KR100221087B1 - 실리콘 단결정 성장 방법 및 실리콘 단결정 - Google Patents
실리콘 단결정 성장 방법 및 실리콘 단결정 Download PDFInfo
- Publication number
- KR100221087B1 KR100221087B1 KR1019970005530A KR19970005530A KR100221087B1 KR 100221087 B1 KR100221087 B1 KR 100221087B1 KR 1019970005530 A KR1019970005530 A KR 1019970005530A KR 19970005530 A KR19970005530 A KR 19970005530A KR 100221087 B1 KR100221087 B1 KR 100221087B1
- Authority
- KR
- South Korea
- Prior art keywords
- single crystal
- magnetic field
- oxygen concentration
- silicon
- block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 129
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 79
- 239000010703 silicon Substances 0.000 title claims abstract description 79
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 78
- 238000002109 crystal growth method Methods 0.000 title claims abstract description 18
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 68
- 239000001301 oxygen Substances 0.000 claims abstract description 68
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 68
- 230000012010 growth Effects 0.000 claims abstract description 43
- 238000000034 method Methods 0.000 claims abstract description 35
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 8
- 230000007423 decrease Effects 0.000 claims description 4
- HIVGXUNKSAJJDN-UHFFFAOYSA-N [Si].[P] Chemical compound [Si].[P] HIVGXUNKSAJJDN-UHFFFAOYSA-N 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 238000009827 uniform distribution Methods 0.000 abstract description 2
- 238000009826 distribution Methods 0.000 description 8
- 235000012431 wafers Nutrition 0.000 description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 6
- 229910002804 graphite Inorganic materials 0.000 description 6
- 239000010439 graphite Substances 0.000 description 6
- 239000010453 quartz Substances 0.000 description 6
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 4
- 230000008018 melting Effects 0.000 description 4
- 238000002844 melting Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 238000004090 dissolution Methods 0.000 description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 230000003698 anagen phase Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000005426 magnetic field effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 230000005501 phase interface Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B30/00—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions
- C30B30/04—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions using magnetic fields
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/917—Magnetic
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (3)
- 다결정 실리콘을 가열 용해하여 실리콘 용액을 형성하는 단계, 상기 실리콘 용액의 표면에 종자결정을 담그는 단계, 상기 종자결정의 아랫부분이 실리콘 용액 속에서 녹기 시작할 때 종자결정을 인상시켜 실리콘 단결정을 성장시키는 단계, 및 상기 실리콘 단결정 성장 중에 커스프 자장을 인가하여 실리콘 단결정을 성장하는 방법에 있어서, 상기 커스프 자장인가는, a)상기 단결정에 중 산소 농도의 블록을 형성할 때까지 자장을 인가하지 않고, b)상기 단결정에 중 산소 농도의 블록이 형성된 이후부터 자장의 세기를 균일한 저 산소 농도 블록이 형성될 수 있는 비율로 서서히 증가시키고, 저 산소 농도의 결정을 얻기 위한 자장 세기에 도달한 후 자장의 세기를 균일한 저 산소 농도 블록이 형성될 수 있는 비율로 서서히 감소시켜서, 상기 단결정 성장이 완료되기 직전에 자장의 세기를 0이 되도록 인가하여, 성장된 단결정내에 중 산소 농도 블록과 균일한 저 산소 농도 블록을 연속하여 형성하게 하는 실리콘 단결정 성장방법.
