KR100687866B1 - 메모리장치의 데이터 입출력 장치 - Google Patents
메모리장치의 데이터 입출력 장치 Download PDFInfo
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- KR100687866B1 KR100687866B1 KR1020040025510A KR20040025510A KR100687866B1 KR 100687866 B1 KR100687866 B1 KR 100687866B1 KR 1020040025510 A KR1020040025510 A KR 1020040025510A KR 20040025510 A KR20040025510 A KR 20040025510A KR 100687866 B1 KR100687866 B1 KR 100687866B1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1048—Data bus control circuits, e.g. precharging, presetting, equalising
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1069—I/O lines read out arrangements
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
Abstract
Description
그리고, 본 발명은 센스앰프로부터 입력되는 제1GIO 신호와 제2GIO 신호를 비교하여 제어신호를 출력하는 비교부와; 상기 제어신호에 응답하여 상기 제2GIO 신호를 상기 제1GIO 신호와 동일한 극성을 갖도록 출력하는 제1,2 전달부와; 상기 제어신호에 응답하여 상기 제1,2 전달부의 출력신호를 상기 제2GIO 신호와 동일한 극성을 갖도록 출력하는 제3,4 전달부;를 포함한다.
Claims (7)
- 메모리장치의 각 뱅크에 설치된 입출력 센스앰프로부터 GIO 신호를 입력받아 인접한 GIO 신호들과 비교하여 제어신호를 출력하는 비교부와, 상기 제어신호에 응답하여 상기 GIO 신호가 상기 인접한 GIO 신호들과 동일한 극성을 갖도록 상기 GIO 신호를 바이패스 또는 반전시켜 출력하는 제1,2 전달부를 포함하는 트랜시버와;상기 트랜시버로부터 출력되는 GIO 신호를 상기 제어신호에 응답하여 바이패스 또는 반전시켜 드라이버로 출력하는 제3,4 전달부를 포함하는 리시버;로 이루어진 것을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 제 1항에 있어서, 상기 트랜시버는복수개의 GIO 신호를 입력받아 어느 하나의 GIO 신호는 바이패스시켜 출력하고,다른 하나의 GIO 신호는 어느 하나의 GIO 신호와 비교하여 제어신호를 출력하는 비교부와,상기 비교부의 제어신호에 따라 다른 하나의 GIO 신호를 바이패스시켜 출력하는 제 1전달부와,상기 비교부의 제어신호에 따라 다른 하나의 GIO 신호를 반전시켜 출력하는 제 2전달부로 이루어진 것을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 제 1항에 있어서, 상기 리시버는상기 트랜시버에서 출력된 어느 하나의 GIO 신호를 바이패스시켜 출력하고,상기 트랜시버에서 출력된 다른 하나의 GIO 신호를 상기 트랜시버의 제어신호에 따라 바이패스시켜 출력하는 제 3전달부와,상기 트랜시버에서 출력된 다른 하나의 GIO 신호를 상기 트랜시버의 제어신호에 따라 반전시켜 출력하는 제 4전달부로 이루어진 것을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 센스앰프로부터 입력되는 제1GIO 신호와 제2GIO 신호를 비교하여 제어신호를 출력하는 비교부와;상기 제어신호에 응답하여 상기 제2GIO 신호를 상기 제1GIO 신호와 동일한 극성을 갖도록 출력하는 제1,2 전달부와;상기 제어신호에 응답하여 상기 제1,2 전달부의 출력신호를 상기 제2GIO 신호와 동일한 극성을 갖도록 출력하는 제3,4 전달부;로 이루어진 것을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 제 4 항에 있어서,상기 비교부는 입력되는 제1 GIO 신호와 제2 GIO 신호를 배타적 논리합 연산을 수행하여 제어신호를 출력하는 논리소자로 구성함을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 제 4 항에 있어서,상기 제1전달부는 제어신호에 응답하여 상기 제2 GIO 신호를 바이패스하는 제1전달 트랜지스터로 구성하고, 상기 제2전달부는 제어신호에 응답하여 상기 제2 GIO 신호를 반전시켜 출력하는 제2전달 트랜지스터와 인버터로 구성함을 특징으로 하는 메모리장치의 데이터 입출력 장치.
