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JPS6474745A - Embedding of groove - Google Patents

Embedding of groove

Info

Publication number
JPS6474745A
JPS6474745A JP23282387A JP23282387A JPS6474745A JP S6474745 A JPS6474745 A JP S6474745A JP 23282387 A JP23282387 A JP 23282387A JP 23282387 A JP23282387 A JP 23282387A JP S6474745 A JPS6474745 A JP S6474745A
Authority
JP
Japan
Prior art keywords
film
groove
etching
oxide film
deposited
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23282387A
Other languages
Japanese (ja)
Inventor
Nobuo Aoi
Shinichi Yamamoto
Mikio Nishio
Ichiro Nakao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP23282387A priority Critical patent/JPS6474745A/en
Publication of JPS6474745A publication Critical patent/JPS6474745A/en
Pending legal-status Critical Current

Links

Landscapes

  • Local Oxidation Of Silicon (AREA)

Abstract

PURPOSE:To inhibit the generation of a recess and a slit and to make possible a complete flattening by a method wherein, after a large taper is formed on an oxide film, which is an etching mask, an insulative thin film is deposited in a desired thickness and is made to remain only in the interior of a groove by anisotropic etching. CONSTITUTION:A first oxide film 2 is subjected to taper etching by a resist retreating method and a groove is anisotropically etched in an Si substrate 1 using the film 2 as a mask. Then, after a second oxide film 3 is deposited in a thickness of 1/3 or 1/2 of a pattern width by an LPCVD method, the film 3 is made to remain only in the interior of the groove by anisotropic etching. By using a film having an etching resistance higher than that of the film 2 as the film 3, the film 2 only is selectively removed. Thereby, a taper is formed on the aperture of the groove. Then, a third oxide film 4 is deposited by an LPCVD method and an embedding of the groove is finished by entire surface etching. At this time, a void is generated only in the interior of the groove and the generation of a recess and a slit does not occur.
JP23282387A 1987-09-17 1987-09-17 Embedding of groove Pending JPS6474745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23282387A JPS6474745A (en) 1987-09-17 1987-09-17 Embedding of groove

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23282387A JPS6474745A (en) 1987-09-17 1987-09-17 Embedding of groove

Publications (1)

Publication Number Publication Date
JPS6474745A true JPS6474745A (en) 1989-03-20

Family

ID=16945338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23282387A Pending JPS6474745A (en) 1987-09-17 1987-09-17 Embedding of groove

Country Status (1)

Country Link
JP (1) JPS6474745A (en)

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