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KR830010370A - 형상 검출장치(形狀檢出裕置) - Google Patents

형상 검출장치(形狀檢出裕置) Download PDF

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Publication number
KR830010370A
KR830010370A KR1019820001891A KR820001891A KR830010370A KR 830010370 A KR830010370 A KR 830010370A KR 1019820001891 A KR1019820001891 A KR 1019820001891A KR 820001891 A KR820001891 A KR 820001891A KR 830010370 A KR830010370 A KR 830010370A
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KR
South Korea
Prior art keywords
signal
width
steel sheet
binarizing
peak
Prior art date
Application number
KR1019820001891A
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English (en)
Other versions
KR870000456B1 (ko
Inventor
도요가즈 사이또오
세이 에쓰 산미야
아끼오 호소오까
가지오 다까시마
Original Assignee
가다야마 히도하지로
미쓰비시전기 주식회사
다께다 유다까
신니혼 제철주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6603881A external-priority patent/JPS57179611A/ja
Priority claimed from JP6603781A external-priority patent/JPS57179610A/ja
Application filed by 가다야마 히도하지로, 미쓰비시전기 주식회사, 다께다 유다까, 신니혼 제철주식회사 filed Critical 가다야마 히도하지로
Publication of KR830010370A publication Critical patent/KR830010370A/ko
Application granted granted Critical
Publication of KR870000456B1 publication Critical patent/KR870000456B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

내용 없음

Description

형상 검출장치(形狀 檢出裕置)
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 동작을 설명하기 위한 강판의 선단형상도.
제3도는 본발명의 일실시예의 구성도.
제4도는 각부의 신호파형도.

Claims (4)

  1. 복수개의 광전소자군상에 강판영상을 결상하고, 상기강판의 온도에 대응하는 주사전기신호를 발생하는 검출수단과, 상기검출수단의 주사간격을 상기강판의 진행거리에 따라제어하는 주사수단과, 상기검출수단으로 얻어진 검출신호를 다치화하는 양자화수단과, 상기 양자화수단으로 얻어진 다치화신호를 기억하는 기억 수단과, 상기 기억수단에 기억된 양자화신호를 2차원적으로 미분하는 미분수단과, 상기미분신호를 2치화하는 2치화수단과, 상기 2치화신호를 피크홀더하는 피크홀더수단과, 상기피크홀더신호에서 상기강판의 각주사부의 판폭을 구하는 폭측정수단과, 상기폭신호와 사전에 설정되는 규정폭치를 비교하고, 이결과를 출력하는 비교수단을 구비함을 특징으로 하는 형상검출장치.
  2. 제1항에 있어서, 상기미분신호를 피크홀더하는 피크홀더수단과, 상기피크홀더신호의 농도 히스토그람 규정치레벨을 결정하고 상기 피크홀더신호를 2치화하는 2치화수단과, 상기 2치화신호에서 상기강판의 각주사부의 판폭을 구하는 폭측정수단과, 상기폭신호와 사전에 설정되는 규정폭치를 비교하고, 이결과를 출력하는 비교수단을 구비하여서된 형상검출장치.
  3. 제1항에 있어서 기억수단에 기억된 양자화신호를 상기강판의 온도분포에 대응한 복수의 영역으로 분할하고, 각기의 영역마다 규정치레벨을 정하여 상기분할된 양자화신호를 각각 2치화하는 수단과, 이 2치화신호에서 상기강판의 각주사부의 판폭을 구하는 폭측정수단과, 이폭신호와 사전에 설정되는 규정폭치를 비교하고, 이결과를 출력하는 비교수단을 구비한 형상검출장치.
  4. 제3항에 있어서, 양자화신호를 강판중앙부의 온도가 높은 부분을 폭방향으로 구획한 영역 g와, 폭방향으로 소정비율로 3분한 중앙부영역 l와, 상기 3분한 양측중 강판의 선단소정부를 함유하는 영역 q와, 그나머2개의 영역 r와 s로 분할하도록 하였음을 특징으로 한 형상검출장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR8201891A 1981-04-29 1982-04-29 형상 검출장치 KR870000456B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP6603881A JPS57179611A (en) 1981-04-29 1981-04-29 Configuration detecting device
JP56-66037 1981-04-29
JP6603781A JPS57179610A (en) 1981-04-29 1981-04-29 Configuration detecting device
JP56-66038 1981-04-29
JP66037 1985-03-29

