KR20170038113A - 캐리어 헤드 멤브레인 - Google Patents
캐리어 헤드 멤브레인 Download PDFInfo
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- KR20170038113A KR20170038113A KR1020177008442A KR20177008442A KR20170038113A KR 20170038113 A KR20170038113 A KR 20170038113A KR 1020177008442 A KR1020177008442 A KR 1020177008442A KR 20177008442 A KR20177008442 A KR 20177008442A KR 20170038113 A KR20170038113 A KR 20170038113A
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- membrane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24355—Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24479—Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness
- Y10T428/24612—Composite web or sheet
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
- Laminated Bodies (AREA)
- Electroluminescent Light Sources (AREA)
- Gasket Seals (AREA)
- Casings For Electric Apparatus (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
도 1은 예시적인 종래 기술에 따른 캐리어 헤드 장치의 개략적인 단면도이다.
도 1a는 도 1의 장치의 상세도이다.
도 2는 일 실시예에 따른 예시적인 캐리어 헤드 장치의 개략적인 단면도이다.
도 2a 및 2b는 도 2의 장치의 상세도이다.
도 3a 및 3b는 실시예들에 따른 두 개의 캐리어 헤드 멤브레인의 개략적인 단면도이다.
도 4a는 일 실시예에 따른 장치의 사시도이다.
도 4b는 일 실시예에 따른 마스크 장치의 측면도이다.
도 5는 일 실시예에 따른 캐리어 헤드 장치의 개략적인 단면도이다.
이해를 촉진시키기 위해 가능한한 동일한 참조 번호가 도면에서 공통적인 동일한 요소를 가리키도록 이용되었다. 일 실시예에서 개시된 요소는 구체적인 인용이 없어도 다른 실시예들에 유리하게 이용될 수 있음이 고려된다.
Claims (23)
- 기판 캐리어 헤드를 위한 멤브레인으로서,
기판을 체결하는(engage) 표면; 및
캐리어 헤드에서 수용 구조물을 체결하기 위한 표면의 엣지에 있는 비드(bead)를 포함하고,
상기 표면은 약 10 마이크로 인치 이상의 Ra 거칠기를 갖는,
기판 캐리어 헤드를 위한 멤브레인.
- 제 1 항에 있어서,
상기 표면은 약 15 마이크로 인치 이상의 Ra 거칠기를 갖는,
기판 캐리어 헤드를 위한 멤브레인.
- 제 1 항에 있어서,
상기 표면이 약 0.02 lbs 미만의 교착력으로 상기 기판에 부착되는,
기판 캐리어 헤드를 위한 멤브레인.
- 제 1 항에 있어서,
상기 표면이 약 0.01 lbs 미만의 교착력으로 상기 기판에 부착되는,
기판 캐리어 헤드를 위한 멤브레인.
- 기판 캐리어 헤드를 위한 멤브레인으로서,
기판을 체결하는 장착면;
상기 장착면으로부터 연장하는 둘레부;
상기 둘레부로부터 연장하는 비드; 및
코팅부 및 비코팅부를 형성하도록 상기 멤브레인의 일부를 커버하는 비교착 코팅을 포함하고,
상기 비코팅부는 상기 비드를 포함하는,
기판 캐리어 헤드를 위한 멤브레인.
- 제 5 항에 있어서,
상기 비코팅부는 상기 둘레부를 포함하는,
기판 캐리어 헤드를 위한 멤브레인.
- 제 5 항에 있어서,
상기 멤브레인의 누출 속도는 약 0.2 psi/min 미만인,
기판 캐리어 헤드를 위한 멤브레인.
- 제 5 항에 있어서,
상기 비드의 표면이 6.0 Pa 이상의 교착 응력(sticking tension)으로 금속에 부착되는,
기판 캐리어 헤드를 위한 멤브레인.
- 평탄화 장치를 위한 멤브레인을 형성하는 방법으로서,
평평한 중앙부, 윤곽을 가진 둘레부, 및 엣지 주위의 비드를 구비한 가요성 물품을 형성하는 단계;
상기 가요성 물품의 일부에 마스크를 적용하는 단계;
상기 가요성 물품을 비교착 코팅으로 코팅하는 단계; 및
상기 마스크를 제거하는 단계를 포함하는,
평탄화 장치를 위한 멤브레인을 형성하는 방법.
