KR101203325B1 - 시트-기반 물품에 대한 재고품 제어 - Google Patents
시트-기반 물품에 대한 재고품 제어 Download PDFInfo
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- KR101203325B1 KR101203325B1 KR1020067015524A KR20067015524A KR101203325B1 KR 101203325 B1 KR101203325 B1 KR 101203325B1 KR 1020067015524 A KR1020067015524 A KR 1020067015524A KR 20067015524 A KR20067015524 A KR 20067015524A KR 101203325 B1 KR101203325 B1 KR 101203325B1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30124—Fabrics; Textile; Paper
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30136—Metal
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Textile Engineering (AREA)
- General Factory Administration (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
- Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
Abstract
Description
Claims (27)
- 시트의 순차 부분을 이미징(imaging)하여 디지털 정보를 제공하는 단계,디지털 정보를 적어도 하나의 초기 알고리즘을 가지고 처리하여 시트 상의, 이상(anomaly)을 포함하는 부분들을 식별하는 단계,복수의 변환 장소 중 하나를 선택하여 시트를 제품으로 변환하는 단계,디지털 정보의 적어도 일부를, 상기 제품에 대한 요건에 기초하여 선택된 하나 이상의 후속 알고리즘을 가지고 자동으로 분석하여 어떤 이상이 제품에 대한 시트에서 실제 결함을 나타내는지 판정하는 단계, 및시트를 판정된 실제 결함에 기초하여 선택된 변환 장소에서 제품으로 변환하는 단계를 포함하는 방법.
- 제1항에 있어서,복수의 변환 장소 중 하나를 선택하는 단계는복수의 변환 장소 각각에 대한 적어도 하나의 장소 선택 파라미터 값을 결정하는 단계로서, 장소 선택 파라미터는 복수의 변환 장소 각각에서의 제품에 대한 재고 수준, 복수의 변환 장소 각각에서의 제품에 대한 주문 잔량, 복수의 변환 장소 각각에서의 제품에 대한 시장 수요 또는 복수의 변환 장소 각각에서의 제품에 대한 변환 시간 중 하나 이상을 포함하는, 적어도 하나의 장소 선택 파라미터 값을 결정하는 단계, 및변환 장소 각각에 대하여 결정된 값에 기초하여 복수의 변환 장소로부터 변환 장소를 선택하는 단계를 포함하는 방법.
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- 시트의 순차 부분을 이미징하여 디지털 정보를 제공하는 이미징 장치,디지털 정보를 초기 알고리즘을 가지고 처리하여 시트 상의, 이상을 포함하는 부분들을 식별하는 분석 컴퓨터, 및복수의 변환 장소 중 하나를 선택하여 시트를 제품으로 변환하고, 디지털 정보의 적어도 일부를, 상기 제품에 대한 요건에 기초하여 선택된 적어도 하나의 후속 알고리즘을 가지고 자동으로 분석하여 어떤 이상이 제품에 대한 시트에서 실제 결함을 나타내는지 판정하는 변환 제어 시스템을 포함하는, 시스템.
- 제4항에 있어서,변환 제어 시스템은 복수의 변환 장소 각각에 대하여 적어도 하나의 장소 선택 파라미터의 값을 결정하고, 변환 장소 각각에 대하여 결정된 값에 기초하여 시트의 변환을 위해 변환 장소 중 하나를 선택하고,장소 선택 파라미터는 복수의 변환 장소 각각에서의 제품에 대한 재고 수준, 복수의 변환 장소 각각에서의 제품에 대한 주문 잔량, 복수의 변환 장소 각각에서의 제품에 대한 시장 수요 또는 복수의 변환 장소 각각에서의 제품에 대한 변환 시간 중 하나 이상을 포함하는, 시스템.
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Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US53359603P | 2003-12-31 | 2003-12-31 | |
US60/533,596 | 2003-12-31 | ||
PCT/US2004/043623 WO2005065305A2 (en) | 2003-12-31 | 2004-12-29 | Inventory control for web-based articles |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060127959A KR20060127959A (ko) | 2006-12-13 |
KR101203325B1 true KR101203325B1 (ko) | 2012-11-20 |
Family
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Application Number | Title | Priority Date | Filing Date |
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KR1020067015524A Expired - Fee Related KR101203325B1 (ko) | 2003-12-31 | 2004-12-29 | 시트-기반 물품에 대한 재고품 제어 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7120515B2 (ko) |
EP (1) | EP1702299A4 (ko) |
JP (1) | JP2007523810A (ko) |
KR (1) | KR101203325B1 (ko) |
BR (1) | BRPI0418285A (ko) |
WO (1) | WO2005065305A2 (ko) |
Families Citing this family (16)
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US7623699B2 (en) | 2004-04-19 | 2009-11-24 | 3M Innovative Properties Company | Apparatus and method for the automated marking of defects on webs of material |
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US7545971B2 (en) * | 2005-08-22 | 2009-06-09 | Honeywell International Inc. | Method and apparatus for measuring the crepe of a moving sheet |
WO2007096475A1 (en) * | 2006-02-22 | 2007-08-30 | Viconsys Oy | Method for monitoring a rapidly-moving paper web and corresponding system |
ATE445872T1 (de) * | 2007-02-01 | 2009-10-15 | Abb Oy | Verfahren zur erstellung eines optimierten schnittplans für ein streifenförmiges material |
US8175739B2 (en) * | 2007-07-26 | 2012-05-08 | 3M Innovative Properties Company | Multi-unit process spatial synchronization |
US20090028417A1 (en) * | 2007-07-26 | 2009-01-29 | 3M Innovative Properties Company | Fiducial marking for multi-unit process spatial synchronization |
US7542821B2 (en) * | 2007-07-26 | 2009-06-02 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
US7937233B2 (en) * | 2008-04-17 | 2011-05-03 | 3M Innovative Properties Company | Preferential defect marking on a web |
US7797133B2 (en) * | 2008-09-10 | 2010-09-14 | 3M Innovative Properties Company | Multi-roller registered repeat defect detection of a web process line |
US8270701B2 (en) | 2010-01-08 | 2012-09-18 | 3M Innovative Properties Company | Optical web-based defect detection using intrasensor uniformity correction |
CN102339296A (zh) * | 2010-07-26 | 2012-02-01 | 阿里巴巴集团控股有限公司 | 一种查询结果的排序方法和装置 |
US10119225B2 (en) | 2014-04-15 | 2018-11-06 | Gpcp Ip Holdings Llc | Systems for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web |
JP2018036890A (ja) * | 2016-08-31 | 2018-03-08 | 富士通株式会社 | 情報処理装置、情報処理システムおよび情報処理方法 |
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2004
- 2004-12-29 JP JP2006547467A patent/JP2007523810A/ja active Pending
- 2004-12-29 KR KR1020067015524A patent/KR101203325B1/ko not_active Expired - Fee Related
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JP2000241358A (ja) * | 1998-07-03 | 2000-09-08 | Nkk Corp | 欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法 |
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EP1702299A4 (en) | 2011-11-23 |
BRPI0418285A (pt) | 2007-05-02 |
US7120515B2 (en) | 2006-10-10 |
WO2005065305A2 (en) | 2005-07-21 |
KR20060127959A (ko) | 2006-12-13 |
JP2007523810A (ja) | 2007-08-23 |
WO2005065305A3 (en) | 2008-04-24 |
US20050144094A1 (en) | 2005-06-30 |
EP1702299A2 (en) | 2006-09-20 |
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