KR0164248B1 - 전류제어 전압발생회로 - Google Patents
전류제어 전압발생회로 Download PDFInfo
- Publication number
- KR0164248B1 KR0164248B1 KR1019940012810A KR19940012810A KR0164248B1 KR 0164248 B1 KR0164248 B1 KR 0164248B1 KR 1019940012810 A KR1019940012810 A KR 1019940012810A KR 19940012810 A KR19940012810 A KR 19940012810A KR 0164248 B1 KR0164248 B1 KR 0164248B1
- Authority
- KR
- South Korea
- Prior art keywords
- current
- circuit
- mos transistor
- current control
- transistor
- Prior art date
Links
- 238000006243 chemical reaction Methods 0.000 claims abstract description 17
- 238000010586 diagram Methods 0.000 description 11
- 230000004044 response Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 4
- 230000015654 memory Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/34—DC amplifiers in which all stages are DC-coupled
- H03F3/343—DC amplifiers in which all stages are DC-coupled with semiconductor devices only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Radar, Positioning & Navigation (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Automation & Control Theory (AREA)
- Nonlinear Science (AREA)
- Dram (AREA)
- Control Of Electrical Variables (AREA)
- Amplifiers (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
Abstract
Description
Claims (3)
- 전류제어 MOS트랜지스터(Q7)를 내장한 차동증폭기(3)에 대해, 전류제어 MOS트랜지스터와 전류미러회로를 구성하는 부하 MOS트랜지스터(Q6)가 내장된 구성을 갖추고, 전류제어 MOS트랜지스터의 게이트에 그 트랜지스터가 5극관영역에서 동작하기에 충분한 중간전위를 공급해서 차동증폭기를 정전류제어하는 전류제어 전압발생회로에 있어서, 상기 차동증폭기(3)를 정전류제어하기 위한 기준전류를 발생시키는 정전류회로부(1,2)와, 이 정전류회로부애서 발생된 기준전류를 기준전압으로 변환하는 전류-전압 변환회로부(4)를 구비하여 이루어지고, 이들 2개의 회로부를 전류미러구성으로 접속한 것을 특징으로 하는 전류제어 전압발생회로.
- 제1항에 있어서, 상기 정전류회로부(1,2)는, 소망하는 기준전압을 발생시키는 기준전압 발생회로(1)와, 이 기준전압 발생회로에서 발생된 기준전압이 참조전위로서 입력되는 오차증폭기(DA), 이 오차증폭기의 출력이 게이트에 입력되는 전류제어 MOS트랜지스터(Q4) 및, 이 MOS트랜지스터에 직렬로 접속된 표준저항(Rc)으로 이루어지고, 상기 전류-진압 변환회로부(4)는, 상기 정전류회로부의 전류제어 MOS트랜지스터(Q4)와 전류미러회로를 구성하는 MOS트랜지스터(Q5)와, 이 MOS트랜지스터에 직렬로 접속된 상기 부하 MOS트랜지스터(Q6)로 이루어진 것을 특징으로 하는 전류제어 전압발생회로.
