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JPS63220514A - Compound semiconductor film and manufacture thereof - Google Patents

Compound semiconductor film and manufacture thereof

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Publication number
JPS63220514A
JPS63220514A JP62053428A JP5342887A JPS63220514A JP S63220514 A JPS63220514 A JP S63220514A JP 62053428 A JP62053428 A JP 62053428A JP 5342887 A JP5342887 A JP 5342887A JP S63220514 A JPS63220514 A JP S63220514A
Authority
JP
Japan
Prior art keywords
group
compound semiconductor
semiconductor film
compound
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62053428A
Other languages
Japanese (ja)
Inventor
Noriyoshi Shibata
典義 柴田
Sakae Maebotoke
栄 前佛
Akira Tomaru
暁 都丸
Akira Oki
明 大木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62053428A priority Critical patent/JPS63220514A/en
Publication of JPS63220514A publication Critical patent/JPS63220514A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To obtain a P-type conductivity IIb-VIb compound semiconductor film having high quality by adding one element selected from a group consisting of Cu, Ag and Au as group Ib elements in the element periodic table as an impurity. CONSTITUTION:A compound containing a group IIb, a compound containing a group VIb and a hydrocarbon group compound or a chelate compound containing a group Ib as an impurity introduced to a compound semiconductor as the raw gases of the compound semiconductor are admitted into a reaction vessel in the vapor phase, and a IIb-VIb compound semiconductor film is grown through a chemical vapor phase reaction. The IIb-VIb compound semiconductor film as a compound semiconductor film displays P-type conductivity because it includes one kind of Cu, Ag and Au as group Ib elements as the impurity. ZnS, ZnSe, CdS and CdSe can be cited concretely as the combination of IIb-VIb. Accordingly, the P-type conductivity compound semiconductor film having high quality is acquired.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、元素の周期表IIb族およびyb族元素よシ
なる化合物半導体膜とその製造方法に関するものである
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a compound semiconductor film made of elements of group IIb and group yb of the periodic table of elements, and a method for manufacturing the same.

〔従来の技術〕[Conventional technology]

近年、青色発光材料として注目されているZnS。 In recent years, ZnS has attracted attention as a blue-emitting material.

Zn5eなどの化合物半導体膜を製造する方法として、
有機金属化学気相成長法(MOOVD法)と呼ばれる方
法が多く採用されるように・なった。
As a method for manufacturing compound semiconductor films such as Zn5e,
A method called metalorganic chemical vapor deposition (MOOVD) has come to be widely adopted.

このMOCVD法では、例えばジメチル亜鉛C(CH3
)2 Zn 〕などの周期表1IIb族元素を含む有機
金属化合物を気相熱分解し、セレン化水素(H2Se 
)などのyb族元素を含む化合物と反応させることによ
って、ZnSθなどのIb−VIb族化合物半導体膜を
基板上に成長させていた。
In this MOCVD method, for example, dimethylzinc C (CH3
) 2 Zn ] and other organometallic compounds containing Group 1IIb elements of the periodic table are subjected to gas phase pyrolysis to produce hydrogen selenide (H2Se
), etc., to grow an Ib-VIb group compound semiconductor film such as ZnSθ on a substrate.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

nb−vtb族化合物においてp型伝導性を有する化合
物半導体膜を得るためには、原料ガス中に、yb族元素
であるN、  PまたはAsを含む化合物を添加してい
たが、この方法では化合物半導体結晶中でyb族元素を
yb族元素で置き換えるために、置き換えの際に余分の
yb族元素の空孔ができやすく、生成した空孔は電気的
にドナーとして作用し、添加したyb族元素がアクセプ
タとして作用することをさまたげる、いわゆる補償効果
が発生することが知られている。この補償効果のために
、化合物半導体は電気的に高抵抗となり、結果的にp型
伝導性が得られないという欠点かあった。したかってy
b族元素を添加する従来法ではp型伝導性を実現するこ
とは極めて困難であった。
In order to obtain a compound semiconductor film having p-type conductivity using a nb-vtb group compound, a compound containing N, P, or As, which is a yb group element, is added to the source gas. In order to replace the YB group element with the YB group element in the semiconductor crystal, extra vacancies of the YB group element are likely to be created during the replacement, and the generated vacancies act as electrical donors, and the added YB group element It is known that a so-called compensation effect occurs, which prevents the molecules from acting as acceptors. Due to this compensation effect, the compound semiconductor becomes electrically high in resistance, resulting in a disadvantage that p-type conductivity cannot be obtained. I want to
It has been extremely difficult to achieve p-type conductivity using the conventional method of adding group B elements.

