KR19990013599A - Mr. I. Test handler - Google Patents

Abstract

The present invention discloses an IC test handler for screen displaying various notification contents. The help screen contains the operation screen showing the operation sequence of the IC test handler and the notification contents such as an alarm when an abnormality occurs, and is stored as a help file. When the notification contents are displayed, the help file is executed to display detailed information on the notification contents. Display.

Description

Mr. I. Test handler

The present invention carries out the transfer and the like when testing various IC devices such as semiconductor memories. Seed. Test handlers (hereinafter referred to as IC test handlers).

When performing various tests of IC devices, such as a semiconductor memory, using a semiconductor test apparatus, it is necessary to provide the some IC device used as a test object in a predetermined test position. An IC test handler is used to efficiently install such an IC device.

The IC test handler includes a mechanism unit for carrying an IC device or changing an arrangement, various sensors for detecting an operation state or an abnormality, a controller for controlling each operation according to the mechanism unit according to the output of these sensors, and an operator. ) Includes an operation unit for inputting various settings and operation instructions, and a panel display for displaying various setting screens or displaying alarms when an abnormality occurs.

By inputting the model number and the characteristic data of each IC device from the above-mentioned operation part, various types of IC devices of different types can be tested. In addition, the customer tray used for supplying or retrieving the IC device has various shapes because the user of the IC test handler prepares, and in the case of using various types of customer trays prepared by the user in advance, It is necessary to input data regarding the detailed shape of the customer tray and the like from the operation unit.

In addition, the above-described control unit detects the conveyance state of the supplied IC device by monitoring the outputs of various sensors, and when an abnormality such as dropping of the IC device occurs during the conveyance, stops the conveyance operation immediately and displays a red light.燈) blinks or alarm is displayed. For example, the alarm notification at the time of an abnormal occurrence, such as the fall of an IC device, is performed by displaying various alarm codes of several tens of digits previously prepared according to the kind of abnormality which occurred on the panel display with which the IC test handler is equipped.

By the way, in the above-described IC test handler, various data inputs and various operation instruction inputs are performed while looking at the operation screen of the panel display, and since the terminology specific to the IC test handler is used for the display, an operator inexperienced to some extent is used. There is a problem that it is difficult to grasp the details. For this reason, manual books have been provided that explain various setting items and operation instructions, and the operator can know what the corresponding setting items mean by looking at the manual book.

In addition, since the alarm display when an abnormality occurs in the above-described IC test handler is performed by displaying a predetermined alarm code on the panel display, it is difficult to grasp the contents only by looking at the alarm code. In general, a manual book is provided which describes the cause of the alarm, a method of releasing the alarm, etc. according to various alarm codes, and the operator can obtain detailed information on the generated alarm by examining the manual book.

By the way, various setting items, operation instructions, etc., and the cause of alarms (for example, alarms have jams, errors, statuses, guides, etc.) can be divided into several branches. It is not easy to find the corresponding setting item or cause of alarm. In general, descriptions of various setting items and the like described in the manual book and descriptions of various alarms are often written for a skilled person who has experience in operating an IC test handler, and a short expression using technical terms is used. Therefore, it is not necessarily easy for an operator who is unfamiliar to understand. On the contrary, it can be considered to describe in detail using expressions that can be understood by anyone, and it is difficult for an experienced operator to understand in descriptions without using technical terms.

In addition, the product life of the IC test handler itself is about 10 to 15 years, and if the software is changed due to the addition or change of the IC device under test within the period of use, it is necessary to change the entire manual book or part thereof. However, if this update operation is not performed at an appropriate timing, the displayed operation instruction or the like and the alarm code and the contents of the manual book cannot be corresponded to each other, and it becomes difficult to investigate the corresponding item or the cause or release method of the alarm. For example, when the user does not pay the distribution of the update page of the manual book according to the user's application, and the application is not carried out. The operation instructions and the like displayed on the screen and the alarm code and the contents described in the manual book cannot be correlated with each other.

