KR100255430B1 - 박막을 성장시키기 위한 방법 및 장치 - Google Patents
박막을 성장시키기 위한 방법 및 장치 Download PDFInfo
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- KR100255430B1 KR100255430B1 KR1019960704091A KR19960704091A KR100255430B1 KR 100255430 B1 KR100255430 B1 KR 100255430B1 KR 1019960704091 A KR1019960704091 A KR 1019960704091A KR 19960704091 A KR19960704091 A KR 19960704091A KR 100255430 B1 KR100255430 B1 KR 100255430B1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
- C23C16/45546—Atomic layer deposition [ALD] characterized by the apparatus specially adapted for a substrate stack in the ALD reactor
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (15)
- 반응공간내에 위치된 기판 상에 박막을 형성하도록 두 개 이상의 기체상 반응물을 교대로 반복적으로 상기 기판에 가함으로써 상기 기판 상으로 박막을 성장시키기 위한 방법으로서, 반응물 소오스로부터 분리된 상기 반응물을 기체상의 형태로 교대로 반복적으로 상기 반응공간내로 공급하는 단계와, 상기 기판 상에 고상의 박막 혼합물을 형성하도록 상기 기체상 반응물을 상기 기판의 표면과 반응시키는 단계와, 두 연속적인 기체상 펄스 사이의 간격동안 상기 반응공간의 두 가스부피 보다 훨씬 큰 용량을 배출시킬 수 있는 펌프에 상기 반응공간을 연결시킴으로써 상기 두 연속적인 기체상 펄스 사이에서 상기 반응공간의 둘 이상의 가스 부피를 배출시키는 단계로서, 상기 반응공간내에 잔존하는 상기 두 연속적인 기체상 펄스의 제 1펄스의 잔류 성분이 상기 두 연속적인 기체상 펄스의 제 2펄스가 유입되기 전에 1% 미만의 레벨이 되는 단계와, 그리고 상기 배출 단계와 동시에 상기 반응공간내로 무반응성 가스를 공급하는 단계를 포함하는 방법.
- 제1항에 있어서, 상기 반응공간의 상기 가스 부피가 상기 두 연속적인 기체상 펄스 사이의 간격동안 2배 내지 10배로 배출되는 방법.
- 제1항에 있어서, 상기 반응공간에 잔류하는 상기 두 연속적인 기체상 펄스의 제 1펄스의 잔류 성분이 상기 연속적인 기체상 펄스의 제 2펄스가 유입되기 전에 1% 미만의 레벨이 되도록 상기 반응공간의 상기 가스 부피가 배출되는 방법.
- 제1항에 있어서, 상기 반응공간이 상기 두 연속적인 기체상 펄스 사이의 간격동안 상기 반응공간의 가스 부피 보다 훨씬 큰 용량을 갖는 폄프에 연결되는 방법.
- 제1항에 있어서, 상기 각각의 기체상 반응물이 상기 반응공간으로부터 배출된 가스 부피를 최소화시키기 위해 별도의 유입 채널을 통해 상기 반응공간내로 공급되는 방법.
- 제1항에 있어서, 상기 각각의 기체상 펄스가 상기 반응공간내로 유입되기 전에 상기 무반응성 가스와 혼합되는 방법.
- 제1항에 있어서, 상기 반응공간은 상기 기판이 위치될 반응 챔버와, 상기 반응 챔버와 연통하는 가스 흐름 채널을 포함하고 있으며, 상기 가스 흐름 채널은 상기 기체상 펄스를 상기 반응 공간내로 유입시키고 상기 반응 챔버로부터 상기 기체상 펄스의 비반응된 성분을 배출시키기에 적합하도록 구성되며, 상기 가스 흐름 채널의 일부분이 상기 반응공간의 부피를 최소화하기 위해 높이보다 폭이 큰 직사각형 단면을 갖는 방법.
- 제1항에 또는 제7항에 있어서, 상기 반응공간은 상기 기판이 위치될 반응 챔버와, 상기 반응 챔버와 연통하는 가스 흐름 채널을 포함하고 있으며, 상기 가스 흐름 채널은 상기 기체상 펄스를 상기 반응 공간내로 유입시키는 동시에 상기 반응 챔버로부터 상기 기체상 펄스의 비반응된 성분을 배출시키기에 적합하도록 구성되어 있고, 상기 반응 챔버가 상기 반응공간의 부피를 최소화하기 위해 높이 보다 폭이 큰 직사각형 단면을 갖는 방법.
- 제8항에 있어서, 상기 기체상 펄스가, 평면형 기체상 반응물 펄스를 형성하고 상기 기체상 반응물과 캐리어 가스 흐름의 상호 혼합을 개선하기 위해, 높이보다 폭이 큰 직사각형 단면을 갖는 상기 가스 흐름 채널을 통해 공급되는 방법.
- 제8항에 있어서, 각각의 반응물 그룹의 상기 기체상 펄스의 각각의 유입 채널을 통해 상기 반응 챔버로 직접 공급되며, 상기 기체상 펄스는 상기 반응물이 상기 기판과 접촉하기 전에 캐리어 가스 흐름과 상호 혼합되는 방법.
- 제1항에 있어서, 상기 기체상 펄스의 일부가 층류로서 상기 반응 챔버내로 공급되는 방법.
