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KR920701830A - Ic 시험장치 - Google Patents

Ic 시험장치

Info

Publication number
KR920701830A
KR920701830A KR1019910701231A KR910701231A KR920701830A KR 920701830 A KR920701830 A KR 920701830A KR 1019910701231 A KR1019910701231 A KR 1019910701231A KR 910701231 A KR910701231 A KR 910701231A KR 920701830 A KR920701830 A KR 920701830A
Authority
KR
South Korea
Prior art keywords
test equipment
test
equipment
Prior art date
Application number
KR1019910701231A
Other languages
English (en)
Other versions
KR960007508B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR920701830A publication Critical patent/KR920701830A/ko
Application granted granted Critical
Publication of KR960007508B1 publication Critical patent/KR960007508B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1019910701231A 1990-02-02 1991-02-01 Ic 시험장치 KR960007508B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023704A JP2831780B2 (ja) 1990-02-02 1990-02-02 Ｉｃ試験装置
JP90-23704 1990-02-02
PCT/JP1991/000125 WO1991011728A1 (en) 1990-02-02 1991-02-01 Ic testing device

Publications (2)

Publication Number Publication Date
KR920701830A true KR920701830A (ko) 1992-08-12
KR960007508B1 KR960007508B1 (ko) 1996-06-05

Family

ID=12117756

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910701231A KR960007508B1 (ko) 1990-02-02 1991-02-01 Ic 시험장치

Country Status (6)

Country Link
US (1) US5225775A (ko)
EP (1) EP0466939B1 (ko)
JP (1) JP2831780B2 (ko)
KR (1) KR960007508B1 (ko)
DE (1) DE69115776T2 (ko)
WO (1) WO1991011728A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100936707B1 (ko) * 2006-10-20 2010-01-13 요코가와 덴키 가부시키가이샤 반도체 시험 장치의 타이밍 교정 회로 및 타이밍 교정 방법

