JPS63234536A - Semiconductor substrate cleaning device - Google Patents
Semiconductor substrate cleaning deviceInfo
- Publication number
- JPS63234536A JPS63234536A JP62069757A JP6975787A JPS63234536A JP S63234536 A JPS63234536 A JP S63234536A JP 62069757 A JP62069757 A JP 62069757A JP 6975787 A JP6975787 A JP 6975787A JP S63234536 A JPS63234536 A JP S63234536A
- Authority
- JP
- Japan
- Prior art keywords
- roller brushes
- wafer
- roller
- semiconductor substrate
- brushes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 23
- 239000000758 substrate Substances 0.000 title claims abstract description 21
- 239000004065 semiconductor Substances 0.000 title claims abstract description 17
- 230000000694 effects Effects 0.000 abstract description 7
- 239000000126 substance Substances 0.000 abstract description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 12
- 239000007788 liquid Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
Landscapes
- Cleaning In General (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は半導体基板(以下ウェハーと称す)の洗浄装置
、特にウェハーの両面をローラーブラシで洗浄する装置
に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a cleaning device for semiconductor substrates (hereinafter referred to as wafers), and particularly to a device for cleaning both sides of a wafer with a roller brush.
[従来の技術]
従来、この種の半導体基板洗浄装置はローラーブラシを
定速回転させて該ブラシで半導体基板の洗浄を行ってい
る。[Prior Art] Conventionally, this type of semiconductor substrate cleaning apparatus cleans semiconductor substrates by rotating a roller brush at a constant speed.
[発明が解決しようとする問題点]
従来の装置ではローラーブラシが定速回転されるため、
ローラーブラシと基板との接触時間が不変であり、洗浄
効果を上げることは不可能である。[Problems to be solved by the invention] In the conventional device, the roller brush rotates at a constant speed.
The contact time between the roller brush and the substrate remains unchanged, making it impossible to increase the cleaning effect.
またローラーブラシが直角配置となっているため、ウェ
ハーをセットするときの安定性に欠けるという欠点があ
る。Furthermore, since the roller brushes are arranged at right angles, there is a drawback that stability is lacking when setting wafers.
本発明の目的は前記問題点を解消した洗浄装置を提供す
ることにある。An object of the present invention is to provide a cleaning device that solves the above problems.
[問題点を解決するための手段]
本発明はローラーブラシを用いて半導体基板を洗浄する
半導体基板洗浄装置において、互いに逆方向に回転して
前記基板に送りを与え、かつ各組毎に任意に設定された
回転速度をもって駆動される一対の洗浄用ローラーブラ
シの複数組を有し、該複数組の洗浄用ローラーブラシ対
を半導体基板の搬送ラインに沿って直列に配列したこと
を特徴とする半導体基板洗浄装置である。[Means for Solving the Problems] The present invention provides a semiconductor substrate cleaning apparatus for cleaning semiconductor substrates using roller brushes, which rotate in opposite directions to give feed to the substrates, and arbitrarily feed each set of roller brushes. A semiconductor comprising a plurality of pairs of cleaning roller brushes driven at a set rotational speed, the plurality of pairs of cleaning roller brushes being arranged in series along a semiconductor substrate conveyance line. This is a substrate cleaning device.
[実施例] 以下、本発明の一実施例を図により説明する。[Example] Hereinafter, one embodiment of the present invention will be described with reference to the drawings.
第1図において、上下に対向し互いに逆方向に回転して
基板に送りを与える一対のローラーブラシla、 lb
、 2a、 2b、 3a、 3b、 4a、 4bを
1組とし、その複数組を水平方向に一定間隔で直列に配
列する。また、半導体基板6に薬液等を吹き付けるノズ
ル5,5・・・を隣接するローラーブラシ間に配置させ
て設ける。またローラーブラシla、 ib、 2a。In FIG. 1, a pair of roller brushes la and lb are vertically opposed and rotate in opposite directions to feed the substrate.
