KR100392528B1 - 금속재료, 금속재료의 제조방법 및 금속재료를 이용한 단자 및 커넥터 - Google Patents
금속재료, 금속재료의 제조방법 및 금속재료를 이용한 단자 및 커넥터 Download PDFInfo
- Publication number
- KR100392528B1 KR100392528B1 KR10-2001-7003056A KR20017003056A KR100392528B1 KR 100392528 B1 KR100392528 B1 KR 100392528B1 KR 20017003056 A KR20017003056 A KR 20017003056A KR 100392528 B1 KR100392528 B1 KR 100392528B1
- Authority
- KR
- South Korea
- Prior art keywords
- plating
- alloy
- metal material
- tin
- weight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000007769 metal material Substances 0.000 title claims description 37
- 238000000034 method Methods 0.000 title claims description 13
- 238000004519 manufacturing process Methods 0.000 title claims description 5
- 230000008569 process Effects 0.000 title description 4
- 239000010410 layer Substances 0.000 claims abstract description 145
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 66
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 65
- 239000011574 phosphorus Substances 0.000 claims abstract description 63
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 63
- 229910052796 boron Inorganic materials 0.000 claims abstract description 59
- 229910052802 copper Inorganic materials 0.000 claims abstract description 59
- 239000010949 copper Substances 0.000 claims abstract description 59
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 57
- 239000002344 surface layer Substances 0.000 claims abstract description 56
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 52
- 239000000463 material Substances 0.000 claims abstract description 44
- 238000003780 insertion Methods 0.000 claims abstract description 36
- 230000037431 insertion Effects 0.000 claims abstract description 36
- 229910001128 Sn alloy Inorganic materials 0.000 claims abstract description 33
- 238000000605 extraction Methods 0.000 claims abstract description 21
- 229910000881 Cu alloy Inorganic materials 0.000 claims abstract description 13
- 229910000990 Ni alloy Inorganic materials 0.000 claims abstract description 13
- 238000007747 plating Methods 0.000 claims description 235
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 83
- 239000011135 tin Substances 0.000 claims description 77
- 229910052718 tin Inorganic materials 0.000 claims description 76
- 229910052759 nickel Inorganic materials 0.000 claims description 43
- 229910045601 alloy Inorganic materials 0.000 claims description 35
- 239000000956 alloy Substances 0.000 claims description 35
- 238000009792 diffusion process Methods 0.000 claims description 29
- 229910052725 zinc Inorganic materials 0.000 claims description 22
- 239000012535 impurity Substances 0.000 claims description 21
- 230000032683 aging Effects 0.000 claims description 14
- 239000002245 particle Substances 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 10
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 claims description 9
- 238000009713 electroplating Methods 0.000 claims description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 5
- 230000001050 lubricating effect Effects 0.000 claims description 3
- -1 phosphorus compound Chemical class 0.000 claims description 3
- 239000007864 aqueous solution Substances 0.000 claims 2
- 150000002903 organophosphorus compounds Chemical class 0.000 claims 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 48
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 24
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 17
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 17
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 16
- 239000011701 zinc Substances 0.000 description 16
- RJTANRZEWTUVMA-UHFFFAOYSA-N boron;n-methylmethanamine Chemical compound [B].CNC RJTANRZEWTUVMA-UHFFFAOYSA-N 0.000 description 15
- 230000000694 effects Effects 0.000 description 14
- 238000011156 evaluation Methods 0.000 description 14
- 239000010408 film Substances 0.000 description 12