本発明は、このような従来技術の欠点を解決し、高品質
のp型伝碑性の肛−VIb族化合物半導体膜を提供し、
線膜を容易に成長しうる製造方法を提供しようとするも
のである。
The present invention solves the drawbacks of the prior art and provides a high quality p-type anal-VIb group compound semiconductor film,
The purpose of this invention is to provide a manufacturing method that allows easy growth of linear films.

〔問題を解決するための手段〕[Means to solve the problem]

上記目的は、化合物半導体の原料ガスであるIb族を含
む化合物とVIb族を含む化合物、および化合物半導体
に導入する不純物であるIIb族を含む炭化水素系化合
物あるいはキレート化合物を、キャリアガス(例えば水
素ガス)によって気相で反応容器内に導入し、化学気相
反応によってIIb −VIb族化合物半導体膜を成長
させることによシ達成できる。本発明の化合物半導体膜
では、結晶中でIb族元素をIIb族元素で置き換える
ためVIb族元素空孔の発生が抑制され、まだ置き換え
の際に余分のIIIbIb族元素孔が発生してもIb族
元素の空孔はアクセプタとして作用するため添加したI
Ib族元素がアクセプタとして作用することを伺らさま
たげない。
The above purpose is to use a carrier gas (e.g. hydrogen This can be achieved by introducing a gas (gas) into a reaction vessel in a vapor phase and growing a IIb-VIb group compound semiconductor film by a chemical vapor phase reaction. In the compound semiconductor film of the present invention, since the Ib group element is replaced with the IIb group element in the crystal, the generation of VIb group element vacancies is suppressed, and even if extra IIIbIb group element vacancies are generated during the replacement, the Ib group element vacancy is suppressed. Since the vacancies of the element act as acceptors, the added I
There is no doubt that group Ib elements act as acceptors.

〔作 用〕[For production]

本発明の化合物半導体膜のIIb −VIb族化合物半
導体膜であり、Ib族元素であるCu、 Ag、 Au
のうちの一種を不純物として含有することによりp型伝
導を示す。IIb−VIbの組み合わせとしてはZnS
 。
The IIb-VIb group compound semiconductor film of the compound semiconductor film of the present invention contains Cu, Ag, and Au which are group Ib elements.
By containing one of these as an impurity, p-type conduction is exhibited. As a combination of IIb-VIb, ZnS
.

Zn5e 、  Ode 、  C!dseを具体的に
挙げることができる。
Zn5e, Ode, C! dse can be specifically mentioned.

本発明の化合物半導体膜の製造方法において、導入する
不純物であるIIb族元素を含む炭化水素化合物として
は、Ib族元素がCu、Ag、Auのうちいずれかであ
り、かつアルキル基が、メチル、へキシニル、イソブテ
ニル、シクロペンタンエニル基−〇    − のうちいずれかである炭化水素化合物を用いることが望
ましい。まだ上記IIb族元素を含む炭化水素化合物の
熱分解反応を容易にするために、アミンあるいはフォス
フインと錯体を形成している炭化水素化合物を用いるこ
とも好ましい。そして、IIb族を含qヒ合物として、
銅ポレフイ叱銅フタロ/アニン、 銅TC!IQなどの
金属キレートを用いることもできる。
In the method for manufacturing a compound semiconductor film of the present invention, the hydrocarbon compound containing a group IIb element as an impurity to be introduced is such that the group Ib element is Cu, Ag, or Au, and the alkyl group is methyl, It is desirable to use a hydrocarbon compound that is any one of hexynyl, isobutenyl, and cyclopentanenyl groups. In order to facilitate the thermal decomposition reaction of the hydrocarbon compound that still contains the Group IIb element, it is also preferable to use a hydrocarbon compound that forms a complex with an amine or phosphine. And, as a q-hybrid compound containing group IIb,
Copper Porefi Scolding Copper Phthalo/Anin, Copper TC! Metal chelates such as IQ can also be used.

これらの化合物は、いずれも常温常圧で固体であり、昇
華性を有するために容器中に収容して融点又は分解点以
下の温度に加熱して昇華させキャリアガスにより反応容
器へ輸送できる。
All of these compounds are solid at room temperature and pressure, and because they have sublimation properties, they can be stored in a container, heated to a temperature below the melting point or decomposition point, sublimated, and transported to a reaction container by a carrier gas.