- 기판상에 고상의 박막을 형성하도록 상기 기판에 기체상 반응물을 교대로 반복적으로 상기 기판 상에 가함으로써 상기 기판 상으로 박막을 성장시키기 위한 장치로서, 기판이 위치되는 반응공간과, 상기 반응공간과 연통하고 있고, 박막 성장 공정에 사용되는 반응물을 기체상 펄스 형태로 상기 반응 공간으로 공급하는 동시에 무반응성 가스를 상기 반응 공간으로 공급하기에 적합하도록 구성된 다수의 유입 채널과 그리고 상기 반응공간과 연통하고 있고, 상기 반응공간으로부터 반응 생성물과 과잉의 반응물을 배출시키기에 적합하도록 구성된 반응물 배출 채널을 포함하고 있으며, 상기 반응물 배출 채널이 상기 반응공간을 진공으로 배출시킬 수 있도록 펌프에 연결된 연결부를 갖추고 있고, 상기 펌프가 두 연속적인 기체상 반응물 펄스 사이의 간격동안 상기 반응 공간의 가스 부피의 두 배 이상을 배출시킬 수 있는 용량을 갖는 장치.
- 제12항에 있어서, 상기 펌프가 두 연속적인 기체상 반응물 펄스 사이의 간격동안 상기 반응공간의 가스 부피의 두 배 이상을 배출시킬 수 있는 용량을 갖는 장치.
- 기판 상에 고상의 박막을 형성하도록 기판에 기체상 반응물의 표면 반응을 교대로 반복적으로 가함으로써 기판 상으로 박막을 성장시키기 위한 장치로서, 기판이 위치되는 반응공간과, 상기 반응공간과 연통하고 있는 가스 흐름 채널을 포함하고 있으며, 상기 가스 흐름 채널은 다수의 상기 기체상 펄스와 무반응성 가스를 상기 반응 공간내로 유입시키는 동시에 상기 반응 공간으로부터 상기 박막 성장 공정 중에 발생되는 반응 생성물 및 과잉의 반응물 펄스를 상기 반응공간으로부터 배출시키기에 적합하도록 구성되어 있고, 상기 반응공간의 부피를 최소화하기 위해 상기 가스 흐름 채널의 일부분이 높이보다 폭이 큰 직사각형 단면을 갖는 장치.
- 제14항에 있어서, 상기 반응공간의 부피를 최소화하기 위해 상기 반응 챔버가 높이보다 폭이 큰 직사각형 단면을 갖는 장치.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI945611 | 1994-11-28 | ||
FI945611A FI100409B (fi) | 1994-11-28 | 1994-11-28 | Menetelmä ja laitteisto ohutkalvojen valmistamiseksi |
PCT/FI1995/000658 WO1996017107A1 (en) | 1994-11-28 | 1995-11-28 | Method and apparatus for growing thin films |
Publications (2)
Publication Number | Publication Date |
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KR970700787A KR970700787A (ko) | 1997-02-12 |
KR100255430B1 true KR100255430B1 (ko) | 2000-05-01 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1019960704091A Expired - Lifetime KR100255430B1 (ko) | 1994-11-28 | 1995-11-28 | 박막을 성장시키기 위한 방법 및 장치 |
Country Status (7)
Country | Link |
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US (5) | US6015590A (ko) |
JP (1) | JPH09508890A (ko) |
KR (1) | KR100255430B1 (ko) |
AU (1) | AU3985695A (ko) |
DE (1) | DE19581483B4 (ko) |
FI (1) | FI100409B (ko) |
WO (1) | WO1996017107A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20190004635A (ko) * | 2017-07-04 | 2019-01-14 | 한국과학기술원 | 개시제를 이용한 화학 기상 증착의 다층 시스템 및 방법 |
Families Citing this family (658)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI119941B (fi) * | 1999-10-15 | 2009-05-15 | Asm Int | Menetelmä nanolaminaattien valmistamiseksi |
FI118158B (sv) | 1999-10-15 | 2007-07-31 | Asm Int | Förfarande för modifiering av utgångsämneskemikalierna i en ALD-prosess |
FI100409B (fi) * | 1994-11-28 | 1997-11-28 | Asm Int | Menetelmä ja laitteisto ohutkalvojen valmistamiseksi |
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Also Published As
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US6572705B1 (en) | 2003-06-03 |
DE19581483B4 (de) | 2010-03-11 |
FI100409B (fi) | 1997-11-28 |
JPH09508890A (ja) | 1997-09-09 |
FI945611A0 (fi) | 1994-11-28 |
US20020041931A1 (en) | 2002-04-11 |
AU3985695A (en) | 1996-06-19 |
US7498059B2 (en) | 2009-03-03 |
DE19581483T1 (de) | 1997-01-02 |
US6015590A (en) | 2000-01-18 |
KR970700787A (ko) | 1997-02-12 |
FI945611A7 (fi) | 1996-06-11 |
US8507039B2 (en) | 2013-08-13 |
US20090181169A1 (en) | 2009-07-16 |
US20080138518A1 (en) | 2008-06-12 |
US7404984B2 (en) | 2008-07-29 |
WO1996017107A1 (en) | 1996-06-06 |
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