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 11
- 230000006866 deterioration Effects 0.000 description 11
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical compound NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 description 10
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 10
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 9
- 230000000052 comparative effect Effects 0.000 description 9
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 9
- PEVJCYPAFCUXEZ-UHFFFAOYSA-J dicopper;phosphonato phosphate Chemical compound [Cu+2].[Cu+2].[O-]P([O-])(=O)OP([O-])([O-])=O PEVJCYPAFCUXEZ-UHFFFAOYSA-J 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 239000004323 potassium nitrate Substances 0.000 description 8
- 235000010333 potassium nitrate Nutrition 0.000 description 8
- 229910000679 solder Inorganic materials 0.000 description 8
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 8
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 8
- 229910000368 zinc sulfate Inorganic materials 0.000 description 7
- 229960001763 zinc sulfate Drugs 0.000 description 7
- 229910001096 P alloy Inorganic materials 0.000 description 6
- 229910001297 Zn alloy Inorganic materials 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- OFNHPGDEEMZPFG-UHFFFAOYSA-N phosphanylidynenickel Chemical compound [P].[Ni] OFNHPGDEEMZPFG-UHFFFAOYSA-N 0.000 description 6
- 229910000521 B alloy Inorganic materials 0.000 description 5
- 239000004471 Glycine Substances 0.000 description 5
- 229910019142 PO4 Inorganic materials 0.000 description 5
- 238000005275 alloying Methods 0.000 description 5
- 229910000365 copper sulfate Inorganic materials 0.000 description 5
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 5
- 229940098779 methanesulfonic acid Drugs 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- 239000010452 phosphate Substances 0.000 description 5
- 239000004094 surface-active agent Substances 0.000 description 5
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 4
- PMZURENOXWZQFD-UHFFFAOYSA-L Sodium Sulfate Chemical compound [Na+].[Na+].[O-]S([O-])(=O)=O PMZURENOXWZQFD-UHFFFAOYSA-L 0.000 description 4
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 4
- 239000004327 boric acid Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 239000008139 complexing agent Substances 0.000 description 4
- PGGZKNHTKRUCJS-UHFFFAOYSA-N methanesulfonic acid;tin Chemical compound [Sn].CS(O)(=O)=O PGGZKNHTKRUCJS-UHFFFAOYSA-N 0.000 description 4
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 4
- 238000010791 quenching Methods 0.000 description 4
- 230000000171 quenching effect Effects 0.000 description 4
- 229910052938 sodium sulfate Inorganic materials 0.000 description 4
- 235000011152 sodium sulphate Nutrition 0.000 description 4
- RIRXDDRGHVUXNJ-UHFFFAOYSA-N [Cu].[P] Chemical compound [Cu].[P] RIRXDDRGHVUXNJ-UHFFFAOYSA-N 0.000 description 3
- QDWJUBJKEHXSMT-UHFFFAOYSA-N boranylidynenickel Chemical compound [Ni]#B QDWJUBJKEHXSMT-UHFFFAOYSA-N 0.000 description 3
- 229910017052 cobalt Inorganic materials 0.000 description 3
- 239000010941 cobalt Substances 0.000 description 3
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 3
- 230000007774 longterm Effects 0.000 description 3
- 229940085991 phosphate ion Drugs 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- FAKFSJNVVCGEEI-UHFFFAOYSA-J tin(4+);disulfate Chemical compound [Sn+4].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O FAKFSJNVVCGEEI-UHFFFAOYSA-J 0.000 description 3
- 235000011777 Corchorus aestuans Nutrition 0.000 description 2
- 240000004792 Corchorus capsularis Species 0.000 description 2
- 235000010862 Corchorus capsularis Nutrition 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- QCEUXSAXTBNJGO-UHFFFAOYSA-N [Ag].[Sn] Chemical compound [Ag].[Sn] QCEUXSAXTBNJGO-UHFFFAOYSA-N 0.000 description 2