- 전류제어 MOS트랜지스터(Q7)를 내장한 차동증폭기(3)에 대해 전류제어 MOS트랜지스터의 게이트에 그 트랜지스터가 5극관영역에어 동작하기에 충분한 중간전위를 공급해서 차동증폭기를 정전류제어하는 전류제어 전압발생회로에 있어서, 바이폴라 트랜지스터를 그 기본 구성요소로 하는 밴드갭 리퍼런스회로(5)로 이루어지고, 소망하는 기준전압을 발생시키는 기준전압 발생회로(1)와, 상기 기준전압이 참조전위로서 입력되는 오차증폭기(DA), 이 오차증폭기의 출력이 게이트에 입력되는 전류제어 MOS트랜지스터(Q4)및, 이 MOS트랜지스터에 접속된 표준저항(Rc)으로 이루어지고, 상기 차동증폭기를 정전류 제어하기 위한 기준전류를 발생시키는 정전류회로(2)와, 이 정전류회로의 전류제어 MOS트랜지스터와 전류미러회로를 구성하는 MOS트랜지스터(Q5) 및, 이 MOS트랜지스터에 직렬로 접속되어 상기 차동 증폭기의 전류제어 MOS트랜지스터와 전류미러회로를 구성하는 부하 MOS 트랜지스터(Q6)로 이루어지고, 상기 기준전류를 기준전압으로 변환하는 전류-전압 변환회로부(4)를 구비하여 이루어진 것을 특징으로 하는 전류제어 전압발생회로.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13765993A JP3321246B2 (ja) | 1993-06-08 | 1993-06-08 | 電流制御電圧発生回路 |
JP93-137659 | 1993-06-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950002010A KR950002010A (ko) | 1995-01-04 |
KR0164248B1 true KR0164248B1 (ko) | 1999-03-20 |
Family
ID=15203818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940012810A KR0164248B1 (ko) | 1993-06-08 | 1994-06-08 | 전류제어 전압발생회로 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5933051A (ko) |
JP (1) | JP3321246B2 (ko) |
KR (1) | KR0164248B1 (ko) |
DE (1) | DE4420041C2 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100417899B1 (ko) * | 1995-08-18 | 2004-05-12 | 텍사스 인스트루먼츠 인코포레이티드 | 반도체집적회로 |
KR101256911B1 (ko) * | 2006-06-21 | 2013-04-22 | 삼성전자주식회사 | 전압 발생 회로 |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3223844B2 (ja) * | 1997-06-27 | 2001-10-29 | 日本電気株式会社 | 基準電圧発生装置 |
JP3465840B2 (ja) * | 1997-11-21 | 2003-11-10 | 松下電器産業株式会社 | 電圧電流変換回路 |
JP3742230B2 (ja) * | 1998-08-28 | 2006-02-01 | 株式会社東芝 | 電流発生回路 |
US6163178A (en) * | 1998-12-28 | 2000-12-19 | Rambus Incorporated | Impedance controlled output driver |
US6943618B1 (en) * | 1999-05-13 | 2005-09-13 | Honeywell International Inc. | Compensation mechanism for compensating bias levels of an operation circuit in response to supply voltage changes |
KR100335496B1 (ko) | 1999-11-26 | 2002-05-08 | 윤종용 | 낮은 외부전원전압에서도 안정적으로 동작하는내부전압발생회로 |
US6285256B1 (en) | 2000-04-20 | 2001-09-04 | Pericom Semiconductor Corp. | Low-power CMOS voltage follower using dual differential amplifiers driving high-current constant-voltage push-pull output buffer |
DE10028098C2 (de) * | 2000-06-07 | 2002-05-02 | Texas Instruments Deutschland | Schaltungsanordnung zur Erzeugung eines einstellbaren konstanten Ausgangsstroms |
CH697322B1 (fr) | 2000-06-13 | 2008-08-15 | Em Microelectronic Marin Sa | Procédé de génération d'un courant sensiblement indépendent de la température et dispositif permettant de mettre en oeuvre ce procédé. |
ATE328313T1 (de) * | 2000-06-13 | 2006-06-15 | Em Microelectronic Marin Sa | Verfahren und vorrichtung zur erzeugung eines temperaturunabhängigen stroms |
US6583661B1 (en) | 2000-11-03 | 2003-06-24 | Honeywell Inc. | Compensation mechanism for compensating bias levels of an operation circuit in response to supply voltage changes |
US20030009924A1 (en) * | 2000-11-03 | 2003-01-16 | Sajadian Zahra Nassrin | Outdoor numeric/allphabetic lighting |