In this way, it is difficult for anyone to understand the contents of various setting items and operation instructions displayed on the operation screen by examining the manual book, and a method for anyone to easily understand the contents of setting items is desired regardless of skill level. have. In addition, it is not easy for anyone to understand the series of actions from alarm generation to alarm release by examining the manual book. have.

An object of the present invention is to provide an IC test handler which can easily obtain detailed information of various notification contents such as various items included in an operation screen, an alarm generated, and the like.

In a preferred embodiment, the IC test handler of the present invention stores display means for displaying predetermined notification contents and a help file including at least detailed information on the notification contents displayed by the displaying means. Help file storage means and help function execution means for displaying the detailed information by executing the help file.

Detailed information on various notification contents of the IC test handler is stored in the help file, and by executing the help file by the help function execution means, detailed information on the notification contents can be displayed when the various notification contents are displayed on the screen. have. By providing a help file corresponding to each item included in the notification contents, detailed information on each of these items can be easily obtained. In addition, even if the contents of the notification are changed because the software used in the IC test handler is changed, the contents of the help file are updated at the same time as the change of the software, so that each item included in the contents of the notification and detailed information on each of these items are displayed. Can match.

1 is an external view of an IC test handler according to one embodiment.

2 shows a schematic configuration of an IC test handler mechanism;

3 is a block diagram showing a schematic configuration of a control mechanism for controlling the operation of the IC test handler.

4 is a flowchart showing an operation procedure of a help screen display performed in parallel with the system operation screen display.

Fig. 5 is a diagram showing a display example of a customer tray setting screen which is one of the system operation screens.

Fig. 6 is a diagram showing a specific example of the help screen displayed by executing a help file.

7 is a diagram illustrating another example of the help screen.

8 shows another example of a help screen.

Fig. 9 is a flowchart showing an operation procedure when changing from a customer tray to a test tray.

Fig. 10 is a flowchart showing the operation procedure of the IC test handler when an abnormality occurs during normal operation.

Fig. 11 is a flowchart showing an operation procedure of alarm display performed by the input / output processing unit.

12 is a view showing a display screen of an alarm message.

Fig. 13 is a diagram showing a display screen when a guide display button is clicked.

Fig. 14 is a diagram showing a display screen in which a popup window is partially displayed;

15 shows a display screen when a detail display button is clicked.

EMBODIMENT OF THE INVENTION Hereinafter, the IC test handler of one Embodiment is demonstrated in detail with reference to drawings.

1 is an external view of an IC test handler of one embodiment, and a front view of a horizontal transfer type IC test handler is shown as an example. The IC test handler 100 shown in FIG. 1 is an opening / closing door 110 that opens and closes to supply and retrieve a plurality of customer trays, and a display unit that displays a predetermined alarm display when an operation screen display or abnormality necessary for various settings is made. LCD (liquid crystal display device) 112, a keyboard 114 which is an operation unit for inputting various setting values and operation instructions for the IC device to be tested and the customer tray on which it is placed, and illumination of different colors depending on the operation state It has a signal tower (116) for turning on or blinking.

FIG. 2 is a diagram showing a schematic configuration of a mechanism part of the IC test handler 100 shown in FIG. 1. As shown in Fig. 2, the IC test handler 100 is a mechanism part for conveying the supplied IC device to a predetermined position after heating it, and cooling and taking it out after the end of the test. A suction head 126, a loader 128, a soak chamber 130, a test chamber 132, an unsoak chamber 136, an unloader 138 Equipped.

The customer tray 120 is a container for accommodating the plurality of IC devices 118, and different ones are used depending on the type and shape of the IC device 118. Since the customer tray 120 is prepared by the user of the IC test handler 100 and a certain degree of freedom is allowed in the shape, it is necessary to set various data such as size in advance.