- VFYPSWGDJSPEQI-UHFFFAOYSA-N [B].[P].[Ni] Chemical compound [B].[P].[Ni] VFYPSWGDJSPEQI-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- XPPKVPWEQAFLFU-UHFFFAOYSA-J diphosphate(4-) Chemical compound [O-]P([O-])(=O)OP([O-])([O-])=O XPPKVPWEQAFLFU-UHFFFAOYSA-J 0.000 description 2
- 235000011180 diphosphates Nutrition 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 2
- 238000005461 lubrication Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910000480 nickel oxide Inorganic materials 0.000 description 2
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- WHOZNOZYMBRCBL-OUKQBFOZSA-N (2E)-2-Tetradecenal Chemical compound CCCCCCCCCCC\C=C\C=O WHOZNOZYMBRCBL-OUKQBFOZSA-N 0.000 description 1
- RSEBUVRVKCANEP-UHFFFAOYSA-N 2-pyrroline Chemical compound C1CC=CN1 RSEBUVRVKCANEP-UHFFFAOYSA-N 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- 229910000570 Cupronickel Inorganic materials 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N EtOH Substances CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- AZHRLYWHBSSZCZ-UHFFFAOYSA-J P(O)(O)O.P(O)(O)(O)=O.[Ni](Cl)Cl.S(=O)(=O)([O-])[O-].[Ni+2] Chemical compound P(O)(O)O.P(O)(O)(O)=O.[Ni](Cl)Cl.S(=O)(=O)([O-])[O-].[Ni+2] AZHRLYWHBSSZCZ-UHFFFAOYSA-J 0.000 description 1
- MFWPBGUEAHRINS-UHFFFAOYSA-N [Cu].[B].[Ni] Chemical compound [Cu].[B].[Ni] MFWPBGUEAHRINS-UHFFFAOYSA-N 0.000 description 1
- QGHFWZQZPGKVHD-UHFFFAOYSA-N [Cu].[P].[B].[Ni] Chemical compound [Cu].[P].[B].[Ni] QGHFWZQZPGKVHD-UHFFFAOYSA-N 0.000 description 1
- VLSGVDCOTNVFML-UHFFFAOYSA-N [P].[B].[Zn].[Cu] Chemical compound [P].[B].[Zn].[Cu] VLSGVDCOTNVFML-UHFFFAOYSA-N 0.000 description 1
- ZFCGLHTWIYWCNW-UHFFFAOYSA-N [Pb].[Ag].[Bi] Chemical compound [Pb].[Ag].[Bi] ZFCGLHTWIYWCNW-UHFFFAOYSA-N 0.000 description 1
- VNSXJXAATIBOBP-UHFFFAOYSA-N [Sn].[B].[Ni] Chemical compound [Sn].[B].[Ni] VNSXJXAATIBOBP-UHFFFAOYSA-N 0.000 description 1
- PDTOKXNZSNUABX-UHFFFAOYSA-N [Zn].[B].[Ni] Chemical compound [Zn].[B].[Ni] PDTOKXNZSNUABX-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- CCXYPVYRAOXCHB-UHFFFAOYSA-N bismuth silver Chemical compound [Ag].[Bi] CCXYPVYRAOXCHB-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- YOCUPQPZWBBYIX-UHFFFAOYSA-N copper nickel Chemical compound [Ni].[Cu] YOCUPQPZWBBYIX-UHFFFAOYSA-N 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 229960002089 ferrous chloride Drugs 0.000 description 1
- 235000003891 ferrous sulphate Nutrition 0.000 description 1
- 239000011790 ferrous sulphate Substances 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- NMCUIPGRVMDVDB-UHFFFAOYSA-L iron dichloride Chemical compound Cl[Fe]Cl NMCUIPGRVMDVDB-UHFFFAOYSA-L 0.000 description 1
- BAUYGSIQEAFULO-UHFFFAOYSA-L iron(2+) sulfate (anhydrous) Chemical compound [Fe+2].[O-]S([O-])(=O)=O BAUYGSIQEAFULO-UHFFFAOYSA-L 0.000 description 1
- 229910000359 iron(II) sulfate Inorganic materials 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 150000002815 nickel Chemical class 0.000 description 1
- CLDVQCMGOSGNIW-UHFFFAOYSA-N nickel tin Chemical compound [Ni].[Sn] CLDVQCMGOSGNIW-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 239000003002 pH adjusting agent Substances 0.000 description 1
- 229940044654 phenolsulfonic acid Drugs 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- ZVJHJDDKYZXRJI-UHFFFAOYSA-N pyrroline Natural products C1CC=NC1 ZVJHJDDKYZXRJI-UHFFFAOYSA-N 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229940032330 sulfuric acid Drugs 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- ISIJQEHRDSCQIU-UHFFFAOYSA-N tert-butyl 2,7-diazaspiro[4.5]decane-7-carboxylate Chemical compound C1N(C(=O)OC(C)(C)C)CCCC11CNCC1 ISIJQEHRDSCQIU-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 235000009529 zinc sulphate Nutrition 0.000 description 1
- 239000011686 zinc sulphate Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/02—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material
