KR20130131024A - Automation system and method for testing embedded device using independent interface - Google Patents

Abstract

The present invention relates to an embedded device test automation system and method using an independent interface method, comprising: a host terminal converting test control commands into a data packet according to a test protocol and transmitting the data to a test target; And an embedded device that analyzes the data packet received from the host terminal, performs a test according to a corresponding control command, converts the test result into a data packet according to a test protocol, and transmits the result to the host terminal. Including, The host terminal, Input unit for receiving any data value or test control command; A host application unit requesting a test for the embedded device; A test library unit implementing a test protocol to provide a standardized test application program interface to the host application unit; An abstraction unit converting the test control command into a data packet and analyzing the data packet received from the embedded device; An interface unit configured to process transmission and reception with the embedded device; A driver unit connected to the interface unit to provide a physical link with an embedded device; And a control unit controlling the input unit, the host application unit, the test library unit, the abstraction unit, the interface unit, and the driver unit. .

Description

Embedded system test automation system and method using independent interface method {AUTOMATION SYSTEM AND METHOD FOR TESTING EMBEDDED DEVICE USING INDEPENDENT INTERFACE}

The present invention relates to an interface device embedded device test automation system and method thereof, and more particularly, to a physical connection method between a PC and an embedded device, and an independent interface method for testing an embedded device by a data transmission method independent of a communication protocol. An embedded device test automation system and method thereof are provided.

Recently, as the configuration of embedded systems, such as mobile phones, PDAs, PMPs, navigators, and set-top boxes, is diversified, requirements for communicating with various embedded systems through a single data transmission method are rapidly increasing.

In case of CDMA mobile phone using Qualcomm chip, data can be exchanged with PC using DM (Diagnostic Monitor) protocol defined by Qualcomm, but in case of GSM mobile phone using other chip, use other protocol. . Smartphones and PDAs with Microsoft's Windows Mobile can communicate with PCs based on ActiveSync, but protocols for data exchange between applications must be defined and developed for each application separately.

Conventionally, the technology for the embedded device test has been published and published a number of applications other than the Republic of Korea Patent Publication No. 2003-0070420 'debugging device of the embedded system'.

The debugging device of the embedded system executes a plurality of tasks, and also executes a software agent to detect an operation state of the task, send the operation state, and change a register in response to a control signal transmitted from the outside; An embedded system including an infrared port for transmitting an operation state detected by the processor to an external device and receiving an external control signal; And a personal computer capable of infrared communication with the embedded system and including agent monitor software for interfacing a user with a software agent of the embedded system.

However, the conventional technology has a problem in that the personal computer and a specific embedded system must use different data transmission methods according to the hardware, operating system, and communication protocol of the embedded system.

The present invention has been made in view of the above problems, and the embedded device test automation system using an independent interface method for testing the embedded device in a data transmission method independent of the physical connection method, communication protocol between the PC and the embedded device and its The purpose is to provide a method.

The present invention for achieving the technical problem relates to an embedded device test automation system using an independent interface method, the host terminal for converting the test control commands to a data packet according to the test protocol to transmit to the test target; And an embedded device that analyzes the data packet received from the host terminal, performs a test according to a corresponding control command, converts the test result into a data packet according to a test protocol, and transmits the result to the host terminal. Including, The host terminal, Input unit for receiving any data value or test control command; A host application unit requesting a test for the embedded device; A test library unit implementing a test protocol to provide a standardized test application program interface to the host application unit; An abstraction unit converting the test control command into a data packet and analyzing the data packet received from the embedded device; An interface unit configured to process transmission and reception with the embedded device; A driver unit connected to the interface unit to provide a physical link with an embedded device; And a control unit controlling the input unit, the host application unit, the test library unit, the abstraction unit, the interface unit, and the driver unit. And a control unit.

Meanwhile, the present invention relates to an embedded device test automation method using an independent interface method, the method comprising: (a) a control unit of a host terminal receiving an arbitrary data value or a control command through an input unit; (b) the control unit loading a test protocol from a test library unit to a host application unit; (c) searching and connecting the test target embedded device through the search unit; (d) determining, by the searching unit, whether the control unit supports the test protocol of the found embedded device; (e) if the found embedded device supports the test protocol as a result of the determination of step (d), performing a test on the found embedded device by the controller; (f) disconnecting the embedded device to which the control unit is connected; (G) the controller unloading a test protocol from a test library unit; .

