KR20220026483A - 피가공물의 세정 방법 - Google Patents
피가공물의 세정 방법 Download PDFInfo
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- KR20220026483A KR20220026483A KR1020210094556A KR20210094556A KR20220026483A KR 20220026483 A KR20220026483 A KR 20220026483A KR 1020210094556 A KR1020210094556 A KR 1020210094556A KR 20210094556 A KR20210094556 A KR 20210094556A KR 20220026483 A KR20220026483 A KR 20220026483A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
- B23K26/702—Auxiliary equipment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0023—Other grinding machines or devices grinding machines with a plurality of working posts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
- B24B37/345—Feeding, loading or unloading work specially adapted to lapping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02096—Cleaning only mechanical cleaning
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- Condensed Matter Physics & Semiconductors (AREA)
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Abstract
(해결 수단) 가공 장치 내에서 피가공물을 세정하는 피가공물의 세정 방법으로서, 가공 장치는, 피가공물의 상면 측을 흡인 유지하는 흡인면을 가지는 흡인 패드를 포함한 반송 기구와, 흡인 패드의 이동 경로와 겹치는 위치에 설치되고, 피가공물의 하면 측을 세정하는 세정 부재와, 세정액을 분사하는 분사 노즐을 포함한 세정 기구를 구비하고, 분사 노즐로부터 피가공물의 하면 측에 세정액을 분사하면서, 세정 부재를 피가공물의 하면 측에 접촉시키면서 이동시키는 것에 의해, 피가공물의 하면 측을 세정하는 세정 단계와, 분사 노즐로부터의 세정액의 분사를 정지한 상태로, 세정 부재를 피가공물의 하면 측에 접촉시키면서 이동시키는 것에 의해, 피가공물의 하면 측에 부착된 세정액을 제거하는 제거 단계를 구비한다.
Description
도 2는 피가공물을 나타내는 사시도이다.
도 3은 반송 기구를 나타내는 일부 단면 측면도이다.
도 4는 세정 기구를 나타내는 사시도이다.
도 5는 피가공물의 하면 측을 세정하는 세정 기구를 나타내는 일부 단면 정면도이다.
11a 표면(제1 면)
11b 이면(제2 면)
13 분할 예정 라인(스트리트)
15 디바이스
17 보호 부재
2 가공 장치(연삭 장치)
4 베이스
4a, 4b 개구
6 반송 기구(반송 유닛)
8a, 8b 카세트 배치 영역
10a, 10b 카세트
12 위치 맞춤 기구(얼라인먼트 기구)
14 반송 기구(반송 유닛 반송, 로딩 아암)
16 턴 테이블
18 척 테이블(유지 테이블)
18a 유지면
20 지지 구조
22a, 22b 이동 기구(이동 유닛)
24 가이드 레일
26 이동 플레이트
28 볼 나사
30 펄스 모터
32 지지구
34a, 34b 가공 유닛(연삭 유닛)
36 하우징
38 스핀들
40 마운트
42a, 42b 연삭 휠
44 반송 기구(반송 유닛, 언로딩 아암)
46 세정 기구(세정 유닛)
48 세정 기구(세정 유닛)
50 건조 노즐
50a 분사구
52 입력 유닛(입력부)
54 제어 유닛(제어부)
60 아암
62 기초부
64 지지부
64a 개구부
64b 관통 구멍
64c 홈
66 승강 기구
68 회전 구동원
70 흡인 패드
72 베이스
72a 유로
74 본체부(프레임)
74a 오목부
76 지지부(지지축)
76a 돌기부
78 흡인 부재
78a 흡인면
80 배관
82 압박 부재
100 하우징
100a 세정액 공급로
102 샤프트
104 회전 구동원
106 종동 풀리
108 구동 풀리
110 벨트
112 세정 유닛
114 지지 로드
116 유지 부재
118 세정 부재
120 승강 기구
122 승강부
124 분사 노즐
124a 분사구
Claims (3)
- 가공 장치 내에서 피가공물을 세정하는 피가공물의 세정 방법으로서,
상기 가공 장치는,
상기 피가공물의 하면 측을 유지하는 척 테이블과,
상기 척 테이블에 의해서 유지된 상기 피가공물의 상면 측을 가공하는 가공 유닛과,
상기 척 테이블에 의해서 유지되어 상기 가공 유닛에 의해서 가공된 상기 피가공물의 상면 측을 흡인 유지하는 흡인면을 가지는 흡인 패드를 포함한 반송 기구와,
상기 흡인 패드의 이동 경로와 겹치는 위치에 설치되고, 상기 피가공물의 하면 측을 세정하는 세정 부재와, 세정액을 분사하는 분사 노즐을 포함한 세정 기구
를 구비하고,
상기 분사 노즐로부터 상기 피가공물의 하면 측에 상기 세정액을 분사하면서, 상기 세정 부재를 상기 피가공물의 하면 측에 접촉시키면서 이동시키는 것에 의해, 상기 피가공물의 하면 측을 세정하는 세정 단계와,
상기 분사 노즐로부터의 상기 세정액의 분사를 정지한 상태로, 상기 세정 부재를 상기 피가공물의 하면 측에 접촉시키면서 이동시키는 것에 의해, 상기 피가공물의 하면 측에 부착된 상기 세정액을 제거하는 제거 단계
를 구비하는 것을 특징으로 하는 피가공물의 세정 방법. - 제1항에 있어서,
상기 피가공물의 하면 측에는, 상기 피가공물을 보호하는 보호 부재가 고정되어 있고,
상기 세정 단계에서는, 상기 보호 부재를 세정하고,
상기 제거 단계에서는, 상기 보호 부재에 부착된 상기 세정액을 제거하는 것을 특징으로 하는 피가공물의 세정 방법. - 제1항 또는 제2항에 있어서,
상기 제거 단계의 실시 후에, 상기 피가공물의 하면 측에 기체를 분사하여서 상기 피가공물을 건조시키는 건조 단계를 더 구비하는 것을 특징으로 하는 피가공물의 세정 방법.
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JPJP-P-2020-141489 | 2020-08-25 | ||
JP2020141489A JP7536400B2 (ja) | 2020-08-25 | 2020-08-25 | 被加工物の洗浄方法 |
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KR (1) | KR20220026483A (ko) |
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CN115302246B (zh) * | 2022-09-06 | 2024-08-13 | 无锡市锡山区半导体先进制造创新中心 | 一种复合加工机床 |
CN118486618B (zh) * | 2024-07-12 | 2024-09-24 | 合肥聚跃检测技术有限公司 | 一种芯片加工用蚀刻清洗装置 |
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JP2010094785A (ja) | 2008-10-17 | 2010-04-30 | Disco Abrasive Syst Ltd | 研削装置 |
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JP2022037381A (ja) | 2022-03-09 |
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