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JPS6249265A - Wiring test equipment - Google Patents

Wiring test equipment

Info

Publication number
JPS6249265A
JPS6249265A JP60176402A JP17640285A JPS6249265A JP S6249265 A JPS6249265 A JP S6249265A JP 60176402 A JP60176402 A JP 60176402A JP 17640285 A JP17640285 A JP 17640285A JP S6249265 A JPS6249265 A JP S6249265A
Authority
JP
Japan
Prior art keywords
test
terminal
insulation
wiring
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60176402A
Other languages
Japanese (ja)
Other versions
JPH0548864B2 (en
Inventor
Taiichi Miho
美保 泰一
Ichizo Oshika
大鹿 市三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP60176402A priority Critical patent/JPS6249265A/en
Publication of JPS6249265A publication Critical patent/JPS6249265A/en
Publication of JPH0548864B2 publication Critical patent/JPH0548864B2/ja
Granted legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔れ1要〕 与えられた配線データに基−jい′こ選#Jゼl、人二
当面の試験の対象と4゛る1(IMの−・)〕の試験用
端子と他方の試験用端子との間の絶縁を測定する、: 
、、1.:ζ−11、って、当面の試すの対象とする一
方の試験用端子にり4する絶縁不良端子を検出する配線
試験装置二おいて、す1面の試験の対象とする一方0)
試験用端イに本来接続さ41ている試験用端子が絶縁不
良端子とりなされ゛(検出されないようにすること4に
、Lっで、試験結咀デーク中に冗1、ニデータが混入す
ることを防11−シたもの。
[Detailed description of the invention] [Required 1] Based on the given wiring data, the current test target and the 4-1 (IM's -)] Measuring the insulation between a test terminal and another test terminal:
,,1. : ζ-11, one of the test terminals that will be tested for the time being is installed with a wiring test device that detects poor insulation terminals.
The test terminal that was originally connected to the test terminal 41 is replaced with a terminal with poor insulation. Defense 11-Shimono.

〔産業上の利用分野〕[Industrial application field]

本発明は配線網の検査とくに絶縁の検査に使用する配線
試験装置に関するものである。
The present invention relates to a wiring testing device used for testing wiring networks, particularly for testing insulation.

配線試験装置は、たとえばプリント配線板等0)配線網
が設a1どおりに正しく配線され”でG\るか否かを試
験す2〕装置でJ〕す、試験は、d1智(ムu1d用設
d1ノステム(〇へ1[)等によ−、”6作(′−)ね
た配線データC二基づいて試験用端子を選択し、 ・力
の試験用端−rと他方の試験用端子との間の導j1nあ
るいは絶縁が配線データどおりであるか否かの試験を行
・)。
The wiring test equipment is used to test whether the wiring network, such as a printed wiring board, is correctly wired according to the design. Select the test terminal based on the wiring data C2 obtained by setting d1 nostem (○ to 1[) etc., and connect the force test end -r and the other test terminal. Test whether the conductivity or insulation between the wire and the wire is in accordance with the wiring data.

すなわち、配線試験装置乙こよっておごなう試験は、粘
土的には11m試験または絶縁試験のい−」相かであり
、導通試験では当面性1−1する1個の−・−7ノの試
験用端子 (以下、 1ILI I′lli!子と称す
る)と他方の試験用端子(以−ト相丁側端子と称すイ)
)との間で−・夕1−・で行う。
In other words, the test conducted by wiring test equipment B is the 11m test or insulation test in terms of clay, and in the continuity test, it is one of the The test terminal (hereinafter referred to as 1ILI I'lli!) and the other test terminal (hereinafter referred to as the side terminal)
) will be held in the evening 1-.

こねに幻U7絶縁試験では、試験時間を短縮するために
、注[16g、j子と籍数の相二)’、 fill端子
群端子間でまとめてfj ’)。
In the Kononigen U7 insulation test, in order to shorten the test time, note [16g, j child and register number phase 2)', fill terminal group terminals are collectively fj').

試験の対象とする配線網には、jm常、規則的に配列さ
ネ1だ多数の試験用端子(+:JT、中に端子と+3+
、する)が設けてあり、それぞれの6gl 7にはある
規則によって決めた固自の一連番y3を(=t L 、
  この順序にしたがって前記導通試験および絶縁試験
をおこなう。
The wiring network to be tested usually has a large number of test terminals (+: JT, terminals inside and +3+) arranged regularly.
, do), and each 6gl 7 has its own serial number y3 determined by a certain rule (=t L ,
The continuity test and insulation test are performed in this order.

なお、絶縁試験には、 t−El−+1〜tij I′
i以り1の4くての醪11了を相−11明・さNj +
’ とし、てLl)−イ”−ノトシ→ −I う−ス1
−1メ11−1端r、1、句曲のすべてEノ)番間の酩
、1(4−川」(明醪、1了とj7て行′l l:l−
ンづ−Iう−スI・1才?、1、び11+−1bご1子
A、81%の番−jの“4べzo>:44f苓相−f(
tl’l 5gl −”fとj−1,で行うハイ・ンヨ
−1う〜11の314i類のメノメ去がある。
In addition, for the insulation test, t-El-+1 ~ tij I'
i is 1 4 pieces of moromi 11 ryo - 11 light・sa Nj +
' and then Ll) -I''-notoshi→ -I U-su 1
-1 me 11-1 end r, 1, all of the poems and songs are E-no) Banma's sake, 1 (4-kawa') (Mei-momi, 1ryo and j7 line'l l:l-
Is it 1 year old? , 1, bi 11 + - 1b Go 1 child A, 81% number -j's "4 bezo>: 44f Rei phase - f (
tl'l 5gl-"There is a menome removal of 314i class of Hai Nyo-1-11 performed with f and j-1.

たとえば、フリノゾフD ノブI「旧18が1と結さ狛
乙I′I!i11子にはオン便1と」](明との一つの
出力醪11了があり、 、=、11らの中の一ツノをま
ったく使用1−7ない場合があるが、このような不使用
端子の絶t(試験乙、二はオールう/ヨーlデストを7
衿ごな′)。
For example, Frinosov D Nobu I "Old 18 is tied to 1 Komaotsu I'I! i11 child is on flight 1"] (There is one output 11 end with Ming, , =, 11 et al. There are cases in which one terminal is not used at all, but such unused terminals are completely removed (examination B, second is all / YOL Dest is 7).
Collar').

また、配線によって接1tCさ11でいイ順C1了一群
LC’;”;まれる端子を注1−1端了、!:ずで)配
線試験は、最初にこねらのvs、+ rの中の最も若い
番冒のl′藺了を711−I+鶏子として絶縁試験4お
ごな、ったあと、2番[1の5%1子を1・[ト1側端
子と1−2゛で4通試験をおこない1.!ダ1lllが
jFU、、 +)打ば2番F−1の端イをl目」端子と
し3番1(0) 61fA 子i相Ef−側I′+li
l 、、111 L テ導1111 AK験をに コA
 イ。
In addition, for the wiring test, first connect the terminals that are connected by wiring. After carrying out the insulation test 4 times using the youngest terminal in the 711-I + chicken, connect the 5% 1 child of the 2nd [1] to the 1 side terminal and 1-2. Perform four tests with ゛, and if 1.!da1lll is jFU,, +), set the end A of No. 2 F-1 as the lth terminal, and No. 3 1 (0) 61fA Child i-phase Ef- side I'+li
l ,,111 L Tei 1111 AK experience core A
stomach.

lu士同様に1,7て導通試験をオハニなパ)。Just like the master, conduct the continuity test using 1 and 7).

これらの導II+試験において導通不良が発μされた(
場合に番、1.そのときの4刊手(明端子を注]−1醋
j了とL2て内び絶縁試験をおこなうが、浦富、最初の
絶縁試験はローショー1−デス1−でおこない、あとの
絶縁試験はオールショートテストでおこなう。
Continuity failure occurred in these conductor II+ tests (
In case, 1. At that time, the 4th edition (note the light terminal) - 1 and L 2 were used to conduct insulation tests, but the first insulation test was performed with Low Show 1 - Death 1 - in Uradome, and all subsequent insulation tests were carried out. Do a short test.

配線試験の結果は試験結果データとして印刷等乙、二よ
って出力され2作業音の目?kUこ、■、る不良個所の
発見・修復等に利用されるが、この際、出力されろ試験
結果データの中に冗長あるいは不5なデータが含まれで
いない、二とが望ましい。
The results of the wiring test are printed as test result data, etc. It is used for finding and repairing defective parts, but in this case, it is desirable that the output test result data does not include redundant or invalid data.

〔従来の技術〕[Conventional technology]

第3し1ば従来例の説明図であり。 The third example is an explanatory diagram of a conventional example.

1は、SlW機援用設計システムによって作成された配
線データに基づいて、各部の制御を行う制御部。
Reference numeral 1 denotes a control unit that controls each part based on wiring data created by the SlW machine-aided design system.

2は、制御部1の制御を受IJて注目端子を選))ぐす
る第一の選択回路。
2 is a first selection circuit which selects the terminal of interest under the control of the control unit 1;

3は2制御部1の制御を受けて注目端子との間で絶縁試
験をおこなう相手側端子を選択するする第一二のj鍔板
回路。
Reference numeral 3 denotes a first and second j-flange plate circuit which selects a mating terminal to perform an insulation test with the terminal of interest under the control of the control unit 1;

4(4,第一の選)II!回路2に。1、−うて選択、
きねた汀1−トyg1子と、第二の選択回路j3に、1
、っ゛こj鍔板11た相−f(!III端Yとの間の絶
縁を測定する絶縁測定器である。
4 (4, first choice) II! to circuit 2. 1.-Ute selection,
1 to Kineta 1-toyg1 child and the second selection circuit j3
This is an insulation measuring instrument that measures the insulation between the flange plate 11 and the phase-f (!III end Y).

また5は、試験の対象とする配線網eあり、その−・部
を第4図に例示する。
In addition, in 5, there is a wiring network e to be tested, and the part thereof is illustrated in FIG.

第4図において、■〜■?;t: +’lυ1rであり
、これらの端rの間は実線のよう6、二配線されCいる
が、×印によって丞す断線と点線によって示−4′絶縁
不良があることを表し7ている。
In Figure 4, ■~■? ;t: +'lυ1r, and between these ends r there are 6 and 2 wires C as shown by the solid line, but the cross mark indicates a disconnection and the dotted line indicates -4' insulation failure7. There is.

ここ−乙I′Ig+−7,(:31を注[−1端イとす
る導通試験において端子■が不良端子とし°C検出され
ると、このあと、端子■を注Ll +’T尚了としてオ
ールショー]デス1、による絶縁試験をおこならことに
なる。
Here-Otsu I'Ig+-7, (Note: 31 Note [-If terminal ■ is detected as a defective terminal in °C during the continuity test with terminal A, then after this, terminal ■ is Note Ll +'T. If you conduct an insulation test using the All Show] Death 1.

この場合、端子■を1): [−11′4子とするオー
ルショートテスト 手(lu11端子として絶縁試験器4に接続さ引1,こ
の中にば端子■も含ま1する。
In this case, the terminal ■ is connected to the insulation tester 4 as the terminal 1): [-11' 4 terminals (connected to the insulation tester 4 as the lu11 terminal, including the terminal 1).

このため、端子■および■が絶縁イ・良端rとし。For this reason, terminals ■ and ■ should be insulated (I) and the good end (R).

て検出さ1+るほか、・シ高r■も絶縁不1’ij :
?$l rとμなされて一緒C,:検出さ4Iろ。
In addition to being detected as 1+, the insulation is also not 1'ij:
? $l r and μ are made together C,: detected 4I.

説明を油田8化才ろため、−1−記例では絶縁不良端子
とシ5.なされて検出さ力2る端Y−L;t I l固
であるが。
Since the explanation is about 8 years old in the oil field, -1- In the example, there is a terminal with poor insulation.5. The force being detected is the end Y-L; t I l is firm.

′太際乙こ番J多数の端rが絶縁不良辱1了−と見なさ
れて検出されろ場合がある。
There are cases where a large number of edges are considered to be insulation defects and are detected.

すなわら、試験結果データの中に不良端Yと見なされだ
多数の端−rが含まれるご、J−になり、不良個所の発
見あるいt4[修復作業において1作業tfC,二過刺
な負#11をりえるとい−)問題点がある。
In other words, if the test result data includes a large number of ends -r that are considered to be defective ends Y, it becomes J-, and if the defective part is found or t4 [in the repair work, one work tfC, two There is a problem with getting back to negative #11.

したがって本発明の[1的は、絶縁試験における試験結
果Y−夕の中に不良端子と見なされる醋i子が含まれな
いようにすることにあ?)。
Therefore, the first object of the present invention is to prevent test results Y-Y in insulation tests from including any terminals considered to be defective terminals. ).

〔問題点を解決−するための手段〕[Means for solving problems]

第1図は本発明の涼哩ブロック図ごあり、第31ツレ、
共通−Jイ)73号1〜5は従来例と同一・のりj象で
あり、そのし。丁か、6i:(第一の選択回路2によっ
て選11(されたiトl−16I了に本来配線されてい
Z)端子と、絶縁測定器4との間の接*J′cを遮断す
るiJ!!I 14ji lt’1路である。
Figure 1 is a block diagram of the present invention, No. 31,
Common - J A) No. 73 No. 1 to 5 are the same as the conventional example, and are different from each other. 6i: (Cuts off the connection *J'c between the terminal selected by the first selection circuit 2 and the insulation measuring device 4. iJ!!I 14ji lt'1 road.

11′I用〕 −J’−ナワ’a 、 J: 、’: A、、 191
4 +’Il−’f■を?111 :’を出γと1−1
てオールシ云r −1−5′ス1.に、1、?)絶縁試
験を行・)際、端子(4)に本来配線さ杓”こいイ)靜
1了■・■打よび(:D L! 。
11'I] -J'-Nawa'a, J: ,': A,, 191
4 +'Il-'f■? 111: 'output γ and 1-1
All sheets r -1-5' class 1. Ni, 1,? ) When carrying out the insulation test, please confirm that the original wiring was connected to terminal (4).

、11嘗機援川没計シスーアムから制御部1にりλらイ
9ζ)配線データによって111っているので1、これ
らの端−rが(11丁側端子として絶縁測定:(34に
18続さ1+ないように、遮1tfi回路に6、τよっ
て遮断するものである。
, 111 according to the wiring data from the 11th machine Enkawa sinking system to the control unit 1. In order to prevent this from happening, the interrupter 1tfi circuit is interrupted by 6,τ.

その結果、端子■を2口」端子とする絶縁試験の際に■
および■のみが不良端子と1.7検出され。
As a result, when conducting an insulation test using terminal ■ as a 2-port terminal,
Only 1.7 and ■ are detected as defective terminals.

端子■が不良端子古城なさ41て検出さ11.るごとを
防11することができろ。
Terminal ■ is detected as a defective terminal. 11. Be able to defend 11 times.

〔実施例〕〔Example〕

第2図は本発明の 実施例の構成図で、+)ろ。 Figure 2 is a block diagram of an embodiment of the present invention.

第一・のi鍔板回路21に、配線網5の−4−べ゛(の
端子乙こ接続されろメーク接4+1町形のりL−−JI
I2L および;l+lI 1ffl1部1の制御を受
番1てr1゛目端子をin II< l−、7II +
/−iff 2+中の対応するりシ・−乙こり11.駆
÷11信号を送出1−る信−J送出fi1+ 22とか
ら構成されていイ)。
Connect the -4-B (terminal A) of the wiring network 5 to the I-flag plate circuit 21 of the first one.
I2L and ;l+lI 1ffl1 Part 1 control is assigned number 1 and r1゛th terminal is in II< l-, 7II +
/-if Corresponding Rishi-Otori in 2+ 11. It is composed of the following: 1-1 signal for transmitting ÷11 signal and 1-1 signal for sending signal-J for transmitting fi1+22.

第 Q)選択回路:H4,配線j閘5のずべ−Cの端子
に1「続されるメーク接点形のリレ一群31.および制
御部1の制御を受1)て相−1置11端子を選択し−(
す[・一群31中の対し’i5するリレーに対1−.駆
l!II(4号を送出する(?j ”4−送出部32と
から構成されている。
Q) Selection circuit: H4, a group of make contact type relays 31 connected to the terminals 1 and 1 of phase 1 and 1 of wiring 5 and 1) under the control of control section 1. Select - (
[-1-. Drive! II (transmits No. 4 (?j ``4--sending section 32).

また遮断回路(jは、信号送出部32とリレー君13+
との間に段目、制御部1から与えられる化1−1端了の
番号表配線データとに基づいて注II i端子に本来接
続されていWI IIM!了をi鍔板し、信号送出部3
2からリレー君Y 31に送出される駆動信−シのうち
、注]−1端子に本来接続されている端子に対応するも
のを遮1すiする。
In addition, the cutoff circuit (j is the signal sending section 32 and relay-kun 13+
WI IIM! is originally connected to the i terminal based on the number table wiring data of 1-1 completed given from the control unit 1 between the stage and the WI IIM! Attach the end plate to the signal transmitter 3.
Among the drive signals sent from 2 to relay 31, those corresponding to the terminal originally connected to the -1 terminal are interrupted.

たとλば、第4図ζこ例示した配線網において。For example, in the wiring network shown in FIG.

端子−■を注1」端子としてオールンヨートデス1−に
よる絶縁試験をおこ/曹う際には、第一の選択回路2 
ニ、1; −J テi4 了■カJ巽+Hサ1′4色L
& i$I >E器4の一ノiの端J’−tこ接続さ1
9る。
When carrying out an insulation test using Orunyotodesu 1- with terminal -■ as Note 1' terminal, first selection circuit 2
ni, 1; -J Tei4 End ■ Ka J Tatsumi + H Sa 1'4 color L
& i$I > One end of E unit 4 J'-t is connected 1
9.

−・方、第一、 o> i91択回路3rj、L、信号
送出部;32ニよ−、て端子■以外の端子が相■′−側
1′Iglrとして選+16さ4’1.、  IJ L
−111’31中の対応−1゛イ)す[/−に々1j−
1駆tjJ信号が送出されろ。しか1.、、  :11
らθ)うら酩1了(4)に本来接続されている端fO)
・■および(すt、二対し1′、、す1/−にりlする
駆動(−1号が遮141i回路(iによ−、7遮I折さ
れる。その結果、酩1了(0ならびにζIMI了0)・
■および■を除く端子が一括され−(絶縁側定器40)
他方の端子−に接続される。
- side, first, o> i91 selection circuit 3rj, L, signal sending section; , I.J.L.
- Correspondence in 111'31 -1゛b)su[/-NiN1j-
Send the 1st drive tjJ signal. Only 1. ,, :11
raθ) The end fO) that is originally connected to the back
・■ and (st, 2 vs. 1', 1/-) drive (-1 is interrupted by the 141i circuit (i), 7 interrupts I. As a result, the 141i circuit (i) 0 and ζIMI completion 0)・
Terminals except ■ and ■ are grouped together - (insulated side regulator 40)
Connected to the other terminal -.

その結果、 I’l!!子■を化1−1端YとするA”
−ルショートデス1−による絶縁試験においてル4.端
子■・■および■は相f6側端子から除り(ざ狛、ジノ
、−が−。
As a result, I'l! ! A” where child ■ is chemical 1-1 end Y
- In the insulation test according to Le Short Death 1 - Le 4. Terminals ■, ■ and ■ are excluded from the phase f6 side terminals (Zakoma, Jino, - is -.

て端子■が絶縁不良端子と見なされて検出されることを
防11−することができる。
11- can be prevented from being detected as being considered as a terminal with poor insulation.

〔発明の効果〕 以上説明したように1本発明によれば、絶縁試験の際、
注1・1哨子に配線されている端子が絶縁不良端子と見
なされ”C検出されることを防11−できるので、試験
結果データ中に冗長データが混入することを防II−で
き、不良11)+I 111iの発1Lあイ、いはイ1
ト復作業におい一乙作業五にりiTl過刺l1−i、t
!!をIll除することかできる。
[Effects of the Invention] As explained above, according to the present invention, during an insulation test,
Note 1: Since the terminal wired to the 1 sentry can be prevented from being detected as a defective insulation terminal, it is possible to prevent redundant data from being mixed into the test result data. )+I 111i's output 1L Ai, yes I1
In the second work, the second work is the fifth one, it is over-pierced.
! ! It is possible to divide by Ill.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の19理ブロック図。 第2図は一実施例の構成図。 第3図は従来例の説明図。 第4し1(、I配線網の一部の例である。 FIG. 1 is a block diagram of the 19th principle of the present invention. FIG. 2 is a configuration diagram of one embodiment. FIG. 3 is an explanatory diagram of a conventional example. This is an example of a part of the fourth wiring network.

Claims (1)

【特許請求の範囲】 与えられた配線データに基づいて試験の対象とする配線
網(5)上の試験用端子から当面の試験の対象とする1
個の一方の試験用端子を選択する第一の選択回路(2)
と、 前記配線データに基づいて配線網(5)上の試験用端子
から当面の試験の対象とする他方の試験用端子を選択す
る第二の選択回路(3)と、 前記選択された一方の試験用端子と他方の試験用端子と
の間の絶縁を測定する絶縁測定器(4)とを備え、 前記一方の試験用端子に対する絶縁不良端子を検出する
配線試験装置において、 前記選択された他方の試験用端子に本来配線されている
試験用端子と絶縁測定器(4)との接続を遮断する遮断
回路(6)を設けたことを特徴とする配線試験装置。
[Scope of Claims] Based on the given wiring data, from the test terminal on the wiring network (5) to be tested, to 1 to be tested for the time being.
First selection circuit (2) that selects one of the test terminals
and a second selection circuit (3) that selects the other test terminal to be subjected to the current test from among the test terminals on the wiring network (5) based on the wiring data, and the selected one A wiring testing device that detects an insulation defective terminal with respect to the one test terminal, comprising an insulation measuring device (4) that measures insulation between a test terminal and the other test terminal, A wiring test device characterized in that a cutoff circuit (6) is provided to cut off the connection between the test terminal originally wired to the test terminal and the insulation measuring device (4).
JP60176402A 1985-08-10 1985-08-10 Wiring test equipment Granted JPS6249265A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60176402A JPS6249265A (en) 1985-08-10 1985-08-10 Wiring test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60176402A JPS6249265A (en) 1985-08-10 1985-08-10 Wiring test equipment

Publications (2)

Publication Number Publication Date
JPS6249265A true JPS6249265A (en) 1987-03-03
JPH0548864B2 JPH0548864B2 (en) 1993-07-22

Family

ID=16013044

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60176402A Granted JPS6249265A (en) 1985-08-10 1985-08-10 Wiring test equipment

Country Status (1)

Country Link
JP (1) JPS6249265A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5202488A (en) * 1991-04-15 1993-04-13 E. I. Du Pont De Nemours And Company Method for the manufacture of 3-aminophenol

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5202488A (en) * 1991-04-15 1993-04-13 E. I. Du Pont De Nemours And Company Method for the manufacture of 3-aminophenol

Also Published As

Publication number Publication date
JPH0548864B2 (en) 1993-07-22

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