KR900008244A - 곡률반경 측정장치 및 방법 - Google Patents

곡률반경 측정장치 및 방법

Info

Publication number: KR900008244A
Authority: KR; South Korea
Prior art keywords: measuring device; curvature radius; radius measuring; curvature; radius
Prior art date: 1988-11-11
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

KR1019890016185A

Other languages

English (en)

Other versions

KR920009800B1 (ko

Inventor

가네야스 오오가와

Original Assignee

올림퍼스 고오가꾸 고오교 가부시끼가이샤

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-11-11

Filing date

1989-11-09

Publication date

1990-06-02

1989-11-09 Application filed by 올림퍼스 고오가꾸 고오교 가부시끼가이샤 filed Critical 올림퍼스 고오가꾸 고오교 가부시끼가이샤

1990-06-02 Publication of KR900008244A publication Critical patent/KR900008244A/ko

1992-10-22 Application granted granted Critical

1992-10-22 Publication of KR920009800B1 publication Critical patent/KR920009800B1/ko

Status Expired legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices By Optical Means (AREA)
Testing Of Optical Devices Or Fibers (AREA)

KR1019890016185A 1988-11-11 1989-11-09 곡률반경 측정장치 및 방법 Expired KR920009800B1 (ko)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP88-285357		1988-11-11
JP63285357A JPH0812127B2 (ja)	1988-11-11	1988-11-11	曲率半径測定装置及び方法

Publications (2)

Publication Number	Publication Date
KR900008244A true KR900008244A (ko)	1990-06-02
KR920009800B1 KR920009800B1 (ko)	1992-10-22

Family

ID=17690513

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
KR1019890016185A Expired KR920009800B1 (ko)	1988-11-11	1989-11-09	곡률반경 측정장치 및 방법

Country Status (3)

Country	Link
US (1)	US5059022A (ko)
JP (1)	JPH0812127B2 (ko)
KR (1)	KR920009800B1 (ko)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5355210A (en) *	1991-12-20	1994-10-11	Rotlex Optics Ltd.	Method and apparatus for measuring optical properties of optical devices
US6894788B2 (en)	2000-11-20	2005-05-17	Zygo Corporation	Interferometric system for automated radius of curvature measurements
WO2003032912A2 (en) *	2001-10-16	2003-04-24	Hypnion, Inc.	Treatment of cns disorders using cns target modulators
DE10224317A1 (de) *	2002-05-31	2003-12-11	Zeiss Carl Smt Ag	Verfahren zur Kalibrierung eines Radienprüfplatzes
JP4474150B2 (ja) *	2003-11-28	2010-06-02	キヤノン株式会社	偏心測定方法
US7570368B2 (en) *	2004-05-12	2009-08-04	Veeco Instruments Inc.	Method and apparatus for measuring the curvature of reflective surfaces
JP4764040B2 (ja) *	2005-03-18	2011-08-31	キヤノン株式会社	レンズの非球面の偏心軸の偏心測定方法
JP4789177B2 (ja)	2005-07-06	2011-10-12	独立行政法人科学技術振興機構	３次元位置観測方法及び装置
CN101772696A (zh) *	2007-08-27	2010-07-07	株式会社尼康	波面像差测量装置及方法、以及波面像差调整方法
KR100948577B1 (ko) *	2008-11-20	2010-03-18	갤럭시아포토닉스 주식회사	광학 장치 및 이를 이용한 빛발광 및 곡률 측정 방법
JP5492303B2 (ja) *	2010-08-30	2014-05-14	株式会社東芝	変位検出装置
PL3037800T3 (pl)	2014-12-24	2018-11-30	Trioptics Gmbh	Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego
RU2581440C1 (ru) *	2015-01-29	2016-04-20	Федеральное государственное унитарное предприятие "Уральский научно-исследовательский институт метрологии" (ФГУП "УНИИМ")	Способ измерения локального радиуса кривизны упругодеформированной эталонной балки и устройство для его осуществления
ES2984010T3 (es) *	2017-06-28	2024-10-28	Consejo Superior Investigacion	Aparato para determinar la potencia óptica de lentes y método de medida
CN108106560B (zh) *	2018-01-30	2024-01-26	青岛海泰光电技术有限公司	光学元件大曲率半径的比较法测量方法及其测量装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4609287A (en) *	1982-10-05	1986-09-02	Canon Kabushiki Kaisha	Method of and apparatus for measuring refractive characteristics
JPS5987336A (ja) *	1982-11-11	1984-05-19	Asahi Optical Co Ltd	分割像合致式合焦指示光学系を有するレンズメ−タ−
JPS61118639A (ja) *	1984-11-15	1986-06-05	Olympus Optical Co Ltd	偏心量測定装置
US4826315A (en) *	1985-06-14	1989-05-02	Canon Kabushiki Kaisha	Lens meter