- C23C28/023—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material only coatings of metal elements only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/024—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by cleaning or etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/026—Deposition of sublayers, e.g. adhesion layers or pre-applied alloying elements or corrosion protection
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/02—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material
- C23C28/021—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material including at least one metal alloy layer
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
- C25D5/50—After-treatment of electroplated surfaces by heat-treatment
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
- C25D5/50—After-treatment of electroplated surfaces by heat-treatment
- C25D5/505—After-treatment of electroplated surfaces by heat-treatment of electroplated tin coatings, e.g. by melting
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/615—Microstructure of the layers, e.g. mixed structure
- C25D5/617—Crystalline layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/562—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/58—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/12—End pieces terminating in an eye, hook, or fork
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/922—Static electricity metal bleed-off metallic stock
- Y10S428/9265—Special properties
- Y10S428/929—Electrical contact feature
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12708—Sn-base component
- Y10T428/12715—Next to Group IB metal-base component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12708—Sn-base component
- Y10T428/12722—Next to Group VIII metal-base component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12903—Cu-base component
- Y10T428/1291—Next to Co-, Cu-, or Ni-base component
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electrochemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Electroplating Methods And Accessories (AREA)
Abstract
Description
조건 | |
도금액 조성 | 황산 니켈 150g/L염화 니켈 45g/L인산 50g/L아인산 0.25 ~ 10g/L |
도금액 온도 | 70℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L황산제일주석 20g/L인산 50g/L아인산 0.25 ~ 10g/L |
도금액 온도 | 70℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 100g/L황산 구리 10g/L글리신 30g/L인산 25g/L아인산 0.25 ~ 10g/L |
도금액 온도 | 25℃ |
전류 밀도 | 2A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L황산 아연 20g/L황산 나트륨 150g/L인산 40g/L아인산 0.25 ~ 10g/L |
도금액 온도 | 70℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L염화 니켈 45g/L인산 50g/L아인산 0.25 ~ 10g/L디메틸아민착체 0.5 ~ 1.0g/L |
도금액 온도 | 50℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L염화제일철 20g/L인산 50g/L아인산 0.5 ~ 10g/L보레인 디메틸아민착체 0.5 ~ 1.0g/L |
도금액 온도 | 50℃ |
전류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 100g/L황산 구리 10g/L글리신 30g/L인산 25g/L아인산 0.25 ~ 10g/L보레인 디메틸아민착체 0.5 ~ 1.0g/L |
도금액 온도 | 25℃ |
전류 밀도 | 2A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L황산 아연 20g/L황산 나트륨 150g/L인산 40g/L아인산 0.25 ~ 10g/L보레인 디메틸아민착체 0.5 ~ 1.0g/L |
도금액 온도 | 50℃ |
잔류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
도금액 조성 | 메탄술폰산 100g/L메탄술폰산 주석 200g/L계면활성제 2g/L |
도금액 온도 | 40℃ |
전류 밀도 | 10A/d㎡ |
도금액 온도 | 40℃ |
리플로우 조건 | 260℃, 5s, 60℃담금질(quenching) |
도금 두께 | 1.5㎛ |
조건 | |
도금액 조성 | 황산 니켈 280g/L염화 나트륨 20g/L붕산 40g/L보레인 디메틸아민착제 1~4g/L |
도금액 온도 | 45℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 280g/L염화 니켈 20g/L붕산 40g/L보레인 디메틸아민착제 1~4g/L황산제일주석 20g/L |
도금액 온도 | 45℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 200g/L황산 구리 10g/L글리신 30g/L붕산 25g/L보레인 디메틸아민착제 1~4g/L |
도금액 온도 | 45℃ |
전류 밀도 | 2A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 280g/L황산 아연 20g/L황산 나트륨 150g/L붕산 50g/L보레인 디메틸아민착제 1~4g/L |
도금액 온도 | 45℃ |
전류 밀도 | 10A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 메탄술폰산 100g/L메탄술폰산 주석 200g/L계면활성제 2g/L |
도금액 온도 | 40℃ |
전류 밀도 | 10A/d㎡ |
도금액 온도 | 40℃ |
리플로우 조건 | 260℃, 5s, 60℃담금질(quenching) |