〔実施例〕〔Example〕

第4図は本実施例において使用したZn5e化合物半導
体の単結晶膜の製造装置の構成を示す系統図である。図
において、Zn5e化合物半導体を構成するZn元素を
含む原料である液体のジエチル亜鉛C(02H5)2 
Zn :lが封入されているバブラー容器夕内に、ガス
流量コントローラタにより流量調節された水素ガス/グ
をバブリングさせることによシ、ジエチル亜鉛を所要量
含む水素ガスを形成し、これに不純物添加用のドーピン
グ化合物として、銅の有機金属化合物の一種であるシク
ロペンタンエニル銅(05H50u ) トフォスフィ
ンの一種であるトリフェニルフォスフインP(C6H5
)3の錯体を入れた容器7内を通過させた所定流量の水
素ガスを加えて原料となし、他方、Zn5e化合物を構
成するSs元素を含む原料であるセレノ化水素(H2E
te )が充填されているガスボンベ2より、ガス流量
コントローラ/2を介して所要量を供給し、これにガス
流量コントローラ//から所定流量の水素ガスを加えて
原料として、上記のジエチル亜鉛およびシクロペンタン
エニル銅・トリフェニルフォスフイン錯体を含む原料ガ
スと共に、気相で反応容器/内に導入する。反応容器内
には、GaAs基板3が基板ホルダ一の上に配置されて
いて、高周波加熱コイル≠により所定の温度に加熱され
、化学気相反応により銅を含むp型伝導性のZnEie
化合物半導体の単結晶膜がGaAs基板上に形成される
。GaASとZn5eの格子定数の不整合は7%以下で
あシ、良好な単結晶膜が形成できる。この格子定数の不
整合ば〜j%まで許容され、工nP、Si等が基板とし
て使用可能である。このZn5e単結晶の形成において
、ドーピング化合物であるシクロペンタンエニル銅・ト
リフェニルフォスフイン錯体ハ常温−常圧で昇華性のあ
る固体であり、容器7を加熱しながらガス流量コントロ
ーラ10を通った水素ガスを容器7中を通過させるだけ
でドーピング化合物の蒸気を含んだガスが容易に得られ
るので、容器7の温度を一定に保ちかつガス流量コント
ローラ10でガス流量を精密にしかも容易に制御するこ
とが可能である。
FIG. 4 is a system diagram showing the configuration of an apparatus for manufacturing a single crystal film of a Zn5e compound semiconductor used in this example. In the figure, liquid diethylzinc C(02H5)2, which is a raw material containing the Zn element constituting the Zn5e compound semiconductor, is shown.
By bubbling hydrogen gas whose flow rate is regulated by a gas flow controller into a bubbler container in which Zn:1 is sealed, hydrogen gas containing the required amount of diethylzinc is formed, and impurities are added to it. As doping compounds for addition, cyclopentanenyl copper (05H50u), which is a type of organometallic compound of copper, and triphenylphosphine P (C6H5, which is a type of tophosphine) are used.
) A predetermined flow rate of hydrogen gas passed through the container 7 containing the complex of 3 is added as a raw material, and on the other hand, hydrogen selenoide (H2E
A required amount of hydrogen gas is supplied from the gas cylinder 2 filled with te) via the gas flow controller/2, and a predetermined flow rate of hydrogen gas is added from the gas flow controller// to the raw materials to produce the above-mentioned diethyl zinc and cyclo It is introduced into the reaction vessel in a gas phase together with the raw material gas containing the pentanenyl copper/triphenylphosphine complex. Inside the reaction vessel, a GaAs substrate 3 is placed on a substrate holder 1, heated to a predetermined temperature by a high-frequency heating coil, and heated to a p-type conductive ZnEie containing copper by a chemical vapor phase reaction.
A compound semiconductor single crystal film is formed on a GaAs substrate. The lattice constant mismatch between GaAS and Zn5e is 7% or less, and a good single crystal film can be formed. If this lattice constant mismatch is allowed up to ~j%, nP, Si, etc. can be used as the substrate. In the formation of this Zn5e single crystal, the doping compound cyclopentanenyl copper triphenylphosphine complex is a solid that sublimes at normal temperature and normal pressure, and hydrogen passing through the gas flow controller 10 while heating the container 7 Since the gas containing the vapor of the doping compound can be easily obtained by simply passing the gas through the container 7, the temperature of the container 7 can be kept constant and the gas flow rate can be precisely and easily controlled by the gas flow controller 10. is possible.