The stocker 122 accommodates the customer tray 120 on which the IC device 118 is placed before the test, or the customer tray 120 on which each IC device 118 classified by category is placed after the test. It is to. The stocker 122 has a lamination part in which a plurality of customer trays 120 are laminated, and a plurality of these are arranged. When supplying the IC device 118 to the loader 128, the IC device 118 placed on the customer tray 120 at the top of the stacked portion is picked up and placed on the test tray 124, and then the loader 128 To the) side. When the customer tray 120 at the top of the stack becomes empty, the empty tray is moved to the bottom, and then an elevator (not shown) rises to push up the second customer tray 120 to the top, and the IC device 118 ) Supply is continued. In the case of storing the IC device 118 from the unloader 138 side, the IC device 118 on the test tray 124 is transferred onto the empty customer tray 120 at the uppermost end of the stacking part, Acceptance is achieved by sequentially lowering the customer tray 120 on which the IC device 118 is placed.

The above-mentioned stocker 122 is in the position which opened the opening-closing door 110 shown in FIG. 1, and an operator supplies the customer tray 120 to the predetermined position of this stocker 122 in normal test operation. And the stocker 122 performs the operation | work which collect | recovers the customer tray 120 in which the IC device 118 after completion | finish of testing was put.

Replacing the IC device 118 from the customer tray 120 to the test tray 124 or replacing the IC device 118 from the test tray 124 to the customer tray 120 is the adsorption head 126. Is done by. The suction head 126 picks up the IC device 118 by making the inside of the head negative, and releases the negative pressure, thereby releasing the supported IC device 118.

The loader 128 picks up the IC device 118 on the customer tray 120 at the top of any stacker of the stocker 122 by the suction head 126 and places it on the test tray 124. The test tray 124 is conveyed toward the soak chamber 130.

The soak chamber 130 is a thermostat which heats or cools the IC device 118 before a test, and maintains it at predetermined temperature, and accommodates the some test tray 124. As shown in FIG. The test tray 124 conveyed by the loader 128 is set at the top of the soak chamber 130 and then descends one by one in sequence. By setting this fall time to a predetermined value, heating or cooling of the IC device 118 is performed until the desired achieved temperature is reached. The test tray 124 is discharged after reaching the lowest end of the soak chamber 130 and is conveyed to the test chamber 132.

The test chamber 132 is a constant temperature bath for conducting various functional tests on the IC device 118 maintained at a predetermined temperature. In the test chamber 132, each IC device 118 on the test tray 124 discharged from the soak chamber 130 is individually picked up and moved to the contact unit 134 to test various functional tests on each IC device 118. This IC device 118 is received in the original test tray 124 after the test is completed. The contact portion 134 is provided with a plurality of IC sockets (not shown), and after attaching the IC device 118 to each of them, a test head (not shown) is brought into contact with each terminal of the IC device 118. By doing so, the IC device 118 and the semiconductor test apparatus 200 are electrically connected. After the electrical connection is completed, the semiconductor test apparatus 200 performs a functional test on the IC device 118. When the tests for all the IC devices 118 on the test tray 124 are finished, the test tray 124 is conveyed toward the unsoak chamber 126.

The unsoak chamber 136 is a thermostat that gently cools or heats the IC device 118 in a high or low temperature state during testing to return to normal temperature in order to prevent sudden application of temperature stress or condensation. . After the test tray 124 in which the testing of the IC device 118 is finished is received at the bottom of the unsock chamber 136, the temperature of the IC device 118 is returned to room temperature until it sequentially rises one by one to reach the top. Go back. The test tray 124 at the top is discharged from the unsoak chamber 136 and conveyed toward the unloader 138.

The unloader 138 classifies the IC device 118 after the end of the test discharged from the unsoak chamber 136 by good or bad or by characteristics, and transfers the IC device 118 to the corresponding customer tray 120. Which customer tray 120 to distribute the IC device 118 belonging to which classification is set in advance.

