KR100571515B1 - 반도체 제조용 척 테이블 및 반도체 패키지 절단방법 - Google Patents
반도체 제조용 척 테이블 및 반도체 패키지 절단방법 Download PDFInfo
- Publication number
- KR100571515B1 KR100571515B1 KR1020050021455A KR20050021455A KR100571515B1 KR 100571515 B1 KR100571515 B1 KR 100571515B1 KR 1020050021455 A KR1020050021455 A KR 1020050021455A KR 20050021455 A KR20050021455 A KR 20050021455A KR 100571515 B1 KR100571515 B1 KR 100571515B1
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- KR
- South Korea
- Prior art keywords
- vacuum
- semiconductor package
- package
- semiconductor
- chuck table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 57
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 238000000034 method Methods 0.000 title claims abstract description 16
- 238000001179 sorption measurement Methods 0.000 claims abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 8
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (5)
- 기판상에 다수개의 반도체칩 및 스크랩이 일정형태로 배치되어 형성된 스트립을 소잉머신에 의해 각각의 반도체 패키지로 절단하기 위하여 상기 스트립을 고정하는 반도체 패키지 제조용 척 테이블에 있어서,진공라인과 연결되어 상기 반도체칩들을 각각 진공으로 흡착하는 다수의 패키지 흡착용 진공패드; 및진공라인과 연결되어 상기 스크랩들을 각각 진공으로 흡착하는 다수의 스크랩 흡착용 진공패드;를 포함하여 이루어지는 것을 특징으로 하는 반도체 패키지 제조용 척 테이블.
- 제 1 항에 있어서,상기 패키지 흡착용 진공패드 및 스크랩 흡착용 진공패드에 연결되는 진공라인은 하나의 진공원으로부터 공압을 제공받는 것을 특징으로 하는 상기 반도체 패키지 제조용 척 테이블.
- 제 1 항 또는 제 2 항에 있어서,다수개의 상기 패키지 흡착용 진공패드 및 스크랩 흡착용 진공패드는 일체로 형성되어 베이스에 부착되는 것을 특징으로 하는 상기 반도체 패키지 제조용 척 테이블.
- 제 1 항 또는 제 2 항에 있어서,다수개의 상기 패키지 흡착용 진공패드 및 스크랩 흡착용 진공패드는 개별로 형성되어 베이스에 삽입되는 것을 특징으로 하는 상기 반도체 패키지 제조용 척 테이블.
- 기판상에 다수개의 반도체칩 및 스크랩이 일정형태로 배치되어 형성된 스트립을 소잉머신에 의해 각각의 반도체 패키지로 절단하는 반도체 패키지 절단방법에 있어서,진공라인과 연결된 척 테이블에 의해 다수개의 상기 반도체칩 및 스크랩을 각각 흡착한 후, 소잉머신에 의해 각각의 반도체 패키지로 절단되는 것을 특징으로 하는 반도체 패키지 절단방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050021455A KR100571515B1 (ko) | 2005-03-15 | 2005-03-15 | 반도체 제조용 척 테이블 및 반도체 패키지 절단방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050021455A KR100571515B1 (ko) | 2005-03-15 | 2005-03-15 | 반도체 제조용 척 테이블 및 반도체 패키지 절단방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR100571515B1 true KR100571515B1 (ko) | 2006-04-14 |
Family
ID=37180605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020050021455A Expired - Fee Related KR100571515B1 (ko) | 2005-03-15 | 2005-03-15 | 반도체 제조용 척 테이블 및 반도체 패키지 절단방법 |
Country Status (1)
Country | Link |
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KR (1) | KR100571515B1 (ko) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200448311Y1 (ko) | 2008-02-15 | 2010-03-31 | 세크론 주식회사 | 반도체소자 절단장치용 진공척 테이블 |
KR101391706B1 (ko) * | 2012-12-07 | 2014-05-07 | 한미반도체 주식회사 | 진공흡착 테이블 및 그 제조방법 |
KR101415162B1 (ko) * | 2012-08-20 | 2014-07-04 | 한미반도체 주식회사 | 반도체 제조장치용 흡착유닛 |
US9474145B2 (en) | 2014-06-25 | 2016-10-18 | Samsung Electronics Co., Ltd. | Substrate and method for manufacturing semiconductor package |
KR102383030B1 (ko) | 2021-06-09 | 2022-04-08 | 주식회사 케이지시스템 | 반도체 패키지용 케이블 재단 포인트 설정방법 |
CN118448313A (zh) * | 2024-05-14 | 2024-08-06 | 江苏凯嘉电子科技有限公司 | 一种解决异形产品切割的切割盘 |
-
2005
- 2005-03-15 KR KR1020050021455A patent/KR100571515B1/ko not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200448311Y1 (ko) | 2008-02-15 | 2010-03-31 | 세크론 주식회사 | 반도체소자 절단장치용 진공척 테이블 |
KR101415162B1 (ko) * | 2012-08-20 | 2014-07-04 | 한미반도체 주식회사 | 반도체 제조장치용 흡착유닛 |
KR101391706B1 (ko) * | 2012-12-07 | 2014-05-07 | 한미반도체 주식회사 | 진공흡착 테이블 및 그 제조방법 |
US9474145B2 (en) | 2014-06-25 | 2016-10-18 | Samsung Electronics Co., Ltd. | Substrate and method for manufacturing semiconductor package |
KR102383030B1 (ko) | 2021-06-09 | 2022-04-08 | 주식회사 케이지시스템 | 반도체 패키지용 케이블 재단 포인트 설정방법 |
CN118448313A (zh) * | 2024-05-14 | 2024-08-06 | 江苏凯嘉电子科技有限公司 | 一种解决异形产品切割的切割盘 |
CN118448313B (zh) * | 2024-05-14 | 2025-03-07 | 江苏凯嘉电子科技有限公司 | 一种解决异形产品切割的切割盘 |
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