도금 두께 | 1.5㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L염화니켈 45g/L인산 50g/L아인산 5~10g/L보레인 디메틸아민착제 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L황산제일철 20g/L인산 50g/L아인산 5~10g/L보레인 디메틸아민착제 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 100g/L황산 구리 10g/L글리신 30g/L인산 25g/L아인산 5~10g/L보레인 디메틸아민착제 0.5~1g/L |
도금액 온도 | 25℃ |
전류 밀도 | 2A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 황산 니켈 150g/L황산 아연 20g/L황산 나트륨 150g/L인산 40g/L아인산 5~10g/L보레인 디메틸아민착제 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 메탄술폰산 100g/L메탄술폰산 주석 200g/L계면활성제 2g/L |
도금액 온도 | 40℃ |
전류 밀도 | 10A/d㎡ |
도금액 온도 | 40℃ |
리플로우 조건 | 260℃, 5s, 60℃담금질(quenching) |
도금 두께 | 1.5㎛ |
처리액 | Sn(H2PO4)2·2H2O 70g/LH3PO450g/L |
처리 온도 | 90℃ |
처리 시간 | 10분 |
처리 방법 | 무전해 |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L |
도금액 온도 | 70℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L주산 칼륨 20g/L질산 칼륨 12g/L피로인산 주석 20g/L차아인산 나트륨 10~20g/L |
도금액 온도 | 70℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L황산 니켈 20g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L |
도금액 온도 | 60℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L황산 아연 10g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L |
도금액 온도 | 60℃ |
전류 밀도 | 1A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L보레인 디메틸아민착체 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L피로인산 주석 20g/L주산 칼륨 20g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L보레인 디메틸아민착체 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L황산 아연 20g/L질산 칼륨 12g/L차아인산 나트륨 10~20g/L보레인 디메틸아민착체 0.5~1g/L |
도금액 온도 | 50℃ |
전류 밀도 | 5A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 피로인산 칼륨 350g/L피로인산 구리 80g/L황산 아연 10g/L질산 칼륨 12g/L차아인산 나트륨 20g/L보레인 디메틸아민착체 0.5g/L |
도금액 온도 | 50℃ |
전류 밀도 | 3A/d㎡ |
도금 두께 | 2.0㎛ |
조건 | |
도금액 조성 | 메탄술폰산 100g/L메탄술폰산 주석 200g/L계면활성제 2g/L |
도금액 온도 | 40℃ |
전류 밀도 | 10A/d㎡ |
도금액 온도 | 40℃ |
리플로우 조건 | 260℃, 5s, 60℃담금질(quenching) |
도금 두께 | 1.5㎛ |
Claims (27)
- 구리 또는 구리합금의 모재에 0.05 ∼ 20 중량% 의 인 및 0.05 ∼ 20 중량% 의 붕소 중 적어도 하나를 함유하는 니켈함금 또는 구리합금으로 이루어지는 합금도금의 중간층을 형성하고, 이 중간층에 주석 또는 주석합금도금의 표층을 형성한 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 20 중량% 함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 20 중량%, 그리고 Sn, Cu 및 Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량% 함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 20 중량%, 붕소를 0.05 ∼ 20 중량% 함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 20 중량%, 붕소를 0.05 ∼ 20 중량%, 그리고 Sn, Cu 및 Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량%함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 붕소를 0.05 ∼ 20 중량% 함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 붕소를 0.05 ∼ 20 중량%, Sn, Cu, Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량% 함유하고, 잔부가 니켈 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인과 붕소중 어느 일방 또는 양방을 합계 0.05 ∼ 20 중량% 함유하는 전기도금된 니켈합금이고, 상기 표층을 형성한 후에 리플로우처리를 실시한 후의 상기 표층중의 인과 붕소중 어느 일방 또는 양방의 농도가 0.01 ∼ 1 중량% 인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인과 붕소중 어느 일방 또는 양방을 합계 0.05 ∼ 20 중량%, Sn, Cu, Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량% 함유하는 니켈합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인과 붕소중 어느 일방 또는 양방을 합계 0.05 ∼ 20 중량% 함유하는 전기도금된 니켈합금이고, 상기 표층을 형성한 후에 리플로우처리와 가열처리중 어느 일방 또는 양방을 실시하고, 그럼으로써 중간층에 함유되는 인과 붕소중 어느 일방 또는 양방을 주석 또는 주석합금도금층 표면으로 확산시킨 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 주석 또는 주석합금도금층중의 탄소농도가 0.05 ∼ 0.5 중량% 인 것을 특징으로 하는 금속재료.
- 제 8 항에 있어서, 리플로우처리후 또는 가열처리후에 유기인화합물 혹은 무기인화합물의 피막을 형성한 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 표층의 두께가 0.3 ∼ 3 ㎛ 인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층의 두께가 0.5 ∼ 3 ㎛ 인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 표층이 주석 또는 주석합금을 전기도금후에 리플로우처리한 도금피막인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 도금후 혹은 리플로우후에 시효처리한 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 표층과 상기 중간층 사이에 주로 주석과 니켈로 형성된 확산층의 두께가 1 ㎛ 이하이고, 또한 확산층을 구성하는 입자의 평균입경이 1 ㎛ 이하인 것을 특징으로 하는 금속재료.
- 제 12 항에 기재된 금속재료의 제조방법으로서, 리플로우처리후 또는 가열처리후에, 인산이온을 0.1 ∼ 2 mol/L 함유하는 수용액에 재료를 침지하거나 수용액중에서 양극으로 하여 전해처리하는 것을 특징으로 하는 금속재료의 제조방법.
