KR0168230B1 - Improved Time Division Switching Subscriber Test System - Google Patents

Abstract

The present invention is an improved time division exchange (TDX-10) subscriber test that improves a subscriber test device (TEC: Test Equipment Control, TEC), which is a hardware test for the line characteristics of wired subscribers in a TDX-10 exchange. The apparatus relates to an inter-processor communication (hereinafter referred to as IPC). The PPHA 22, which is a lower processor connected to the node 11, and command data and mode data from the PPHA 22 are stored. TECA (13, 15) that transmits data on the abnormal state of the subscriber circuit to the PPHA (22) using the TD-bus line after receiving the input, and the state of the terminal and the subscriber circuit and the state of the TECA (13) The analog subscriber interface block (ASI), which transmits and receives analog signals to and from the TEMU 14 and 16 to measure and the TEC 13 and 15 through a test bus, and interfaces with a subscriber. Including (17, 18) In this configuration, the number of printed circuit boards is greatly reduced, and the price is reduced, and the test bus is realized, so that up to 8,192 subscribers can be tested with only one TECA sheet.

Description

Improved Time Division Exchange (TDX-10) Subscriber Test System

1 is a block diagram of a conventional subscriber test apparatus (TEC),

2 is a block diagram of a subscriber test apparatus (TEC) of the present invention,

3 is a diagram illustrating a connection structure between a subscriber test apparatus (TEC) block and a peripheral block of the present invention.

* Explanation of symbols for main parts of the drawings

11: TEBB 13: PBU-A

13,15: TECA 14,16: TEMU

21: IPC Node 22: PPHA

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a time division exchange (TDX) of a wired communication system. Particularly, a subscriber test apparatus (TEC), which is hardware for testing the line characteristics of a wired subscriber in a TDX-10 exchange, is provided. An improved Time Division Exchange (TDX-10) Subscriber Test System with improved Control (hereinafter referred to as TEC).

That is, as a field for testing the track part and the circuit part of the fixed subscriber, it can be applied to a mobil services switching center (MSC) and a local exchange.

An access switching subsystem (ASS) is commonly referred to as the supply of current for subscriber circuits, monitoring of subscriber circuit conditions, overvoltage protection, call signaling, AC / DC interconversion, and conference call processing. It is a system that performs the function, the relay line connection function, and the test circuit connection function. In the conventional TDX-10, two TEC blocks for the IN / OUT test of 8,192 subscribers in one ASS were configured. .

Referring to the drawings, a conventional TEC block diagram is shown as shown in FIG. 1, and includes a TECO and a TECI block capable of testing at least 4,098 subscribers to test 8,192 subscribers accessible in one ASS. It consists of two TEC blocks.

That is, each TEC supplies power to the test equipment control back board (TEBB) 1, which is a back board on which a printed circuit board assembly (PBA) and a cable of one TEC block can be mounted, and the TEC block. The power supply unit (PBU-A) (2), the power supply unit to control the TECO and the TECI, and report the current status to an access switching processor (ASP), which is not shown, the upper processor. A test bus distributorboard assembly (TBDA) (4), a test device that connects test buses between test equipments of a subscriber under the control of a peripheral processor hardware board assembly (PPHA), which is a processor board made to be used, and a subscriber board. AuXiliary test module board unit (ATMU) 6, which is an intest device for testing GSLA, and a test contort interface board assembly (TCIA), which is a control board that controls the ATMU 6 and determines a test result ( 3) with subscriber line Out tests to examine the state of the (out test) consists of the equipment MTMU (main test module board unit) (5).

The TEC of the TDX-10 configured as described above has two slots, which are slotted back boards, two TEBBs (1), two PBU-A (2) s, two TCIAs (3) s, It consists of four TBDA (4) sheets, two MTMU (5) sheets, two ATMU (6) sheets, and one PPHA sheet.

In addition, since the conventional TEC was separated into TECO and TECI, the number of backboards and power boards was two, and the MTMU (5), which is the subscriber out test equipment, and the ATMU (6), which is the in-test equipment, were separated. The price of the equipment module has increased, and four TBDAs (relay matrix boards) for interlocking tests between ASS systems are required, and faults occur in the MTMU (5) or ATMU (6) of TEC. In this case, there was a problem in performing the interworking function, and the complexity of the software due to the complicated structure of the TEC device and thus the maintenance was difficult.

The present invention is to solve the above problems, design a reasonable structure for the entire TEC block, and based on this, reduce the TBDA function according to the integration / structure reorganization through the integration of ATMU, MTMU test equipment modules, By integrating logic circuit and reducing test equipment control, it is possible to perform TBDA function after securing space and to provide improved TDX-10 subscriber test device to accommodate TEC 2 module on one back board.

