KR100519922B1 - 다영역 자기모드 잠김 반도체 레이저 다이오드 - Google Patents
다영역 자기모드 잠김 반도체 레이저 다이오드 Download PDFInfo
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- KR100519922B1 KR100519922B1 KR10-2002-0080707A KR20020080707A KR100519922B1 KR 100519922 B1 KR100519922 B1 KR 100519922B1 KR 20020080707 A KR20020080707 A KR 20020080707A KR 100519922 B1 KR100519922 B1 KR 100519922B1
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- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
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- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
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- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
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- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/0625—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
- H01S5/06255—Controlling the frequency of the radiation
- H01S5/06258—Controlling the frequency of the radiation with DFB-structure
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- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/065—Mode locking; Mode suppression; Mode selection ; Self pulsating
- H01S5/0657—Mode locking, i.e. generation of pulses at a frequency corresponding to a roundtrip in the cavity
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- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2206—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on III-V materials
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- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2222—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties
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- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34306—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000nm, e.g. InP based 1300 and 1500nm lasers
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Abstract
Description
Claims (14)
- DFB 레이저 영역과 위상조절영역, 증폭영역을 포함하는 공진기로 구성되어, 상기 공진기를 통해 전파한 후에 상기 DFB 레이저 영역으로 귀환되는 광 세기와 위상변화가 상기 증폭영역과 상기 위상조절영역의 주입전류들에 의해 조절되고 넓은 주파수 범위로 변화되는 다영역 자기모드 잠김 반도체 레이저 다이오드에 있어서,상기 DFB 레이저 영역은 복합결합 회절격자 및 발진되는 레이저 빛의 세기를 조절하는 활성구조를 갖추어 레이저 빛을 단일 모드로 발진하고,상기 공진기는 귀환되는 레이저 빛의 위상변화를 조절하는 도파층을 갖춘 위상조절영역, 귀환되는 레이저 빛의 세기를 조절하는 활성구조를 갖춘 증폭영역으로 이루어져,상기 DFB 레이저 영역 및 상기 공진기가 단일 기판상에 일체로 집적되어 각 영역들에 독립적으로 전류를 주입하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역과 상기 공진기는 PBH 구조에 의해 일체로 구성됨을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역과 상기 공진기는 ridge 구조에 의해 일체로 구성됨을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역의 복합결합 회절격자는 InGaAs로 형성된 손실결합 회절격자로서, 공간상에서 굴절률과 손실을 주기적으로 변화시키는 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역의 복합결합 회절격자는 활성층에 회절격자가 만들어진 이득결합 회절격자로서, 공간상에서 굴절률과 이득을 주기적으로 변화시키는 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1 내지 제3항 중 어느 한 항에 있어서,상기 DFB 레이저영역과 상기 증폭영역에 포함된 활성구조는 각각 제1 광가이드층, 활성층, 제2 광가이드층으로 적층 형성된 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제6항에 있어서,상기 제1 광가이드층과 제2 광가이드층은 두께 70nm를 갖는, 1.3㎛ 밴드갭의 InGaAsP이고, 상기 활성층은 InGaAsP에 의한 우물과 장벽을 포함하는 1.55㎛ 밴드갭의 다중 양자우물 구조로 된 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제6항에 있어서,상기 제1 광가이드층과 제2 광가이드층은 두께 70nm를 갖는, 1.3㎛ 밴드갭의 InGaAsP이고, 상기 활성층은 1.55㎛ 밴드갭의 InGaAsP로 된 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 위상조절영역의 도파층은 상기 활성구조에 대하여 중심축이 일치하는 버트 결합으로 배치된 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제9항에 있어서,상기 도파층은 두께 400nm를 갖는, 1.3㎛ 밴드갭의 InGaAsP로 이루어진 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역, 상기 위상조절영역 및 상기 증폭영역은 공통의 도파층을 갖는 에버네센트 결합(evanescent coupling)으로 구성된 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역과 상기 증폭영역의 사이에 상기 위상조절영역이 위치하는 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역과 상기 위상조절영역의 사이에 상기 증폭영역이 위치하는 것임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
- 제1항에 있어서,상기 DFB 레이저영역의 외측단면은 무반사 박막이 코팅되고, 반대측 외부 공진기의 외측단면은 무코팅 또는 높은 반사율을 가진 반사막으로 코팅된 구성임을 특징으로 하는 다영역 자기모드 잠김 반도체 레이저 다이오드.
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KR10-2002-0080707A KR100519922B1 (ko) | 2002-12-17 | 2002-12-17 | 다영역 자기모드 잠김 반도체 레이저 다이오드 |
US10/726,141 US7680169B2 (en) | 2002-12-17 | 2003-12-01 | Self-mode locked multi-section semiconductor laser diode |
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KR10-2002-0080707A KR100519922B1 (ko) | 2002-12-17 | 2002-12-17 | 다영역 자기모드 잠김 반도체 레이저 다이오드 |
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KR102368946B1 (ko) * | 2017-12-15 | 2022-03-04 | 한국전자통신연구원 | 파장 가변 레이저 장치 및 이를 제조하는 방법 |
KR20210087085A (ko) * | 2019-01-04 | 2021-07-09 | 후아웨이 테크놀러지 컴퍼니 리미티드 | 반도체 레이저, 광 전송기 컴포넌트, 광 회선 단말 및 광 네트워크 유닛 |
KR102495786B1 (ko) * | 2019-01-04 | 2023-02-06 | 후아웨이 테크놀러지 컴퍼니 리미티드 | 반도체 레이저, 광 전송기 컴포넌트, 광 회선 단말 및 광 네트워크 유닛 |
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US20040125851A1 (en) | 2004-07-01 |
US7680169B2 (en) | 2010-03-16 |
KR20040054073A (ko) | 2004-06-25 |
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