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JPS6452233U - - Google Patents

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Publication number
JPS6452233U
JPS6452233U JP14795887U JP14795887U JPS6452233U JP S6452233 U JPS6452233 U JP S6452233U JP 14795887 U JP14795887 U JP 14795887U JP 14795887 U JP14795887 U JP 14795887U JP S6452233 U JPS6452233 U JP S6452233U
Authority
JP
Japan
Prior art keywords
chamber
window
quartz glass
dry etching
spectroscopic analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14795887U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14795887U priority Critical patent/JPS6452233U/ja
Publication of JPS6452233U publication Critical patent/JPS6452233U/ja
Pending legal-status Critical Current

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  • Drying Of Semiconductors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の基本的構成を示す集光部の断
面図、第2図は実施例に係るプラズマドライエツ
チング装置の要部断面図と周辺の回路図、第3図
は従来技術における集光部の断面図である。 1……チヤンバ壁部、2……窓、3……チヤン
バ内、4……石英ガラス板、5……オプチカルフ
アイバー、6……光。
Fig. 1 is a sectional view of a condensing section showing the basic configuration of the present invention, Fig. 2 is a sectional view of main parts and a peripheral circuit diagram of a plasma dry etching apparatus according to an embodiment, and Fig. 3 is a concentrator in the prior art. FIG. 3 is a cross-sectional view of the light section. 1... Chamber wall, 2... Window, 3... Inside the chamber, 4... Quartz glass plate, 5... Optical fiber, 6... Light.

Claims (1)

【実用新案登録請求の範囲】 発光分光分析方式のドライエツチング終了判定
装置において、 ドライエツチング装置のチヤンバ壁部に窓を形
成し、同窓にチヤンバ内へ膨出した石英ガラス板
を設け、同石英ガラス板により集光された光をオ
プチカルフアイバで分光分析部へ導くことを特徴
としたエツチング終了判定装置における分光分析
用集光部。
[Scope of Claim for Utility Model Registration] In an apparatus for determining the completion of dry etching using an emission spectrometry method, a window is formed in the wall of a chamber of the dry etching apparatus, a quartz glass plate is provided in the window that bulges into the chamber, and the quartz glass A condensing section for spectroscopic analysis in an etching completion determination device, characterized in that light condensed by a plate is guided to a spectroscopic analysis section by an optical fiber.
JP14795887U 1987-09-28 1987-09-28 Pending JPS6452233U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14795887U JPS6452233U (en) 1987-09-28 1987-09-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14795887U JPS6452233U (en) 1987-09-28 1987-09-28

Publications (1)

Publication Number Publication Date
JPS6452233U true JPS6452233U (en) 1989-03-31

Family

ID=31418838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14795887U Pending JPS6452233U (en) 1987-09-28 1987-09-28

Country Status (1)

Country Link
JP (1) JPS6452233U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7254098B2 (en) 2002-10-25 2007-08-07 Samsung Electronics Co., Ltd. CD-DVD compatible optical pickup and optical recording and/or reproducing apparatus using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7254098B2 (en) 2002-10-25 2007-08-07 Samsung Electronics Co., Ltd. CD-DVD compatible optical pickup and optical recording and/or reproducing apparatus using the same

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