KR100486113B1 - 렌즈 내장형 이미지 센서의 제조 방법 - Google Patents
렌즈 내장형 이미지 센서의 제조 방법 Download PDFInfo
- Publication number
- KR100486113B1 KR100486113B1 KR10-2002-0057071A KR20020057071A KR100486113B1 KR 100486113 B1 KR100486113 B1 KR 100486113B1 KR 20020057071 A KR20020057071 A KR 20020057071A KR 100486113 B1 KR100486113 B1 KR 100486113B1
- Authority
- KR
- South Korea
- Prior art keywords
- metal
- lens
- image sensor
- film
- iron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 229910052751 metal Inorganic materials 0.000 claims abstract description 68
- 239000002184 metal Substances 0.000 claims abstract description 68
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 48
- 229910052742 iron Inorganic materials 0.000 claims abstract description 24
- 230000008569 process Effects 0.000 claims abstract description 20
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 9
- 238000009713 electroplating Methods 0.000 claims description 9
- 239000010936 titanium Substances 0.000 claims description 9
- 229910052719 titanium Inorganic materials 0.000 claims description 9
- 238000000151 deposition Methods 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 5
- 230000001681 protective effect Effects 0.000 claims description 5
- LSNNMFCWUKXFEE-UHFFFAOYSA-N Sulfurous acid Chemical compound OS(O)=O LSNNMFCWUKXFEE-UHFFFAOYSA-N 0.000 claims description 3
- 238000004544 sputter deposition Methods 0.000 claims description 3
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000003792 electrolyte Substances 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 4
- 239000012530 fluid Substances 0.000 abstract description 3
- 230000007547 defect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 239000010931 gold Substances 0.000 description 4
- 238000002161 passivation Methods 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000008151 electrolyte solution Substances 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 230000008570 general process Effects 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Facsimile Heads (AREA)
Abstract
Description
Claims (6)
- 상기 화소어레이부와 상기 CMOS 로직부가 원칩에 집적화되는 이미지 센서에 있어서,금속 배선 및 절연막과 최상금속층을 증착하는 단계와,상기 최상 금속층을 화소 어레이 주변에만 남기고 상기 최상 금속층 상에 보호막을 증착하는 단계와,상기 보호막 증착 후 칼라 필터 공정을 진행한 후 패드 금속 단자를 오픈하는 마스크 공정을 진행하여 최상 금속층이 보호막 사이로 드러나도록 하는 단계와,상기 최상 금속층 상부에 티타늄막 및 금속막을 증착하는 단계와,상기 금속막 상부에 금속철(凸)을 형성할 부분을 오픈한 후 전기적인 도금 방법을 이용하여 금속철(凸)을 성장시키는 단계와,상기 전기적 도금에 의해 성장된 금속철(凸) 하부의 금속막 및 티타늄막을 제거하는 단계와,상기 금속철(凸)이 형성되어 있는 결과물 상부에 상기 금속철(凸)과 일체하는 홈(凹)을 가지는 렌즈를 형성하는 단계와,상기 렌즈의 홈(凹)과 상기 금속철(凸)을 정렬마크를 사용하여 서로 대응하게 정렬시킨 다음 결합시키는 단계를포함하는 것을 특징으로 하는 렌즈 내장형 이미지 센서의 제조 방법.
- 제 1항에 있어서, 상기 티타늄 및 금속막은 스퍼터링 또는 전기 도금 방식을 통해 증착하는 것을 특징으로 하는 렌즈 내장형 이미지 센서의 제조 방법.
- 제 1항에 있어서, 상기 금속막 및 금속철(凸)은 Au, Ag, Cu중 어느하나를 이용하는 것을 특징으로 하는 렌즈 내장형 이미지 센서의 제조 방법.
- 제 1항에 있어서, 상기 전기 도금 방식을 이용한 금속철(凸) 성장 공정은 아황산염 전해질을 이용하는 것을 특징으로 하는 렌즈 내장형 이미지 센서의 제조 방법.
