KR20090097855A - 추가적인 장치와 연결되거나 또는 연결될 수 있는 전기 장치의 전류 회귀 경로 무결성을 판정하기 위한 방법 - Google Patents
추가적인 장치와 연결되거나 또는 연결될 수 있는 전기 장치의 전류 회귀 경로 무결성을 판정하기 위한 방법 Download PDFInfo
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- KR20090097855A KR20090097855A KR1020097010853A KR20097010853A KR20090097855A KR 20090097855 A KR20090097855 A KR 20090097855A KR 1020097010853 A KR1020097010853 A KR 1020097010853A KR 20097010853 A KR20097010853 A KR 20097010853A KR 20090097855 A KR20090097855 A KR 20090097855A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
- H04B3/487—Testing crosstalk effects
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Current Or Voltage (AREA)
- Control Of Direct Current Motors (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (10)
- 복수의 신호선(22, 26) 및 공급선들(24)을 가지는 전기 장치(10)의 전류 회귀 경로 무결성(current return path integrity)을 판정하는 방법으로서, 상기 전기 장치(10)는 추가적인 장치(40)와 연결되거나 또는 연결될 수 있고, 상기 공급선들(24)의 적어도 하나의 그룹은 전기적으로 서로 상호연결되며,상기 방법은,a) 정의된 신호선(26) 상의 근단 크로스토크 신호(near end crosstalk signal) - 상기 근단 크로스 토크 신호는 다른 정의된 신호선(22) 상의 입력 신호(18)로부터 발생함 - 의 적어도 하나의 기준 신호 패턴(50)을 가지는 라이브러리를 제공하는 단계 - 상기 라이브러리는 상기 전기 장치(10)와 동일하고 유효성이 긍정적으로 테스트된 기준 장치로 생성됨 -;b) 상기 전기 장치(10)의 선택된 신호선(22)에 소정의 신호(18)를 인가하는 단계;c) 상기 전기 장치(10)의 적어도 하나의 추가적인 신호선(26) 상에서의 상기 근단 크로스토크 신호(20)를 검출하는 단계;d) 상기 근단 크로스토크 신호(20)와 상기 라이브러리로부터의 상기 대응하는 기준 신호 패턴(50)을 비교하는 단계; 및e) 상기 근단 크로스토크 신호(20)와 상기 대응하는 기준 신호 패턴(50) 사이의 편차가 있으면,f) 상기 전기 장치(10)에 임의의 결함이 있다는 정보를 공표하는 단계를 포함하는 방법.
- 제1항에 있어서,상기 단계 c)부터 f)는 다른 추가적인 신호선(26) 상에서 반복되는, 방법.
- 제1항 또는 제2항에 있어서,상기 단계 b)부터 f)는 추가로 선택된 신호선(26) 상에서 반복되는, 방법.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 방법은 적어도 하나의 공급선(24) 상의 개구의 위치를 발견하기 위해서 제공되는, 방법.
- 제1항 내지 제4항 중 어느 한 항에 있어서,상기 근단 크로스토크 신호(20)는 소정의 시간 윈도우(time window) 내에서 검출되는, 방법.
- 제1항 내지 제5항 중 어느 한 항에 있어서,상기 개구 또는 상기 결함은, 상기 근단 크로스토크 신호(20)와 상기 대응하는 기준 신호 패턴(50) 사이의 상기 편차가 발생하는 시간에 기초하여 그 위치가 정해지는, 방법.
- 제1항 내지 제6항 중 어느 한 항에 있어서,상기 근단 크로스토크 신호(20)와 상기 대응하는 기준 신호 패턴(50) 사이의 상기 편차가 소정의 값보다 크면, 상기 결함의 상기 정보가 공표되는, 방법.
- 디지털 컴퓨터 시스템의 내장 메모리에 로딩될 수 있는 컴퓨터 프로그램으로서,상기 컴퓨터 프로그램이 상기 컴퓨터 상에서 실행될 때 제1항 내지 제7항 중 어느 한 항에 따르는 상기 방법을 수행하기 위한 소프트웨어 코드 부분들을 포함하는 컴퓨터 프로그램.
- 제1항 내지 제7항 중 어느 한 항에 따르는 상기 방법을 수행하기 위한 테스트 장치로서,상기 전기 장치(10) 또는 상기 커넥터 리셉터클(10)과 연결되거나 또는 연결될 수 있는 테스트 헤드를 포함하는 테스트 장치.