1988
- 1988-11-11 JP JP63285357A patent/JPH0812127B2/ja not_active Expired - Fee Related
1989
- 1989-11-09 KR KR1019890016185A patent/KR920009800B1/ko not_active Expired
- 1989-11-13 US US07/435,716 patent/US5059022A/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
JPH02161332A (ja)	1990-06-21
US5059022A (en)	1991-10-22
JPH0812127B2 (ja)	1996-02-07
KR920009800B1 (ko)	1992-10-22

Publication	Publication Date	Title
DE69133624D1 (de)	2009-12-03	Messverfahren und -vorrichtung
DE69017249D1 (de)	1995-04-06	Ophthalmologisches Messverfahren und Einrichtung.
FI890120A7 (fi)	1989-07-12	Menetelmä ja laite värähtelyn mittaamista varten
DE68927781D1 (de)	1997-03-27	Geometrisches Modellierungsverfahren und -gerät
DE69225964D1 (de)	1998-07-23	Messverfahren und gerät
DE69319050D1 (de)	1998-07-16	Flugzeugvermessungsverfahren und -gerät
DE68928726D1 (de)	1998-08-13	Bilderausrichtungsverfahren und -gerät
NO174978C (no)	1994-08-10	Anordning og fremgangsmåte for måling eller inngrep i en brönn, samt anvendelse av anordningen
DK48491D0 (da)	1991-03-19	Indgrebs- og beskadigelsesindikerende indretning
KR860003524A (ko)	1986-05-26	탐사방법 및 장치
DE68928657D1 (de)	1998-06-04	Schnee-erzeugungseinrichtung und -verfahren
DE3887325D1 (de)	1994-03-03	Positionsmessverfahren und -apparat.
DE69033872D1 (de)	2002-01-17	Messgerät und Verfahren
KR880701865A (ko)	1988-11-05	거리 결정방법 및 장치
DE3683584D1 (de)	1992-03-05	Entwicklungsverfahren und -vorrichtung.
KR880701143A (ko)	1988-07-25	차체수리방법과 차체수리장치
KR880701589A (ko)	1988-11-03	유체분배 장치 및 방법
DE69029534D1 (de)	1997-02-13	Aufzeichnungseinrichtung und Aufzeichnungsmethode
KR900008244A (ko)	1990-06-02	곡률반경 측정장치 및 방법
KR890017521A (ko)	1989-12-16	3차원 곡면형상의 측정방법 및 장치
FI893050L (fi)	1989-12-24	Testauslaite
KR890700816A (ko)	1989-04-27	설정압력 확인장치 및 방법
DE3855494D1 (de)	1996-10-02	Abfragevorrichtung und -methode
KR890701281A (ko)	1989-12-19	위치결정장치 및 그 용도
DE69006648D1 (de)	1994-03-24	Messvorrichtung und -verfahren.

Legal Events

Date	Code	Title	Description
1989-11-09	A201	Request for examination
1989-11-09	PA0109	Patent application	St.27 status event code: A-0-1-A10-A12-nap-PA0109
1989-11-09	PA0201	Request for examination	St.27 status event code: A-1-2-D10-D11-exm-PA0201
1989-11-09	R17-X000	Change to representative recorded	St.27 status event code: A-3-3-R10-R17-oth-X000
1990-06-02	PG1501	Laying open of application	St.27 status event code: A-1-1-Q10-Q12-nap-PG1501
1992-09-30	G160	Decision to publish patent application
1992-10-22	PG1605	Publication of application before grant of patent	St.27 status event code: A-2-2-Q10-Q13-nap-PG1605
1993-01-04	E701	Decision to grant or registration of patent right
1993-01-04	PE0701	Decision of registration	St.27 status event code: A-1-2-D10-D22-exm-PE0701
1993-03-17	GRNT	Written decision to grant
1993-03-17	PR0701	Registration of establishment	St.27 status event code: A-2-4-F10-F11-exm-PR0701
1993-03-17	PR1002	Payment of registration fee	St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1
1995-10-21	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4
1996-10-14	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5
1997-08-30	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6
1998-10-09	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7
1999-10-08	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8
2000-10-11	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9
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2002-10-08	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11
2003-10-13	FPAY	Annual fee payment	Payment date: 20031013 Year of fee payment: 12
2003-10-13	PR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 12
2004-01-07	PN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301
2004-01-16	PN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301
2004-10-15	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2004-10-23	LAPS	Lapse due to unpaid annual fee
2004-10-23	PC1903	Unpaid annual fee	St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20041023 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE
2005-07-09	PC1903	Unpaid annual fee	St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20041023
2016-05-19	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000