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JPS6472077A - Method and apparatus for determining ac calibration error - Google Patents

Method and apparatus for determining ac calibration error

Info

Publication number
JPS6472077A
JPS6472077A JP63122957A JP12295788A JPS6472077A JP S6472077 A JPS6472077 A JP S6472077A JP 63122957 A JP63122957 A JP 63122957A JP 12295788 A JP12295788 A JP 12295788A JP S6472077 A JPS6472077 A JP S6472077A
Authority
JP
Japan
Prior art keywords
signal
calibration
converter
calibration error
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63122957A
Other languages
English (en)
Inventor
Edowaado Ekuresuton Rarii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Publication of JPS6472077A publication Critical patent/JPS6472077A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G1/00—Details of arrangements for controlling amplification
    • H03G1/04—Modifications of control circuit to reduce distortion caused by control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP63122957A 1987-05-19 1988-05-19 Method and apparatus for determining ac calibration error Pending JPS6472077A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/051,318 US4859936A (en) 1987-01-29 1987-05-19 Method of and apparatus for determining AC calibration errors and apparatus using device with AC calibration errors

Publications (1)

Publication Number Publication Date
JPS6472077A true JPS6472077A (en) 1989-03-16

Family

ID=21970564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63122957A Pending JPS6472077A (en) 1987-05-19 1988-05-19 Method and apparatus for determining ac calibration error

Country Status (5)

Country Link
US (1) US4859936A (ja)
JP (1) JPS6472077A (ja)
CN (1) CN1018028B (ja)
DE (1) DE3817156A1 (ja)
GB (1) GB2204959B (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011211668A (ja) * 2010-03-31 2011-10-20 National Institute Of Advanced Industrial Science & Technology 高精度任意波形信号発生装置
CN103926549A (zh) * 2014-04-25 2014-07-16 中国计量科学研究院 相位校准方法及装置
JP2019219226A (ja) * 2018-06-18 2019-12-26 国立研究開発法人産業技術総合研究所 センサ装置

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9016972D0 (en) * 1990-08-02 1990-09-19 Farnell Instr Improvements relating to lcr meters
IT1249299B (it) * 1991-04-30 1995-02-22 Sgs Thomson Microelectronics Circuito integrato con componenti passivi trimmabili
US5245229A (en) * 1992-02-28 1993-09-14 Media Vision Digitally controlled integrated circuit anti-clipping mixer
US5420515A (en) * 1992-08-28 1995-05-30 Hewlett-Packard Company Active circuit trimming with AC and DC response trims relative to a known response
DE4229770A1 (de) * 1992-09-05 1994-03-10 Asea Brown Boveri Verfahren zur Messung der transienten wiederkehrenden Spannung eines Stromkreises und Vorrichtung zur Durchführung des Verfahrens
US5933013A (en) * 1995-11-22 1999-08-03 Advantest Corp. Calibration circuit for calibrating frequency characteristics of an AC/DC converter
US5724363A (en) * 1996-06-21 1998-03-03 Breya; Edward F. Optical analog signal transmission system
US5907241A (en) * 1996-09-11 1999-05-25 Abb Power T&D Company Inc. Current measurement methods and apparatus employing second harmonic scaling
US6479979B1 (en) 1999-07-09 2002-11-12 Srico, Inc. Opto-electric device for measuring the root-mean-square value of an alternating current voltage
JP4274462B2 (ja) * 2003-09-18 2009-06-10 株式会社アドバンテスト 誤差要因取得用装置、方法、プログラムおよび記録媒体
DE102005033919A1 (de) * 2005-07-20 2007-01-25 Conti Temic Microelectronic Gmbh Verfahren und Vorrichtung Strommessung
US8262550B2 (en) 2009-03-19 2012-09-11 R. J. Reynolds Tobacco Company Apparatus for inserting objects into a filter component of a smoking article
AT513412B1 (de) 2012-09-17 2014-07-15 Tannpapier Gmbh Mundstückbelagspapier
CN103293510B (zh) * 2013-05-29 2015-06-10 国家电网公司 一种快速测定电能表误差的装置及方法
CN103983936B (zh) * 2014-05-29 2016-04-20 国家电网公司 一种单三相电能表一体化校验装置
CN104267369B (zh) * 2014-08-01 2017-01-18 云南电力试验研究院（集团）有限公司电力研究院 单三相电能表兼容检定电压系统分离解决方法
CN109541513B (zh) * 2018-12-25 2022-02-08 北京东方计量测试研究所 一种交流微电流溯源装置和方法
CN109975591B (zh) * 2019-03-28 2024-02-23 漳州市玉山电子制造有限公司 一种交流钳形多用表及其线圈绕线方法
TWI758950B (zh) * 2020-11-13 2022-03-21 大陸商昆山瑞創芯電子有限公司 應用於顯示面板的校準方法及校準裝置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3012197A (en) * 1958-10-27 1961-12-05 Gen Radio Co Calibration apparatus
US3105239A (en) * 1960-04-12 1963-10-01 Bergstrom Nils Emil Lennart Method for mounting of plastic sheet material, particularly as ceiling covering in aroom, and a tool accomplishing the method
US4200933A (en) * 1976-07-30 1980-04-29 Systron-Donner Corporation Method of automatically calibrating a microprocessor controlled digital multimeter
US4337517A (en) * 1976-09-16 1982-06-29 Systron Donner Corporation Method of automatically calibrating a microprocessor controlled digital multimeter
SU708251A1 (ru) * 1977-10-04 1980-01-05 Омский Институт Инженеров Железнодорожного Транспорта Устройство дл измерени электрической энергии
JPS5885182A (ja) * 1981-11-17 1983-05-21 Sony Tektronix Corp プローブ校正表示方法
JPS6048625A (ja) * 1983-08-29 1985-03-16 Anritsu Corp ２重スーパヘテロダイン受信機
US4663586A (en) * 1985-05-02 1987-05-05 Hewlett-Packard Company Device with automatic compensation of an ac attenuator
US4739495A (en) * 1985-09-25 1988-04-19 Rca Corporation Solid-state imager defect corrector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011211668A (ja) * 2010-03-31 2011-10-20 National Institute Of Advanced Industrial Science & Technology 高精度任意波形信号発生装置
CN103926549A (zh) * 2014-04-25 2014-07-16 中国计量科学研究院 相位校准方法及装置
JP2019219226A (ja) * 2018-06-18 2019-12-26 国立研究開発法人産業技術総合研究所 センサ装置

Also Published As

Publication number Publication date
GB2204959B (en) 1991-08-21
GB8811874D0 (en) 1988-06-22
US4859936A (en) 1989-08-22
GB2204959A (en) 1988-11-23
CN1018028B (zh) 1992-08-26
CN88103246A (zh) 1988-12-07
DE3817156A1 (de) 1988-12-08

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