A series of controls such as transfer control of the customer tray 120 and the test tray 124 described above, heating and cooling control in the soak chamber 130 and the unsoak chamber 136, and identification management control of the IC device 118 are performed. This is done by a sequence control unit (to be described later).

3 is a block diagram schematically showing a control mechanism for controlling the operation of the IC test handler 100 of the present embodiment. As shown in FIG. 3, the IC test handler 100 of this embodiment controls the operation of the mechanism part shown in FIG. 2, and has the sequence which has a structure which is necessary for performing the functional test by the semiconductor test apparatus 200. FIG. A control interface 140 and a user interface (I / F) board 160 having a configuration required for an operator to input various setting data and operation instructions or to display an alarm or operation screen for the operator; And a motor controller (MC) 170, 172 for rotationally driving a pulse motor or a servo motor (not shown) for moving the loader 128 or the unloader 138, and the IC device 118. And a solenoid valve 174 and an adsorption sensor 176 formed at each adsorption head 126 to pick up or release the device and detect the support state thereof.

The sequence control board 140 may include a sequence control unit 142, an input / output control unit 144, a temperature control unit 146, a user interface (I / F) conversion unit 148, and a tester interface (I / F) unit 150. It is configured to include. The sequence control unit 142 includes a processor and a memory, and is realized by executing a predetermined program using a dedicated operating system (OS) capable of parallel processing a plurality of tasks. The input / output control unit 144 controls the operation of the mechanism shown in FIG. 2 according to the instructions of the sequence control unit 142, and sends an operation instruction to the motor controllers 170 and 172 and the solenoid valve 174. In addition, the input / output controller 144 detects the output of the adsorption sensor 176 and notifies the sequence controller 142 of the presence or absence of the IC device 118. The temperature controller 146 controls the temperatures of the soak chamber 130, the unsoak chamber 136, and the test chamber 132. The user interface converter 148 is for controlling data input / output between the sequence control board 140 and the user interface board 160.

The user interface board 160 includes an input / output processing unit 162 and an input / output interface (I / F) unit 164. The input / output processing unit 162 is a main body of a personal computer including a processor and a memory, and inputs various data and operation instructions using an operating system (for example, Windows (registered trademark) of Microsoft Corporation) that is used in general personal computers. The predetermined help screen display processing is performed in parallel with the processing, display processing, alarm occurrence, or operation screen display. The input / output interface unit 164 connects the input / output processing unit 162, the LCD 112, the keyboard 114, the mouse 180, the hard disk device (HDD) 182, and the speaker 184, and connects to the device to be connected. It has a connector shape suitable for a predetermined standard according to. In addition, the hard disk device 182 stores a help file for displaying the help screen described above. In addition, although the mouse 180 was used as an example of a pointing device, you may make it use other pointing devices, such as a joystick.

[Input operation of various setting data and operation instruction using operation screen]

The operation in the case of inputting various setting data or operation instructions by displaying a predetermined operation screen prior to the normal operation will be described below. 4 is a diagram illustrating an operation procedure of a help screen display in parallel with the system operation screen display. For example, consider an input operation screen for inputting various setting data regarding the customer tray 120 prepared by the user of the IC test handler 100.

Prior to the normal operation of the IC test handler 100, the input / output processing unit 162 displays, on the LCD 112, a system operation screen for inputting various setting data or operation instructions necessary for the normal operation of the IC test handler 100. (Step 301), a help file prepared in advance for supplementary explanation of each item included in this system operation screen is started (step 302).

FIG. 5 is a diagram illustrating a system operation screen. As an example, details of the customer tray setting screen for making various settings regarding the customer tray 120 prepared for each user are shown. On the customer tray setting screen shown in the figure, various setting values such as "X pitch", "Y pitch", "Z pitch", and "distance to X tip" of the customer tray 120 are loaded. It can be input separately for Dragon and Unloader (UL) 138. In addition, the right area of the customer tray setting screen includes a diagram showing which part of each setting item corresponds to the customer tray 120, and is designed to help an operator to input data of each item. It is.

