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JPS6437832A - Method of growing compound semiconductor crystal - Google Patents

Method of growing compound semiconductor crystal

Info

Publication number
JPS6437832A
JPS6437832A JP19373387A JP19373387A JPS6437832A JP S6437832 A JPS6437832 A JP S6437832A JP 19373387 A JP19373387 A JP 19373387A JP 19373387 A JP19373387 A JP 19373387A JP S6437832 A JPS6437832 A JP S6437832A
Authority
JP
Japan
Prior art keywords
source
gas
flowed
carrier
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19373387A
Other languages
Japanese (ja)
Inventor
Nobuyuki Otsuka
Masashi Ozeki
Koji Mochizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP19373387A priority Critical patent/JPS6437832A/en
Publication of JPS6437832A publication Critical patent/JPS6437832A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a compound semiconductor crystal in an epitaxial manner by a method wherein an inert gas is used as a carrier, a source-gas composed of a compound containing a methyl group is flowed, the film of an element as the component of a source is shaped, the source-gas is stopped, the gas of another compound is flowed and the film of an element as a component is formed. CONSTITUTION:When a GaAs single crystal is grown onto a GaAs single crystal substrate by utilizing an atomic layer epitaxial method, N2 gas is used as a carrier, and (CH3)3Ga is employed as a Ca source and AsH3 as an As source. The substrate is brought to 500 deg.C and a bubbler to 3 deg.C. The flow rate of (CU3)3Ga is brought to 40cm<3>/min at 0 deg.C and 1 atm. to shape the monoatomic layer of Ga, and the feed of (CH3)3Ga is stopped. AsH3 is flowed at the flow rate of 480cm<3>/min at 0 deg.C and 1 atm. to form the monoatomic layer of As, and a GaAs single crystal layer is shaped in an epitaxial manner. Since an inert gas is used as the carrier, there is no possibility of the promotion of thermal decomposition, thus largely improving controllability at the time of crystal growth.
JP19373387A 1987-08-04 1987-08-04 Method of growing compound semiconductor crystal Pending JPS6437832A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19373387A JPS6437832A (en) 1987-08-04 1987-08-04 Method of growing compound semiconductor crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19373387A JPS6437832A (en) 1987-08-04 1987-08-04 Method of growing compound semiconductor crystal

Publications (1)

Publication Number Publication Date
JPS6437832A true JPS6437832A (en) 1989-02-08

Family

ID=16312903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19373387A Pending JPS6437832A (en) 1987-08-04 1987-08-04 Method of growing compound semiconductor crystal

Country Status (1)

Country Link
JP (1) JPS6437832A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004504496A (en) * 2000-07-07 2004-02-12 エイエスエム・インターナシヨナル・エヌ・ブイ Film deposition on substrates
US6916398B2 (en) 2001-10-26 2005-07-12 Applied Materials, Inc. Gas delivery apparatus and method for atomic layer deposition
US7201803B2 (en) 2001-03-07 2007-04-10 Applied Materials, Inc. Valve control system for atomic layer deposition chamber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004504496A (en) * 2000-07-07 2004-02-12 エイエスエム・インターナシヨナル・エヌ・ブイ Film deposition on substrates
US7201803B2 (en) 2001-03-07 2007-04-10 Applied Materials, Inc. Valve control system for atomic layer deposition chamber
US6916398B2 (en) 2001-10-26 2005-07-12 Applied Materials, Inc. Gas delivery apparatus and method for atomic layer deposition

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