- 제9항에 있어서,상기 테스트 헤드를 제어하기 위한 로봇 암(robot arm)을 더 포함하는 테스트 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07100678.7 | 2007-01-17 | ||
EP07100678 | 2007-01-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090097855A true KR20090097855A (ko) | 2009-09-16 |
Family
ID=39247276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020097010853A Abandoned KR20090097855A (ko) | 2007-01-17 | 2007-11-20 | 추가적인 장치와 연결되거나 또는 연결될 수 있는 전기 장치의 전류 회귀 경로 무결성을 판정하기 위한 방법 |
Country Status (7)
Country | Link |
---|---|
US (5) | US8248082B2 (ko) |
EP (1) | EP2104863B1 (ko) |
JP (1) | JP4639263B2 (ko) |
KR (1) | KR20090097855A (ko) |
AT (1) | ATE467132T1 (ko) |
DE (1) | DE602007006347D1 (ko) |
WO (1) | WO2008086908A1 (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE602007006347D1 (de) | 2007-01-17 | 2010-06-17 | Ibm | Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist |
TR201811114T4 (tr) * | 2008-03-07 | 2018-08-27 | Rte Reseau De Transp Delectricite | Bir elektrik bağlantısı üzerinde bir arızanın yerinin saptanması için yöntem ve cihaz |
US10705134B2 (en) * | 2017-12-04 | 2020-07-07 | International Business Machines Corporation | High speed chip substrate test fixture |
JP6410915B1 (ja) * | 2017-12-19 | 2018-10-24 | 馬鞍山市明珠電子科技有限公司 | 電気機器及び電気機器の接地状態検知方法 |
CN111277291A (zh) * | 2018-11-16 | 2020-06-12 | 英业达科技有限公司 | 电路装置 |
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GB2065312B (en) * | 1979-11-16 | 1983-06-08 | Post Office | Location of croos-talk faults by correlation |
US4620282A (en) * | 1984-02-03 | 1986-10-28 | Shelley Marlin C | System and method for documenting and checking cable interconnections |
JP2763793B2 (ja) * | 1989-07-15 | 1998-06-11 | 富士通株式会社 | プリント配線板検査装置 |
US5513188A (en) * | 1991-09-10 | 1996-04-30 | Hewlett-Packard Company | Enhanced interconnect testing through utilization of board topology data |
JPH06194401A (ja) * | 1992-04-01 | 1994-07-15 | Pentek Inc | 電線・ケーブル系統の異常検知装置 |
JP3399630B2 (ja) * | 1993-09-27 | 2003-04-21 | 株式会社日立製作所 | バスシステム |
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JP3397957B2 (ja) * | 1996-01-10 | 2003-04-21 | 株式会社オートネットワーク技術研究所 | ワイヤーハーネスの故障位置検出方法及び同方法に用いるワイヤーハーネス |
US5821760A (en) * | 1996-07-31 | 1998-10-13 | Fluke Corporation | Method and apparatus for measuring near-end cross-talk in patch cords |
JPH1090337A (ja) * | 1996-09-13 | 1998-04-10 | Tokyo Electric Power Co Inc:The | ケーブルの劣化測定方法 |
US6040770A (en) * | 1997-09-05 | 2000-03-21 | Britton; Rick A. | Communication path integrity supervision in a network system for automatic alarm data communication |
JP4248627B2 (ja) * | 1998-07-30 | 2009-04-02 | 関西電力株式会社 | 地絡検査装置 |
JP3880286B2 (ja) * | 1999-05-12 | 2007-02-14 | エルピーダメモリ株式会社 | 方向性結合式メモリシステム |
JP2003050256A (ja) * | 2001-08-08 | 2003-02-21 | Hitachi Ltd | プリント基板検査装置 |
US20030182640A1 (en) * | 2002-03-20 | 2003-09-25 | Alani Alaa F. | Signal integrity analysis system |
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DE602007006347D1 (de) * | 2007-01-17 | 2010-06-17 | Ibm | Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist |
EP2065312A1 (de) | 2007-11-22 | 2009-06-03 | Nodrops Aktiengesellschaft | Einrichtung zum tropfenfreien Ausgiessen von Flüssigkeiten |
-
2007
- 2007-11-20 DE DE602007006347T patent/DE602007006347D1/de active Active
- 2007-11-20 EP EP07847223A patent/EP2104863B1/en active Active
- 2007-11-20 KR KR1020097010853A patent/KR20090097855A/ko not_active Abandoned
- 2007-11-20 WO PCT/EP2007/062542 patent/WO2008086908A1/en active Application Filing
- 2007-11-20 JP JP2009545839A patent/JP4639263B2/ja not_active Expired - Fee Related
- 2007-11-20 US US12/523,119 patent/US8248082B2/en not_active Expired - Fee Related
- 2007-11-20 AT AT07847223T patent/ATE467132T1/de not_active IP Right Cessation
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2012
- 2012-08-02 US US13/565,159 patent/US9134364B2/en active Active
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2015
- 2015-07-10 US US14/796,595 patent/US9304158B2/en active Active
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2016
- 2016-04-01 US US15/088,258 patent/US9581631B2/en not_active Expired - Fee Related
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2017
- 2017-01-17 US US15/407,874 patent/US9891256B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US9581631B2 (en) | 2017-02-28 |
ATE467132T1 (de) | 2010-05-15 |
EP2104863A1 (en) | 2009-09-30 |
DE602007006347D1 (de) | 2010-06-17 |
US20170122993A1 (en) | 2017-05-04 |
US9304158B2 (en) | 2016-04-05 |
JP2010517002A (ja) | 2010-05-20 |
US9891256B2 (en) | 2018-02-13 |
US9134364B2 (en) | 2015-09-15 |
US20100109679A1 (en) | 2010-05-06 |
US8248082B2 (en) | 2012-08-21 |
US20160216302A1 (en) | 2016-07-28 |
US20120293185A1 (en) | 2012-11-22 |
US20150309100A1 (en) | 2015-10-29 |
EP2104863B1 (en) | 2010-05-05 |
WO2008086908A1 (en) | 2008-07-24 |
JP4639263B2 (ja) | 2011-02-23 |
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