- 제 9 항에 있어서,
상기 가요성 물품은 실리콘 고무, 부틸 고무, 천연 고무, EPDM 고무, 폴리이미드 및 열가소성 탄성체를 포함한 그룹으로부터 선택된 물질로 형성되는,
평탄화 장치를 위한 멤브레인을 형성하는 방법.
- 제 9 항에 있어서,
상기 가요성 물품의 일부에 마스크를 적용하는 단계는 상기 가요성 물품의 일부 위에 가요성 커버링(covering)을 장착시키는 단계를 포함하는,
평탄화 장치를 위한 멤브레인을 형성하는 방법.
- 제 9 항에 있어서,
상기 가요성 물품의 일부는 상기 비드를 포함하는,
평탄화 장치를 위한 멤브레인을 형성하는 방법.
- 기판 캐리어 헤드를 위한 멤브레인으로서,
기판을 체결하는 표면; 및
캐리어 헤드 상에서 수용 구조물을 체결하기 위한 표면의 엣지에 있는 비드를 포함하고,
상기 비드의 폭은 상기 수용 구조물의 폭보다 큰,
기판 캐리어 헤드를 위한 멤브레인.
- 제 13 항에 있어서,
상기 비드는 원형 단면 형상을 갖는,
기판 캐리어 헤드를 위한 멤브레인.
- 화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드로서,
하우징;
상기 하우징에 커플링된 베이스; 및
상기 베이스에 커플링된 커버를 포함하고,
상기 커버는 상기 베이스 상에서 수용 구조물과 체결하는 비드를 포함하며, 상기 비드의 두께는 상기 수용 구조물의 폭보다 큰,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 제 15 항에 있어서,
상기 수용 구조물이 그루브인,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 제 15 항에 있어서,
상기 비드는 상기 수용면과 체결될 때 약 10% 이상의 압축률을 겪는,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 제 17 항에 있어서,
상기 비드는 상기 수용 구조물과 체결될 때 약 12% 내지 약 20%의 압축률을 겪는,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 제 15 항에 있어서,
상기 커버는 약 0.2 psi/min 미만의 누출 속도를 갖는,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 제 15 항에 있어서,
상기 비드의 표면은 밀봉을 형성하도록 상기 그루브의 표면과 동일 형상을 이루는,
화학 기계적 폴리싱 장치에서 기판을 조작하기 위한 캐리어 헤드.
- 기판 캐리어 헤드 및 멤브레인 사이에서 밀봉을 형성하는 방법으로서,
기판 캐리어 헤드의 일부에 그루브를 제공하는 단계;
상기 그루브의 폭보다 큰 두께를 갖는 멤브레인의 엣지 주위에 비드를 형성하는 단계;
상기 그루브 안으로 상기 비드를 삽입하는 단계; 및
상기 그루브 내부로 상기 비드를 압축하여 상기 비드의 표면이 상기 그루브의 표면과 동일 형상을 이루어 밀봉을 형성하는,
기판 캐리어 헤드 및 멤브레인 사이에서 밀봉을 형성하는 방법.
- 제 21 항에 있어서,
상기 비드의 두께는 상기 그루브의 폭보다 약 10% 이상 큰,
기판 캐리어 헤드 및 멤브레인 사이에서 밀봉을 형성하는 방법.