According to the present invention as described above, the physical connection method between the PC and the embedded device, there is an effect that can test the embedded device by a data transmission method independent of the communication protocol.

In addition, according to the present invention, in the case of performing test automation for various types of embedded devices, if the data transmission protocol is applied to the embedded device, one type of testing tool may be used for all types of embedded devices in the host terminal. There is also the effect that the test can be carried out.

In addition, according to the present invention, there is an effect of improving the stability of the embedded device and shorten the development period.

1 is an overall configuration diagram conceptually showing an embedded device test automation system using an independent interface method according to the present invention.
2 is an overall flowchart of an embedded device test automation method using an independent interface method according to the present invention.
3 is a detailed flow diagram for performing an embedded device test in accordance with the present invention.
4 is a detailed flowchart of communication of a host terminal and an embedded device according to the present invention.
5 is a detailed flowchart of the test operation of the embedded device according to the present invention.

Specific features and advantages of the present invention will become more apparent from the following detailed description based on the accompanying drawings. It is to be noted that the detailed description of known functions and constructions related to the present invention is omitted when it is determined that the gist of the present invention may be unnecessarily blurred.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will now be described in detail with reference to the accompanying drawings.

The embedded device test automation system using the independent interface method according to the present invention will be described with reference to FIG. 1 as follows.

1 is an overall configuration diagram conceptually showing an embedded device test automation system S using an independent interface method according to the present invention. As illustrated, a host terminal 100 and a plurality of embedded devices 200 are illustrated. ).

The host terminal 100 converts test control commands for testing the embedded device 200 into data packets according to a test protocol, transmits them to a test target, and receives a test result, which is illustrated in FIG. 1. As described above, the input unit 110, the host application unit 120, the test library unit 130, the abstraction unit 140, the search unit 150, the interface unit 160, the driver unit 170, and the output unit 180. And a controller 190.

In detail, the input unit 110 receives an arbitrary data value or a test control command from the user.

The host application unit 120 requests a test for the embedded device.

The host application unit 120 according to an embodiment of the present invention includes various types of programs, such as a test automation program such as TestQuest Pro and SKT TIM, a target motion logging / analysis program, and a target motion monitoring program.

The test library unit 130 is a library component that implements a test protocol and provides a standardized test application program interface (Application Programming Interface) to the host application unit 120.

The test protocol according to the embodiment of the present invention is an integrated serial, HDLC, TCP / IP, EMMI, etc., is defined as a data packet including the test control commands (Table 1), the test control command Can be expanded as needed.

The abstraction unit 140 converts the data packet according to the test protocol and analyzes the data packet received from the embedded device 200. As shown in FIG. 1, the abstraction unit 140 It includes a conversion module 141 and an analysis module 142.

The conversion module 141 of the abstraction unit 140 converts the data packet according to the test protocol to be used as a consistent and identical application program interface (API), and the analysis module 142 of the abstraction unit 140 The data packet received from the embedded device 200 is analyzed.

The searcher 150 searches for an embedded device to be tested and determines whether a test protocol is supported for the embedded device under test.

The interface unit 160 handles actual transmission and reception of the embedded device 200 and various individual network transmission protocols. In the present embodiment, the various network transmission protocols refer to TCP / IP, UDP, OBEX, Serial Communication, and the like.

The driver unit 170 provides a physical link with the embedded device 200.

The driver unit 170 according to the present embodiment includes Ethernet, USB, RS-232C, Bluetooth, Wireless Network Connection, and the like.

The output unit 180 outputs a test result of the embedded device 200.

The controller 190 may include the input unit 110, the host application unit 120, the test library unit 130, the abstraction unit 140, the search unit 150, the interface unit 160, the driver unit 170, and the like. The output unit 180 is controlled.

The embedded device 200 analyzes the data packet according to the test protocol received from the host terminal 100, performs a test according to the corresponding control command, and converts the test result into a data packet according to the test protocol. As shown in FIG. 1, the target test unit 210, the target abstraction unit 220, the target interface unit 230, the target driver unit 240, and the target control unit are performed as shown in FIG. 1. 250.

The target test unit 210 processes a test request transmitted from the host terminal 100.

The target abstraction unit 220 analyzes the data packet according to the test protocol received from the host terminal 100, and converts the test result processed by the target test unit 210 into a data packet according to the test protocol.

The target interface unit 230 processes transmission and reception of the network transmission protocol with the host terminal 100.

The target driver unit 240 provides a physical link with the host terminal 100.

