KR101392399B1 - Burn-in socket for test - Google Patents

Abstract

The present invention relates to a burn-in socket for a test and, more specifically, to a burn-in socket for the test comprising: a socket base fixed on an inspection circuit board and in which a base hole is formed at the center; a medium member connected to the terminal of the inspection circuit board in an insertion state within the base hole; a cover member slidingly combined on the socket base and including a cover hole connected to the base hole; a floating member inserted into the cover hole of the cover member and for slidingly mounting the inspected device between a first location connected to the medium member and a second location separately arranged from the medium member; and a ratchet unit for releasing or fixing the location of the inspected device mounted in the floating member along the rising or dropping of the cover member in the burn-in socket for the test for electrically connecting an inspected device to the inspection circuit board.

Description

{Burn-in socket for test}

The present invention relates to a test burn-in socket, and more particularly to a test burn-in socket in which a floating member for seating a semiconductor device is movable in a vertical direction.

In general, semiconductor chips are subjected to various tests after manufacture to confirm the reliability of the products. This test is an electrical test in which all the input / output terminals of a semiconductor chip are connected to a test signal generating circuit to test normal operation and disconnection, and a test signal generating circuit by connecting some input / output terminals such as a power input terminal of the semiconductor chip, There is a burn-in test in which stress is applied by a temperature, a voltage and a current higher than a condition to check the life of the semiconductor chip and whether a defect occurs.

As a result, when the semiconductor chip is used in a steady state, such a defect, for example, a breakdown of the insulating film of the gate oxide film, which may cause a failure, must occur. Therefore, the burn-in test is to detect the defective chip during the test and remove it before shipment to ensure the reliability of the product.

1 is a sectional view of a conventional test socket, specifically, a socket disclosed in Korean Patent Publication No. 10-2012-0054548.

Such a conventional socket 100 is provided with a base member 20, a cover member 30, a plurality of contacts 40, and a base member 20 which are rotatably supported by the base member 20, An adapter 50 which rotates in response to the rotation of the cover member 30 and moves upward and downward in response to movement of the cover member 30 by providing a mounting surface for the IC package and being attached to the base member 20; And a latch plate 200 rotatably attached to the adapter 50A and urged by an elastic member. At this time, a latch guide 58 for moving the latch plate 200 in the vertical direction is formed in the adapter 50A when the latch plate 200 presses the IC package.

The socket according to this conventional technique has a pin type electrical connection means in contact with the IC package inside the base member 20. [ The electrical connecting means is disposed at the lower end of the IC package, and the lower end of the electrical connecting means is in contact with the test signal generating circuit.

The height of the electrical connection means of the IC package is fixed to a fixed level, which causes compatibility with various equipment. That is, there is a difference in the height at which the IC package can be mounted on the socket, depending on the type of the equipment for transporting the IC package. However, since the height of the electrical connection means is fixed, it is required to be used with specific equipment.

In addition, the conventional pin-type electrical connection means is required to manufacture a large number of pins, and accordingly, in the case of an IC package having a fine pitch, the assembly is not easy and the manufacturing cost is high.

In the conventional pin type socket, in order to align the IC package in place, the inner edge of the base member is often used or the edge of the electrical connection means is used, but in the IC package having a fine pitch terminal There is a problem that it is difficult to apply it as it is.

1. Korean Patent Publication No. 10-2011-0085710

It is an object of the present invention to provide a burn-in socket for test, which is compatible with various equipment, is easy to assemble and manufacture, and can easily be aligned with a device to be inspected .

According to an aspect of the present invention, there is provided a burn-in socket for testing, comprising a test board for electrical inspection of an inspected device, a test for electrically connecting the inspected device electrically connected to the test board to be inspected, In the burn-in socket,

A socket base fixedly mounted on the test board and having a base hole formed at a center thereof;

An intermediate member in contact with a terminal of the test board in a state of being inserted into the base hole;

A cover member coupled to the socket base so as to be slidable up and down and having a cover hole communicating with the base hole;

Wherein the inspecting device is slidable between a first position where the lower end is in contact with the intermediate member and a second position which is spaced upward from the intermediate member and which is inserted into the cover hole of the cover member, A floating member; And

And ratchet means for fixing or releasing the position of the device to be inspected which is seated in the floating member in accordance with the rising or falling of the cover member.

In the test burn-in socket,

The floating member includes a floating body provided with an insertion hole into which a device to be inspected can be inserted at a center thereof, and a position supporting the inspecting device by closing the insertion hole of the floating body, And a support member on which an alignment section is provided.

In the test burn-in socket,

The alignment unit may be a through-hole formed at each position corresponding to a terminal of the device to be inspected.

