KR100553056B1 - 촬상장치 - Google Patents
촬상장치 Download PDFInfo
- Publication number
- KR100553056B1 KR100553056B1 KR1020030012719A KR20030012719A KR100553056B1 KR 100553056 B1 KR100553056 B1 KR 100553056B1 KR 1020030012719 A KR1020030012719 A KR 1020030012719A KR 20030012719 A KR20030012719 A KR 20030012719A KR 100553056 B1 KR100553056 B1 KR 100553056B1
- Authority
- KR
- South Korea
- Prior art keywords
- refractive index
- light
- image pickup
- photoelectric conversion
- wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8057—Optical shielding
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8067—Reflectors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Color Television Image Signal Generators (AREA)
Abstract
Description
Claims (14)
- 광전변환부와, 상기 광전변환부로 소정 파장범위의 광을 투과하는 파장선택부를 각각 지닌 복수의 화소로 이루어진 촬상소자에 있어서,상기 파장선택부는, 정점을 지니고, 해당 촬상소자의 주변부에 위치된 화소에 대해서는, 상기 파장선택부의 정점 축이 상기 광전변환부의 중심 축보다도 해당 촬상소자의 중심 축에 근접해서 위치되어 있는 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 상기 파장선택부가 다각뿔형상을 지닌 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 상기 복수의 화소의 각각에 포함된 상기 파장선택부는 동일한 형상인 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 상기 촬상소자의 제 1위치에 배치된 화소에 포함된 상기 파장선택부의 형상은, 해당 촬상소자의 제 2위치에 배치된 화소에 포함된 상기 파장선택부의 형상과 다른 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 상기 복수의 화소의 각각은, 집광용의 마이크로렌즈를 지니고, 상기 촬상소자의 주변부에 위치된 화소에 대해서는, 상기 파장선택부의 정점이 상기 마이크로렌즈의 중심과 상기 광전변환부의 중심을 연결하는 광축보다도 해당 촬상소자의 중심에 보다 근접해서 위치되는 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 소정의 굴절률을 지닌 제 2굴절률영역은, 상기 파장선택부보다도 광입사쪽으로 근접해서 설치되고, 소정의 굴절률을 지닌 제 1굴절률영역은, 제 2굴절률영역보다도 광입사쪽으로 근접해서 설치되고, 상기 제 2굴절률영역의 소정의 굴절률은 상기 제 1굴절률영역의 소정의 굴절률보다도 높은 것을 특징으로 하는 촬상소자.
- 제 1항에 있어서, 소정의 굴절률을 지닌 고굴절률영역은, 상기 광전변환부로 광을 도광시키기 위해 상기 파장선택부와 상기 광전변환부사이에 설치되고, 상기 고굴절률영역보다도 낮은 굴절률을 지닌 저굴절률영역은, 상기 고굴절률영역의 주변부에 설치되는 것을 특징으로 하는 촬상소자.
- 제 1항에 의한 촬상소자와;상기 촬상소자로부터 수신된 신호를 디지틀신호로 변환하는 아날로그/디지틀변환기와;상기 아날로그/디지틀변환기에 의해 얻어진 신호를 처리하는 신호처리회로를 구비한 것을 특징으로 하는 촬상장치.
- 피사체로부터의 광을 마이크로렌즈에 의해 집광하고, 해당 집광된 광을 광전변환부에서 수광하여, 해당 수광된 광을 전기신호로 변환해서 피사체의 화상을 얻는 촬상장치에 있어서,마이크로렌즈와 굴절부사이에 위치되어, 소정 파장을 지닌 광을 선택적으로 투과하는 동시에 다른 파장을 가진 광을 반사하는 파장선택부; 및상기 마이크로렌즈와 굴절부사이에 위치되어, 상기 파장선택부에서 반사된 광을 인접한 광전변환부쪽으로 향하게 하는 반사부를 지니고,상기 반사부에서 반사된 광은 파장선택부상에 결상되도록 구성되어 있는 것을 특징으로 하는 촬상장치.
- 제 9항에 있어서, 상기 반사부에 의해 반사된 광에 의해 상기 파장선택부상에 결상하도록, 상기 마이크로렌즈의 높이, 상기 파장선택부의 정점과 상기 반사부의 반사면간의 거리, 상기 광전변환부에 대한 상기 파장선택부의 경사각 및 상기 광전변환부의 피치를 조정하고 있는 것을 특징으로 하는 촬상장치.
- 제 9항에 있어서, 상기 파장선택부는 다이크로익층(dichroic layer)인 것을 특징으로 하는 촬상장치.
- 제 9항에 있어서, 상기 반사부는 상기 광전변환부를 향해 오목한 것을 특징으로 하는 촬상장치.
- 제 9항에 있어서, 상기 굴절부는, 광입사쪽이 넓은 테이퍼형상을 지닌 것을 특징으로 하는 촬상장치.
- 제 9항에 의한 촬상소자와;상기 촬상소자로부터 수신된 신호를 디지틀신호로 변환하는 아날로그/디지틀변환기와;상기 아날로그/디지틀변환기에 의해 얻어진 신호를 처리하는 신호처리회로를 구비한 것을 특징으로 하는 촬상장치.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002054018A JP2003258220A (ja) | 2002-02-28 | 2002-02-28 | 撮像素子及び撮像装置 |
JPJP-P-2002-00054018 | 2002-02-28 | ||
JP2002057579A JP4298209B2 (ja) | 2002-03-04 | 2002-03-04 | 撮像装置およびシステム |
JPJP-P-2002-00057579 | 2002-03-04 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030071577A KR20030071577A (ko) | 2003-09-03 |
KR100553056B1 true KR100553056B1 (ko) | 2006-02-15 |
Family
ID=27736573
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030012719A Expired - Fee Related KR100553056B1 (ko) | 2002-02-28 | 2003-02-28 | 촬상장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7245324B2 (ko) |
EP (1) | EP1341235A3 (ko) |
KR (1) | KR100553056B1 (ko) |
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JP5325117B2 (ja) * | 2008-06-18 | 2013-10-23 | パナソニック株式会社 | 固体撮像装置 |
JP5276371B2 (ja) * | 2008-07-09 | 2013-08-28 | キヤノン株式会社 | 撮像装置 |
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JP5159700B2 (ja) | 2009-05-19 | 2013-03-06 | キヤノン株式会社 | 光学装置及び焦点検出方法 |
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JP5471117B2 (ja) | 2009-07-24 | 2014-04-16 | ソニー株式会社 | 固体撮像装置とその製造方法並びにカメラ |
JP5538811B2 (ja) * | 2009-10-21 | 2014-07-02 | キヤノン株式会社 | 固体撮像素子 |
JP5595298B2 (ja) | 2010-04-06 | 2014-09-24 | キヤノン株式会社 | 固体撮像装置及び撮像システム |
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2003
- 2003-02-27 EP EP03004455A patent/EP1341235A3/en not_active Withdrawn
- 2003-02-28 KR KR1020030012719A patent/KR100553056B1/ko not_active Expired - Fee Related
- 2003-02-28 US US10/375,170 patent/US7245324B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20030071577A (ko) | 2003-09-03 |
EP1341235A3 (en) | 2006-05-10 |
US7245324B2 (en) | 2007-07-17 |
EP1341235A2 (en) | 2003-09-03 |
US20040004668A1 (en) | 2004-01-08 |
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