KR920018759A - 반도체 메모리장치에서의 워드라인 구동회로 - Google Patents
반도체 메모리장치에서의 워드라인 구동회로 Download PDFInfo
- Publication number
- KR920018759A KR920018759A KR1019910004068A KR910004068A KR920018759A KR 920018759 A KR920018759 A KR 920018759A KR 1019910004068 A KR1019910004068 A KR 1019910004068A KR 910004068 A KR910004068 A KR 910004068A KR 920018759 A KR920018759 A KR 920018759A
- Authority
- KR
- South Korea
- Prior art keywords
- voltage level
- word line
- voltage
- memory cycle
- level
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims 3
- 230000004044 response Effects 0.000 claims 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4085—Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (5)
- 다수의 워드라인과, 각각의 라인에 접속된 다수의 메모리쎌들과, 상기 워드라인들과 접속되고 메모리 싸이클중 입력 어드레스 신호에 응답하여 워드라인을 선택하고 상기 워드라인을 제1전압레벨에서 제2전압 레벨로 구동하기 위한 행디코우더 및 구동회로와, 상기 워드라인에 접속되고 비메모리 싸이클에서 부전압을 공급하기 위한 부전압 발생회로를 가지는 고밀도 반도체 메모리 장치에 있어서, 메모리 싸이클의 개시 및 종료중 적어도 어느 하나에서 상기 선택된 워드라인을 상기 제1전압레벨과 제2전압레벨 사이의 중간 전압 레벨로 유지하는 리세스 회로를 가짐을 특징으로 하는 워드 라인 구동회로.
- 제1항에 있어서, 상기 제1전압 레벨과 상기 중간전압 레벨과의 차의 절대값은 상기 제2전압레벨과 상기 중간 레벨과의 차의 절대값보다 더 작음을 특징으로 하는 워드라인 구동회로.
- 제1항에 있어서, 상기 제1전압레벨은 음의 전압레벨이고 상기 제2전압 레벨은 양의 부우스트 전압이고, 상기 중간전압 레벨은 접지전압 또는 트랜지스터의 드레쉬 홀드 전압임을 특징으로 하는 워드라인 구동회로.
- 비 메모리 싸이클중 워드라인을 제1전압벨로 유지하고 메모리 싸이클중 상기 워드라인을 제2전압 레벨로 유지하는 반도체 메모리 장치의 워드라인 구동 방법에 있어서, 상기 메모리 싸이클의 개시 및 종료중 적어도 어느 하나에서 상기 워드라인을 상기 제1전압레벨과 제2전압레벨 사이의 중간 전압 레벨로 구동하는 워드라인 구동방법.
- 제4항에 있어서, 상기 제1전압 레벨은 음의 전압 레벨이고 상기 제2전압 레벨은 양의 전압이며, 상기 중간전압 레벨은 접지전압 또는 트랜지스터의 드레쉬 홀드 전압임을 특징으로 하는 워드라인 구동 방법.※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910004068A KR940002859B1 (ko) | 1991-03-14 | 1991-03-14 | 반도체 메모리장치에서의 워드라인 구동회로 |
US07/850,840 US5297104A (en) | 1991-03-14 | 1992-03-13 | Word line drive circuit of semiconductor memory device |
JP4054981A JP2662335B2 (ja) | 1991-03-14 | 1992-03-13 | ワードライン駆動回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910004068A KR940002859B1 (ko) | 1991-03-14 | 1991-03-14 | 반도체 메모리장치에서의 워드라인 구동회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920018759A true KR920018759A (ko) | 1992-10-22 |
KR940002859B1 KR940002859B1 (ko) | 1994-04-04 |
Family
ID=19312092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910004068A KR940002859B1 (ko) | 1991-03-14 | 1991-03-14 | 반도체 메모리장치에서의 워드라인 구동회로 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5297104A (ko) |
JP (1) | JP2662335B2 (ko) |
KR (1) | KR940002859B1 (ko) |
Cited By (1)
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KR100278981B1 (ko) * | 1997-12-23 | 2001-01-15 | 김영환 | 반도체 메모리의 구동전압 가변형 데이타 기록장치 |
Families Citing this family (55)
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JP3743453B2 (ja) * | 1993-01-27 | 2006-02-08 | セイコーエプソン株式会社 | 不揮発性半導体記憶装置 |
US5410508A (en) * | 1993-05-14 | 1995-04-25 | Micron Semiconductor, Inc. | Pumped wordlines |