In the test burn-in socket,

The through hole may have a size corresponding to a terminal of the device to be inspected.

In the test burn-in socket,

The support member may be attached to the lower end of the floating body.

In the test burn-in socket,

The upper supporting member may be a film made of a non-conductive synthetic resin material.

In the test burn-in socket,

The floating member can be elastically supported by the elastic supporting means.

In the test burn-in socket,

The elastic supporting means may be disposed between the socket base and the floating member.

In the test burn-in socket,

Wherein the socket base is provided with a guide rod for fitting the elastic supporting means therein,

The floating member may be provided with an inner hole at a position corresponding to the guide rod, the inner hole being inserted into the elastic supporting means.

In the test burn-in socket,

The intermediate member may be provided with a conductive portion including a conductive powder in the elastic material at a position corresponding to the terminal of the device to be inspected on the PCB.

The burn-in socket for testing according to the present invention is advantageous in that the floating member for seating the device to be inspected is slidable in the up-and-down direction and is compatible with various equipment.

In addition, the test burn-in socket according to the present invention has an advantage that the height of the intermediate member for electrically connecting the device to be inspected to the test board side can be varied, so that the intermediate member can be easily assembled and the assembly time can be shortened .

In addition, the test burn-in socket according to the present invention is advantageous in that the through-holes for aligning the devices to be inspected are formed on the supporting member of the floating member, thereby ensuring alignment of the devices to be inspected.

1 shows a socket for testing according to the prior art;
2 is an exploded perspective view of a burn-in socket for testing according to an embodiment of the present invention;
FIG. 3 is an exploded perspective view of the main part of FIG. 2; FIG.
Fig. 4 is a cross-sectional view of the burn-in socket of Fig. 2; Fig.
5 is a plan view of the burn-in socket of FIG. 2;
6 is a cross-sectional view taken along the line VI-VI of FIG.
7 is a cross-sectional view taken along line VII-VII of FIG. 5;
Figs. 8 to 10 are operation diagrams of Fig.

Hereinafter, a test burn-in socket of the present invention will be described in detail with reference to the accompanying drawings.

A test burn-in socket 100 according to the present invention includes an inspection board 210 for electrically inspecting a device 200 to be inspected, a device to be inspected (not shown) electrically connected to the inspection board 210 200, and the socket base 110, the intermediate member 120, the cover member 130, the floating member 140, and the ratchet means 150.

The socket base 110 is fixedly mounted on the inspection board 210 and includes a plurality of side walls 111 which are upwardly formed as a whole in a rectangular tube shape. A base hole 111a is formed at the center of the plurality of side walls 111 and a floating member 140 may be inserted into the base hole 111a. The pair of side walls 111 facing each other is provided with a protrusion 112 protruding downward on the bottom surface thereof so that the intermediate member 120 is engaged with the protrusion 112 to adjust the position of the intermediate member 120 Respectively.

A pair of side walls 111 facing each other among the plurality of side walls 111 are formed at the center of the pair of side walls 111 to prevent detachment of the cover member 130 from the socket base 110 when the cover member 130 is coupled to the socket base 110. [ (Not shown). In addition, the plurality of side walls 111 are formed with spring insertion holes 141a and 114 extending downward from the upper end. The spring insertion holes 141a and 114 may be formed with springs 117 that elastically support the cover member 130 upward.

Each of the side walls 111 is provided with a guide part 115 which protrudes upward from the upper side and the guide part 115 guides the cover member 130 and the floating member 140 slide up and down do.

A supporting piece 116 protruding toward the center of the base hole 111a is provided at the lower end of the side wall 111. The supporting piece 116 is provided with elastic supporting means 143 for elastically supporting the floating member 140 So that the guide rod 116a can be inserted.

The intermediate member 120 is in contact with a terminal of the inspection substrate 210 while being inserted into the base hole 111a. The intermediate member 120 can be brought into contact with the test substrate 210 and the upper surface can be brought into contact with the bottom surface of the floating member 140. The intermediate member 120 is provided with a conductive portion 121 at each position corresponding to the terminal of the test board 210. The lower end of the conductive part 121 may be connected to the terminal of the inspection board 210 and the upper end thereof may be in contact with the terminal 201 of the device under test 200. [ The conductive part 121 may have a structure in which a plurality of conductive powders are contained in an elastic material such as silicone rubber. A material other than the conductive part 121 may be used for a common PCB.

The intermediate member 120 has a substantially rectangular plate shape and is provided with a coupling portion 122 protruding from the center of the edge and engaged with the protrusion 112 of the socket base 110.