After displaying the above-mentioned customer tray setting screen, the input / output processing unit 162 monitors whether data relating to each setting item is input (step 303) and whether data input operation is finished (step 304). If data corresponding to a certain setting item is input, after setting the input data as a new setting value for the item (step 305), the control returns to the monitoring state of the data input of step 303 again.

As described above, the contents of the customer tray setting screen are not designed to be easily understood by an inexperienced operator, but the display content of the setting screen does not necessarily mean that all the setting items mean. For example, an inexperienced operator may not fully understand what each item, such as a "tray setting mode" or a "device access method", means.

In parallel with the above-described display operation of the customer tray setting screen, the input / output processing unit 162 monitors whether the display operation of the help screen corresponding to each setting item is requested or not (step 306), and the display operation of the help screen is performed. If so, a help screen including a description of the contents of the corresponding setting item is displayed (step 307). For example, a predetermined help screen display is enabled by the input / output processing unit 162 by executing a help file on Windows (registered trademark) which is a general purpose OS.

6 is a diagram illustrating a help screen displayed by executing a help file. By clicking the "?" Mark on the upper right side of the customer tray setting screen shown in FIG. 5 with the mouse 180, the pointer of the mouse 180 is moved and clicked on a matter to know the meaning of the term. As shown in FIG. 2, a pop-up window including a meaning of a term and the like for the portion may be displayed as a help screen.

In general, a help file of Windows (registered trademark) is a collection of a plurality of topics to which one information is assigned, and has a function of searching for a desired topic by specifying a keyword. In addition, it is easy to check related information by having a connection between topics.

7 is a diagram illustrating a topic search screen for searching a topic by specifying a keyword. In the topic search screen shown in FIG. 7, a plurality of topics related to the keyword are displayed by designating a keyword (for example, "customer tray") relating to the desired topic. By selecting any one of the displayed plurality of topics, the specific contents of the topic are displayed as a new help screen shown in FIG. 8 shows a state in which a topic "Customer tray size" is selected and a help screen including the specific contents is displayed.

In addition, a help screen in which a topic is selected and displayed includes sentences, drawings, tables, still images, moving images, animations, and the like, if necessary, which are referred to as hot spots in these sentences, drawings, tables, and still images. There is a part, and by clicking on the hot spot with the mouse 180, a pop-up window containing the meaning or related matter of the term for the part can be displayed, or another topic can be displayed. Therefore, if the contents (for example, sentences or drawings) contained in the first displayed help screen cannot be sufficiently understood, other help including more detailed contents (for example, still images or moving images) according to the operator's selection. You can also display the screen in stages. In addition, the input / output processing unit 162 may output a guidance voice from the speaker 184 in parallel with the above-described display operation of the various help screens.

As described above, in the IC test handler 100 of the present embodiment, when the system operation screen is displayed and in the input standby state, help screens relating to the respective items of the operation screen are displayed at the request of the operator. Detailed descriptions, drawings, images and the like can be displayed step by step. Therefore, each operator can know the contents of each item of the displayed operation screen in detail by designating the display contents according to the skill level.

In addition, even when a software change occurs due to the addition or update of an IC device to be tested, the help file corresponding to the changed software is simultaneously changed so that each item of the displayed operation screen and the explanation contents can be associated with each other. The defect that disappears disappears.

[Operation when Alarm is Displayed When an Error Occurs]

Hereinafter, an operation in which an alarm is displayed due to an abnormality occurring in the normal operation will be described. For example, considering the operation of replacing the IC device 118 from the customer tray 120 to the test tray 124 as a normal operation, the IC device 118 will fall in the middle.

FIG. 9 is a flowchart showing an operation procedure when the customer tray 120 is changed from the customer tray 120 to the test tray 124. A series of actions are executed by the action task executed by the sequence control unit 142 shown in FIG. The operation is performed.