ここで、原料錯体中のシクロペンタンエニル銅はZn5
e単結晶膜の成長温度(約300−600′C)の領域
で容易に熱分解することができるが、一方錯体中のトリ
フェニルフォスフインは上記温度領域ではほとんど熱分
解せずに排気されるだめ、銅を選択的に添加することが
できる。
Here, cyclopentanenyl copper in the raw material complex is Zn5
e It can be easily thermally decomposed in the range of the single crystal film growth temperature (approximately 300-600'C), but on the other hand, triphenylphosphine in the complex is hardly thermally decomposed in the above temperature range and is exhausted. No, copper can be added selectively.

以上説明した化合物半導体の単結晶膜成長装置ヲ用い、
1°Cの温度のジエチル亜鉛のパブ7 ’容器jを通過
した。2 J″cc/分の水素ガスと、7.20′c−
〇    − に加熱したジクロペンタジェニル銅・トリフェニルフォ
スフイン錯体の容器7を通過した10cc/分の水素ガ
スとを、/ρ/分の水素ガスに混合希釈した後の原料ガ
スを反応容器/内に導く。同時に、水素ガスで希釈した
j容積チセレン化水素ガス100cc1分の原料ガスを
さらに/ 117分の水素ガスに混合希釈した後、反応
容器/内に導き、1ltOO′Cの温度に加熱されだG
aAs基板3上に吹きつけることにより銅を含むZn5
e単結晶膜を7時間あたり2μmの速度で成長させた。
Using the compound semiconductor single crystal film growth apparatus described above,
Passed through a pub 7' container of diethylzinc at a temperature of 1°C. 2 J″cc/min of hydrogen gas and 7.20′c-
〇 - 10 cc/min of hydrogen gas passed through the container 7 of the diclopentadienyl copper/triphenylphosphine complex heated to /ρ/min was mixed and diluted with the hydrogen gas, and the raw material gas was added to the reaction vessel/. Lead inward. At the same time, the raw material gas for 100 cc of hydrogen thylenide gas diluted with hydrogen gas was further mixed and diluted with 117 volumes of hydrogen gas, introduced into the reaction vessel, and heated to a temperature of 1 ltOO'C.
Zn5 containing copper is sprayed onto the aAs substrate 3.
e Single crystal films were grown at a rate of 2 μm per 7 h.

成長の際には、Seの空孔の発生を抑制するような条件
を採用することが重要であり、このためにはSeを含む
原料を十分多量に供給し成長が常にZnを含む原料の供
給で律速される状況が必要であるが、このような条件は
Seを含む原料の供給量をZnを含む原料の供給量に比
しモル比で3倍以上にすることで容易に実現できた。こ
の条件は他のIIb−VIb族化合物半導体膜を成長さ
せる場合にも適用される。得られたznse単結晶膜の
表面は、良好な表面が形成され、結晶性も銅を添加しな
い場合と同等であり何ら問題はなかった。また、Zn5
e単結晶膜の抵抗は、添加物を含まない場合およびyb
族元素であるPやAsを含む場合には106Ω・m以上
の高抵抗値であったのに対し、シクロペンタンエニル銅
・トリフェニルフォスフイン錯体原料として銅を添加し
た場合には数+Ω・m以下の低い抵抗値を示した。
During growth, it is important to adopt conditions that suppress the generation of Se vacancies, and for this purpose, it is necessary to supply a sufficiently large amount of raw material containing Se and to ensure that the growth is always carried out by supplying the raw material containing Zn. However, such conditions could be easily achieved by increasing the supply amount of the Se-containing raw material to at least three times the molar ratio of the Zn-containing raw material supply amount. These conditions are also applied when growing other IIb-VIb group compound semiconductor films. The surface of the obtained ZNSE single crystal film had a good surface, and the crystallinity was the same as that without adding copper, so there were no problems. Also, Zn5
eThe resistance of the single crystal film is the same when no additive is included and when yb
When the group elements P and As are included, the resistance value is as high as 106Ω・m or more, whereas when copper is added as a raw material for the cyclopentanenyl copper/triphenylphosphine complex, the resistance value is several +Ω・m. It showed the following low resistance value.