The target controller 250 controls the target test unit 210, the target abstraction unit 220, the target interface unit 230, and the target driver unit 240.

Hereinafter, an embedded device test automation method using an independent interface method using the above-described system will be described with reference to FIGS. 2 to 5.

2 is a flowchart illustrating a method for automating an embedded device test using an independent interface method according to an exemplary embodiment of the present invention. As illustrated, the controller 190 of the host terminal 100 may transmit an arbitrary data value or a control command through an input unit. Receive (S2).

Next, the controller 190 loads the test protocol from the test library unit 130 to the host application unit 120 (S4).

Next, the controller 190 searches for and connects the embedded device 200 to be tested through the searcher 150 (S6).

Next, the controller 190 determines whether the test protocol is supported by the searcher 150 through the searcher 150 (S8).

Next, as a result of the determination in step S8, when the found embedded device 200 supports the test protocol, the controller 190 performs a test on the found embedded device 200 (S10).

Next, the controller 190 disconnects the connected embedded device 200 (S12).

Next, the controller 190 unloads the test protocol from the test library unit 130 (S14).

As a result of the determination of step S8, when the found embedded device 200 does not support the test protocol, the procedure proceeds to step S12.

3 is a detailed flowchart of performing an embedded device test according to the present invention. As illustrated, the control unit 190 of the host terminal 100 passes the test application program to the host application unit 120 through the test library unit 130. Call the interface (Test API) (S22).

Next, the control unit 190 converts the test control command into a data packet according to the test protocol through the conversion module 141 of the abstraction unit 140 (S24).

Next, the controller 190 communicates the data packet with the embedded device 200 through the driver unit 170 from the interface unit 160 (S26).

Next, the controller 190 analyzes the data packet received from the embedded device 200 through the analysis module 142 of the abstraction unit 140 (S28).

The controller 190 outputs the test result for the analyzed data packet through the output unit 180 (S30).

4 is a detailed flowchart illustrating communication between a host terminal and an embedded device according to the present invention. As illustrated, the controller 190 of the host terminal 100 may convert the data packet converted from the abstraction unit 140 into the interface unit 160. (S32).

Next, the controller 190 transmits the data packet converted through the driver unit 170 from the interface unit 160 to the embedded device 200 to perform a test operation (S34).

Next, the controller 190 receives a data packet according to the result of the test operation of the embedded device 200 from the driver unit 170 through the interface unit 160 (S36).

The controller 190 transmits the data packet according to the result of the test operation to the abstraction unit 140 (S38).

FIG. 5 is a detailed flowchart illustrating a test operation of an embedded device according to the present disclosure. As shown in FIG. 5, the target controller 250 of the embedded device 200 may be configured from the driver unit 170 of the host terminal 100. The data packet is received by the target interface unit 230 through the 240 (S42).

Next, the target controller 250 analyzes the data packet through the target abstraction unit 220 (S44).

Next, the target controller 250 determines whether the data packet is defined by the test protocol as a result of the analysis in step S44 (S46).

Next, when the target controller 250 determines that the data packet is defined in the test protocol in operation S46, the target controller 250 tests the target control unit 210 according to the corresponding test control command of the data packet (S48).

Next, the target control unit 250 converts the test result of the target test unit 210 into a data packet according to the test protocol through the target abstraction unit 220 (S50).

The target controller 250 transmits a data packet for a test result from the target interface unit 230 to the host terminal 100 through the target driver 240 (S52).

While the present invention has been particularly shown and described with reference to preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. It will be appreciated by those skilled in the art that numerous changes and modifications may be made without departing from the invention. Accordingly, all such appropriate modifications and changes, and equivalents thereof, should be regarded as within the scope of the present invention.

S: Embedded Device Test Automation System Using Independent Interface
100: host terminal 110: input unit
120: host application unit 130: test library unit
140: abstraction unit 141: conversion module
142: analysis module 150: search unit
160: interface unit 170: driver unit
180: output unit 190: control unit
200: embedded device 210: target test unit
220: target abstraction unit 230: target interface unit
240: target driver 250: target controller

Claims (10)