- 제 1항에 있어서, 상기 화소 어레이 주변에만 남기는 최상 금속층은 폐쇄형, 유선형, 일자형 중 어느 하나의 형태로 형성하는 것을 특징으로 하는 렌즈 내장형 이미지 센서의 제조 방법.
- 삭제
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2002-0057071A KR100486113B1 (ko) | 2002-09-18 | 2002-09-18 | 렌즈 내장형 이미지 센서의 제조 방법 |
TW091138127A TWI226080B (en) | 2002-09-18 | 2002-12-31 | Manufacturing method of image detector with built-in lens |
JP2003005199A JP4384417B2 (ja) | 2002-09-18 | 2003-01-14 | レンズ内蔵型イメージセンサーの製造方法 |
US10/365,987 US6670205B1 (en) | 2002-09-18 | 2003-02-13 | Method of fabricating image sensor equipped with lens |
CNB031026389A CN1249805C (zh) | 2002-09-18 | 2003-02-14 | 镜头内藏型图象传感器的制造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2002-0057071A KR100486113B1 (ko) | 2002-09-18 | 2002-09-18 | 렌즈 내장형 이미지 센서의 제조 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040025218A KR20040025218A (ko) | 2004-03-24 |
KR100486113B1 true KR100486113B1 (ko) | 2005-04-29 |
Family
ID=29728798
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2002-0057071A Expired - Fee Related KR100486113B1 (ko) | 2002-09-18 | 2002-09-18 | 렌즈 내장형 이미지 센서의 제조 방법 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6670205B1 (ko) |
JP (1) | JP4384417B2 (ko) |
KR (1) | KR100486113B1 (ko) |
CN (1) | CN1249805C (ko) |
TW (1) | TWI226080B (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100505894B1 (ko) * | 2003-10-24 | 2005-08-01 | 매그나칩 반도체 유한회사 | 저온산화막의 박리현상을 개선한 시모스 이미지센서의제조방법 |
US7102159B2 (en) * | 2004-06-12 | 2006-09-05 | Macronix International Co., Ltd. | Ultra thin image sensor package structure and method for fabrication |
KR100821476B1 (ko) * | 2006-12-26 | 2008-04-11 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
US8605208B2 (en) | 2007-04-24 | 2013-12-10 | Digitaloptics Corporation | Small form factor modules using wafer level optics with bottom cavity and flip-chip assembly |
US7825985B2 (en) | 2007-07-19 | 2010-11-02 | Flextronics Ap, Llc | Camera module back-focal length adjustment method and ultra compact components packaging |
US9118825B2 (en) * | 2008-02-22 | 2015-08-25 | Nan Chang O-Film Optoelectronics Technology Ltd. | Attachment of wafer level optics |
US7916396B2 (en) * | 2008-06-27 | 2011-03-29 | Micron Technology, Inc. | Lens master devices, lens structures, imaging devices, and methods and apparatuses of making the same |
US9419032B2 (en) | 2009-08-14 | 2016-08-16 | Nanchang O-Film Optoelectronics Technology Ltd | Wafer level camera module with molded housing and method of manufacturing |
US10009528B2 (en) | 2011-02-24 | 2018-06-26 | Nan Chang O-Film Optoelectronics Technology Ltd | Autofocus camera module packaging with circuitry-integrated actuator system |
US8545114B2 (en) | 2011-03-11 | 2013-10-01 | Digitaloptics Corporation | Auto focus-zoom actuator or camera module contamination reduction feature with integrated protective membrane |
JP5893287B2 (ja) | 2011-08-10 | 2016-03-23 | ルネサスエレクトロニクス株式会社 | 半導体装置および基板 |