ITTO20020252A1 (it) * | 2002-03-21 | 2003-09-22 | Micron Technology Inc | Circuito e procedimento per la generazione di una corrente di riferimento a bassa tensione, dispositivo di memoria comprendente tale circuit |
US7095271B2 (en) * | 2002-09-27 | 2006-08-22 | Oki Electric Industry Co., Ltd. | Bias circuit |
US7088127B2 (en) * | 2003-09-12 | 2006-08-08 | Rambus, Inc. | Adaptive impedance output driver circuit |
CN100359808C (zh) * | 2004-04-21 | 2008-01-02 | 厦门优迅高速芯片有限公司 | 高速电流模式逻辑电路 |
TWI228347B (en) * | 2004-04-23 | 2005-02-21 | Faraday Tech Corp | Bandgap reference circuit |
US7250812B2 (en) * | 2004-05-05 | 2007-07-31 | International Business Machines Corporation | Integrated circuit current regulator |
US7064602B2 (en) * | 2004-05-05 | 2006-06-20 | Rambus Inc. | Dynamic gain compensation and calibration |
JP2006018663A (ja) * | 2004-07-02 | 2006-01-19 | Fujitsu Ltd | 電流安定化回路、電流安定化方法、及び固体撮像装置 |
US7312641B2 (en) * | 2004-12-28 | 2007-12-25 | Spansion Llc | Sense amplifiers with high voltage swing |
JP4386113B2 (ja) * | 2007-08-03 | 2009-12-16 | ソニー株式会社 | 参照電圧回路および撮像回路 |
JP2010035098A (ja) * | 2008-07-31 | 2010-02-12 | Sony Corp | 位相同期回路並びに記録再生装置および電子機器 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4585955B1 (en) * | 1982-12-15 | 2000-11-21 | Tokyo Shibaura Electric Co | Internally regulated power voltage circuit for mis semiconductor integrated circuit |
IT1213095B (it) * | 1986-05-20 | 1989-12-07 | S G S Microelettrica S P A | Specchio di corrente ad alta capacita'.! |
US4763021A (en) * | 1987-07-06 | 1988-08-09 | Unisys Corporation | CMOS input buffer receiver circuit with ultra stable switchpoint |
JP2674669B2 (ja) * | 1989-08-23 | 1997-11-12 | 株式会社東芝 | 半導体集積回路 |
US5053640A (en) * | 1989-10-25 | 1991-10-01 | Silicon General, Inc. | Bandgap voltage reference circuit |
JP3068146B2 (ja) * | 1990-01-08 | 2000-07-24 | 日本電気株式会社 | 半導体集積回路 |
US5105102A (en) * | 1990-02-28 | 1992-04-14 | Nec Corporation | Output buffer circuit |
JPH04146650A (ja) * | 1990-10-08 | 1992-05-20 | Mitsubishi Electric Corp | 半導体集積回路装置 |
JPH05312850A (ja) * | 1992-05-12 | 1993-11-26 | Nec Ic Microcomput Syst Ltd | 半導体集積回路 |
US5300837A (en) * | 1992-09-17 | 1994-04-05 | At&T Bell Laboratories | Delay compensation technique for buffers |
-
1993
- 1993-06-08 JP JP13765993A patent/JP3321246B2/ja not_active Expired - Fee Related
-
1994
- 1994-06-08 KR KR1019940012810A patent/KR0164248B1/ko not_active IP Right Cessation
- 1994-06-08 DE DE4420041A patent/DE4420041C2/de not_active Expired - Fee Related
-
1996
- 1996-09-18 US US08/714,291 patent/US5933051A/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100417899B1 (ko) * | 1995-08-18 | 2004-05-12 | 텍사스 인스트루먼츠 인코포레이티드 | 반도체집적회로 |
KR101256911B1 (ko) * | 2006-06-21 | 2013-04-22 | 삼성전자주식회사 | 전압 발생 회로 |
Also Published As
Publication number | Publication date |
---|---|
JP3321246B2 (ja) | 2002-09-03 |
JPH06350355A (ja) | 1994-12-22 |
DE4420041A1 (de) | 1994-12-15 |
DE4420041C2 (de) | 1998-06-04 |
US5933051A (en) | 1999-08-03 |
KR950002010A (ko) | 1995-01-04 |
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