The cover member 130 is vertically coupled to the socket base 110 so as to be slidable and includes a cover hole 131a communicating with the base hole 111a. Specifically, the cover member 130 includes a cover body 131 having a substantially rectangular frame shape and a ratchet support portion 132 extending downward from a lower end of the cover body 131. The ratchet means (150) is hingedly coupled to the ratchet support (132).

Meanwhile, the cover member 130 is elastically supported by the spring 117 disposed on the socket base 110.

The floating member 140 is inserted into the cover hole 131a of the cover member 130 and is inserted into the cover member 130 at a first position where the lower end is in contact with the intermediate member 120, (The position shown in FIG. 7), which is spaced upward from the first position (the position shown in FIG. 7), and the inspected device 200 can be seated therein. The floating member 140 includes a floating body 141 having an insertion hole 141a at a center thereof so that the inspected device 200 can be inserted into the insertion hole 141a of the floating body 141, And a support member 142 for supporting the device 200 to be inspected.

The floating body 141 has a rectangular frame shape having an outer size corresponding to the cover hole 131a and an insertion hole 141a having a size corresponding to the device 200 to be inspected is formed inside the floating body 141 . A plurality of coupling protrusions 141c protruding downward are formed at the lower end of the floating body 141. [ The floating body 141 is provided with an inner hole 141b through which the elastic supporting member 142 inserted into the guide rod 116a can be inserted. As shown in FIG.

The support member 142 is coupled to the lower end of the floating body 141 and supports the device under test 200 placed in the insertion hole 141a. The supporting member 142 is formed of a film made of a non-conductive synthetic resin material, and a through hole 142a is formed at a position corresponding to the terminal of the device under test 200. [ Each of the through holes 142a has a size corresponding to the terminal of the device under test 200. Specifically, the through hole 142a may have a circular hole shape having a diameter slightly larger than the terminal of the device under test 200 have. The through hole 142a functions as a position aligning unit for aligning the device 200 to be inspected in a predetermined position. Specifically, a terminal of the device under test 200 is inserted into the through hole 142a, So that it can be placed on a desired position.

 Such a floating member 140 can be elastically supported by elastic supporting means 143 fitted in the guide rod 116a of the socket base 110. [ At this time, the elastic supporting means 143 is disposed between the socket base 110 and the floating member 140, and may be a conventional coil spring. The floating member 140 allows the device 200 to be inspected to be spaced apart from the intermediate member 120 by a predetermined height. When the device under test 200 is pressed by an external force, So that the terminal of the inspected device 200 can be brought into contact with the intermediate member 120.

The ratchet means 150 may fix or fix the position of the device under test 200 that is seated in the floating member 140 according to the rising or falling of the cover member 130, More specifically, when the cover member 130 is lowered, the ratchet means 150 opens the insertion hole of the floating member to allow the device 200 to be inspected to be inserted into the floating member 140, The inspecting device inserted in the floating member is pressed and fixed while closing the insertion hole.

The ratchet means 150 comprises a ratchet 151 and a ratchet pusher 152. The ratchet 151 includes a first through hole 142a which is hingedly secured by a first pin 153 supported by the ratchet support 132 of the cover member 130, And a second through hole 142a which is engaged with a ratchet pusher 152 which presses the device under test 200. The second through hole 142a is provided with a first slit,

The ratchet pusher 152 is hingedly connected to the ratchet 151 and the third pin 155 by the second through-hole 142a and is configured to press and fix the upper surface of the device under test 200 . Meanwhile, since the ratchet means 150 is a conventional technique, a detailed description thereof will be omitted.

The test burn-in socket 100 according to the present invention has the following operational effects.

First, when the cover member 130 is pressed, the ratchet means 150 opens the insertion hole 141a, and accordingly, the device under test 200 that has been carried from the predetermined tray as shown in FIG. 7 is moved to the floating member 140 (Not shown). At this time, the terminals of the device under test 200 may be aligned with the through holes 142a of the support member 142. The floating member 140 may be positioned to be spaced apart from the median by a predetermined height while being elastically supported by the elastic supporting means 143. Thereafter, when the device under test 200 is lowered while lifting the cover member 130, as shown in FIGS. 8 and 9, the ratchet means 150 moves toward the center of the device under test 200 The insertion hole is gradually closed and the floating member 140 on which the device under test 200 is placed is gradually lowered. 10, the lower surface of the floating member 140 comes into contact with or comes into contact with the intermediate member 120, and the ratchet means 150 is moved to the side of the intermediate member 120. As a result, The position of the device under test 200 is fixed by contacting the upper surface of the inspection device 200. At this time, the terminal of the device under test 200 comes into contact with the conductive part 121 of the intermediate member 120. Thereafter, when a predetermined inspection signal is applied from the inspection board 210, the inspection signal is transmitted to the terminal of the device under test 200 through the intermediate member 120, and a predetermined test is performed.

