KR200172710Y1 - 칩 크기의 패키지 - Google Patents
칩 크기의 패키지 Download PDFInfo
- Publication number
- KR200172710Y1 KR200172710Y1 KR2019970016156U KR19970016156U KR200172710Y1 KR 200172710 Y1 KR200172710 Y1 KR 200172710Y1 KR 2019970016156 U KR2019970016156 U KR 2019970016156U KR 19970016156 U KR19970016156 U KR 19970016156U KR 200172710 Y1 KR200172710 Y1 KR 200172710Y1
- Authority
- KR
- South Korea
- Prior art keywords
- package
- chip
- lead frame
- semiconductor chip
- protrusion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 32
- 229910000679 solder Inorganic materials 0.000 claims abstract description 13
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 2
- 239000010931 gold Substances 0.000 claims 2
- 229910052737 gold Inorganic materials 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 9
- 230000008054 signal transmission Effects 0.000 abstract description 3
- 230000000881 depressing effect Effects 0.000 abstract description 2
- 239000002184 metal Substances 0.000 description 7
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012958 reprocessing Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000019491 signal transduction Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49575—Assemblies of semiconductor devices on lead frames
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49517—Additional leads
- H01L23/4952—Additional leads the additional leads being a bump or a wire
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/4826—Connecting between the body and an opposite side of the item with respect to the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73215—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
Claims (3)
- 다수개의 본딩 패드가 구비된 반도체 칩 ; 상기 반도체 칩의 본딩 패드에 형성된 도전성 범프 ; 상기 반도체 칩의 본딩 패드 형성면가 대향, 배치되어, 상기 도전성 범프를 매개로 반도체 칩의 본딩 패드에 전기적으로 연결되며, 하부를 향해 돌출부가 형성된 리드 프레임 ; 상기 리드 프레임의 돌출부만이 노출되도록, 전체 결과물을 봉지하는 패키지 몸체 ; 및 상기 패키지 몸체로부터 노출된 리드 프레임의 돌출부에 형성된 솔더 볼을 포함하는 것을 특징으로하는 칩 크기의 패키지.
- 제1항에 있어서, 상기 도전성 범프의 재질은 금인 것을 특징으로 하는 칩 크기의 패키지.
- 제2항에 있어서, 상기 금 재질의 범프 높이는 50μm 미만인 것을 특징으로 하는 칩 크기의 패키지.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019970016156U KR200172710Y1 (ko) | 1997-06-27 | 1997-06-27 | 칩 크기의 패키지 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019970016156U KR200172710Y1 (ko) | 1997-06-27 | 1997-06-27 | 칩 크기의 패키지 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19990002582U KR19990002582U (ko) | 1999-01-25 |
KR200172710Y1 true KR200172710Y1 (ko) | 2000-03-02 |
Family
ID=19504276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019970016156U Expired - Lifetime KR200172710Y1 (ko) | 1997-06-27 | 1997-06-27 | 칩 크기의 패키지 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR200172710Y1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100583494B1 (ko) * | 2000-03-25 | 2006-05-24 | 앰코 테크놀로지 코리아 주식회사 | 반도체패키지 |
-
1997
- 1997-06-27 KR KR2019970016156U patent/KR200172710Y1/ko not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR19990002582U (ko) | 1999-01-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR0169820B1 (ko) | 금속 회로 기판을 갖는 칩 스케일 패키지 | |
KR100194747B1 (ko) | 반도체장치 | |
US6864588B2 (en) | MCM package with bridge connection | |
US7015591B2 (en) | Exposed pad module integrating a passive device therein | |
US6894904B2 (en) | Tab package | |
KR0157857B1 (ko) | 반도체 패키지 | |
KR19990024255U (ko) | 적층형 볼 그리드 어레이 패키지 | |
KR200172710Y1 (ko) | 칩 크기의 패키지 | |
KR100331070B1 (ko) | 칩싸이즈반도체패키지의 구조 및 그 제조 방법 | |
KR100260996B1 (ko) | 리드프레임을 이용한 어레이형 반도체패키지 및 그 제조 방법 | |
KR100230921B1 (ko) | CSP(Chip Scale Package ; 칩 스케일 패키지)의 구조 및 제조방법 | |
JP3545171B2 (ja) | 半導体装置 | |
KR100216845B1 (ko) | CSP ( Chip Scale Package ; 칩 스케일 패키지)의 구조 및 제조방법 | |
KR100226106B1 (ko) | 리드프레임을 이용한 볼그리드어레이반도체패키지 및 그 제조방법 | |
KR20030033706A (ko) | 플립칩 패키지 | |
KR20030025481A (ko) | 플립칩 반도체패키지 및 그의 제조방법 | |
KR200313831Y1 (ko) | 바텀리드패키지 | |
KR20000001410A (ko) | 볼그리드어레이 패키지 | |
KR20020031881A (ko) | 반도체 패키지 및 그 제조방법 | |
KR20000002808A (ko) | 볼 그리드 어레이 패키지 및 그의 제조방법 | |
KR950000516B1 (ko) | 반도체 조립장치 | |
KR100230922B1 (ko) | CSP(Chip Scale Package; 칩 스케일 패키지)의 구조 및 제조방법 | |
KR19980082181A (ko) | 리드 온 칩 타입의 칩 스케일 반도체 패키지 구조 및 제조방법 | |
KR100225238B1 (ko) | CSP(Chip Scale Package ; 칩 스케일 패키지)의 구조 및 제조방법 | |
JPH1070150A (ja) | Csp型半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
UA0108 | Application for utility model registration |
Comment text: Application for Utility Model Registration Patent event code: UA01011R08D Patent event date: 19970627 |
|
UA0201 | Request for examination |
Patent event date: 19970627 Patent event code: UA02012R01D Comment text: Request for Examination of Application |
|
UG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
UE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event code: UE09021S01D Patent event date: 19990528 |
|
E701 | Decision to grant or registration of patent right | ||
UE0701 | Decision of registration |
Patent event date: 19990916 Comment text: Decision to Grant Registration Patent event code: UE07011S01D |
|
REGI | Registration of establishment | ||
UR0701 | Registration of establishment |
Patent event date: 19991213 Patent event code: UR07011E01D Comment text: Registration of Establishment |
|
UR1002 | Payment of registration fee |
Start annual number: 1 End annual number: 3 Payment date: 19991214 |
|
UG1601 | Publication of registration | ||
UR1001 | Payment of annual fee |
Payment date: 20021120 Start annual number: 4 End annual number: 4 |
|
UR1001 | Payment of annual fee |
Payment date: 20031119 Start annual number: 5 End annual number: 5 |
|
UR1001 | Payment of annual fee |
Payment date: 20041119 Start annual number: 6 End annual number: 6 |
|
UR1001 | Payment of annual fee |
Payment date: 20051116 Start annual number: 7 End annual number: 7 |
|
UR1001 | Payment of annual fee |
Payment date: 20061122 Start annual number: 8 End annual number: 8 |
|
UR1001 | Payment of annual fee |
Payment date: 20071120 Start annual number: 9 End annual number: 9 |
|
FPAY | Annual fee payment |
Payment date: 20081125 Year of fee payment: 10 |
|
UR1001 | Payment of annual fee |
Payment date: 20081125 Start annual number: 10 End annual number: 10 |
|
LAPS | Lapse due to unpaid annual fee |