display

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19950630

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid