[go: up one dir, main page]

KR950001314A - High Impedance Measurement Circuit - Google Patents

High Impedance Measurement Circuit Download PDF

Info

Publication number
KR950001314A
KR950001314A KR1019930010662A KR930010662A KR950001314A KR 950001314 A KR950001314 A KR 950001314A KR 1019930010662 A KR1019930010662 A KR 1019930010662A KR 930010662 A KR930010662 A KR 930010662A KR 950001314 A KR950001314 A KR 950001314A
Authority
KR
South Korea
Prior art keywords
input
signal
high impedance
comparator
inverting terminal
Prior art date
Application number
KR1019930010662A
Other languages
Korean (ko)
Other versions
KR0122855B1 (en
Inventor
이천성
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019930010662A priority Critical patent/KR0122855B1/en
Publication of KR950001314A publication Critical patent/KR950001314A/en
Application granted granted Critical
Publication of KR0122855B1 publication Critical patent/KR0122855B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

본 발명은 하이 임피던스 측정회로에 관한 것으로, 특히 입력신호를 비교기를 통하여 기준신호와 비교하여 디지탈 계측기만으로 입력신호의 하이 임피던스 상태의 유무를 판별할 수 있도록 된 하이 임피던스 측정회로에 관한 것이며, 입력단자(1)를 통하여 비반전단자에 입력되는 입력신호와 반전단자에 입력되는 기준신호(Va)를 비교하는 비교기(COMPI)와, 이 비교기(COMPI)의 출력신호를 반전시키는 인버어터(NT)와, 상기 입력단자(1)를 통하여 비반전단자에 입력되는 입력신호와 반전단자에 입력되는 기준신호(Vb)를 비교하는 비교기(COMP2)와, 이 비교기 (COMP2)의 출력신호와 상기 인버어터(NT)의 출력신호를 논리합하는 OR 게이트(OR)로 구성된 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high impedance measuring circuit, and more particularly, to a high impedance measuring circuit capable of determining the presence or absence of a high impedance state of an input signal by using only a digital measuring instrument by comparing an input signal with a reference signal through a comparator. (1) a comparator (COMPI) for comparing the input signal input to the non-inverting terminal and the reference signal (V a ) input to the inverting terminal, and an inverter (NT) for inverting the output signal of the comparator (COMPI). And a comparator COMP2 for comparing the input signal input to the non-inverting terminal and the reference signal V b input to the inverting terminal through the input terminal 1, the output signal of the comparator COMP2 and the inverter. The OR gate is configured to OR the output signal of the adapter NT.

Description

하이 임피던스 측정회로High Impedance Measurement Circuit

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제 1 도는 본 발명의 실시회로도이다.1 is an exemplary circuit diagram of the present invention.

Claims (2)

입력단자(1)를 통하여 비반전단자에 입력되는 입력신호와 반전단자에 입력되는 기준신호(Va)를 비교하는 비교기(COMP1)와, 이 비교기(COMP1)의 출력신호를 반전시키는 인버어터(NT)와, 상기 입력단자(1)를 통하여 비반전단자에 입력되는 입력신호와 반전단자에 입력되는 기준신호(Vb)를 비교하는 비교기(COMP2)와, 이 비교기 (COMP2)의 출력신호와 상기 인버어터(NT)의 출력신호를 논리합하는 OR 게이트(OR)로 구성된 것을 특징으로 하는 하이 임피던스 측정회로.Comparator COMP1 for comparing the input signal input to the non-inverting terminal and the reference signal V a input to the inverting terminal through the input terminal 1, and an inverter for inverting the output signal of the comparator COMP1. NT), a comparator COMP2 for comparing the input signal input to the non-inverting terminal and the reference signal V b input to the inverting terminal through the input terminal 1, and the output signal of the comparator COMP2. The high impedance measurement circuit, characterized in that consisting of an OR gate (OR) for ORing the output signal of the inverter (NT). 제 1 항에 있어서, 기준신호들(Va,Vb)의 값은 Va〈Hi-Z 입력신호〈V|b의 관계가 이루어지도록 설정되는 것을 특징으로 하는 하이 임피던스 측정회로.The method of claim 1, wherein the reference value of the signals (V a, V b) is a V <Hi-Z input signal <V | A high impedance measurement circuit, characterized in that the relationship of b is set to be made. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930010662A 1993-06-11 1993-06-11 High impedance test circuit KR0122855B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019930010662A KR0122855B1 (en) 1993-06-11 1993-06-11 High impedance test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019930010662A KR0122855B1 (en) 1993-06-11 1993-06-11 High impedance test circuit

Publications (2)

Publication Number Publication Date
KR950001314A true KR950001314A (en) 1995-01-03
KR0122855B1 KR0122855B1 (en) 1997-12-05

Family

ID=19357265

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930010662A KR0122855B1 (en) 1993-06-11 1993-06-11 High impedance test circuit

Country Status (1)

Country Link
KR (1) KR0122855B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100314756B1 (en) * 1999-06-04 2001-11-15 신형인 Rubber Compound for bladder

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102662272B1 (en) * 2018-12-11 2024-05-02 삼성전자주식회사 A power amplifier and an elelctronic device comprising the same
KR102574188B1 (en) * 2022-08-19 2023-09-04 심플라온 주식회사 Protection circuit for digital amp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100314756B1 (en) * 1999-06-04 2001-11-15 신형인 Rubber Compound for bladder

Also Published As

Publication number Publication date
KR0122855B1 (en) 1997-12-05

Similar Documents

Publication Publication Date Title
KR880011601A (en) Battery remaining capacity alarm
KR920003690A (en) Optical receiver circuit
KR960012761A (en) Load termination detection circuit
KR850002387A (en) Moisture measuring device such as skin
KR900002553A (en) Phase detection circuit
KR950001314A (en) High Impedance Measurement Circuit
KR960001762A (en) Frequency measuring circuit
KR900019364A (en) Integrator circuit
DE69522663D1 (en) BYPASS CONTROL FOR SCAN TEST WITH AUTOMATIC RESET
KR840000123A (en) Dual Mode Tone Detector Circuit
KR920020217A (en) Digital Signal Measuring Device
JPS5752227A (en) Data sampling circuit
KR950007270A (en) Signal detection device
KR920015827A (en) Detector for Telephone Answering Device with Automatic Separation
KR980004129A (en) Optical coupler data detection method
KR920016843A (en) Signal level measuring circuit
JPS6415622A (en) Measuring method for temperature
KR910005062A (en) Semiconductor test method
KR920016849A (en) Filter characteristic measuring device
KR970055371A (en) Clock discrimination circuit
KR900001453Y1 (en) White-black distinguishing circuit
RU2034334C1 (en) Emergency alarm
KR900017343A (en) Dial pulse measuring circuit
KR880008679A (en) Ring Zero Cross Detection Circuit
KR980003622A (en) MAT applications for testing equipment

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19930611

A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 19941231

Comment text: Request for Examination of Application

Patent event code: PA02011R01I

Patent event date: 19930611

Comment text: Patent Application

PG1501 Laying open of application
E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 19970818

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 19970909

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 19970909

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

Termination category: Default of registration fee

Termination date: 20010611