JPS5739363A - Testing device - Google Patents
Testing deviceInfo
- Publication number
- JPS5739363A JPS5739363A JP55114179A JP11417980A JPS5739363A JP S5739363 A JPS5739363 A JP S5739363A JP 55114179 A JP55114179 A JP 55114179A JP 11417980 A JP11417980 A JP 11417980A JP S5739363 A JPS5739363 A JP S5739363A
- Authority
- JP
- Japan
- Prior art keywords
- connector
- test
- test board
- dut
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To use a device without changing a test program, by setting a time-lag of an electric signal to each device to be tested (DUT) by length of a cable, after encoding it on the test board which is used for connecting with a handling device, in advance. CONSTITUTION:A test board 4 is equipped with an IC socket 6 for installing a DUT, and a wire 7 is used for each part signal of a test station, and the IC socket 6, and a connector 8 is used for reading a code on the test board. A connector 10 is capable of connecting with each part signal of the test station, and is constituted so that the testboard 4 can be replaced easily depending on a kind of the DUT9. In case of connection as shown in the figure, a code of the connector 8 becomes A3 (hexadecimal), and 256 kinds of combination are available. Accordingly, when a time lag is set to 256msec, correction is executed by 1msec each.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55114179A JPS5739363A (en) | 1980-08-20 | 1980-08-20 | Testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55114179A JPS5739363A (en) | 1980-08-20 | 1980-08-20 | Testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5739363A true JPS5739363A (en) | 1982-03-04 |
Family
ID=14631155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55114179A Pending JPS5739363A (en) | 1980-08-20 | 1980-08-20 | Testing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5739363A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0466939B1 (en) * | 1990-02-02 | 1995-12-27 | Advantest Corporation | Ic testing device |
-
1980
- 1980-08-20 JP JP55114179A patent/JPS5739363A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0466939B1 (en) * | 1990-02-02 | 1995-12-27 | Advantest Corporation | Ic testing device |
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