First, an operation task executed by the sequence control unit 142 (in this embodiment, collectively referred to as an operation task and described as a task for general operation) is an electromagnetic valve through the input / output control unit 144. 174 is driven, and the suction device 126 sucks the IC device 118 on the customer tray 120 (step 401). After completion of the adsorption operation, the operation task checks whether or not the IC device 118 is adsorbed to the tip of the adsorption head 126 according to the output of the adsorption sensor 176 input to the input / output control unit 144 (step 402). ).

Upon confirming that the IC device 118 is adsorbed, the operation task then raises the adsorption head 126 with the IC device 118 adsorbed (step 403) and the IC by a position sensor (not shown). The device 118 confirms that the predetermined position has been reached and stops the ascending operation (step 404). Thereafter, the operation task checks whether the IC device 118 has fallen from the adsorption head 126 during the ascending operation in accordance with the output of the adsorption sensor 176 (step 405).

After confirming that the IC device 118 has not fallen, the operation task is then driven by rotating a motor (not shown) for moving the arm provided with the suction head 126, thereby moving the suction head 126 in the horizontal direction. The IC device is conveyed (step 406), the stop state is confirmed by the conveyance distance of the motor, and the conveyance operation is terminated (step 407). Thereafter, the operation task checks whether the IC device 118 has fallen from the adsorption head 126 during the conveyance operation in accordance with the output of the adsorption sensor 176 (step 408).

Upon confirming that the IC device 118 has not fallen, the operation task then lowers the adsorption head 126 with the IC device adsorbed (step 409), and the IC device 118 is moved to a predetermined position by the position sensor. It confirms that it has reached and stops the falling operation (step 410). Thereafter, the operation task checks whether the IC device 118 has fallen from the adsorption head 126 during the lowering operation in accordance with the output of the adsorption sensor 176 (step 411).

By the way, the operation task checks whether the IC device 118 has fallen in each of the above-described steps 402, 405, 408, and 411. For example, if the IC device 118 falls during the falling operation of step 409, The abnormal situation is detected (step 412), and an alarm output is requested to the state management task (hereinafter, referred to as "state management task") executed by the sequence control unit 142 (step 413).

Fig. 10 is a flowchart showing the operation procedure of the IC handler 100 when an abnormality occurs during normal operation, and shows the operation performed by the state management task. The state management task that receives the alarm output request from the operation task confirms that the alarm is not a request for a duplicate alarm with the currently output alarm (step 501), and counts up the cumulative occurrence number of the alarm (step 501). 502). In addition, an alarm output request that is duplicated with an alarm that is currently output is a case where an alarm output request is made by the same cause without restarting the abnormal situation that caused the alarm that occurred, and the same cause is caused. The count up operation of the cumulative number of occurrences described above is not performed. In addition, if the cumulative number of occurrences of the same alarm is frequently counted up and becomes a large value, there is a possibility that the cumulative number of occurrences of the same alarm may be inconsistent, so that countermeasures can be taken early by monitoring the cumulative number of occurrences.

Subsequently, the state management task requests the display of an alarm message to the input / output processing unit 162 in the user interface board 160 through the user interface conversion unit 148, and the input / output processing unit 162 displays on the LCD 112 screen. Predetermined alarm display is performed (step 503). In addition, the state management task outputs a warning sound indicating an abnormal situation from an alarm buzzer (not shown) through the input / output control unit 144 (step 504), and flashes the signal tower 116 in red. At the same time (step 505), the operation of the IC test handler 100 as a whole is stopped (step 506).

In this way, the state management task maintains the operation stop state of the entire IC test handler 100 until a series of processes are performed at the time of an abnormal situation, and an instruction of restart which is a normal operation is performed by the operator.

Next, an alarm display operation of the input / output processing unit 162 that has been requested to display an alarm from the above state management task will be described. 11 is a flowchart showing the operation procedure of the alarm display performed by the input / output processing unit 162. Upon receiving an alarm display request from the state management task, the input / output processing unit 162 displays a predetermined alarm message corresponding to the abnormal situation (step 601), and is prepared in advance for supplementary explanation of this content. The help file is activated (step 602).