, 2a, 2b, 3a, 3b, 4a, and 4b are set as one set, and the plurality of sets are arranged in series at regular intervals in the horizontal direction. Further, nozzles 5, 5, . . . for spraying a chemical liquid or the like onto the semiconductor substrate 6 are arranged between adjacent roller brushes. Also roller brushes la, ib, 2a.
2b、 3a、 3b、 4a、 4bノ対は各組毎に
任意に設定された回転速度をもって駆動する。The pairs 2b, 3a, 3b, 4a, and 4b are driven at an arbitrarily set rotation speed for each pair.
ローラーブラシは上下1対で組となり、その複数組が半
導体基板の搬送ラインに沿って並んでいる。ウェハー6
がベルト搬送等により最初のローラーブラシla、 1
bまで運ばれると、ローラーブラシ1a、 lbは上下
で逆方向A、A’へ回転しているので、ウェハー6には
推進力が与えられローラーブラシla、 lbら次のロ
ーラーブラシ2a、 2bへ向けて進んで行く。ローラ
ーブラシ2a、 2b、 3a、 3b。The roller brushes are arranged in pairs (upper and lower), and multiple sets are lined up along the semiconductor substrate conveyance line. wafer 6
The first roller brush la, 1 is transferred by belt conveyance etc.
When the wafer 6 is carried to the point b, since the roller brushes 1a and lb are vertically rotating in opposite directions A and A', a driving force is applied to the wafer 6, and the roller brushes la and lb move to the next roller brushes 2a and 2b. Go towards it. Roller brushes 2a, 2b, 3a, 3b.
4a、 4bもローラーブラシia、 ibと同様の回
転をしておりウェハー6は順にローラーブラシ間を通り
扱ける。各ローラーブラシ1a、 lb、 2a、 2
b、 3a。The roller brushes 4a and 4b also rotate in the same manner as the roller brushes ia and ib, and the wafer 6 can be handled by passing between the roller brushes in order. Each roller brush 1a, lb, 2a, 2
b. 3a.
3b、 4a、 4bは回転方向は同一でも回転数を変
化させておく。任意に設定して良いが、ここではローラ
ーブラシ1a、 lb、 4a、 4bを遅く、ローラ
ーブラシ2a、 2b、 3a、 3bを速く設定する
。ローラーブラシla、 lbを通りローラーブラシ2
a、 2bへ達すると、ローラーブラシia、 ibと
ローラーブラシ2a、 2bの回転数の違いにより各ロ
ーラーブラシはつ■バー6上にてスリップを起こしウェ
ハー6をこするように当りウェハー6を洗浄する。ロー
ラーブラシ3a、 3b、 4a、 4bを通る場合に
も同様の現象か生じウェハー6を洗浄する。一方ノズル
5からは洗浄の効果を高めるためにウェハー6に向けて
純水又は洗浄薬品を噴き付ける。尚各ローラーブラシの
組にかかるテンションは自由に調節できるようにするこ
とで傷のつかない洗浄を行なうことができる。3b, 4a, and 4b have different rotational speeds even though their rotational directions are the same. Although it may be set arbitrarily, here, the roller brushes 1a, lb, 4a, and 4b are set to be slow, and the roller brushes 2a, 2b, 3a, and 3b are set to be fast. Roller brush 2 passes through roller brushes la and lb
When reaching the roller brushes a and 2b, each roller brush slips on the bar 6 due to the difference in rotational speed between the roller brushes ia and ib and the roller brushes 2a and 2b, and the wafer 6 is washed by rubbing the wafer 6. do. A similar phenomenon occurs when the wafer 6 passes through the roller brushes 3a, 3b, 4a, and 4b, and the wafer 6 is cleaned. On the other hand, pure water or cleaning chemicals are sprayed from the nozzle 5 toward the wafer 6 in order to enhance the cleaning effect. By making the tension on each set of roller brushes freely adjustable, cleaning can be performed without causing scratches.
[発明の効果]
以上説明したように本発明は1対のローラーブラシを1
組として複数組並べることにより、安定した搬送を行う
ことができ、並べる段数、かけるテンションの設定によ
り洗浄効果を向上できる効果がある。[Effects of the Invention] As explained above, the present invention has a pair of roller brushes.
