KR100837436B1 - 기판 검사 및 측정 장치 - Google Patents
기판 검사 및 측정 장치 Download PDFInfo
- Publication number
- KR100837436B1 KR100837436B1 KR1020070036156A KR20070036156A KR100837436B1 KR 100837436 B1 KR100837436 B1 KR 100837436B1 KR 1020070036156 A KR1020070036156 A KR 1020070036156A KR 20070036156 A KR20070036156 A KR 20070036156A KR 100837436 B1 KR100837436 B1 KR 100837436B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- inspection
- unit
- guide
- loading
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 48
- 238000005259 measurement Methods 0.000 title claims abstract description 20
- 239000000758 substrate Substances 0.000 claims abstract description 125
- 238000012546 transfer Methods 0.000 claims abstract description 37
- 238000000034 method Methods 0.000 claims abstract description 30
- 230000036316 preload Effects 0.000 claims description 5
- 230000007547 defect Effects 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000007665 sagging Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
- B65G49/064—Transporting devices for sheet glass in a horizontal position
- B65G49/065—Transporting devices for sheet glass in a horizontal position supported partially or completely on fluid cushions, e.g. a gas cushion
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67784—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/24—Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
- B65G2249/045—Details of suction cups suction cups
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (4)
- 에어를 이용하여 기판을 일정 높이 부상시키도록 검사 테이블 상에 구비되는 로딩부(10)와 언로딩부(10'),상기 기판을 검사하도록 상기 로딩부(10)와 언로딩부(10') 사이에 구비되는 공정부(20);상기 기판을 진공 흡착하여 상기 로딩부(10)로부터 상기 공정부(20) 및 상기 언로딩부(10')로 이송하도록 상기 검사 테이블(1)의 중앙부에 구비되는 이송장치(30)를 포함하여 구성되는 기판 검사 및 측정 장치에 있어서,상기 공정부(20)는;둘레에 에어 토출부(211)가 형성되고 중앙부에 진공 흡입부(212)가 형성되며 에어 토출부(211)와 진공 흡입부(212) 사이에 대기압부(213)가 형성된 다수의 예압포켓(21)을 구비하여 기판이 부상 및 예압되도록 함을 특징으로 하는 기판 검사 및 측정 장치.
- 제 1항에 있어서,상기 이송장치(30)는;상기 검사 테이블(1) 상에 구비되는 가이드(31)와,상기 가이드(31) 측부에 구비되는 리니어모터(32)와,상기 리니어모터(32)의 구동에 의해 상기 가이드(31)의 길이 방향으로 이동 하도록 상기 리니어모터(32)에 블록(37)을 통해 연결되는 패드지지부(33), 및상기 패드지지부(33)의 상부에 구비되어 상기 기판을 진공 흡착하는 진공패드(34)를 포함하여 구성되는 것을 특징으로 하는 기판 검사 및 측정 장치.
- 제 2항에 있어서,상기 패드지지부(33)와 상기 가이드(31) 사이에는 마찰력 발생을 방지하기 위한 에어베어링(35)이 더 구비됨을 특징으로 하는 기판 검사 및 측정 장치.
- 제 2항 또는 제 3항에 있어서,상기 이송장치(30)는;상기 가이드(31)의 길이 방향으로 이동하는 상기 패드지지부(33)의 진행 경로를 제어하기 위한 PZT 엑츄에이터(36)를 더 구비함을 특징으로 하는 기판 검사 및 측정 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070036156A KR100837436B1 (ko) | 2007-04-12 | 2007-04-12 | 기판 검사 및 측정 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070036156A KR100837436B1 (ko) | 2007-04-12 | 2007-04-12 | 기판 검사 및 측정 장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR100837436B1 true KR100837436B1 (ko) | 2008-06-12 |
Family
ID=39771021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070036156A Expired - Fee Related KR100837436B1 (ko) | 2007-04-12 | 2007-04-12 | 기판 검사 및 측정 장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100837436B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101141071B1 (ko) * | 2011-12-01 | 2012-05-03 | 디아이티 주식회사 | 공기 부상 유리기판 이송 장치에 있어 유리 기판 외곽부 형상 개선을 위한 아이들 롤러 장치 |
KR20210073933A (ko) | 2019-12-11 | 2021-06-21 | (주)미래컴퍼니 | 테라헤르츠파를 이용한 기판 검사 시스템 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020076553A (ko) * | 2001-03-29 | 2002-10-11 | 삼성전자 주식회사 | 반도체 패키지의 마킹장치 |
KR20040047062A (ko) * | 2002-11-29 | 2004-06-05 | (주)넥스트인스트루먼트 | 스테이지 방식을 갖는 다목적 광학 검사용 디스플레이패널 이송장치 |
-
2007
- 2007-04-12 KR KR1020070036156A patent/KR100837436B1/ko not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020076553A (ko) * | 2001-03-29 | 2002-10-11 | 삼성전자 주식회사 | 반도체 패키지의 마킹장치 |
KR20040047062A (ko) * | 2002-11-29 | 2004-06-05 | (주)넥스트인스트루먼트 | 스테이지 방식을 갖는 다목적 광학 검사용 디스플레이패널 이송장치 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101141071B1 (ko) * | 2011-12-01 | 2012-05-03 | 디아이티 주식회사 | 공기 부상 유리기판 이송 장치에 있어 유리 기판 외곽부 형상 개선을 위한 아이들 롤러 장치 |
KR20210073933A (ko) | 2019-12-11 | 2021-06-21 | (주)미래컴퍼니 | 테라헤르츠파를 이용한 기판 검사 시스템 |
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