JPS6433961A - Mos composite memory device - Google Patents
Mos composite memory deviceInfo
- Publication number
- JPS6433961A JPS6433961A JP18934187A JP18934187A JPS6433961A JP S6433961 A JPS6433961 A JP S6433961A JP 18934187 A JP18934187 A JP 18934187A JP 18934187 A JP18934187 A JP 18934187A JP S6433961 A JPS6433961 A JP S6433961A
- Authority
- JP
- Japan
- Prior art keywords
- section
- mos transistor
- floating gate
- gate
- nonvolatile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Dram (AREA)
Abstract
PURPOSE:To enable a function as a nonvolatile RAM to be obtained in a small occupied area, by forming a memory cell which consists of substantial three transistors including a nonvolatile MOS transistor memory with a floating gate and one capacitor element in one semiconductor substrate. CONSTITUTION:A memory cell comprises a DRAM section including a first MOS transistor MT1 which is connected to a capacitor C, a nonvolatile memory section MT2 with a floating gate FG which is connected to the DRAM section, and a second MOS transistor MT3 which is connected to the nonvolatile memory section MT2. And, the DRAM section, the nonvolatile memory section MT2 and the second MOS transistor MT3 are formed together in the same semiconductor substrate. For example, a gate electrode 15 is formed over between a drain area 12 and a diffusion area 13 through a gate oxide film to the transistor MT1 for selecting element. And, an electrode 16 for forming the capacitor C is superposed on the diffusion area 13 through the oxide film, and a floating gate 17 is so formed as to have an insulating film section A with very thin thickness for writing and erasing over a part of the diffusion area 13; moreover, a control gate 18 is formed over the floating gate 17.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18934187A JPS6433961A (en) | 1987-07-29 | 1987-07-29 | Mos composite memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18934187A JPS6433961A (en) | 1987-07-29 | 1987-07-29 | Mos composite memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6433961A true JPS6433961A (en) | 1989-02-03 |
Family
ID=16239713
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18934187A Pending JPS6433961A (en) | 1987-07-29 | 1987-07-29 | Mos composite memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6433961A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03134894A (en) * | 1989-10-19 | 1991-06-07 | Sharp Corp | Semiconductor memory device |
KR20020046684A (en) * | 2000-12-15 | 2002-06-21 | 박종섭 | Structure of EEPROM and method for manufacturing the same |
KR100328743B1 (en) * | 1995-11-28 | 2002-10-31 | 삼성전자 주식회사 | Ferroelectric dynamic random access memory |
WO2009078456A1 (en) | 2007-12-19 | 2009-06-25 | Soshin Electric Co., Ltd. | High frequency switch |
-
1987
- 1987-07-29 JP JP18934187A patent/JPS6433961A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03134894A (en) * | 1989-10-19 | 1991-06-07 | Sharp Corp | Semiconductor memory device |
KR100328743B1 (en) * | 1995-11-28 | 2002-10-31 | 삼성전자 주식회사 | Ferroelectric dynamic random access memory |
KR20020046684A (en) * | 2000-12-15 | 2002-06-21 | 박종섭 | Structure of EEPROM and method for manufacturing the same |
WO2009078456A1 (en) | 2007-12-19 | 2009-06-25 | Soshin Electric Co., Ltd. | High frequency switch |
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