By arranging a plurality of sets, stable conveyance can be achieved, and the cleaning effect can be improved by setting the number of stages arranged and the tension applied.
第1図は本発明の実施例の縦断面図である。
la、 lb、 2a、 2b、 3a、 3b、 4
a、 41o・a−ラーブラシ、5・・・ノズル、6・
・・半導体基板特許出願人 九州日本電気株式会社
口−う−ブうシ
第1図FIG. 1 is a longitudinal sectional view of an embodiment of the invention. la, lb, 2a, 2b, 3a, 3b, 4
a, 41o・a-ra brush, 5...nozzle, 6・
...Semiconductor substrate patent applicant Kyushu NEC Co., Ltd. Figure 1
Claims (1)
導体基板洗浄装置において、互いに逆方向に回転して前
記基板に送りを与え、かつ各組毎に任意に設定された回
転速度をもって駆動される一対の洗浄用ローラーブラシ
の複数組を有し、該複数組の洗浄用ローラーブラシ対を
半導体基板の搬送ラインに沿って直列に配列したことを
特徴とする半導体基板洗浄装置。(1) In a semiconductor substrate cleaning apparatus that cleans semiconductor substrates using roller brushes, a pair of roller brushes that rotate in opposite directions to feed the substrate and are driven at an arbitrarily set rotational speed for each set. 1. A semiconductor substrate cleaning apparatus comprising a plurality of pairs of cleaning roller brushes, the plurality of pairs of cleaning roller brushes being arranged in series along a semiconductor substrate conveyance line.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62069757A JPS63234536A (en) | 1987-03-24 | 1987-03-24 | Semiconductor substrate cleaning device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62069757A JPS63234536A (en) | 1987-03-24 | 1987-03-24 | Semiconductor substrate cleaning device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63234536A true JPS63234536A (en) | 1988-09-29 |
Family
ID=13411985
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62069757A Pending JPS63234536A (en) | 1987-03-24 | 1987-03-24 | Semiconductor substrate cleaning device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63234536A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0370133A (en) * | 1989-08-09 | 1991-03-26 | Shin Etsu Handotai Co Ltd | Automatic cleaning device of work |
EP0718871A2 (en) * | 1994-12-21 | 1996-06-26 | Shin-Etsu Handotai Co., Ltd. | Washing of wafers and wafer washing and drying apparatus |
WO2007059925A1 (en) | 2005-11-26 | 2007-05-31 | Acp - Advanced Clean Production Gmbh | Apparatus and method for wet-chemical processing of flat, thin substrates in a continuous method |
CN103143515A (en) * | 2013-03-01 | 2013-06-12 | 佛山市森科能源科技开发有限公司 | Plate die cleaning device |
CN106140676A (en) * | 2016-07-26 | 2016-11-23 | 江西中加创展新能源科技有限公司 | Battery electrode sheet cleaning device |
-
1987
- 1987-03-24 JP JP62069757A patent/JPS63234536A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0370133A (en) * | 1989-08-09 | 1991-03-26 | Shin Etsu Handotai Co Ltd | Automatic cleaning device of work |
EP0718871A2 (en) * | 1994-12-21 | 1996-06-26 | Shin-Etsu Handotai Co., Ltd. | Washing of wafers and wafer washing and drying apparatus |
EP0718871A3 (en) * | 1994-12-21 | 1996-11-27 | Shinetsu Handotai Kk | Cleaning semiconductor wafers and cleaning and drying equipment |
WO2007059925A1 (en) | 2005-11-26 | 2007-05-31 | Acp - Advanced Clean Production Gmbh | Apparatus and method for wet-chemical processing of flat, thin substrates in a continuous method |
CN103143515A (en) * | 2013-03-01 | 2013-06-12 | 佛山市森科能源科技开发有限公司 | Plate die cleaning device |
CN106140676A (en) * | 2016-07-26 | 2016-11-23 | 江西中加创展新能源科技有限公司 | Battery electrode sheet cleaning device |
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