- 다결정 실리콘을 가열 용해하여 실리콘 용액을 형성하는 단계, 상기 실리콘 용액의 표면에 종자결정을 담그는 단계, 상기 종자결정의 아랫부분이 실리콘 용액 속에서 녹기 시작할 때, 상기 종자결정을 인상시켜 실리콘 단결정을 성장시키는 단계, 및 상기 실리콘 단결정 성장 중에 커스프 자장을 인가하여 실리콘 단결정을 성장하는 방법에 있어서, 상기 커스프 자장인가는, a)상기 단결정에 중 산소 농도의 블록을 형성할 때까지 자장을 인가하지 않고, b)상기 단결정에 중 산소 농도의 블록이 형성된 이후부터 자장의 세기를 균일한 저 산소 농도 블록이 형성될 수 있는 비율로 서서히 증가시키고, 저 산소 농도의 결정을 얻기 위한 자장 세기에 도달한 후 자장의 세기를 균일한 저 산소 농도 블록이 형성될 수 있는 비율로 서서히 감소시켜서, 상기 단결정 성장이 완료되기 직전에 자장의 세기를 0이 되도록 인가하여, 성장된 단결정내에 중 산소 농도 블록과 균일한 저 산소 농도 블록을 연속하여 형성하게 하는 실리콘 단결정 성장방법에 의하여 제조된, 실리콘 단결정에서 단결정의 길이가 020일 때 산소 농도가 7817개/ 3이고, 상기 단결정의 길이가 2560일 때 산소 농도가 5617개/ 3인 실리콘 단결정.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970005530A KR100221087B1 (ko) | 1997-02-24 | 1997-02-24 | 실리콘 단결정 성장 방법 및 실리콘 단결정 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970005530A KR100221087B1 (ko) | 1997-02-24 | 1997-02-24 | 실리콘 단결정 성장 방법 및 실리콘 단결정 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19980068756A KR19980068756A (ko) | 1998-10-26 |
KR100221087B1 true KR100221087B1 (ko) | 1999-09-15 |
Family
ID=19497754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970005530A Expired - Fee Related KR100221087B1 (ko) | 1997-02-24 | 1997-02-24 | 실리콘 단결정 성장 방법 및 실리콘 단결정 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100221087B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100840751B1 (ko) | 2005-07-26 | 2008-06-24 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳 제조 방법, 성장 장치 및그로부터 제조된 잉곳 , 웨이퍼 |
KR101455922B1 (ko) | 2013-03-06 | 2014-10-28 | 주식회사 엘지실트론 | 커스프 자기장을 이용한 실리콘 단결정 잉곳 성장장치 및 성장방법 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101067162B1 (ko) * | 2008-10-20 | 2011-09-22 | 주식회사 엘지실트론 | 석영 도가니 내표면 개선 방법 |
-
1997
- 1997-02-24 KR KR1019970005530A patent/KR100221087B1/ko not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100840751B1 (ko) | 2005-07-26 | 2008-06-24 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳 제조 방법, 성장 장치 및그로부터 제조된 잉곳 , 웨이퍼 |
KR101455922B1 (ko) | 2013-03-06 | 2014-10-28 | 주식회사 엘지실트론 | 커스프 자기장을 이용한 실리콘 단결정 잉곳 성장장치 및 성장방법 |
Also Published As
Publication number | Publication date |
---|---|
KR19980068756A (ko) | 1998-10-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR960006260B1 (ko) | 커스프자장과, 결정 및 도가니의 회전속도와의 조합에 의한 실리콘 결정의 산소량 조절방법 | |
JP5485136B2 (ja) | 単結晶を製造する方法及び装置 | |
KR101009074B1 (ko) | 가변 자기장을 사용한 성장 실리콘 결정의 용융물-고체 계면 형상의 제어 | |
US4040895A (en) | Control of oxygen in silicon crystals | |
KR100827028B1 (ko) | 쵸크랄스키법을 이용한 반도체 단결정 제조 방법, 및 이방법에 의해 제조된 반도체 단결정 잉곳 및 웨이퍼 | |
US20100101485A1 (en) | Manufacturing method of silicon single crystal | |
JP2001158690A (ja) | 高品質シリコン単結晶の製造方法 | |
CN1016191B (zh) | 半导体器件的高氧含量硅单晶基片制法 | |
CN112831836A (zh) | 拉晶方法和拉晶装置 | |
KR100221087B1 (ko) | 실리콘 단결정 성장 방법 및 실리콘 단결정 | |
JP6304125B2 (ja) | シリコン単結晶の軸方向の抵抗率制御方法 | |
JPH07267776A (ja) | 結晶成長方法 | |
JP2009057232A (ja) | シリコン単結晶育成方法およびその装置 | |
JP4013324B2 (ja) | 単結晶成長方法 | |
JP3750440B2 (ja) | 単結晶引上方法 | |
JP2000086392A (ja) | シリコン単結晶の製造方法 | |
JP2000239096A (ja) | シリコン単結晶の製造方法 | |
KR100831052B1 (ko) | 실리콘 단결정 잉곳의 산소농도 조절방법, 이를 사용하여제조된 잉곳 | |
JPH10287488A (ja) | 単結晶引き上げ方法 | |
TWI701363B (zh) | 矽單晶長晶方法 | |
EP1365048B1 (en) | Method for fabricating silicon single crystal | |
KR100829061B1 (ko) | 커습 자기장을 이용한 실리콘 단결정 성장 방법 | |
JPH08333189A (ja) | 結晶引き上げ装置 | |
KR101597207B1 (ko) | 실리콘 단결정 잉곳, 그 잉곳을 제조하는 방법 및 장치 | |
JP2000239097A (ja) | 半導体用シリコン単結晶の引上げ方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19970224 |
|
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19970224 Comment text: Request for Examination of Application |
|
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 19981211 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19990604 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 19990625 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 19990626 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20020508 Start annual number: 4 End annual number: 4 |
|
FPAY | Annual fee payment |
Payment date: 20030403 Year of fee payment: 5 |
|
PR1001 | Payment of annual fee |
Payment date: 20030403 Start annual number: 5 End annual number: 5 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |
Termination category: Default of registration fee Termination date: 20050311 |