The improved time division exchange (TDX-10) subscriber test apparatus of the present invention for achieving the above object is shown in the block diagram of the subscriber test apparatus (TEC) shown in FIG. It is for testing subscriber and performs test function for subscriber line and subscriber terminal status, and test for normal operation of subscriber circuit, and one PBU-A (12) power supply board and TD TEMU (14), which receives the command data and the mode data from the PPHA 22 via the telephony bus, performs the test on the subscriber to be tested and, if necessary, performs the actual measurement. 16) TECA (13, 15) for transmitting test command data, and test equipment control board assembly (TEMU) (14, 16), which is a practical measurement equipment for in / outward testing. , The PBU-A (1 2), TECA (13, 15) and TEMU (14, 16) is composed of a TEBB (11) for connecting a signal and providing power to each other.

The above-described TEC block can be used to test its function outside the exchange, i.e., the condition of the subscriber line, for the outward test function and the inward test function and keys for testing the subscriber circuit inside the exchange. It can be divided into a test (key test) test function, etc. In the case of such a test, the step test (Step test) for the test of each measurement element and item, the same as the step test (step test) A camp-on test to detect changes in the condition, a test to track down the track, and an instant test that performs all items of the step test until a failure is found.

A detailed connection structure diagram between the subscriber test apparatus (TEC) block and the peripheral block of the present invention configured as described above is shown in FIG. 3, and is referred to as inter-processor communication (hereinafter referred to as IPC). PPHA 22, which is a lower processor connected to the processor, and the measurement results from the TEMUs 14 and 16, are analyzed and judged, and then the data and the determination results are transmitted to the PPHA 22 using the TD-bus line. TECA 13 and 15 for transmitting a signal, TEMU 14 connected to the TECA 13 and an RS 232C interface and substantially measuring the state of a terminal or a subscriber circuit, and the TECA 15 and RS. It is connected to each other via a 232C interface, and an analog signal is transmitted to each of the TEMU 16 and the TECA 13 and 15 through a test bus. Give and take sign up It comprises an analog subscriber interface block (ASI) 17, 18 for interfacing with a child.

The test buses connected to the TECAs 13 and 15 and the ASIs 17 and 19 are provided in units of 4096 subscriber units for each TECA and are redundant.

In addition, the TECA (13, 15) is coupled to the lower processor, the PPHA (22) by the TD-bus, the data is transmitted by serial transmission method of 1 byte unit, according to the content of the received data Since the operation to be performed in the TECA (13, 15) is determined, when the item to be measured by the TEMU (14, 16) is transmitted, the transmission result from the TEMU (14, 16) to TECA (13, 15), respectively The TECA 13 and 15 transmit the signal to the PPHA 22, which is a subprocessor, in an interrupt manner.

Referring to the accompanying drawings, the operation, effects of the present invention configured as described above are as follows.

When the operator outputs command data and mode data to check an abnormality of a subscriber line in a monitor (not shown), the PPHA 22 is connected to an IPC node 21 connected to the monitor. Command data and mode data are transferred

The PPHA 22 then transmits the command data and mode data to the TECAs 13 and 15 via two line TD buses.

As such, when data is transmitted to the TECA (13, 15), the TECA (13, 15) checks for any abnormality in the subscriber's telephone line through the ASI (17, 18) directly connected to the subscriber and If necessary, the test command data is transmitted to the TEMU 14 and the TEMU 16 which substantially checks the status of the subscriber through the RS 232C interface.

As such, the TEMU 14 and the TEMU 16 receiving the test command data transmitted from the TECAs 13 and 15 check whether the subscriber's line is abnormal and transmit the check result to the TECAs 13 and 15. The TECA 13 and 15 receive the check result for each subscriber and output the result to the PPHA 22 through the TD bus.

Then, the lower processor PPHA 22 outputs the result of abnormality of the subscriber line to the operator's monitor through the IPC node 21, so that the operator can easily check the state of each subscriber's telephone line. .

It is configured as above, and 2 pieces of TECA are transmitted from the PPHA through the TD bus, and the TECA receives the subscriber in / out test command and gives a test execution command to TEMU, which is a real measurement device, and determines the result and the higher processor. To report to.

Improved time division exchange (TDX-10) subscriber test apparatus of the present invention configured as described above, by reducing the number of printed circuit boards required in the conventional TDX-10 by improving the TEC structure, and also reduced the test bus It is possible to test up to 8,192 subscribers with only one TECA, so it is very practical and useful.

Claims (1)

PPHA 22, which is a lower processor connected to the interprocessor communication node 11, receives command data and mode data from the PPHA 22, and then transmits data on an abnormal state of a subscriber circuit to the PPHA 22. The TECA (13, 15) to transmit, and the TEMU (16) connected to each other via the TECA (15) and the RS 232C interface to substantially measure the state of the terminal or the state of the subscriber circuit, and the TECA (13, 15) And an ASI (17, 18) for exchanging analog signals with each other via a test bus and interfacing with a subscriber.