- 제 10 항에 기재된 금속재료의 제조방법으로서, 리플로우처리후 또는 가열처리후에, 밀봉처리와 윤활처리중 어느 일방 또는 양방을 실시하는 것을 특징으로 하는 금속재료의 제조방법.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 15 중량% 함유하고, 잔부가 구리 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 15 중량%, 그리고 Sn, Ni 및 Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량% 함유하고, 잔부가 구리 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 15 중량%, 붕소를 0.05 ∼ 15 중량%, 잔부가 구리 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 1 항에 있어서, 상기 중간층은 인을 0.05 ∼ 15 중량%, 붕소를 0.05 ∼ 15 중량%, 그리고 Sn, Ni 및 Zn 중 1 종 혹은 2 종 이상을 합하여 10 ∼ 60 중량% 함유하고, 잔부가 구리 및 불가피적 불순물로 이루어지는 합금인 것을 특징으로 하는 금속재료.
- 제 20 항에 있어서, 상기 표층과 상기 중간층 사이에 주로 주석과 구리로 형성된 확산층의 두께가 1 ㎛ 이하이고, 또한 확산층을 구성하는 입자의 평균입경이 1.5 ㎛ 이하인 것을 특징으로 하는 금속재료.
- 제 20 항에 있어서, 주석 또는 주석합금층이 인과 붕소중 어느 일방 또는 양방을 각각 0.05 ∼ 1 중량% 함유하는 것을 특징으로 하는 금속재료.
- 제 21 항에 있어서, 주석 또는 주석합금층이 용융주석도금법으로 실시된 것을 특징으로 하는 금속재료.
- 제 1 항에 기재된 금속재료를 접촉자로 한 내열성, 내시효성,그리고 삽입 및 발출성이 뛰어난 단자 및 커넥터.
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP98-258036 | 1998-09-11 | ||
JP25803698 | 1998-09-11 | ||
JP98-273451 | 1998-09-28 | ||
JP27327698 | 1998-09-28 | ||
JP27313698 | 1998-09-28 | ||
JP27345198 | 1998-09-28 | ||
JP98-273276 | 1998-09-28 | ||
JP98-273136 | 1998-09-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010075016A KR20010075016A (ko) | 2001-08-09 |
KR100392528B1 true KR100392528B1 (ko) | 2003-07-23 |
Family
ID=27478457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-7003056A Expired - Fee Related KR100392528B1 (ko) | 1998-09-11 | 1999-09-10 | 금속재료, 금속재료의 제조방법 및 금속재료를 이용한 단자 및 커넥터 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6613451B1 (ko) |
KR (1) | KR100392528B1 (ko) |
AU (1) | AU5649699A (ko) |
WO (1) | WO2000015876A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101016415B1 (ko) | 2006-12-29 | 2011-02-21 | 일진머티리얼즈 주식회사 | 전기 도금용 Sn-B 도금액 및 이를 이용한 Sn-B 전기 도금 방법 |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6982030B2 (en) * | 2002-11-27 | 2006-01-03 | Technic, Inc. | Reduction of surface oxidation during electroplating |
JP3795898B2 (ja) * | 2003-06-20 | 2006-07-12 | アルプス電気株式会社 | 接続装置 |
KR20070006747A (ko) * | 2004-01-21 | 2007-01-11 | 엔쏜 인코포레이티드 | 전자부품의 주석 표면에서 납땜성의 보존과 휘스커 증식의억제 방법 |
CN100548090C (zh) * | 2004-01-21 | 2009-10-07 | 恩索恩公司 | 在电子部件的锡表面中保持可焊性及抑制晶须生长的方法 |
US20050249969A1 (en) * | 2004-05-04 | 2005-11-10 | Enthone Inc. | Preserving solderability and inhibiting whisker growth in tin surfaces of electronic components |
US20050268991A1 (en) * | 2004-06-03 | 2005-12-08 | Enthone Inc. | Corrosion resistance enhancement of tin surfaces |
GB0507887D0 (en) * | 2005-04-20 | 2005-05-25 | Rohm & Haas Elect Mat | Immersion method |
WO2006113816A2 (en) * | 2005-04-20 | 2006-10-26 | Technic, Inc. | Underlayer for reducing surface oxidation of plated deposits |
US20070052105A1 (en) * | 2005-09-07 | 2007-03-08 | Rohm And Haas Electronic Materials Llc | Metal duplex method |
DE102005062601A1 (de) * | 2005-12-27 | 2007-07-05 | Robert Bosch Gmbh | Elektrisches Gerät mit einer geschmierten Fügestelle sowie Verfahren zur Schmierung einer solchen Fügestelle |