p型キャリア濃度は1017個/ crAであり、正孔
移動度は室温で約/ 00cnI/ V”’であり、良
好なp型缶導性を示した。さらにフォトルミネッセンス
特性は、従来のようなりb族元素であるPやAsを添加
した場合には第2図の曲線/夕に示すように青色以外の
発光が支配的になるのに対し、本実施例の場合である銅
を添加した試料の発光スペクトルは第2図の曲線/乙に
示すごとく、青色発光(約4170nm付近)のみが強
い極めて良好な結果が得られた以上の本発明の実施例に
おいて、不純物添加用のIIb族化合物としてシクロペ
ンタンエニル銅・トリフェニルフォスフイン錯体の例を
挙げたが、この他にIIb族元素として銅、銀または金
を有し、アルキル基としてメチル、ヘキシニル、イソブ
テニル基を有する炭化水素捷たは炭化水素とアミンの錯
体、例えばヘキシニル銅[C4Hg O= CCu ”
J 、  イソブテニル銀〔(c)13)2cm=cH
Ag〕、 トリメチル金・エチレンジアミン錯体[: 
、2 hu (cI(3)3・NH2CH2CH2NH
2)などにおいても、また銅を含む金属キレート化合物
である銅ポルフィリン、銅フタロ/アニン、銅TONQ
などを原料として用いても本実施例と同様に、IIb族
の不純物添加が可能であることを確認した。
The p-type carrier concentration was 1017/crA, and the hole mobility was approximately /00cnI/V'' at room temperature, indicating good p-type can conductivity.Furthermore, the photoluminescence properties were similar to those of the conventional one. When P and As, which are Group B elements, are added, light emission other than blue becomes dominant as shown in the curve in Figure 2, whereas in the case of this example, the sample to which copper was added As shown in the curve/B of Figure 2, the emission spectrum of is shown in Fig. 2. In the above examples of the present invention, very good results were obtained where only the blue emission (near about 4170 nm) was strong. The example of cyclopentanenyl copper/triphenylphosphine complex has been given, but in addition to this, hydrocarbons having copper, silver, or gold as group IIb elements and methyl, hexynyl, or isobutenyl groups as alkyl groups or carbonized Complexes of hydrogen and amines, such as hexynyl copper [C4Hg O= CCu ”
J, isobutenyl silver [(c)13)2cm=cH
Ag], trimethyl gold/ethylenediamine complex [:
, 2 hu (cI(3)3・NH2CH2CH2NH
2), copper-containing metal chelate compounds such as copper porphyrin, copper phthalo/anine, and copper TONQ.
It was confirmed that group IIb impurities can be added using these materials as raw materials in the same manner as in this example.

次表に代表的な化合物の特性を示す。いずれも常温常圧
で固体であり昇華性を有する。融点の示されていない物
質は溶融する前に分解する物質である。これらの原料を
前記実施例に示した容器7内に収容し、融点又は分解温
度以下の温度に保持して昇華させキャリアガスにより反
応容器に導く。
The following table shows the characteristics of typical compounds. Both are solid at room temperature and pressure and have sublimation properties. Substances without melting points are those that decompose before melting. These raw materials are placed in the container 7 shown in the previous example, sublimated while being maintained at a temperature below the melting point or decomposition temperature, and introduced into the reaction container by a carrier gas.

反応容器内で各化合物は分解して、IIb族元素がII
b −VIb族化合物半導体膜に添加される。反応容器
内でのこれらの化合物の分解のしやすさはIIb族の添
加の効率を決める。分M温度の高い化合物では効率の低
下を補償するために容器7に流すキャリアガス流量を増
加させる必要がある。
Each compound decomposes in the reaction vessel, and group IIb elements are converted into IIb group elements.
b - Added to the VIb group compound semiconductor film. The ease with which these compounds decompose within the reaction vessel determines the efficiency of Group IIb addition. For compounds with a high minM temperature, it is necessary to increase the flow rate of the carrier gas flowing into the container 7 in order to compensate for the decrease in efficiency.

表 IIb族元素の添加に用いうる化合物前記実施例で
はIIb−VIb族化合物の例としてZn5eの場合の
例を挙げだが、これ以外のlIIb族とyb族元素から
なる化合物半導体として、ZnS 、 ZnTe。
Table: Compounds that can be used for addition of Group IIb elements In the above example, Zn5e was given as an example of a Group IIb-VIb compound, but other compound semiconductors comprising Group IIb and Yb group elements include ZnS and ZnTe.