Publications (2)

Publication Number Publication Date
KR830010370A true KR830010370A (ko) 1983-12-30
KR870000456B1 KR870000456B1 (ko) 1987-03-11

Family

ID=26407213

Family Applications (1)

Application Number Title Priority Date Filing Date
KR8201891A KR870000456B1 (ko) 1981-04-29 1982-04-29 형상 검출장치

Country Status (4)

Country Link
US (1) US4481534A (ko)
KR (1) KR870000456B1 (ko)
DE (1) DE3215673C2 (ko)
GB (1) GB2102119B (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3337468A1 (de) * 1983-10-14 1985-04-25 Optische Werke G. Rodenstock, 8000 München Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen
DE3834110A1 (de) * 1988-10-07 1990-04-12 Truetzschler & Co Verfahren und vorrichtung zur bewegungserfassung von textilfaserbaendern, z. b. kardenbaendern
WO1991006827A1 (en) * 1989-10-24 1991-05-16 Australian Wool Testing Authority Ltd. Image analysis
GB2262339B (en) * 1991-12-13 1995-09-06 Honda Motor Co Ltd Method of inspecting the surface of a workpiece
US5566244A (en) * 1993-11-22 1996-10-15 Honda Giken Kogyo Kabushiki Kaisha Method of inspecting a workpiece surface including a picturing system with a shortened focal plane
CN103267764B (zh) * 2013-05-30 2015-06-17 东北大学 基于邻域信息评估的热轧钢板表面缺陷图像识别方法
CN104511650B (zh) * 2013-09-30 2017-02-22 宝山钢铁股份有限公司 钢板头部剪切最佳化的方法
CN105447817B (zh) * 2015-11-09 2018-11-09 北京科技大学 一种基于边缘轮廓的热轧中间坯平面图像拼接方法
FI127730B (en) 2017-10-06 2019-01-15 Oy Mapvision Ltd Measurement system with heat measurement

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2040084C3 (de) * 1970-08-12 1981-10-22 Mitsubishi Denki K.K., Tokyo Photoelektrische Meß- und Steuereinrichtung zur Betätigung einer Schneidvorrichtung zum Abschneiden eines durch eine Walzstraße geführten flächigen Walzgutes
DE2200324A1 (de) * 1971-01-08 1972-07-27 Valio Meijerien Eine Vorrichtung zum Feststellen der Breite einer bewegten Materialbahn od.dgl.
DE2113522C3 (de) * 1971-03-19 1974-05-09 Siemens Ag Verfahren zuna berühningsfreien Messen eines Oberflächenprofils
GB1398720A (en) * 1971-11-16 1975-06-25 Lucas Electrical Co Ltd Shape recognition systems
US3746451A (en) * 1971-11-26 1973-07-17 Ibm Highly reliable strip width gauge
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
NL7409850A (nl) * 1974-07-22 1976-01-26 Philips Nv Werkwijze en inrichting voor het testen van een tweedimensionaal patroon.
US3968368A (en) * 1975-03-10 1976-07-06 Owens-Illinois, Inc. Inspection apparatus and method for hot glass containers
US4072818A (en) * 1975-06-10 1978-02-07 Westinghouse Electric Corp. System for converting tonal images to line drawings
DE2855877C2 (de) * 1978-12-22 1985-01-10 Franz Plasser Bahnbaumaschinen-Industriegesellschaft Mbh, Wien Einrichtung zur kontinuierlichen berührungslosen Vermessung der Schienenkopfoberflächen eines verlegten Gleises
US4319270A (en) * 1979-01-12 1982-03-09 Kobe Steel, Ltd. Surface inspection system for hot radiant material
DE3134210A1 (de) * 1980-09-03 1982-04-22 Baker Perkins Holdings Ltd., Peterborough, Cambridgeshire Dimensionsueberwachungsvorrichtung

Also Published As

Publication number Publication date
GB2102119B (en) 1985-02-06
KR870000456B1 (ko) 1987-03-11
DE3215673C2 (de) 1987-04-23
DE3215673A1 (de) 1982-11-25
GB2102119A (en) 1983-01-26
US4481534A (en) 1984-11-06

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