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JPS6479676A - Ic tester - Google Patents

Ic tester

Info

Publication number
JPS6479676A
JPS6479676A JP62237981A JP23798187A JPS6479676A JP S6479676 A JPS6479676 A JP S6479676A JP 62237981 A JP62237981 A JP 62237981A JP 23798187 A JP23798187 A JP 23798187A JP S6479676 A JPS6479676 A JP S6479676A
Authority
JP
Japan
Prior art keywords
results
blocks
controller
electronics
timing signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62237981A
Other languages
Japanese (ja)
Other versions
JPH0814609B2 (en
Inventor
Taiichi Otsuji
Naoaki Narumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62237981A priority Critical patent/JPH0814609B2/en
Priority to US07/229,780 priority patent/US4928278A/en
Publication of JPS6479676A publication Critical patent/JPS6479676A/en
Publication of JPH0814609B2 publication Critical patent/JPH0814609B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To enable a reduction in time required for timing correction, by arranging a controller, a reference timing signal generator, a results of test decision circuit and the like. CONSTITUTION:An output signal of a reference timing signal generator 11 is supplied distributively to a group of pin electronics 9-1-9-n simultaneously and an independently operable controller 8 is provided at each unit of more than one division blocks of the group. The controllers 8 perform a computation and a control involved in a timing error measurement and an error correction as for the individual blocks. A parallel operation can be realized between test pins in the sending of a reference timing signal and in the storage of the results of response of the electronics 9. This accomplishes a parallel operation among division blocks S1-SK for a processing involved in the controller 8, for example, setting of various conditions in the electronics 9 associated with the results of response thereby reducing processing time by fractions for the blocks S1-SK.
JP62237981A 1987-08-10 1987-09-22 IC test equipment Expired - Lifetime JPH0814609B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP62237981A JPH0814609B2 (en) 1987-09-22 1987-09-22 IC test equipment
US07/229,780 US4928278A (en) 1987-08-10 1988-08-05 IC test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62237981A JPH0814609B2 (en) 1987-09-22 1987-09-22 IC test equipment

Publications (2)

Publication Number Publication Date
JPS6479676A true JPS6479676A (en) 1989-03-24
JPH0814609B2 JPH0814609B2 (en) 1996-02-14

Family

ID=17023343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62237981A Expired - Lifetime JPH0814609B2 (en) 1987-08-10 1987-09-22 IC test equipment

Country Status (1)

Country Link
JP (1) JPH0814609B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008534958A (en) * 2005-03-31 2008-08-28 テラダイン・インコーポレーテッド Calibration of automatic test equipment
JP2010534962A (en) * 2007-07-26 2010-11-11 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー Method for synchronizing several channel measuring components and / or measuring devices and corresponding measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008534958A (en) * 2005-03-31 2008-08-28 テラダイン・インコーポレーテッド Calibration of automatic test equipment
JP2010534962A (en) * 2007-07-26 2010-11-11 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー Method for synchronizing several channel measuring components and / or measuring devices and corresponding measuring device

Also Published As

Publication number Publication date
JPH0814609B2 (en) 1996-02-14

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