KR0172533B1 - 플래쉬 메모리 장치 - Google Patents
플래쉬 메모리 장치 Download PDFInfo
- Publication number
- KR0172533B1 KR0172533B1 KR1019950035937A KR19950035937A KR0172533B1 KR 0172533 B1 KR0172533 B1 KR 0172533B1 KR 1019950035937 A KR1019950035937 A KR 1019950035937A KR 19950035937 A KR19950035937 A KR 19950035937A KR 0172533 B1 KR0172533 B1 KR 0172533B1
- Authority
- KR
- South Korea
- Prior art keywords
- column
- address
- flash memory
- data
- input
- Prior art date
Links
- 238000012790 confirmation Methods 0.000 claims abstract description 14
- 238000012795 verification Methods 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 3
- 238000004904 shortening Methods 0.000 abstract description 2
- 210000004027 cell Anatomy 0.000 description 23
- 238000010586 diagram Methods 0.000 description 4
- 210000004460 N cell Anatomy 0.000 description 1
- 102100029469 WD repeat and HMG-box DNA-binding protein 1 Human genes 0.000 description 1
- 101710097421 WD repeat and HMG-box DNA-binding protein 1 Proteins 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
- G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
Landscapes
- Read Only Memory (AREA)
Abstract
Description
Claims (3)
- 확인모드를 선택하기 위한 모드 콘트롤 블럭과, 상기 모드 콘트롤 블럭의 데이타를 입력으로하며, 다수의 입력어드레스핀중 어느 하나를 돈캐어로 처리하므로서 제1 및 제2컬럼디코더로 나누어지는 컬럼디코더와, 상기 제1 및 제2컬럼디코더의 어드레스 및 로우디코더의 어드레스를 각각 입력으로 하는 메인 셀어레이와, 상기 제1 및 제2컬럼디코더의 어드레스 및 로우디코더의 어드레스에 의해 선택되는 상기 메인 셀어레이의 각각의 컬럼라인 및 레퍼런스 셀어레이로 부터 출력되는 컬럼라인을 각각 입력으로 하며, 입력되는 각각의 컬럼라인을 감지하여 증폭하도록 하는 제1 및 제2센스앰프 블록과, 상기 제1 및 제2센스앰프 블럭으로 부터 증폭된 각각의 데이타 및 일정한 기대값을 갖는 셀 데이타를 각각 입력으로 하며, 상기 입력되는 데이타를 비교하여 전체셀에 대한 확인동작으로 정상/불량을 확인 하도록 하는 제1 및 제2비교블럭과, 상기 제1 및 제2비교블럭에 의해 확인된 결과값을 기억시키도록 하며, 상기 확인된 결과값을 출력버퍼를 통해 데이타 출력핀으로 출력시키는 상태 레지스터로 구성되는 것을 특징으로 하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 컬럼디코더를 구성하는 입력 어드레스핀중 복수개의 어드레스를 선택하고, 기존의 확인모드를 2개이상의 정수배로 사용하여 확인을 병렬로 수행할수 있도록 구성되는 것을 특징으로하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 컬럼디코더에서 상기 기존의 확인시간과 같은 시간동안에 확인을 연속하여 2회 실행하고자 할때, 동시에 선택된 어드레스가 인버터를 경유해 반전된값을 가지는 어드레스도 선택하여 병렬로 확인모드를 수행할 수 있도록 구성되는 것을 특징으로하는 플래쉬 메모리 장치.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950035937A KR0172533B1 (ko) | 1995-10-18 | 1995-10-18 | 플래쉬 메모리 장치 |
GB9621502A GB2306717B (en) | 1995-10-18 | 1996-10-15 | Flash memory device |
US08/730,872 US5787038A (en) | 1995-10-18 | 1996-10-18 | Flash memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950035937A KR0172533B1 (ko) | 1995-10-18 | 1995-10-18 | 플래쉬 메모리 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970023452A KR970023452A (ko) | 1997-05-30 |
KR0172533B1 true KR0172533B1 (ko) | 1999-03-30 |
Family
ID=19430507
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950035937A KR0172533B1 (ko) | 1995-10-18 | 1995-10-18 | 플래쉬 메모리 장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5787038A (ko) |
KR (1) | KR0172533B1 (ko) |
GB (1) | GB2306717B (ko) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0913835B1 (en) * | 1997-10-28 | 2007-03-21 | STMicroelectronics S.r.l. | Method for parallel programming of nonvolatile memory devices, in particular flash memories and EEPROMs |
US6560730B1 (en) * | 2000-02-18 | 2003-05-06 | Silicon Storage Technology, Inc. | Method and apparatus for testing a non-volatile memory array having a low number of output pins |
US6538922B1 (en) | 2000-09-27 | 2003-03-25 | Sandisk Corporation | Writable tracking cells |
US6785169B1 (en) * | 2002-04-05 | 2004-08-31 | T-Ram, Inc. | Memory cell error recovery |
US6836434B2 (en) * | 2002-11-21 | 2004-12-28 | Micron Technology, Inc. | Mode selection in a flash memory device |
US7237074B2 (en) * | 2003-06-13 | 2007-06-26 | Sandisk Corporation | Tracking cells for a memory system |
US7301807B2 (en) | 2003-10-23 | 2007-11-27 | Sandisk Corporation | Writable tracking cells |
US7257033B2 (en) * | 2005-03-17 | 2007-08-14 | Impinj, Inc. | Inverter non-volatile memory cell and array system |
US7715236B2 (en) * | 2005-03-30 | 2010-05-11 | Virage Logic Corporation | Fault tolerant non volatile memories and methods |
US7679957B2 (en) * | 2005-03-31 | 2010-03-16 | Virage Logic Corporation | Redundant non-volatile memory cell |
US7719896B1 (en) | 2007-04-24 | 2010-05-18 | Virage Logic Corporation | Configurable single bit/dual bits memory |
US7920423B1 (en) | 2007-07-31 | 2011-04-05 | Synopsys, Inc. | Non volatile memory circuit with tailored reliability |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR930008417B1 (ko) * | 1990-06-18 | 1993-08-31 | 삼성전자 주식회사 | 반도체 메모리 장치의 다중 비트 병렬 테스트방법 |
KR960002006B1 (ko) * | 1991-03-12 | 1996-02-09 | 가부시끼가이샤 도시바 | 2개의 기준 레벨을 사용하는 기록 검증 제어기를 갖는 전기적으로 소거 가능하고 프로그램 가능한 불휘발성 메모리 장치 |
US5361227A (en) * | 1991-12-19 | 1994-11-01 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device and memory system using the same |
US5563823A (en) * | 1993-08-31 | 1996-10-08 | Macronix International Co., Ltd. | Fast FLASH EPROM programming and pre-programming circuit design |
-
1995
- 1995-10-18 KR KR1019950035937A patent/KR0172533B1/ko not_active IP Right Cessation
-
1996
- 1996-10-15 GB GB9621502A patent/GB2306717B/en not_active Expired - Fee Related
- 1996-10-18 US US08/730,872 patent/US5787038A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB9621502D0 (en) | 1996-12-04 |
US5787038A (en) | 1998-07-28 |
GB2306717B (en) | 2000-01-19 |
KR970023452A (ko) | 1997-05-30 |
GB2306717A (en) | 1997-05-07 |
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