0clS 、 0dSe 、 CdTeなどの二元系以
上の化合物半導体膜の製造においても本発明の方法が適
用できることは言うまでもない。
It goes without saying that the method of the present invention can also be applied to the production of binary or higher compound semiconductor films such as 0clS, 0dSe, and CdTe.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明したごとく、本発明のIIb−VIb族
化合物半導体膜の製造方法によれば、添加する不純物と
してIIb族元素を用いさらに膜成長に際してVIb族
原料を十分に供給するため、従来のyb族元素を不純物
として用いた場合に問題と々るVIb族空孔の発生によ
る補償効果を抑制することができる。
As explained in detail above, according to the method for manufacturing a IIb-VIb group compound semiconductor film of the present invention, a Group IIb element is used as an impurity to be added, and a Group VIb raw material is sufficiently supplied during film growth. It is possible to suppress the compensation effect due to the generation of group VIb vacancies, which is problematic when a group element is used as an impurity.

その結果として、本発明の化合物半導体膜は青色発光を
示す商品質のp型缶導性の化合物半導体膜となる。
As a result, the compound semiconductor film of the present invention becomes a commercial quality p-type can conductive compound semiconductor film that emits blue light.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例において用いたZn5e単結晶
膜の製造装置の構成を示す系統図、第2図は本発明の実
施例において形成したZnS e単結晶膜の77にの温
度におけるフォトルミネッセンス特性を示す図である。 /・・・反応容器、2・・・基板ホルダ、3・・・ci
aAs基板、グ・・・高周波加熱コイル、j・・・バブ
ラー容器、−ロー 乙・・・セレン化水素のガスボンへ、7・・・容器、と
。 り、 10. //、 /、2・・・ガス流量コントロ
ーラ、/3・・・排気口、/グ・・・水素ガス、/j・
・・P濃度1015個/ctIの試料の発光スペクトル
、/乙・・・Cu濃濃度101涸
FIG. 1 is a system diagram showing the configuration of the manufacturing apparatus for the ZnS e single crystal film used in the example of the present invention, and FIG. 2 is a photograph of the ZnS e single crystal film formed in the example of the present invention at a temperature of FIG. 3 is a diagram showing luminescence characteristics. /... reaction container, 2... substrate holder, 3... ci
aAs substrate, G...high frequency heating coil, j...bubbler container, -row B...to hydrogen selenide gas cylinder, 7...container. 10. //, /, 2...Gas flow controller, /3...Exhaust port, /G...Hydrogen gas, /j・
...Emission spectrum of sample with P concentration of 1015 pieces/ctI, /B...Cu concentration of 101 pieces/ctI

Claims (7)