- 제 4 항에 있어서,상기 제3전달부는 제어신호에 응답하여 상기 제1,2전달부의 출력신호를 바이패스하는 제3전달 트랜지스터로 구성하고, 상기 제4전달부는 제어신호에 응답하여 상기 제1,2전달부의 출력신호를 반전시켜 출력하는 제4전달 트랜지스터와 인버터로 구성함을 특징으로 하는 메모리장치의 데이터 입출력 장치.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040025510A KR100687866B1 (ko) | 2004-04-13 | 2004-04-13 | 메모리장치의 데이터 입출력 장치 |
US11/030,784 US7161847B2 (en) | 2004-04-13 | 2005-01-07 | Data input/output (I/O) apparatus for use in memory device |
US11/610,212 US7480194B2 (en) | 2004-04-13 | 2006-12-13 | Data input/output (I/O) apparatus for use in a memory device |
Applications Claiming Priority (1)
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KR1020040025510A KR100687866B1 (ko) | 2004-04-13 | 2004-04-13 | 메모리장치의 데이터 입출력 장치 |
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Publication Number | Publication Date |
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KR20050100285A KR20050100285A (ko) | 2005-10-18 |
KR100687866B1 true KR100687866B1 (ko) | 2007-02-27 |
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KR1020040025510A Expired - Fee Related KR100687866B1 (ko) | 2004-04-13 | 2004-04-13 | 메모리장치의 데이터 입출력 장치 |
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US (2) | US7161847B2 (ko) |
KR (1) | KR100687866B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7724584B2 (en) | 2007-08-09 | 2010-05-25 | Samsung Electronics Co., Ltd | Semiconductor memory device and method of compensating for signal interference thereof |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100687866B1 (ko) * | 2004-04-13 | 2007-02-27 | 주식회사 하이닉스반도체 | 메모리장치의 데이터 입출력 장치 |
KR100587080B1 (ko) * | 2004-05-17 | 2006-06-08 | 주식회사 하이닉스반도체 | 메모리 장치의 감지 증폭기를 제어하여 컬럼성 페일을검출하는 방법 및 그 장치 |
KR100649831B1 (ko) * | 2005-11-14 | 2006-11-27 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 글로벌 입출력 버스 제어회로 |
KR101847095B1 (ko) | 2011-10-18 | 2018-04-10 | 에스케이하이닉스 주식회사 | 비휘발성 메모리 장치 |
KR20160146404A (ko) * | 2015-06-12 | 2016-12-21 | 에스케이하이닉스 주식회사 | 입출력라인 테스트 장치 및 방법 |
US10475524B2 (en) * | 2016-09-15 | 2019-11-12 | Apple Inc. | Recovery of data read from memory with unknown polarity |
US11423972B2 (en) | 2020-09-15 | 2022-08-23 | Micron Technology, Inc. | Integrated assemblies |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211069A (ja) * | 1994-01-06 | 1995-08-11 | Hitachi Ltd | 半導体記憶装置 |
US6189133B1 (en) * | 1998-05-14 | 2001-02-13 | International Business Machines Corporation | Coupling noise reduction technique using reset timing |
KR20030026534A (ko) * | 2001-09-26 | 2003-04-03 | 삼성전자주식회사 | 커플링 노이즈를 감소시킬 수 있는 배선 구조 |
KR20030043410A (ko) * | 2001-11-28 | 2003-06-02 | 삼성전자주식회사 | 글로벌 입출력 라인간의 커플링이 최소화되는 구조를가지는 반도체 메모리 장치 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04307495A (ja) * | 1991-04-04 | 1992-10-29 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP3181479B2 (ja) * | 1994-12-15 | 2001-07-03 | 沖電気工業株式会社 | 半導体記憶装置 |
US6128700A (en) * | 1995-05-17 | 2000-10-03 | Monolithic System Technology, Inc. | System utilizing a DRAM array as a next level cache memory and method for operating same |
JP2000268566A (ja) * | 1999-03-19 | 2000-09-29 | Mitsubishi Electric Corp | 同期型半導体記憶装置 |
US6985005B1 (en) * | 2001-11-20 | 2006-01-10 | Silicon Image | Differential amplifiers using asymmetric transfer characteristics to suppress input noise in output logic signals |
KR100687866B1 (ko) * | 2004-04-13 | 2007-02-27 | 주식회사 하이닉스반도체 | 메모리장치의 데이터 입출력 장치 |
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2004
- 2004-04-13 KR KR1020040025510A patent/KR100687866B1/ko not_active Expired - Fee Related
-
2005
- 2005-01-07 US US11/030,784 patent/US7161847B2/en not_active Expired - Fee Related
-
2006
- 2006-12-13 US US11/610,212 patent/US7480194B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211069A (ja) * | 1994-01-06 | 1995-08-11 | Hitachi Ltd | 半導体記憶装置 |
US6189133B1 (en) * | 1998-05-14 | 2001-02-13 | International Business Machines Corporation | Coupling noise reduction technique using reset timing |
KR20030026534A (ko) * | 2001-09-26 | 2003-04-03 | 삼성전자주식회사 | 커플링 노이즈를 감소시킬 수 있는 배선 구조 |
KR20030043410A (ko) * | 2001-11-28 | 2003-06-02 | 삼성전자주식회사 | 글로벌 입출력 라인간의 커플링이 최소화되는 구조를가지는 반도체 메모리 장치 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7724584B2 (en) | 2007-08-09 | 2010-05-25 | Samsung Electronics Co., Ltd | Semiconductor memory device and method of compensating for signal interference thereof |
Also Published As
Publication number | Publication date |
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US20070091693A1 (en) | 2007-04-26 |
US7480194B2 (en) | 2009-01-20 |
KR20050100285A (ko) | 2005-10-18 |
US20050226058A1 (en) | 2005-10-13 |
US7161847B2 (en) | 2007-01-09 |
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