In the embedded device test automation system using an independent interface method,
A host terminal converting the test control commands into a data packet according to the test protocol and transmitting the test control commands to the test target; And
An embedded device that analyzes the data packet received from the host terminal, performs a test according to a corresponding control command, converts the test result into a data packet according to a test protocol, and transmits the result to the host terminal; , ≪ / RTI &
The host terminal,
An input unit for receiving an arbitrary data value or a test control command;
A host application unit requesting a test for the embedded device;
A test library unit implementing a test protocol to provide a standardized test application program interface to the host application unit;
An abstraction unit converting the test control command into a data packet and analyzing the data packet received from the embedded device;
An interface unit configured to process transmission and reception with the embedded device;
A driver unit connected to the interface unit to provide a physical link with an embedded device; And
A control unit controlling the input unit, the host application unit, the test library unit, the abstraction unit, the interface unit, and the driver unit; Embedded device test automation system using an independent interface method comprising a.
The method of claim 1,
The host terminal,
A search unit for searching for and connecting the embedded device, and determining whether a test protocol is supported for the found embedded device;
An output unit configured to output a test result of the embedded device; And
A control unit controlling the search unit and the output unit; Embedded device test automation system using an independent interface method characterized in that it further comprises.
The method of claim 1,
The embedded device,
A target tester which processes a test request transmitted from the host terminal;
A target abstraction unit analyzing a data packet according to the test protocol and converting a test result processed by the target test unit into a data packet according to the test protocol;
A target interface unit configured to process transmission and reception with the host terminal;
A target driver unit providing a physical link with the host terminal; And
A target controller configured to control the target test unit, the target abstraction unit, the target interface unit, and the target driver unit; Embedded device test automation system using an independent interface method comprising a.
The method of claim 1,
The test protocol,
Embedded device test automation system using an independent interface method, characterized in that defined as a data packet containing test control commands.
The method of claim 1,
The abstraction unit 140,
A conversion module 141 converting the data packet according to the test protocol; And
An analysis module 142 analyzing the data packet received from the embedded device 200; Embedded device test automation system using an independent interface method comprising a.
In the method of automating embedded device test using an independent interface method,
(a) receiving, by the controller of the host terminal, an arbitrary data value or a control command through the input unit;
(b) the control unit loading a test protocol from a test library unit to a host application unit;
(c) searching and connecting the test target embedded device through the search unit;
(d) determining, by the searching unit, whether the control unit supports the test protocol of the found embedded device;
(e) if the found embedded device supports the test protocol as a result of the determination of step (d), performing a test on the found embedded device by the controller;
(f) disconnecting the embedded device to which the control unit is connected; And
(g) the controller unloading a test protocol from a test library unit; Embedded device test automation method using an independent interface method including a.
The method according to claim 6,
The step (e)
(e-1) a control unit of the host terminal calling a test application program interface through a test library unit and providing the test application program interface to the host application unit;
(e-2) converting, by the control unit, a test control command into a data packet according to a test protocol through an abstraction unit;
(e-3) the control unit communicating the data packet with an embedded device from an interface unit through a driver unit; And
(e-4) analyzing, by the controller, the data packet received from the embedded device through the abstraction unit; Embedded device test automation method using an independent interface method comprising a.
The method of claim 7, wherein
After the step (e-4),
(e-5) the control unit outputting a test result for the analyzed data packet through an output unit; Embedded device test automation method using an independent interface method characterized in that it further comprises.
The method of claim 7, wherein
The step (e-3),
(e-3-1) the control unit transmitting a data packet converted from the abstraction unit to an interface unit;
(e-3-2) the control unit transmitting a data packet converted from the interface unit through the driver unit to the embedded device to perform a test operation;
(e-3-3) receiving, by the controller, a data packet according to a result of a test operation of the embedded device from the driver through the interface; And
(e-3-4) the control unit transmitting a data packet different from the result of the test operation to the abstraction unit; Embedded device test automation method using an independent interface method comprising a.
The method of claim 9,
The (e-3-2) step,
(h-1) receiving, by the target controller of the embedded device, a data packet from the driver of the host terminal to the target interface through the target driver;
(h-2) analyzing, by the target controller, a data packet through a target abstraction unit;
(h-3) determining, by the target controller, whether the data packet is defined by a test protocol;
(h-4) in the case of the data packet defined in the test protocol as a result of the determination in the (h-3) step, testing by the target control unit according to a corresponding test control command of the data packet through a target test unit;
(h-5) the target controller converting a test result of the target test unit into a data packet according to a test protocol through the target abstraction unit; And
(h-6) the target control unit transmitting a data packet for a test result from the target interface unit to the host terminal through the target driver unit; Embedded device test automation method using an independent interface method comprising a.

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