- 제 21 항에 있어서,
상기 그루브 내부로 상기 비드를 압축하는 단계는 약 12% 내지 20%의 압축률로 상기 비드를 변형시키는 단계를 포함하는,
기판 캐리어 헤드 및 멤브레인 사이에서 밀봉을 형성하는 방법.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US3924608P | 2008-03-25 | 2008-03-25 | |
US3924908P | 2008-03-25 | 2008-03-25 | |
US61/039,246 | 2008-03-25 | ||
US61/039,249 | 2008-03-25 | ||
PCT/US2009/037992 WO2009120641A2 (en) | 2008-03-25 | 2009-03-23 | Improved carrier head membrane |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020167011653A Division KR101722540B1 (ko) | 2008-03-25 | 2009-03-23 | 캐리어 헤드 멤브레인 |
Publications (1)
Publication Number | Publication Date |
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KR20170038113A true KR20170038113A (ko) | 2017-04-05 |
Family
ID=41114621
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020157023720A Active KR101619416B1 (ko) | 2008-03-25 | 2009-03-23 | 개량된 캐리어 헤드 멤브레인 |
KR1020167011653A Active KR101722540B1 (ko) | 2008-03-25 | 2009-03-23 | 캐리어 헤드 멤브레인 |
KR1020107023707A Active KR101617716B1 (ko) | 2008-03-25 | 2009-03-23 | 개량된 캐리어 헤드 멤브레인 |
KR1020177008442A Ceased KR20170038113A (ko) | 2008-03-25 | 2009-03-23 | 캐리어 헤드 멤브레인 |
Family Applications Before (3)
Application Number | Title | Priority Date | Filing Date |
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KR1020157023720A Active KR101619416B1 (ko) | 2008-03-25 | 2009-03-23 | 개량된 캐리어 헤드 멤브레인 |
KR1020167011653A Active KR101722540B1 (ko) | 2008-03-25 | 2009-03-23 | 캐리어 헤드 멤브레인 |
KR1020107023707A Active KR101617716B1 (ko) | 2008-03-25 | 2009-03-23 | 개량된 캐리어 헤드 멤브레인 |
Country Status (5)
Country | Link |
---|---|
US (3) | US20090242125A1 (ko) |
KR (4) | KR101619416B1 (ko) |
CN (2) | CN101981666A (ko) |
TW (2) | TWI540669B (ko) |
WO (1) | WO2009120641A2 (ko) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090242125A1 (en) * | 2008-03-25 | 2009-10-01 | Applied Materials, Inc. | Carrier Head Membrane |
US10160093B2 (en) | 2008-12-12 | 2018-12-25 | Applied Materials, Inc. | Carrier head membrane roughness to control polishing rate |
US8475231B2 (en) | 2008-12-12 | 2013-07-02 | Applied Materials, Inc. | Carrier head membrane |
US8591286B2 (en) | 2010-08-11 | 2013-11-26 | Applied Materials, Inc. | Apparatus and method for temperature control during polishing |
JP5592842B2 (ja) * | 2011-06-24 | 2014-09-17 | Kisco株式会社 | 細胞培養用基膜、細胞培養用基材、及び細胞培養用基材の製造方法 |
US10532441B2 (en) | 2012-11-30 | 2020-01-14 | Applied Materials, Inc. | Three-zone carrier head and flexible membrane |
JP5927129B2 (ja) * | 2013-01-31 | 2016-05-25 | 株式会社荏原製作所 | 研磨装置 |
WO2014163735A1 (en) * | 2013-03-13 | 2014-10-09 | Applied Materials, Inc. | Reinforcement ring for carrier head |
TWI643967B (zh) * | 2013-10-04 | 2018-12-11 | 美商應用材料股份有限公司 | 經塗佈的固定環 |
US10029346B2 (en) * | 2015-10-16 | 2018-07-24 | Applied Materials, Inc. | External clamp ring for a chemical mechanical polishing carrier head |
KR101690053B1 (ko) * | 2015-10-29 | 2016-12-27 | 주식회사 엠오에스 | 다중 경도를 가지는 반도체 웨이퍼 연마용 박막 및 이를 이용한 반도체 웨이퍼 연마장치 |
JP6360586B1 (ja) * | 2017-04-13 | 2018-07-18 | 三菱電線工業株式会社 | Cmp装置のウエハ保持用の弾性膜 |
TWI641448B (zh) * | 2017-06-09 | 2018-11-21 | 林志菁 | Elastic film for grinding head |
TWI676525B (zh) * | 2017-06-09 | 2019-11-11 | 林志菁 | 用於研磨頭的彈性膜 |
WO2019089467A1 (en) * | 2017-11-06 | 2019-05-09 | Axus Technology, Llc | Planarized membrane and methods for substrate processing systems |