JP6076123B2 (ja) * | 2013-02-14 | 2017-02-08 | オリンパス株式会社 | 半導体基板、撮像素子、および撮像装置 |
JP6270339B2 (ja) * | 2013-05-22 | 2018-01-31 | オリンパス株式会社 | 撮像装置、撮像装置の製造方法、及び内視鏡システム |
CN114422658A (zh) * | 2020-10-28 | 2022-04-29 | 北京小米移动软件有限公司 | 摄像头模组的组装方法、装置、摄像头模组及电子设备 |
Citations (4)
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KR970024249A (ko) * | 1995-10-24 | 1997-05-30 | 이데이 노부유끼 | 수광 장치와 그 제조 방법(Micro Camera and Manufacturing Thereof) |
JPH09187991A (ja) * | 1996-01-08 | 1997-07-22 | Canon Inc | 露光装置およびこれを用いた画像形成装置 |
KR20010085459A (ko) * | 2000-02-23 | 2001-09-07 | 다니구찌 이찌로오, 기타오카 다카시 | 촬상 장치 |
JP2001292354A (ja) * | 2000-04-07 | 2001-10-19 | Mitsubishi Electric Corp | 撮像装置 |
Family Cites Families (8)
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US4321628A (en) * | 1980-04-02 | 1982-03-23 | Xerox Corporation | Scanning apparatus |
JPH0642126B2 (ja) * | 1988-10-26 | 1994-06-01 | シャープ株式会社 | 投影型画像表示装置 |
US5719706A (en) * | 1995-03-15 | 1998-02-17 | Matsushita Electric Industrial Co., Ltd. | Illuminating apparatus, projection lens, and display apparatus including the illumination apparatus and the projection lens |
US5751387A (en) * | 1995-07-28 | 1998-05-12 | Fujitsu Limited | Fresnel lens and liquid crystal display device |
US5986297A (en) | 1996-05-22 | 1999-11-16 | Eastman Kodak Company | Color active pixel sensor with electronic shuttering, anti-blooming and low cross-talk |
GB9618720D0 (en) * | 1996-09-07 | 1996-10-16 | Philips Electronics Nv | Electrical device comprising an array of pixels |
NL1011381C2 (nl) | 1998-02-28 | 2000-02-15 | Hyundai Electronics Ind | Fotodiode voor een CMOS beeldsensor en werkwijze voor het vervaardigen daarvan. |
KR100533166B1 (ko) | 2000-08-18 | 2005-12-02 | 매그나칩 반도체 유한회사 | 마이크로렌즈 보호용 저온산화막을 갖는 씨모스이미지센서및 그 제조방법 |
-
2002
- 2002-09-18 KR KR10-2002-0057071A patent/KR100486113B1/ko not_active Expired - Fee Related
- 2002-12-31 TW TW091138127A patent/TWI226080B/zh not_active IP Right Cessation
-
2003
- 2003-01-14 JP JP2003005199A patent/JP4384417B2/ja not_active Expired - Fee Related
- 2003-02-13 US US10/365,987 patent/US6670205B1/en not_active Expired - Lifetime
- 2003-02-14 CN CNB031026389A patent/CN1249805C/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970024249A (ko) * | 1995-10-24 | 1997-05-30 | 이데이 노부유끼 | 수광 장치와 그 제조 방법(Micro Camera and Manufacturing Thereof) |
JPH09187991A (ja) * | 1996-01-08 | 1997-07-22 | Canon Inc | 露光装置およびこれを用いた画像形成装置 |
KR20010085459A (ko) * | 2000-02-23 | 2001-09-07 | 다니구찌 이찌로오, 기타오카 다카시 | 촬상 장치 |
JP2001292354A (ja) * | 2000-04-07 | 2001-10-19 | Mitsubishi Electric Corp | 撮像装置 |
Also Published As
Publication number | Publication date |
---|---|
CN1249805C (zh) | 2006-04-05 |
US6670205B1 (en) | 2003-12-30 |
TWI226080B (en) | 2005-01-01 |
JP2004111896A (ja) | 2004-04-08 |
JP4384417B2 (ja) | 2009-12-16 |
CN1484296A (zh) | 2004-03-24 |
TW200405430A (en) | 2004-04-01 |
KR20040025218A (ko) | 2004-03-24 |
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