KR19980076885A - Mc683 시리즈 계열을 사용한 보드에서의 메모리 실장 확인 및 테스트 방법 - Google Patents
Mc683 시리즈 계열을 사용한 보드에서의 메모리 실장 확인 및 테스트 방법 Download PDFInfo
- Publication number
- KR19980076885A KR19980076885A KR1019970013781A KR19970013781A KR19980076885A KR 19980076885 A KR19980076885 A KR 19980076885A KR 1019970013781 A KR1019970013781 A KR 1019970013781A KR 19970013781 A KR19970013781 A KR 19970013781A KR 19980076885 A KR19980076885 A KR 19980076885A
- Authority
- KR
- South Korea
- Prior art keywords
- memory
- data
- series
- controller
- routine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3037—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a memory, e.g. virtual memory, cache
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3006—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system is distributed, e.g. networked systems, clusters, multiprocessor systems
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
- G06F11/321—Display for diagnostics, e.g. diagnostic result display, self-test user interface
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Quality & Reliability (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Signal Processing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Human Computer Interaction (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
Description
Claims (1)
- 제어기내의 2중 포트 램(DUAL PORT RAM)을 목적한 가능에 맞게끔 정확하게 초기화시키는 초기화 단계(S1)와; EPROM을 사용하기 위한 글로발 칩 셀렉트(GPOBAL CHIP SELECT) 및 메모리 뱅크, 또는 칩 셀렉트들을 목적한 용도로 설정을 하는 EPROM 설정단계(S2)와; 메모리에 임의의 데이타를 라이트하는 메모리 라이트 단계(S3)와; 메모리로부터 임의의 데이타를 리드하는 데이타 리드 단계(S4)와; 라이트 데이타와 리드 데이타를 비교하는 데이타 비교 단계(S5)와; 메모리의 범위내에서 비교한 데이타가 같은지 확인하여 같으면 메모리 라이트 단계(S3)로부터 다시 수행하고 아니면 다음 단계를 수행하는 비교 데이타 확인 단계(S6)와; 비교한 데이타가 다르면 메모리가 불량하거나 미 실장 상태이므로 특정 발광 다이오드를 점멸시키는 루틴(ROUTINE)을 수행하거나 제어기를 정지시키는 루틴 수행 또는 제어기 정지 단계(S7)와; 발광 다이오드 점멸 루틴에서는 특정 어드레스(ADDRESS) 및 제어기의 병렬 입/출력 포트를 이용해서 점멸시키는 발광 다이오드 점멸 단계(S8)를 포함하여 구성됨을 그 방법적 구성상의 특징으로 하는 MC683 시리즈 계열을 사용한 보드에서의 메모리 실장 확인 및 테스트 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970013781A KR100476293B1 (ko) | 1997-04-15 | 1997-04-15 | Mc683시리즈계열을사용한보드에서의메모리실장확인및테스트방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970013781A KR100476293B1 (ko) | 1997-04-15 | 1997-04-15 | Mc683시리즈계열을사용한보드에서의메모리실장확인및테스트방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19980076885A true KR19980076885A (ko) | 1998-11-16 |
KR100476293B1 KR100476293B1 (ko) | 2005-06-08 |
Family
ID=37302809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970013781A Expired - Fee Related KR100476293B1 (ko) | 1997-04-15 | 1997-04-15 | Mc683시리즈계열을사용한보드에서의메모리실장확인및테스트방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100476293B1 (ko) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW231343B (ko) * | 1992-03-17 | 1994-10-01 | Hitachi Seisakusyo Kk |
-
1997
- 1997-04-15 KR KR1019970013781A patent/KR100476293B1/ko not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100476293B1 (ko) | 2005-06-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7143236B2 (en) | Persistent volatile memory fault tracking using entries in the non-volatile memory of a fault storage unit | |
US5996096A (en) | Dynamic redundancy for random access memory assemblies | |
US6092146A (en) | Dynamically configurable memory adapter using electronic presence detects | |
US7487413B2 (en) | Memory module testing apparatus and method of testing memory modules | |
CA1291269C (en) | Efficient address test for large memories | |
US7398439B2 (en) | Semiconductor device with memory and method for memory test | |
CN112382328B (zh) | 内存测试装置以及测试电压调整方法 | |
US5109382A (en) | Method and apparatus for testing a memory | |
US7197675B2 (en) | Method and apparatus for determining the write delay time of a memory utilizing the north bridge chipset as in charge of the works for checking the write delay time of the memory | |
KR100618870B1 (ko) | 데이터 트레이닝 방법 | |
KR100383479B1 (ko) | 디지털 반도체 회로를 테스트하기 위한 회로 및 방법 | |
US8103818B2 (en) | Memory module and auxiliary module for memory | |
US6781398B2 (en) | Circuit for testing an integrated circuit | |
KR100476293B1 (ko) | Mc683시리즈계열을사용한보드에서의메모리실장확인및테스트방법 | |
US6819598B2 (en) | Memory module self identification | |
US20080195821A1 (en) | Method and system of fast clearing of memory using a built-in self-test circuit | |
US7251773B2 (en) | Beacon to visually locate memory module | |
KR100410816B1 (ko) | 메모리 장치 | |
JPS608556B2 (ja) | メモリ−のリフレツシユカウンタ−検査方法及び装置 | |
AU641968B2 (en) | Method of testing read/write memories | |
JPS62192100A (ja) | ダイナミツク形半導体記憶装置 | |
KR100254621B1 (ko) | 메모리 모듈의 불량소자 검출기 | |
KR200319278Y1 (ko) | 메모리 라이트 시스템 | |
KR101948152B1 (ko) | 메모리 모듈의 검사 장치 및 방법 | |
US20070094554A1 (en) | Chip specific test mode execution on a memory module |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19970415 |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20020415 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19970415 Comment text: Patent Application |
|
N231 | Notification of change of applicant | ||
PN2301 | Change of applicant |
Patent event date: 20040116 Comment text: Notification of Change of Applicant Patent event code: PN23011R01D |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20040331 Patent event code: PE09021S01D |
|
N231 | Notification of change of applicant | ||
PN2301 | Change of applicant |
Patent event date: 20040430 Comment text: Notification of Change of Applicant Patent event code: PN23011R01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20041216 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20050303 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20050304 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |
Termination category: Default of registration fee Termination date: 20090210 |