CN108857909A (zh) * | 2018-07-20 | 2018-11-23 | 宁波江丰电子材料股份有限公司 | 一种用于cmp保持环粘接面的加工方法以及cmp保持环的制备方法 |
CN114269516A (zh) * | 2019-07-01 | 2022-04-01 | 崇硕科技公司 | 温度控制基板载具和抛光部件 |
SG10202008012WA (en) * | 2019-08-29 | 2021-03-30 | Ebara Corp | Elastic membrane and substrate holding apparatus |
CN113118965B (zh) * | 2019-12-31 | 2022-09-30 | 清华大学 | 一种基板装卸控制方法 |
JP7623990B2 (ja) | 2022-11-07 | 2025-01-29 | 三菱電線工業株式会社 | 弾性膜及びその取付構造 |
CN119610703A (zh) * | 2024-12-12 | 2025-03-14 | 宁波优璞半导体科技有限公司 | 一种压力膜和压力膜内钢圈保持同心度的方法 |
Family Cites Families (70)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3654047A (en) * | 1970-01-12 | 1972-04-04 | Howard Berkowitz | Surgical instrument holder |
US4132037A (en) * | 1977-02-28 | 1979-01-02 | Siltec Corporation | Apparatus for polishing semiconductor wafers |
US4319432A (en) * | 1980-05-13 | 1982-03-16 | Spitfire Tool And Machine Co. | Polishing fixture |
US4512113A (en) * | 1982-09-23 | 1985-04-23 | Budinger William D | Workpiece holder for polishing operation |
US4918869A (en) * | 1987-10-28 | 1990-04-24 | Fujikoshi Machinery Corporation | Method for lapping a wafer material and an apparatus therefor |
US4834382A (en) * | 1988-06-13 | 1989-05-30 | Donald Spector | Inflatable play ball |
US5193316A (en) * | 1991-10-29 | 1993-03-16 | Texas Instruments Incorporated | Semiconductor wafer polishing using a hydrostatic medium |
US5205082A (en) * | 1991-12-20 | 1993-04-27 | Cybeq Systems, Inc. | Wafer polisher head having floating retainer ring |
US5486129A (en) * | 1993-08-25 | 1996-01-23 | Micron Technology, Inc. | System and method for real-time control of semiconductor a wafer polishing, and a polishing head |
US5624299A (en) * | 1993-12-27 | 1997-04-29 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with improved carrier and method of use |
US5643053A (en) * | 1993-12-27 | 1997-07-01 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with improved polishing control |
US5449316A (en) * | 1994-01-05 | 1995-09-12 | Strasbaugh; Alan | Wafer carrier for film planarization |
US5423716A (en) * | 1994-01-05 | 1995-06-13 | Strasbaugh; Alan | Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied |
JP3158934B2 (ja) * | 1995-02-28 | 2001-04-23 | 三菱マテリアル株式会社 | ウェーハ研磨装置 |
US5908530A (en) * | 1995-05-18 | 1999-06-01 | Obsidian, Inc. | Apparatus for chemical mechanical polishing |
US6024630A (en) * | 1995-06-09 | 2000-02-15 | Applied Materials, Inc. | Fluid-pressure regulated wafer polishing head |
US5643061A (en) * | 1995-07-20 | 1997-07-01 | Integrated Process Equipment Corporation | Pneumatic polishing head for CMP apparatus |
US5738574A (en) * | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
DE69717510T2 (de) * | 1996-01-24 | 2003-10-02 | Lam Research Corp., Fremont | Halbleiterscheiben-Polierkopf |
JP3663767B2 (ja) * | 1996-09-04 | 2005-06-22 | 信越半導体株式会社 | 薄板の鏡面研磨装置 |
US5830806A (en) * | 1996-10-18 | 1998-11-03 | Micron Technology, Inc. | Wafer backing member for mechanical and chemical-mechanical planarization of substrates |
US6146259A (en) * | 1996-11-08 | 2000-11-14 | Applied Materials, Inc. | Carrier head with local pressure control for a chemical mechanical polishing apparatus |
US6183354B1 (en) * | 1996-11-08 | 2001-02-06 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
US5851140A (en) * | 1997-02-13 | 1998-12-22 | Integrated Process Equipment Corp. | Semiconductor wafer polishing apparatus with a flexible carrier plate |