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622636A1 (en) * 1993-04-29 1994-11-02 International Business Machines Corporation Method for improving accuracy tester auto-calibration
DE4314324C1 (de) * 1993-04-30 1994-07-28 Siemens Ag Verfahren zum kollisionsfreien Testbetrieb eines Prüflings
US5682472A (en) * 1995-03-17 1997-10-28 Aehr Test Systems Method and system for testing memory programming devices
US6469493B1 (en) * 1995-08-01 2002-10-22 Teradyne, Inc. Low cost CMOS tester with edge rate compensation
US5894081A (en) * 1996-03-15 1999-04-13 Intel Corporation Method and apparatus for adjusting output signals from a semiconductor device to fulfill a timing specification
JPH09318704A (ja) * 1996-05-30 1997-12-12 Ando Electric Co Ltd Ｉｃ試験装置
JPH10170603A (ja) * 1996-12-13 1998-06-26 Ando Electric Co Ltd Ｉｃテスタのキャリブレーション方法
US6073259A (en) * 1997-08-05 2000-06-06 Teradyne, Inc. Low cost CMOS tester with high channel density
US6060898A (en) * 1997-09-30 2000-05-09 Credence Systems Corporation Format sensitive timing calibration for an integrated circuit tester
JPH11304890A (ja) * 1998-04-16 1999-11-05 Nec Corp Ｌｓｉテスタのテストパタン生成方法および装置
JP4138163B2 (ja) * 1999-07-07 2008-08-20 株式会社ルネサステクノロジ Ｌｓｉ試験装置およびそのタイミングキャリブレーション方法
JP2001035188A (ja) 1999-07-26 2001-02-09 Fujitsu Ltd 半導体装置の試験方法及び半導体装置
US6448799B1 (en) * 1999-09-30 2002-09-10 Hitachi Electronics Engineering Co., Ltd. Timing adjustment method and apparatus for semiconductor IC tester
US6693436B1 (en) * 1999-12-23 2004-02-17 Intel Corporation Method and apparatus for testing an integrated circuit having an output-to-output relative signal
US6745342B1 (en) * 1999-12-29 2004-06-01 Infineon Technologies North America Corp. Universal serial bus transceiver shortcut protection
US7181705B2 (en) 2000-01-18 2007-02-20 Cadence Design Systems, Inc. Hierarchical test circuit structure for chips with multiple circuit blocks
WO2001054001A1 (en) 2000-01-18 2001-07-26 Cadence Design Systems, Inc. Adaptable circuit blocks for use in multi-block chip design
JP3584850B2 (ja) * 2000-04-24 2004-11-04 日本電気株式会社 電子装置用基板およびスイッチ機能付きソケット
US6609077B1 (en) 2000-05-31 2003-08-19 Teradyne, Inc. ATE timing measurement unit and method
KR100574933B1 (ko) * 2000-06-16 2006-05-02 삼성전자주식회사 테스트 시스템의 채널 스큐를 줄이기 위한 조정방법
EP1473573B1 (en) * 2000-06-28 2007-04-18 Cadence Design Systems, Inc. Intelligent test adapter
AU2001296101A1 (en) * 2000-07-06 2002-01-14 Igor Anatolievich Abrosimov Interface device with stored data on transmission lines characteristics
JP2002040108A (ja) * 2000-07-27 2002-02-06 Advantest Corp 半導体デバイス試験装置のタイミング校正方法・半導体デバイス試験装置
JP2003035747A (ja) * 2001-07-19 2003-02-07 Mitsubishi Electric Corp 半導体検査システムおよび半導体検査方法
JP2003098222A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 検査用基板、検査装置及び半導体装置の検査方法
KR100459698B1 (ko) * 2002-02-08 2004-12-04 삼성전자주식회사 병렬검사되는 개수를 증가시키는 반도체 소자의 전기적검사방법
WO2005091962A2 (en) * 2004-03-05 2005-10-06 Qualitau, Inc. Dual channel source measurement unit for semiconductor device testing
US7202687B2 (en) * 2004-04-08 2007-04-10 Formfactor, Inc. Systems and methods for wireless semiconductor device testing
KR100736673B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
JP5429727B2 (ja) * 2007-08-24 2014-02-26 ワイアイケー株式会社 半導体試験装置
JP5023983B2 (ja) * 2007-11-14 2012-09-12 横河電機株式会社 半導体試験装置
US7755375B2 (en) * 2008-01-08 2010-07-13 Advantest Corporation Test apparatus, probe card, and test method
CN102955732A (zh) * 2011-08-29 2013-03-06 鸿富锦精密工业（深圳）有限公司 Cpu测试系统及其测试治具
IT202100015431A1 (it) * 2021-06-14 2022-12-14 Belvedere S R L Dispositivo di connessione elettro-meccanica per apparecchiature da testare

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE31056E (en) * 1977-03-23 1982-10-12 Fairchild Camera & Instrument Corp. Computer controlled high-speed circuit for testing electronic devices
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
JPS5739363A (en) * 1980-08-20 1982-03-04 Nec Corp Testing device
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
US4994732A (en) * 1985-12-18 1991-02-19 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100936707B1 (ko) * 2006-10-20 2010-01-13 요코가와 덴키 가부시키가이샤 반도체 시험 장치의 타이밍 교정 회로 및 타이밍 교정 방법

Also Published As

Publication number Publication date
EP0466939B1 (en) 1995-12-27
DE69115776D1 (de) 1996-02-08
JP2831780B2 (ja) 1998-12-02
EP0466939A4 (en) 1992-10-14
US5225775A (en) 1993-07-06
DE69115776T2 (de) 1996-06-05
JPH03228343A (ja) 1991-10-09
EP0466939A1 (en) 1992-01-22
KR960007508B1 (ko) 1996-06-05
WO1991011728A1 (en) 1991-08-08

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