US5650976A (en) * | 1993-05-14 | 1997-07-22 | Micron Technology, Inc. | Dual strobed negative pumped wordlines for dynamic random access memories |
DE4324853C1 (de) * | 1993-07-23 | 1994-09-22 | Siemens Ag | Spannungserzeugungsschaltung |
JP3569310B2 (ja) | 1993-10-14 | 2004-09-22 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
JP3667787B2 (ja) | 1994-05-11 | 2005-07-06 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
KR0121131B1 (ko) * | 1994-10-13 | 1997-11-10 | 문정환 | 반도체 메모리장치의 구동회로 |
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KR20000014567A (ko) * | 1998-08-21 | 2000-03-15 | 윤종용 | 리셋신호 부트스트랩핑 회로를 갖는 저전압 집적형 포토 센서 |
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US8355276B2 (en) * | 2009-11-20 | 2013-01-15 | Arm Limited | Controlling voltage levels applied to access devices when accessing storage cells in a memory |
CN106847816A (zh) * | 2010-02-05 | 2017-06-13 | 株式会社半导体能源研究所 | 半导体装置 |
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US10998022B2 (en) * | 2019-08-16 | 2021-05-04 | Micron Technology, Inc. | Apparatuses and methods for reducing access device sub-threshold leakage in semiconductor devices |
US11557335B2 (en) | 2020-07-07 | 2023-01-17 | International Business Machines Corporation | Erasing a partition of an SRAM array with hardware support |
US11302378B2 (en) * | 2020-07-07 | 2022-04-12 | International Business Machines Corporation | Semiconductor circuit including an initialization circuit for initializing memory cells and clearing of relatively large blocks of memory |
TWI852168B (zh) * | 2022-11-16 | 2024-08-11 | 立積電子股份有限公司 | 開關裝置 |
TWI865988B (zh) | 2022-12-14 | 2024-12-11 | 立積電子股份有限公司 | 開關裝置 |
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JPS5778695A (en) * | 1980-10-29 | 1982-05-17 | Toshiba Corp | Semiconductor storage device |
US4678941A (en) * | 1985-04-25 | 1987-07-07 | International Business Machines Corporation | Boost word-line clock and decoder-driver circuits in semiconductor memories |
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JPS62183096A (ja) * | 1986-02-07 | 1987-08-11 | Hitachi Ltd | ライン駆動回路 |
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JPH02168494A (ja) * | 1988-12-21 | 1990-06-28 | Nec Corp | 半導体記憶回路 |
JP2868789B2 (ja) * | 1989-06-20 | 1999-03-10 | 株式会社東芝 | 半導体駆動回路 |
-
1991
- 1991-03-14 KR KR1019910004068A patent/KR940002859B1/ko not_active IP Right Cessation
-
1992
- 1992-03-13 JP JP4054981A patent/JP2662335B2/ja not_active Expired - Fee Related
- 1992-03-13 US US07/850,840 patent/US5297104A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100278981B1 (ko) * | 1997-12-23 | 2001-01-15 | 김영환 | 반도체 메모리의 구동전압 가변형 데이타 기록장치 |
Also Published As
Publication number | Publication date |
---|---|
US5297104A (en) | 1994-03-22 |
JPH0589673A (ja) | 1993-04-09 |
KR940002859B1 (ko) | 1994-04-04 |
JP2662335B2 (ja) | 1997-10-08 |
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