US6056632A (en) * | 1997-02-13 | 2000-05-02 | Speedfam-Ipec Corp. | Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head |
US5957751A (en) * | 1997-05-23 | 1999-09-28 | Applied Materials, Inc. | Carrier head with a substrate detection mechanism for a chemical mechanical polishing system |
US5964653A (en) * | 1997-07-11 | 1999-10-12 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
US6080050A (en) * | 1997-12-31 | 2000-06-27 | Applied Materials, Inc. | Carrier head including a flexible membrane and a compliant backing member for a chemical mechanical polishing apparatus |
US6159079A (en) * | 1998-09-08 | 2000-12-12 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing a substrate |
US6210255B1 (en) * | 1998-09-08 | 2001-04-03 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing a substrate |
US6277014B1 (en) * | 1998-10-09 | 2001-08-21 | Applied Materials, Inc. | Carrier head with a flexible membrane for chemical mechanical polishing |
US6132298A (en) * | 1998-11-25 | 2000-10-17 | Applied Materials, Inc. | Carrier head with edge control for chemical mechanical polishing |
US6165058A (en) * | 1998-12-09 | 2000-12-26 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
US6422927B1 (en) * | 1998-12-30 | 2002-07-23 | Applied Materials, Inc. | Carrier head with controllable pressure and loading area for chemical mechanical polishing |
US6733965B2 (en) * | 1999-01-15 | 2004-05-11 | International Paper Company | Microsatellite DNA markers and uses thereof |
US6162116A (en) * | 1999-01-23 | 2000-12-19 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
US6227955B1 (en) * | 1999-04-20 | 2001-05-08 | Micron Technology, Inc. | Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies |
US6068549A (en) * | 1999-06-28 | 2000-05-30 | Mitsubishi Materials Corporation | Structure and method for three chamber CMP polishing head |
US6855043B1 (en) * | 1999-07-09 | 2005-02-15 | Applied Materials, Inc. | Carrier head with a modified flexible membrane |
US6494774B1 (en) * | 1999-07-09 | 2002-12-17 | Applied Materials, Inc. | Carrier head with pressure transfer mechanism |
US6290584B1 (en) * | 1999-08-13 | 2001-09-18 | Speedfam-Ipec Corporation | Workpiece carrier with segmented and floating retaining elements |
US6450868B1 (en) * | 2000-03-27 | 2002-09-17 | Applied Materials, Inc. | Carrier head with multi-part flexible membrane |
JP2003533359A (ja) | 2000-05-12 | 2003-11-11 | マルチプレーナーテクノロジーズ インコーポレーテッド | 独立のリテーナリングと多領域圧力制御とを備えた空気圧ダイアフラムヘッドおよび該空気圧ダイアフラムヘッドを用いた方法 |
US6558232B1 (en) * | 2000-05-12 | 2003-05-06 | Multi-Planar Technologies, Inc. | System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control |
JP2001345297A (ja) * | 2000-05-30 | 2001-12-14 | Hitachi Ltd | 半導体集積回路装置の製造方法及び研磨装置 |
US6722965B2 (en) * | 2000-07-11 | 2004-04-20 | Applied Materials Inc. | Carrier head with flexible membranes to provide controllable pressure and loading area |
US6857945B1 (en) * | 2000-07-25 | 2005-02-22 | Applied Materials, Inc. | Multi-chamber carrier head with a flexible membrane |
US7198561B2 (en) * | 2000-07-25 | 2007-04-03 | Applied Materials, Inc. | Flexible membrane for multi-chamber carrier head |
US6769973B2 (en) * | 2001-05-31 | 2004-08-03 | Samsung Electronics Co., Ltd. | Polishing head of chemical mechanical polishing apparatus and polishing method using the same |
