KR960000706B1 - 전력소자용 플라스틱 패키지 구조 및 그 제조방법 - Google Patents
전력소자용 플라스틱 패키지 구조 및 그 제조방법 Download PDFInfo
- Publication number
- KR960000706B1 KR960000706B1 KR1019930013085A KR930013085A KR960000706B1 KR 960000706 B1 KR960000706 B1 KR 960000706B1 KR 1019930013085 A KR1019930013085 A KR 1019930013085A KR 930013085 A KR930013085 A KR 930013085A KR 960000706 B1 KR960000706 B1 KR 960000706B1
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- Prior art keywords
- power device
- lead
- device chip
- lead frame
- plastic package
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
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Abstract
Description
Claims (7)
- 방열판(7) 상부에 접착되는 4개의 리드를 가진 리드프레임(1)의 면보다 상대적으로 낮은 위치에 연결된 패들(2)과, 상기 패들(2) 상부에 부착되는 코바르 기판(8)과, 상기 코바르 기판(8) 상부에 접착되는 전력소자 칩(9)과, 상기 전력소자 칩(9)의 게이트 전극이 게이트 전극용 리드(3)에, 드레인 전극이 드레인 전극용 리드(4)에 각각 접속되고, 소오스 전극이 리드프레임 패들(2)에 접속되는 본딩 와이어(10)와, 상기 리드프레임 패들(2) 위에 부착되는 금속 캡(11)과, 상기 금속 캡(11) 및 상기 본딩 와이어(10)를 플라스틱으로 덮는 것을 특징으로 하는 전력소자용 플라스틱 패키지 구조.
- 제1항에 있어서, 상기 패들(2)은 양측에 타이바가 있고, 이 타이바는 전력소자 칩(9)의 소오스 전극용 리드(5,6)들로서 사용되는 것을 특징으로 하는 전력소자용 플라스틱 패키지 구조.
- 제1항에 있어서, 상기 4개의 리드는 상기의 게이트 전극용 리드(3) 및 상기의 드레인 전극용 리드(4)와 두개의 소오스 전극용 리드(5,6)들이 포함되되, 상기 게이트 전극용 리드(3)와 상기 드레인 전극용 리드(4)는 냉각 핀인 상기 두개의 소오스 전극용 리드(5,6)들과 반대편으로 굽혀지는 것을 특징으로 하는 전력소자용 플라스틱 패키지 구조.
- 전력소자 칩(9)의 방열을 위해 리드프레임(1) 상부에 방열판(7)이 부착되는 (a)공정과. 상기 리드프레임(1) 상부에 갈륨비소 전력소자 칩(9)과 리드프레임(1)의 열팽창계수 차이로부터 발생되는 열응력을 제거하기 위해 코바르 기판(8)이 부착되는(b)공정과, 상기 코바르 기관(8) 상부에 갈륨비소 전력소자 칩(9)이 접착되는 (c)공정과, 상기 전력소자 칩(9)의 전극들을 리드프레임(1)의 리드에 와이어(10)본딩하고, 이 전력소자 칩(9)이 에폭시와 반응되지 않도록 하기 위한 저온용 폴리이미드를 스핀에 의해서 전력소자 칩(9)에 도포하는 (d)공정과, 상기 리드프레임(1)의 리드를 임피던스가 정합되도록 하고, 상기 전력소자 칩 (9) 상부에 노이즈를 차폐하기 위한 금속 캡(11)이 부착되는 (e)공정과, 상기 금속 캡(11)을 에폭시를 이용하여 플라스틱 몰딩하는 (f)공정을 포함하는 것을 특징으로 하는 전력소자용 플라스틱 패키지 제조방법.
- 제4항에 있이서, 상기 코바르 기판(8)은 310 내지 320℃에서 납, 인듐은 비율이 9.25 : 5 : 2.5로 된 합금이 사용되어 부착되는 것을 특징으로 하는 전력소자용 패키지 제조방법.
- 제4항에 있어서, 상기 (d)공정에서 상기 저온용 폴리아미드는 3000rpm의 스핀속도, 5μm의 도포두께, 220℃ 온도에서 큐어링 되는 것을 특징으로 하는 전력소자용 플라스틱 패키지 제조방법.
- 제4항에 있어서, 상기 금속 캡(11)은 240 내지 250℃에서 주석, 안티몬의 비율이 95 : 5로 된 합금이 사용되어 부착되는 것을 특징으로 하는 전력소자용 플라스틱 패키지 제조방법.