12 is a diagram illustrating a display screen of an alarm message. The alarm message included in the display screen shown in FIG. 12 is an alarm code of several tens of digits, which is the same as the contents of the alarm display conventionally performed. Therefore, it is not easy for an operator who is not skilled in the operation to understand the contents and the release method of the generated alarm only by looking at the display.

In parallel with the display operation of the alarm message, the input / output processing unit 162 monitors whether or not the explanation of the alarm display and the guide display on how to cancel the abnormal state are requested by the operator (step 603). When the "guide display" button in the display screen shown in FIG. 12 is clicked by the operator by using the mouse 180, the input / output processing unit 162 then provides a detailed description corresponding to the alarm message displayed until then. The alarm release method is displayed (step 604).

13 is a view showing a display screen when a guide display button is clicked. As shown in Fig. 13, the display screen includes sentences indicating content explanations and specific contents of the releasing method, and also includes still images such as drawings, tables, and photographs for better understanding of these sentences. Therefore, the operator can easily understand what an alarm message means by looking at these display contents, and can know how to cancel an alarm which occurred.

For example, the display screen shown in FIG. 13 and the display screens shown in FIGS. 14 and 15 described later are created and displayed by executing a help file on Windows (registered trademark) which is a general-purpose OS. This help file is a collection of a plurality of topics to which a single information is assigned, which makes it easy to examine related information by having a link between each topic. In the screen shown in FIG. 13, there is a portion called a hot spot in a sentence of a content commentary or in a sentence of a release method, a figure, a table, or a still image. The hot spot is clicked with a mouse 180 to display it in FIG. As shown in the figure, a pop-up window may be displayed that includes a meaning of a term and the like. Alternatively, the pop-up window described above can be displayed by clicking the? Mark on the upper right of the screen and moving the pointer of the mouse 180 to click on a matter to know the meaning of the term or the like.

In addition, a "detailed guide" button is prepared on the display screen shown in FIG. 13 in consideration of the case where a more detailed guide is to be displayed. It is not necessary to provide a "detailed guide" button when it is easy to understand the content commentary shown in FIG. 13 and also easy to understand the generated alarm releasing method.

When the "Detail Guide" button is displayed, the input / output processing unit 162 monitors whether or not the display of the detailed guide is requested by the operator (step 605), and the "Detail Guide" button is pressed by the operator. ), A detailed guide on contents that are considered difficult to be understood only by a sentence, a drawing, or a still image of the content explanation or release method in the display screen shown in FIG. 13 is output.

15 is a diagram showing a specific example of the display screen when the detail display button is clicked. The display screen shown in FIG. 15 includes moving pictures or animations along with supplemental explanations that were not included in the display screen shown in FIG. By including the video file in the help file, the operation display can be performed in the help screen. For example, when it is necessary to exclude other structures in order to recover the fallen IC device 118, if the order can be explained by moving pictures (or animations), it is easy to understand and not skilled in operation. Even the operator can clear the alarm according to the indication. In addition, the input / output processing unit 162 outputs the operation guidance sound from the speaker 184 in parallel with the display shown in FIG. 15 as necessary.

When the alarm is released by the operator while viewing the display screen in this manner, and the restart switch (not shown) is pressed, the status management task sends an alarm message to the input / output processing unit 162 through the user interface conversion unit 148. Send an instruction to stop displaying the screen and the related help screen, and send an instruction through the input / output control unit 144 to switch the signal tower 116 to light green and stop the output of the alarm sound according to the alarm buzzer. . Thereafter, normal operation according to the operation task is resumed.

