KR100364844B1 - 반도체 패키지 제조 공정용 서키트 테이프 - Google Patents
반도체 패키지 제조 공정용 서키트 테이프 Download PDFInfo
- Publication number
- KR100364844B1 KR100364844B1 KR1020000072921A KR20000072921A KR100364844B1 KR 100364844 B1 KR100364844 B1 KR 100364844B1 KR 1020000072921 A KR1020000072921 A KR 1020000072921A KR 20000072921 A KR20000072921 A KR 20000072921A KR 100364844 B1 KR100364844 B1 KR 100364844B1
- Authority
- KR
- South Korea
- Prior art keywords
- circuit tape
- metal layer
- circuit
- tape
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 23
- 239000002184 metal Substances 0.000 claims abstract description 50
- 229910052751 metal Inorganic materials 0.000 claims abstract description 50
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000010931 gold Substances 0.000 claims abstract description 10
- 229910052737 gold Inorganic materials 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims description 11
- 230000002787 reinforcement Effects 0.000 claims description 3
- 150000002739 metals Chemical class 0.000 claims 1
- -1 these Chemical class 0.000 claims 1
- 238000000465 moulding Methods 0.000 abstract description 22
- 239000011347 resin Substances 0.000 abstract description 16
- 229920005989 resin Polymers 0.000 abstract description 16
- 239000010970 precious metal Substances 0.000 abstract description 11
- 238000005452 bending Methods 0.000 abstract description 3
- 239000012779 reinforcing material Substances 0.000 abstract 1
- 230000003313 weakening effect Effects 0.000 abstract 1
- 229910000679 solder Inorganic materials 0.000 description 7
- 239000000758 substrate Substances 0.000 description 6
- 239000004642 Polyimide Substances 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 206010011469 Crying Diseases 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000007747 plating Methods 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 2
- 238000012858 packaging process Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009429 electrical wiring Methods 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/4985—Flexible insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49838—Geometry or layout
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Geometry (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (3)
- 단위 패키지 영역내에 반도체칩의 본딩패드와 전기적으로 연결되는 소정의 회로패턴을 이루는 메탈층이 형성되고, 상기 단위 패키지 영역 외측의 영역에는 보강재 역할을 하는 메탈층이 형성되며, 상기 각 메탈층에는 골드등의 도전성이 좋은 금속이 도금되는 서키트 테이프에 있어서;상기 단위 패키지 영역 외측 영역에 형성되는 메탈층이 격자형을 이루도록 형성됨을 특징으로 하는 반도체 패키지 제조 공정용 서키트 테이프.
- 제 1 항에 있어서,상기 서키트 테이프의 단위 패키지 영역 외측 영역에 형성되는 격자형의 메탈층의 교차지점이 도트(dot) 형태를 이루도록 형성한 것을 특징으로 하는 반도체 패키지 제조 공정용 서키트 테이프.
- 제 2 항에 있어서,상기 격자형 메탈층의 도트형 교차지점은 그 기하학적 형태가 원형을 이룸을 특징으로 하는 반도체 패키지 제조 공정용 서키트 테이프.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020000072921A KR100364844B1 (ko) | 2000-12-04 | 2000-12-04 | 반도체 패키지 제조 공정용 서키트 테이프 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020000072921A KR100364844B1 (ko) | 2000-12-04 | 2000-12-04 | 반도체 패키지 제조 공정용 서키트 테이프 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020043798A KR20020043798A (ko) | 2002-06-12 |
KR100364844B1 true KR100364844B1 (ko) | 2002-12-16 |
Family
ID=27679328
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020000072921A Expired - Fee Related KR100364844B1 (ko) | 2000-12-04 | 2000-12-04 | 반도체 패키지 제조 공정용 서키트 테이프 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100364844B1 (ko) |
-
2000
- 2000-12-04 KR KR1020000072921A patent/KR100364844B1/ko not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20020043798A (ko) | 2002-06-12 |
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