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019930013085A KR960000706B1 (ko) | 1993-07-12 | 1993-07-12 | 전력소자용 플라스틱 패키지 구조 및 그 제조방법 |
US08/268,104 US5446959A (en) | 1993-07-12 | 1994-07-06 | Method of packaging a power semiconductor device |
GB9413867A GB2280062B (en) | 1993-07-12 | 1994-07-08 | Method of packaging a power semiconductor device and package produced by the method |
FR9408824A FR2707798B1 (fr) | 1993-07-12 | 1994-07-11 | Procédé d'encapsulation d'un dispositif à semi-conducteurs de puissance et encapsulage fabriqué selon ce procédé. |
DE4424549A DE4424549C2 (de) | 1993-07-12 | 1994-07-12 | Verfahren zum Gehäusen eines Leistungshalbleiterbauelements und durch dieses Verfahren hergestelltes Gehäuse |
JP6159894A JP2560205B2 (ja) | 1993-07-12 | 1994-07-12 | 電力素子用プラスチックパッケージ構造及びその組立方法 |
US08/381,304 US5612853A (en) | 1993-07-12 | 1995-01-31 | Package for a power semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019930013085A KR960000706B1 (ko) | 1993-07-12 | 1993-07-12 | 전력소자용 플라스틱 패키지 구조 및 그 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR950004507A KR950004507A (ko) | 1995-02-18 |
KR960000706B1 true KR960000706B1 (ko) | 1996-01-11 |
Family
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Application Number | Title | Priority Date | Filing Date |
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US (2) | US5446959A (ko) |
JP (1) | JP2560205B2 (ko) |
KR (1) | KR960000706B1 (ko) |
DE (1) | DE4424549C2 (ko) |
FR (1) | FR2707798B1 (ko) |
GB (1) | GB2280062B (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2907104B2 (ja) * | 1996-03-27 | 1999-06-21 | 日本電気株式会社 | 時間ダイバーシティ通信方法及び通信装置 |
JP2781783B2 (ja) * | 1996-07-30 | 1998-07-30 | 山形日本電気株式会社 | 半導体装置用パッケージ |
DE19638669A1 (de) * | 1996-09-20 | 1998-04-02 | Siemens Components A T | Herstellungsverfahren von Kunststoffgehäusen für auf Trägerrahmen befestigten Chips |
JPH10247713A (ja) * | 1997-03-05 | 1998-09-14 | Toshiba Corp | 半導体素子、半導体装置及びこれらの製造方法 |
JP2907186B2 (ja) | 1997-05-19 | 1999-06-21 | 日本電気株式会社 | 半導体装置、その製造方法 |
JP2959521B2 (ja) * | 1997-05-21 | 1999-10-06 | 日本電気株式会社 | 半導体装置の製造方法、リードフレーム |
US5889318A (en) * | 1997-08-12 | 1999-03-30 | Micron Technology, Inc. | Lead frame including angle iron tie bar and method of making the same |
KR20000057810A (ko) | 1999-01-28 | 2000-09-25 | 가나이 쓰토무 | 반도체 장치 |
JP4260263B2 (ja) * | 1999-01-28 | 2009-04-30 | 株式会社ルネサステクノロジ | 半導体装置 |
US6166411A (en) * | 1999-10-25 | 2000-12-26 | Advanced Micro Devices, Inc. | Heat removal from SOI devices by using metal substrates |
US6552395B1 (en) | 2000-01-03 | 2003-04-22 | Advanced Micro Devices, Inc. | Higher thermal conductivity glass for SOI heat removal |
DE10014804A1 (de) * | 2000-03-24 | 2001-09-27 | Swoboda Gmbh Geb | Leuchtenmodul |
KR100699746B1 (ko) * | 2000-11-07 | 2007-03-27 | 페어차일드코리아반도체 주식회사 | 열전달 특성이 개선된 전력용 모듈 패키지 |
US6818477B2 (en) * | 2001-11-26 | 2004-11-16 | Powerwave Technologies, Inc. | Method of mounting a component in an edge-plated hole formed in a printed circuit board |
US7211887B2 (en) * | 2004-11-30 | 2007-05-01 | M/A-Com, Inc. | connection arrangement for micro lead frame plastic packages |
US7951698B2 (en) * | 2006-12-05 | 2011-05-31 | Electronics And Telecommunications Research Institute | Method of fabricating electronic device using nanowires |
US7812430B2 (en) * | 2008-03-04 | 2010-10-12 | Powertech Technology Inc. | Leadframe and semiconductor package having downset baffle paddles |
US8324025B2 (en) | 2010-04-22 | 2012-12-04 | Team Pacific Corporation | Power semiconductor device packaging |
TWI489607B (zh) * | 2010-11-23 | 2015-06-21 | 登豐微電子股份有限公司 | 封裝結構 |
JP5949935B2 (ja) | 2012-10-25 | 2016-07-13 | 三菱電機株式会社 | 半導体装置 |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026292Y1 (ko) * | 1968-01-29 | 1975-08-06 | ||
GB1318821A (en) * | 1971-03-26 | 1973-05-31 | Ferranti Ltd | Construction of packages for semiconductor devices |