JP4986499B2 (ja) * | 2006-04-26 | 2012-07-25 | Jx日鉱日石金属株式会社 | Cu−Ni−Si合金すずめっき条の製造方法 |
CN101784165B (zh) * | 2010-03-19 | 2014-11-05 | 中兴通讯股份有限公司 | 一种印制电路板耐腐蚀可焊涂层处理方法 |
EP2799595A1 (de) * | 2013-05-03 | 2014-11-05 | Delphi Technologies, Inc. | Elektrisches Kontaktelement |
JP6146668B2 (ja) * | 2013-09-27 | 2017-06-14 | 株式会社オートネットワーク技術研究所 | 端子金具 |
JP6591140B2 (ja) * | 2014-01-31 | 2019-10-16 | 日本航空電子工業株式会社 | コネクタ対 |
US9525259B2 (en) * | 2014-04-02 | 2016-12-20 | Siemens Aktiengesellschaft | Electrical contactor |
EP3012919B8 (de) * | 2014-10-20 | 2019-01-09 | Aptiv Technologies Limited | Elektrisches Kontaktelement und Verfahren dafür |
WO2017090638A1 (ja) * | 2015-11-27 | 2017-06-01 | 三菱マテリアル株式会社 | 錫めっき付銅端子材及び端子並びに電線端末部構造 |
JP6226037B2 (ja) * | 2015-12-15 | 2017-11-08 | 三菱マテリアル株式会社 | 錫めっき付き銅端子材の製造方法 |
MY189529A (en) * | 2016-05-10 | 2022-02-16 | Mitsubishi Materials Corp | Tinned copper terminal material, terminal, and electrical wire end part structure |
EP3575448B1 (en) * | 2017-01-30 | 2024-05-22 | Mitsubishi Materials Corporation | Terminal material for connectors, terminal, and electric wire end part structure |
JP6686965B2 (ja) * | 2017-05-16 | 2020-04-22 | 三菱マテリアル株式会社 | 錫めっき付銅端子材及び端子並びに電線端末部構造 |
DE102019115243A1 (de) | 2019-06-05 | 2020-12-10 | Erni International Ag | Elektrisches Kontaktelement für hohe Betriebsspannungen |
JP7334485B2 (ja) * | 2019-06-07 | 2023-08-29 | 富士電機株式会社 | 半導体モジュールの外部接続部、半導体モジュールの外部接続部の製造方法、半導体モジュール、車両、及び外部接続部とバスバーとの接続方法 |
KR102159811B1 (ko) * | 2019-10-14 | 2020-09-29 | 한국과학기술연구원 | 내화학성이 향상된 하이브리드 니켈 전해도금방법 및 전해도금액 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63121693A (ja) * | 1986-11-10 | 1988-05-25 | Hitachi Cable Ltd | コネクタ−用端子 |
JPH1060666A (ja) * | 1996-08-24 | 1998-03-03 | Kobe Steel Ltd | 多極端子用錫又は錫合金めっき銅合金及びその製造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4503131A (en) * | 1982-01-18 | 1985-03-05 | Richardson Chemical Company | Electrical contact materials |
JPS59149042A (ja) * | 1983-02-15 | 1984-08-25 | Hitachi Cable Ltd | 半導体用リ−ドフレ−ム |
JPS6149450A (ja) * | 1984-08-17 | 1986-03-11 | Hitachi Cable Ltd | 半導体用リ−ドフレ−ム |
JPS6191394A (ja) * | 1984-10-12 | 1986-05-09 | Nippon Mining Co Ltd | 接触子の製造方法 |
JPH02138484A (ja) * | 1988-11-15 | 1990-05-28 | Aisin Seiki Co Ltd | 高リン含有ニツケルメツキ方法 |
JPH04255259A (ja) * | 1991-02-07 | 1992-09-10 | Kobe Steel Ltd | 半導体装置用リードフレーム |
DE4311872C2 (de) * | 1993-04-10 | 1998-07-02 | Heraeus Gmbh W C | Leiterrahmen für integrierte Schaltungen |
US5516594A (en) * | 1994-09-21 | 1996-05-14 | Scovill Japan Kabushiki Kaisha | Ni-Sn Plated fasteners for clothing |
KR100322975B1 (ko) * | 1997-02-03 | 2002-02-02 | 소네하라 다카시 | 리드 프레임재 |
TW459364B (en) * | 1999-04-28 | 2001-10-11 | Ind Tech Res Inst | Method and structure for strengthening lead frame used for semiconductor |
JP4489232B2 (ja) * | 1999-06-14 | 2010-06-23 | 日鉱金属株式会社 | コネクタ用めっき材料 |
-
1999
- 1999-09-10 KR KR10-2001-7003056A patent/KR100392528B1/ko not_active Expired - Fee Related
- 1999-09-10 WO PCT/JP1999/004951 patent/WO2000015876A1/ja active IP Right Grant