US6758939B2 (en) * | 2001-08-31 | 2004-07-06 | Speedfam-Ipec Corporation | Laminated wear ring |
US6712673B2 (en) * | 2001-10-04 | 2004-03-30 | Memc Electronic Materials, Inc. | Polishing apparatus, polishing head and method |
US20030124963A1 (en) * | 2001-12-27 | 2003-07-03 | Applied Materials, Inc. | Carrier head with a non-stick membrane |
US6764387B1 (en) * | 2003-03-07 | 2004-07-20 | Applied Materials Inc. | Control of a multi-chamber carrier head |
US7001245B2 (en) * | 2003-03-07 | 2006-02-21 | Applied Materials Inc. | Substrate carrier with a textured membrane |
JP4086722B2 (ja) * | 2003-06-24 | 2008-05-14 | 株式会社荏原製作所 | 基板保持装置及び研磨装置 |
KR100586018B1 (ko) * | 2004-02-09 | 2006-06-01 | 삼성전자주식회사 | 연마 헤드용 플렉서블 멤브레인 및 이를 포함하는 연마 장치 |
US7033252B2 (en) * | 2004-03-05 | 2006-04-25 | Strasbaugh | Wafer carrier with pressurized membrane and retaining ring actuator |
DE112005001447B4 (de) * | 2004-06-23 | 2019-12-05 | Komatsu Denshi Kinzoku K.K. | Doppelseitenpolierträger und Herstellungsverfahren desselben |
CN200951520Y (zh) * | 2004-11-04 | 2007-09-26 | 应用材料公司 | 用于载具头的装置 |
US7207871B1 (en) * | 2005-10-06 | 2007-04-24 | Applied Materials, Inc. | Carrier head with multiple chambers |
US8454413B2 (en) * | 2005-12-29 | 2013-06-04 | Applied Materials, Inc. | Multi-chamber carrier head with a textured membrane |
US7364496B2 (en) * | 2006-03-03 | 2008-04-29 | Inopla Inc. | Polishing head for polishing semiconductor wafers |
US20080014842A1 (en) * | 2006-03-03 | 2008-01-17 | Berkstresser David E | Polishing head for polishing semiconductor wafers |
CN101484277A (zh) * | 2006-05-02 | 2009-07-15 | Nxp股份有限公司 | 晶片去夹具 |
TWI288049B (en) * | 2006-06-28 | 2007-10-11 | Wei-Yue Wu | Flexible membrane for chemical mechanical polisher |
US7699688B2 (en) * | 2006-11-22 | 2010-04-20 | Applied Materials, Inc. | Carrier ring for carrier head |
US7575504B2 (en) * | 2006-11-22 | 2009-08-18 | Applied Materials, Inc. | Retaining ring, flexible membrane for applying load to a retaining ring, and retaining ring assembly |
US20090242125A1 (en) * | 2008-03-25 | 2009-10-01 | Applied Materials, Inc. | Carrier Head Membrane |
US8475231B2 (en) * | 2008-12-12 | 2013-07-02 | Applied Materials, Inc. | Carrier head membrane |
US10160093B2 (en) * | 2008-12-12 | 2018-12-25 | Applied Materials, Inc. | Carrier head membrane roughness to control polishing rate |
-
2009
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- 2009-03-23 KR KR1020157023720A patent/KR101619416B1/ko active Active
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- 2009-03-23 KR KR1020107023707A patent/KR101617716B1/ko active Active
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US20090242125A1 (en) | 2009-10-01 |
KR101617716B1 (ko) | 2016-05-03 |
KR101722540B1 (ko) | 2017-04-03 |
KR20160054630A (ko) | 2016-05-16 |
US20170243779A1 (en) | 2017-08-24 |
CN103252711A (zh) | 2013-08-21 |
TWI619197B (zh) | 2018-03-21 |
CN103252711B (zh) | 2016-06-29 |
TWI540669B (zh) | 2016-07-01 |
WO2009120641A3 (en) | 2009-12-10 |
CN101981666A (zh) | 2011-02-23 |
TW200949991A (en) | 2009-12-01 |
WO2009120641A2 (en) | 2009-10-01 |
US20200381286A1 (en) | 2020-12-03 |
KR20150104230A (ko) | 2015-09-14 |
KR101619416B1 (ko) | 2016-05-10 |
TW201530691A (zh) | 2015-08-01 |
KR20100133447A (ko) | 2010-12-21 |
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