US3922712A (en) * | 1974-05-01 | 1975-11-25 | Gen Motors Corp | Plastic power semiconductor flip chip package |
DE2543968A1 (de) * | 1975-10-02 | 1977-04-07 | Licentia Gmbh | Integrierte schaltungsanordnung |
JPS52120768A (en) * | 1976-04-05 | 1977-10-11 | Nec Corp | Semiconductor device |
US4079511A (en) * | 1976-07-30 | 1978-03-21 | Amp Incorporated | Method for packaging hermetically sealed integrated circuit chips on lead frames |
CA1083263A (en) * | 1977-06-29 | 1980-08-05 | Norman Hascoe | Prefabricated composite metallic heat-transmitting plate unit |
JPS55156343A (en) * | 1979-05-25 | 1980-12-05 | Hitachi Ltd | Manufacture of semiconductor device |
JPS5623759A (en) * | 1979-08-01 | 1981-03-06 | Hitachi Ltd | Resin-sealed semiconductor device and manufacture thereof |
FR2488445A1 (fr) * | 1980-08-06 | 1982-02-12 | Efcis | Boitier plastique pour circuits integres |
DE3040867C2 (de) * | 1980-10-30 | 1985-01-17 | Telefunken electronic GmbH, 7100 Heilbronn | Verfahren zur Herstellung einer Halbleiteranordnung |
JPS5972748A (ja) * | 1982-10-20 | 1984-04-24 | Nec Kyushu Ltd | 半導体装置 |
US5476970A (en) * | 1984-02-16 | 1995-12-19 | Velsicol Chemical Corporation | Method for preparing aryl ketones |
US4811166A (en) * | 1986-07-02 | 1989-03-07 | Texas Instruments Incorporated | Heat dissipating member for mounting a semiconductor device and electrical circuit unit incorporating the member |
DE3635375A1 (de) * | 1986-10-17 | 1988-04-28 | Heraeus Gmbh W C | Systemtraeger fuer elektronische bauelemente |
US4855868A (en) * | 1987-01-20 | 1989-08-08 | Harding Ade Yemi S K | Preformed packaging arrangement for energy dissipating devices |
US4829403A (en) * | 1987-01-20 | 1989-05-09 | Harding Ade Yemi S K | Packaging arrangement for energy dissipating devices |
US4783428A (en) * | 1987-11-23 | 1988-11-08 | Motorola Inc. | Method of producing a thermogenetic semiconductor device |
US4953002A (en) * | 1988-03-31 | 1990-08-28 | Honeywell Inc. | Semiconductor device housing with magnetic field protection |
JPH0364033A (ja) * | 1989-08-02 | 1991-03-19 | Hitachi Ltd | 半導体装置およびその製造に用いるリードフレーム |
JPH03136338A (ja) * | 1989-10-23 | 1991-06-11 | Mitsubishi Electric Corp | 半導体装置およびその製造のためのロウ付け方法 |
US5079618A (en) * | 1990-06-12 | 1992-01-07 | Micron Technology, Inc. | Semiconductor device structures cooled by Peltier junctions and electrical interconnect assemblies |
US5440170A (en) * | 1990-09-10 | 1995-08-08 | Fujitsu Limited | Semiconductor device having a die pad with rounded edges and its manufacturing method |
US5270262A (en) * | 1991-02-28 | 1993-12-14 | National Semiconductor Corporation | O-ring package |
US5362680A (en) * | 1992-08-18 | 1994-11-08 | Texas Instruments Incorporated | Technique for enhancing adhesion capability of heat spreaders in molded packages |
US5387554A (en) * | 1992-09-10 | 1995-02-07 | Vlsi Technology, Inc. | Apparatus and method for thermally coupling a heat sink to a lead frame |
-
1993
- 1993-07-12 KR KR1019930013085A patent/KR960000706B1/ko not_active Expired - Fee Related
-
1994
- 1994-07-06 US US08/268,104 patent/US5446959A/en not_active Expired - Fee Related
- 1994-07-08 GB GB9413867A patent/GB2280062B/en not_active Expired - Fee Related
- 1994-07-11 FR FR9408824A patent/FR2707798B1/fr not_active Expired - Fee Related
- 1994-07-12 DE DE4424549A patent/DE4424549C2/de not_active Expired - Fee Related
- 1994-07-12 JP JP6159894A patent/JP2560205B2/ja not_active Expired - Lifetime
-
1995
- 1995-01-31 US US08/381,304 patent/US5612853A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2280062A (en) | 1995-01-18 |
GB2280062B (en) | 1997-04-09 |
FR2707798A1 (fr) | 1995-01-20 |
US5612853A (en) | 1997-03-18 |
JP2560205B2 (ja) | 1996-12-04 |
FR2707798B1 (fr) | 1996-06-14 |
DE4424549C2 (de) | 1996-10-17 |
GB9413867D0 (en) | 1994-08-24 |
US5446959A (en) | 1995-09-05 |
DE4424549A1 (de) | 1995-01-19 |
KR950004507A (ko) | 1995-02-18 |
JPH0778900A (ja) | 1995-03-20 |
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