As described above, in the IC test handler 100 of the present embodiment, when an abnormality occurs and alarm display is performed, the specific contents and the alarm releasing method are gradually phased as a help screen including a drawing or a still image at the request of the operator. If necessary, the terminology can be displayed again or detailed guide information including a moving picture can be displayed. Therefore, each operator can know in detail the contents and the release method of the alarm which generate | occur | produced by selecting display content according to skill.

In addition, even when a software change occurs due to the addition or change of an IC device to be tested, a defect in which the displayed alarm contents and the explanation contents cannot be corresponded to each other by simultaneously changing the help file corresponding to the changed software. This disappears.

In addition, this invention is not limited to the said embodiment, A various implementation change can be implemented within the summary of this invention. For example, in the above-described embodiment, the case where the customer tray setting screen for setting various settings regarding the customer tray 120 is displayed as the system operation screen has been described. However, another setting screen or an operation instruction screen is displayed as the system operation screen. The same can be said for the case. For example, in a system operation screen for performing an operation instruction, if the displayed operation instruction is meaningful, but the timing for performing the operation instruction is unknown, a help screen is displayed to display sentences, drawings, moving images, animations, and the like. By giving specific explanations about them, it is possible to easily understand what the display items mean without looking at the manual book. In the above-described embodiment, the system setting screen is displayed so that a help screen is displayed when various setting data or operation instructions are input. In the help file prepared for displaying the help screen, various manual books (hardware introduction book, general Specifications, operation guides, maintenance instructions, programming instructions, etc.) may be included.

In addition, although the above-mentioned embodiment considered about the alarm which generate | occur | produces when the IC device 118 falls in the middle, it can also think about the alarm corresponding to the other abnormal situation similarly.

In addition, although Windows (registered trademark) has been considered as an OS used by the input / output processing unit 162, an OS having an equivalent function may be used. In the above-described embodiment, the user interface board 160 has a function as a personal computer, but a personal computer is connected to the IC test handler 100 and the above-described online help is displayed on the connected personal computer screen. The operation may be performed.

In addition, although the above-mentioned embodiment demonstrated the horizontal transfer type IC test handler 100, in the automatic test method or the IC test handler which combined these two methods, when a system operation screen is displayed, it overlaps a help screen. The online manual can be displayed by doing this. Alternatively, these IC test handlers may display an online manual when an alarm occurs.

Claims (11)

Display means for displaying predetermined notification contents; Help file storage means for storing a help file including at least detailed information on each item of the notification contents displayed by the display means; And a help function execution means for displaying the detailed information by executing the help file. The IC test handler according to claim 1, wherein the display means is constituted by a display device having a predetermined display screen and a processing device that creates image data on the notification contents displayed on the display screen. The IC test handler according to claim 1, wherein the help file storing means is a storage device for storing the help file as digital data in a predetermined storage medium. The IC test handler of claim 1, wherein the help function execution means is a processing device that executes the help file by a predetermined operating system. The notification content is an operation screen showing an operation procedure, The IC test handler of claim 1, wherein the detailed information included in the help file is information about content description of an item included in the operation screen. The IC test handler of claim 5, wherein the operation screen is a customer tray setting screen. The notification content is an alarm corresponding to the generated abnormality, The IC test handler of claim 1, wherein the detailed information included in the help file is information about a description of the alarm and a method of releasing the alarm. Further provided with abnormality detection means for detecting the occurrence of the abnormality, The notification is an alarm corresponding to the abnormality, The IC test handler of claim 1, wherein the detailed information included in the help file is information about a description of the alarm and a method of releasing the alarm. The IC test handler of claim 8, wherein the abnormality detecting means detects an abnormality occurring during an operation of replacing the IC device between the customer tray and the test tray. The IC test handler according to claim 1, wherein the help function executing means switches step by step the contents of the detailed information to be displayed when a specific portion of the display screen is instructed to be selected. And a pointing device for indicating an arbitrary position of the display screen of the display means. The IC test handler of Claim 1 which displays the said detailed information according to the said help function execution means with respect to what was indicated by the said pointing device among each item of the said notification content contained in the said display screen.