【特許請求の範囲】[Claims] (1)格子定数において整合性を有する半導体基板上の
、元素周期表IIb族元素であるZnおよびCdよりなる
群と、 元素周期表VIb族元素であるS、SeおよびTeよりな
る群から、それぞれ選ばれた一の元素の組み合わせから
なる単結晶性の化合物半導体膜であつて、 元素周期表 I b族元素であるCu、AgおよびAuよ
りなる群から選ばれた一の元素が不純物として添加され
ていることを特徴とする化合物半導体膜。
(1) A group consisting of Zn and Cd, which are Group IIb elements of the Periodic Table of Elements, and a group consisting of S, Se, and Te, which are Group VIb elements of the Periodic Table, on a semiconductor substrate having consistency in lattice constant, respectively. A single-crystalline compound semiconductor film consisting of a combination of selected elements, in which an element selected from the group consisting of Cu, Ag, and Au, which are group Ib elements of the periodic table of elements, is added as an impurity. A compound semiconductor film characterized by:
(2)反応容器内に元素周期表IIb族元素であるZnお
よびCdよりなる群から選ばれた一の元素を含む化合物
および 元素周期表VIb族元素であるS、SeおよびTeよりな
る群から選ばれた一の元素を含む化合物を気相で導入し
、 前記反応容器内で熱分解して、該容器内に 設置した基板上にIIb−VIb族化合物半導体膜を製造す
る方法において、上記原料に加えて元素周期表 I b族
元素であるCu、AgおよびAuよりなる群から選ばれ
た一の元素を含む化合物を気相で導入し、 前記 I b族元素を添加したIIb−VIb族化合物半導体
膜を製造することを特徴とする化合物半導体膜の製造方
法。
(2) A compound containing an element selected from the group consisting of Zn and Cd, which are elements of group IIb of the periodic table, and an element selected from the group consisting of S, Se, and Te, which are elements of group VIb of the periodic table, in the reaction vessel. In the method of manufacturing a IIb-VIb group compound semiconductor film on a substrate placed in the reaction vessel by introducing a compound containing one element in the gas phase in the reaction vessel and then thermally decomposing it in the reaction vessel, In addition, a compound containing an element selected from the group consisting of Cu, Ag, and Au, which are Group Ib elements of the Periodic Table of Elements, is introduced in a gas phase, and the Group IIb-VIb compound semiconductor is added with the Group Ib element. A method for manufacturing a compound semiconductor film, the method comprising manufacturing a film.
(3)VIb族元素を含む原料が、IIb族元素を含む原料
に対して過剰に供給されることを特徴とする特許請求の
範囲第2項記載の化合物半導体膜の製造方法。
(3) The method for manufacturing a compound semiconductor film according to claim 2, wherein the raw material containing the group VIb element is supplied in excess of the raw material containing the group IIb element.
(4) I b族元素を含む化合物が、常温常圧で固体で
あり、昇華性を有することを特徴とする特許請求の範囲
第2項又は第3項記載の化合物半導体膜の製造方法。
(4) The method for producing a compound semiconductor film according to claim 2 or 3, wherein the compound containing the Ib group element is solid at room temperature and pressure and has sublimation properties.
(5) I b族元素を含む化合物が、メチル基、へキシ
ニル基、イソブテニル基、シクロペンタンエニル基から
なる群から選ばれた一の基を有する I b族元素の炭化
水素化合物であることを特徴とする特許請求の範囲第2
項、第3項、第4項いずれか記載の化合物半導体膜の製
造方法。
(5) The compound containing a Group Ib element is a hydrocarbon compound of a Group Ib element having one group selected from the group consisting of a methyl group, a hexynyl group, an isobutenyl group, and a cyclopentanenyl group. Characteristic Claim 2
A method for manufacturing a compound semiconductor film according to any one of Items 1, 3, and 4.
(6) I b族元素を含む化合物が、メチル基、へキシ
ニル基、イソブテニル基、シクロペンタンエニル基から
なる群から選ばれた一の基を有する I b族元素の炭化
水素化合物と、アミンあるいはフォスフィンとの錯体で
あることを特徴とする特許請求の範囲第2項、第3項、
第4項いずれか記載の化合物半導体膜の製造方法。
(6) A hydrocarbon compound of a Group Ib element in which the compound containing a Group Ib element has one group selected from the group consisting of a methyl group, a hexynyl group, an isobutenyl group, and a cyclopentanenyl group, and an amine or Claims 2 and 3, characterized in that it is a complex with phosphine.
4. A method for manufacturing a compound semiconductor film according to any one of Item 4.
(7) I b族元素を含む化合物が、ポルフィリン、フ
タロシアニンおよびテトラシアノキノジメタン(TCN
Q)からなる群から選ばれた一とCuの金属キレート化
合物であることを特徴とする特許請求の範囲第2項、第
3項、第4項いずれか記載の化合物半導体膜の製造方法
(7) Compounds containing Group Ib elements include porphyrins, phthalocyanines, and tetracyanoquinodimethane (TCN
The method for manufacturing a compound semiconductor film according to any one of claims 2, 3, and 4, characterized in that the metal chelate compound is a metal chelate compound of one selected from the group consisting of Q) and Cu.
JP62053428A 1987-03-09 1987-03-09 Compound semiconductor film and manufacture thereof Pending JPS63220514A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62053428A JPS63220514A (en) 1987-03-09 1987-03-09 Compound semiconductor film and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62053428A JPS63220514A (en) 1987-03-09 1987-03-09 Compound semiconductor film and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS63220514A true JPS63220514A (en) 1988-09-13

Family

ID=12942567

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62053428A Pending JPS63220514A (en) 1987-03-09 1987-03-09 Compound semiconductor film and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS63220514A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612432B2 (en) 2004-02-06 2009-11-03 Hoya Corporation P-type ZnS based semiconductor material having a low resistance due to its high copper content

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612432B2 (en) 2004-02-06 2009-11-03 Hoya Corporation P-type ZnS based semiconductor material having a low resistance due to its high copper content

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