On the other hand, when the predetermined test is completed, the cover member 130 is pushed, the ratchet means 150 opens the insertion hole 141a, and the floating member gradually rises. At this time, as the cover member 130 is lowered, the ratchet means 150, which has been fixed by pressing the device 200 to be inspected, operates in the order of FIGS. 9 to 7 while releasing the fixation of the device under test 200 . And the inspected device is raised to the position shown in FIG.

In the test burn-in socket according to the embodiment of the present invention, even when the thickness of the intermediate member is small, the floating member for seating the device to be inspected can compensate for the difference in height while moving up and down, There are advantages. That is, there is an advantage that it can be used as it is without adding or replacing a separate medium according to the equipment.

Further, in the present invention, since a thin intermediate member can be applied, the overall manufacturing cost can be lowered and the manufacturing time can be shortened.

Further, in the burn-in socket of the present invention, a plurality of through holes are formed in the supporting member for aligning the device to be inspected, so that the terminals of the device to be inspected can be positively positioned on the intermediate member.

The burn-in socket according to the present invention can be modified as follows.

In the above-described embodiment, the floating member is supported by the spring, but the present invention is not limited thereto, and various elastic deformable means may be used.

Also, in the above-described embodiments, a plurality of conductive particles are distributed in the conductive part of the intermediate member. However, the present invention is not limited thereto, and conductive wires or various shapes may be distributed in the silicone rubber. It is also possible that the shape and configuration of the conductive parts are variously modified.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, and many modifications may be made without departing from the scope of the present invention.

100 ... burn-in socket 110 ... socket-base
111 .. Side wall 111a ... Base hole
112 ... protruding portion 113 ... engaging portion
114 ... spring insertion hole 115 ... guide portion
116 ... support piece 116a ... guide rod
120 ... intermediate member 121 ... conductive member
122 ... engaging portion 130 ... cover member
131 ... Cover body 131a ... Cover hole
132 ... ratchet support portion 140 ... floating member
141 ... floating body 141a ... insertion hole
141b ... inner hole 142 ... supporting member
142a ... through hole 150 ... ratchet means
151 ... ratchet 151a ... first through hole
151b ... first slit 151c ... second through hole
152 ... ratchet pusher 153 ... first pin
154 ... second pin 155 ... third pin
200 ... inspected device 201 ... terminal
210 ... test board

Claims (10)

A test burn-in socket for electrically connecting an inspection substrate for electrical inspection of a device to be inspected and an inspected device electrically connected to the inspection substrate to be inspected,
A socket base fixedly mounted on the test board and having a base hole formed at a center thereof;
An intermediate member in contact with a terminal of the test board in a state of being inserted into the base hole;
A cover member coupled to the socket base so as to be slidable up and down and having a cover hole communicating with the base hole;
Wherein the inspecting device is slidable between a first position in which the lower end is in contact with the intermediate member and a second position in which it is spaced upward from the intermediate member and inserted into the cover hole of the cover member, A floating member; And
And a ratchet means for fixing or releasing the position of the device to be inspected which is seated in the floating member in accordance with the rising or falling of the cover member. The method according to claim 1,
The floating member includes:
A floating body having an insertion hole through which a device to be inspected can be inserted,
And a supporting member provided with a positioning portion for supporting the device to be inspected by closing the insertion hole of the floating body and aligning the position of the device to be inspected. 3. The method of claim 2,
Wherein the alignment unit is a through hole formed at each position corresponding to a terminal of the device to be inspected. The method of claim 3,
Wherein the through hole has a size corresponding to a terminal of the device to be inspected. 3. The method of claim 2,
Wherein the support member comprises:
And is attached to the lower end of the floating body. 3. The method of claim 2,
The upper support member,
A test burn-in socket characterized by being a film made of a non-conductive synthetic resin material. The method according to claim 1,
The floating member includes:
And is resiliently supported by elastic supporting means. 8. The method of claim 7,
Wherein the elastic supporting means is disposed between the socket base and the floating member. 9. The method of claim 8,
Wherein the socket base is provided with a guide rod for fitting the elastic supporting means therein,
Wherein the floating member is provided with an inner hole which is inserted into the elastic supporting means at a position corresponding to the guide rod. The method according to claim 1,
Wherein the intermediate member comprises:
Wherein a conductive portion including conductive powder in an elastic material is provided at a position corresponding to a terminal of the device to be inspected on the PCB.

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