- 1999-09-10 US US09/786,010 patent/US6613451B1/en not_active Expired - Fee Related
- 1999-09-10 AU AU56496/99A patent/AU5649699A/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63121693A (ja) * | 1986-11-10 | 1988-05-25 | Hitachi Cable Ltd | コネクタ−用端子 |
JPH1060666A (ja) * | 1996-08-24 | 1998-03-03 | Kobe Steel Ltd | 多極端子用錫又は錫合金めっき銅合金及びその製造方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101016415B1 (ko) | 2006-12-29 | 2011-02-21 | 일진머티리얼즈 주식회사 | 전기 도금용 Sn-B 도금액 및 이를 이용한 Sn-B 전기 도금 방법 |
Also Published As
Publication number | Publication date |
---|---|
KR20010075016A (ko) | 2001-08-09 |
WO2000015876A1 (fr) | 2000-03-23 |
US6613451B1 (en) | 2003-09-02 |
AU5649699A (en) | 2000-04-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100392528B1 (ko) | 금속재료, 금속재료의 제조방법 및 금속재료를 이용한 단자 및 커넥터 | |
KR100836540B1 (ko) | 도금재료와 그 제조방법, 이를 사용한 전기,전자부품 | |
KR101203438B1 (ko) | 전자 부품용 Sn 도금재 | |
JP4402132B2 (ja) | リフローSnめっき材及びそれを用いた電子部品 | |
US8728629B2 (en) | Terminal for connector and method of producing the same | |
JP4489232B2 (ja) | コネクタ用めっき材料 | |
US6183886B1 (en) | Tin coatings incorporating selected elemental additions to reduce discoloration | |
JP2003293187A (ja) | めっきを施した銅または銅合金およびその製造方法 | |
KR102355341B1 (ko) | 주석 도금 형성 구리 단자재 및 단자 그리고 전선 단말부 구조 | |
EP2743381A1 (en) | Tin-plated copper alloy terminal member with outstanding insertion and removal characteristics | |
JP2007299722A (ja) | 配線用導体及びその製造方法並びに端末接続部並びにPbフリーはんだ合金 | |
JPH11350188A (ja) | 電気・電子部品用材料とその製造方法、およびその材料を用いた電気・電子部品 | |
JP3953169B2 (ja) | かん合型接続端子用めっき材の製造方法 | |
US20050037229A1 (en) | Plated material, method of producing same, and electrical / electronic part using same | |
EP3751667A1 (en) | Electrical terminal | |
WO2008072418A1 (ja) | オス端子及びその製造方法 | |
EP2273622A1 (en) | Metallic material for connector and process for producing the metallic material for connector | |
US20220085526A1 (en) | Anti-corrosion terminal material, terminal, and electrical wire end section structure | |
JP2000144482A (ja) | 金属材料 | |
JP2000169996A (ja) | 金属材料 | |
JP2003082499A (ja) | 錫−銅金属間化合物分散錫めっき端子 | |
JP2019123935A (ja) | めっき積層体の製造方法及びめっき積層体 | |
JP2000169997A (ja) | 金属材料 | |
JP2005105419A (ja) | めっき材料とその製造方法、それを用いた電気・電子部品 | |
JP2000169995A (ja) | 金属材料 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0105 | International application |
Patent event date: 20010309 Patent event code: PA01051R01D Comment text: International Patent Application |
|
PA0201 | Request for examination | ||
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20020930 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20030520 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20030711 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20030711 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20060626 Start annual number: 4 End annual number: 4 |
|
FPAY | Annual fee payment |
Payment date: 20070625 Year of fee payment: 5 |
|
PR1001 | Payment of annual fee |
Payment date: 20070625 Start annual number: 5 End annual number: 5 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |