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JPS6248757B2 - - Google Patents

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Publication number
JPS6248757B2
JPS6248757B2 JP16619680A JP16619680A JPS6248757B2 JP S6248757 B2 JPS6248757 B2 JP S6248757B2 JP 16619680 A JP16619680 A JP 16619680A JP 16619680 A JP16619680 A JP 16619680A JP S6248757 B2 JPS6248757 B2 JP S6248757B2
Authority
JP
Japan
Prior art keywords
transparent conductive
tin oxide
etchant
etching
conductive film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP16619680A
Other languages
Japanese (ja)
Other versions
JPS5789479A (en
Inventor
Kaname Myazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP16619680A priority Critical patent/JPS5789479A/en
Publication of JPS5789479A publication Critical patent/JPS5789479A/en
Publication of JPS6248757B2 publication Critical patent/JPS6248757B2/ja
Granted legal-status Critical Current

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • ing And Chemical Polishing (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Weting (AREA)

Description

【発明の詳細な説明】 本発明は透明導電膜のエツチヤントに関するも
のである。従来から透明導電膜は、デイスプレイ
の電極に広く用いられているが、近年の液晶デイ
スプレイにおいては、パターン化された透明導電
膜は必要欠くべからずものになつている。一般に
広く用いられている透明電極としては、酸化イン
ジウムを主体としたもの、例えば酸化インジウム
に5〜10wt%程度の酸化スズをドープしたもの
と、酸化スズを主体にしたもの例えば酸化スズに
五酸化アンチモンを0.01モル%〜1.0モル%ドー
プしたものが主として用いられている。前者のイ
ンジウムを主体としたものは、抵抗も低く、透過
率も高く、塩酸又は塩化第1鉄を含む塩酸で容易
に浸漬エツチング可能であるが、現在までのとこ
ろ、その製造方法は、真空蒸着法又はスパツタリ
ング法であるため、製造コストが非常に高価にな
つていた。又電気化学的安定性も後者の酸化スズ
に劣るため、電極をSiO2のような無機物、又は
ポリイミドのような有機物で絶縁コートする必要
があり、液晶パネル製造とのネツクとなつてい
た。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an etchant for transparent conductive films. Transparent conductive films have conventionally been widely used for display electrodes, but patterned transparent conductive films have become indispensable in recent liquid crystal displays. Transparent electrodes that are generally widely used include those based on indium oxide, such as indium oxide doped with about 5 to 10 wt% tin oxide, and those based on tin oxide, such as tin oxide and pentoxide. Those doped with 0.01 mol% to 1.0 mol% of antimony are mainly used. The former, mainly made of indium, has low resistance and high transmittance, and can be easily immersed in etching with hydrochloric acid or hydrochloric acid containing ferrous chloride. The production cost has been extremely high due to the sputtering method. Furthermore, because its electrochemical stability is inferior to that of the latter tin oxide, it is necessary to insulate the electrode with an inorganic material such as SiO 2 or an organic material such as polyimide, which has been a barrier to manufacturing liquid crystal panels.

一方、後者の酸化スズを主体とした透明導電膜
は無水塩化第2スズからのCVD法で安価に製造
され電気化学的安定性も前者に比し優れている。
又透過率、抵抗も五酸化アンチモン(CVDのソ
ースとしては、無水五塩化アンチモン)をドーピ
ングすることにより前者と同等のものが得られ
る。しかし唯一の欠点は、浸漬エツチングが従来
不可能であり、可能でも液寿命が短かかつた。
On the other hand, the latter transparent conductive film mainly composed of tin oxide is produced at low cost by CVD from anhydrous stannic chloride, and has superior electrochemical stability compared to the former.
Transmittance and resistance equivalent to the former can also be obtained by doping with antimony pentoxide (anhydrous antimony pentachloride as a CVD source). However, the only drawback is that immersion etching is not possible in the past, and even if it is possible, the life of the solution is short.

今まで通常使われているエツチング法は、
Zn、Al等の粉末を透明電極上にふりまき、塩酸
をかけながらハケ等でコスリ落とすといつたもの
である。この方法では、発生期の水素を用いても
ハケでコスるため微細なパターンを製造すること
は不可能であつた。パターン化するときのレジス
トがハガレたり、オーバーエツチングし透明導電
膜が切れたりして10〜50μ程度の微細パターンを
安定に量産的に得ることは不可能であつた。一方
USP第4009061号に見られたような二価クロムと
三化クロムの酸化還元反応を用いた浸漬法も考え
られているが、空気中の酸素の還元反応により二
価クロムは三価クロムに代わつてしまうためエツ
チング液の寿命は非常に短かかつた。例えば60℃
で空気中に1時間放置するだけでエツチングスピ
ードは約1/3に低下する。
The etching method commonly used up until now is
It is said that powders of Zn, Al, etc. are sprinkled on a transparent electrode, and hydrochloric acid is poured over it, and then the dust is removed with a brush or the like. With this method, even if nascent hydrogen is used, it is impossible to produce fine patterns because it requires brushing. It has been impossible to stably mass-produce fine patterns of about 10 to 50 μm because the resist peels off during patterning and the transparent conductive film breaks due to overetching. on the other hand
An immersion method using the redox reaction of divalent chromium and chromium trioxide as seen in USP No. 4009061 has also been considered, but divalent chromium is replaced by trivalent chromium due to the reduction reaction of oxygen in the air. The lifespan of the etching solution was very short because it got hot. For example 60℃
If you leave it in the air for one hour, the etching speed will drop to about 1/3.

これでは安定な微細パターンを得ることは工業
的に困難であつた。本発明はかかる欠点を解決す
るためのものであり、安定に微細パターンを得る
酸化スズのエツチヤントを得ることを目的とした
ものである。
This makes it industrially difficult to obtain a stable fine pattern. The present invention is intended to solve these drawbacks, and aims to provide a tin oxide etchant that stably produces fine patterns.

本発明の酸化スズを主体とした透明導電膜とは
酸化スズのみ、さらに酸化スズに0.01〜1.0モル
%の五価金属酸化物、例えば五酸化アンチモン、
五酸化リン等である。
The transparent conductive film mainly composed of tin oxide of the present invention includes only tin oxide, and tin oxide with 0.01 to 1.0 mol% of a pentavalent metal oxide, such as antimony pentoxide.
Such as phosphorus pentoxide.

主として用いられるのは五酸化アンチモンであ
り、無水五塩化アンチモンから、無水塩化第二ス
ズのソースとガス混合してCVDされる。
Antimony pentoxide is primarily used, which is CVDed from anhydrous antimony pentachloride in a gas mixture with an anhydrous stannic chloride source.

絶縁基板(ガラス、セラミツク等)上にCVD
されたこれらの酸化スズを主体とした透明導電膜
は、ポジ、ネガ等のフオトレジストで所定のパタ
ーニング後、本発明のエツチヤントに浸漬(超音
波浸漬、エツチヤントのシヤワー等の広義を示
す)しエツチングを行なう。
CVD on insulating substrate (glass, ceramic, etc.)
These transparent conductive films mainly composed of tin oxide are patterned using a positive or negative photoresist, and then immersed in the etchant of the present invention (in a broad sense such as ultrasonic immersion or etchant shower) for etching. Do this.

エツチヤントは少なくも0.5g/以上のフツ
化アンモニウムを含む酸性水溶液あり、望ましく
は2g/〜20g/程度である。2g/以下
だとエツチングスピードが著しく低下する。
The etchant is an acidic aqueous solution containing at least 0.5 g/or more of ammonium fluoride, preferably about 2 g/-20 g/. If the amount is less than 2 g/min, the etching speed will drop significantly.

又20g/以上だとスピードはほぼ飽和し液が
ムダとなる。
Also, if it exceeds 20g/speed, the speed will be almost saturated and the liquid will be wasted.

ここで使用される酸とは、硝酸、硫酸、リン
酸、塩酸、臭化水素酸、ヨウ化水素酸等の無機酸
から選ばれた1種以上が用いられる。望ましくは
硝酸、塩酸、リン酸であり、水溶液に対して
0.1N〜6Nであり、望ましくは0.5N〜4Nである。
The acid used here is one or more selected from inorganic acids such as nitric acid, sulfuric acid, phosphoric acid, hydrochloric acid, hydrobromic acid, and hydroiodic acid. Nitric acid, hydrochloric acid, and phosphoric acid are preferable, and for aqueous solutions
It is 0.1N to 6N, preferably 0.5N to 4N.

以下実施例に従つて本発明を詳細に説明する。 The present invention will be described in detail below with reference to Examples.

実施例 1 ホウケイ酸ガラスにCVD法により、基板温度
を500℃として無水塩化第二スズと無水五塩化ア
ンチモンをソースとしてSnO2−Sb2O5透明導電膜
を約300Å被覆した。SnO2−Sb2O5の割合は約
99.9:0.1モル%であつた。
Example 1 Borosilicate glass was coated with a SnO 2 -Sb 2 O 5 transparent conductive film of about 300 Å by CVD at a substrate temperature of 500° C. using anhydrous stannic chloride and anhydrous antimony pentachloride as sources. The proportion of SnO 2 −Sb 2 O 5 is approximately
99.9: 0.1 mol%.

洗浄後、ネガ型のフオトレジストを約1μ被覆
し所定のフオト工程を経て、レジストをパターニ
ングした。このレジスト幅は約10μである。
After cleaning, about 1 μm of negative type photoresist was coated and a predetermined photo process was performed to pattern the resist. This resist width is about 10μ.

次に硝酸10c.c.を100c.c.の水に溶解させさらに0.8
gのフツ化アンモニウムを溶かしエツチヤントを
作つた。このエツチヤントを用い前記フオトパタ
ーニングされたガラス基板を浸漬しエツチングし
た。第1図は各温度におけるエツチング速度をグ
ラフ化したものである。300Åの透明導電膜の場
合90℃で約30秒である。エツチング面は不溶性
SnF4と思われる物質の形成により基板からハガ
レ白い片となり、後は、スポンジ、ハケ等で簡単
にハゲ落ちる。次にフオトレジストをエチルアル
コールで落としたところ、10μの透明導電膜のパ
ターンは全くの切れもなく存在した。約10cm長さ
で、16本の10μパターン線は1本の切断(オーバ
ーエツチによる)もなかつた。
Next, dissolve 10 c.c. of nitric acid in 100 c.c. of water and add 0.8
g of ammonium fluoride was dissolved to make an etchant. Using this etchant, the photo-patterned glass substrate was immersed and etched. FIG. 1 is a graph of the etching rate at each temperature. In the case of a 300 Å transparent conductive film, it takes about 30 seconds at 90°C. Etched surface is insoluble
The formation of a substance thought to be SnF 4 causes white flakes to peel off from the substrate, which can then be easily removed with a sponge, brush, etc. Next, when the photoresist was removed with ethyl alcohol, the pattern of the 10 μm transparent conductive film was completely intact. With a length of about 10 cm, there was not a single cut (due to overetching) in the 16 10μ pattern lines.

以上実施例によつて本発明を説明したが本発明
のエツチング液は、従来のような金属のレドツク
ス系を使用していないため液寿命も非常に長く、
1週間位は何ら問題なく使用できる。
The present invention has been explained above with reference to the examples, and since the etching solution of the present invention does not use a metal redox system like the conventional etching solution, the solution life is very long.
It can be used for about a week without any problems.

本発明によつて得られたフアインパターニング
された透明導電膜は、液晶、EC、EPID、コロイ
ダルライトバルブ等の表示体の電極として用いら
れ、時計、電卓等に使われる。
The fine-patterned transparent conductive film obtained by the present invention is used as an electrode for display bodies such as liquid crystals, ECs, EPIDs, and colloidal light valves, and is used in watches, calculators, and the like.

なお、本発明は実施例だけに限定されるもので
はなく、もちろん従来のフアインパターン以外の
透明導電膜(例えば100〜500μ幅)にも、酸化イ
ンジウム系透明導電膜のエツチヤントとして用い
られることは明らかである。
Note that the present invention is not limited to the examples, and of course can be used for transparent conductive films other than conventional fine patterns (for example, 100 to 500μ width) as an etchant for indium oxide-based transparent conductive films. it is obvious.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図……本発明のエツチヤントによるエツチ
ングレイトと温度の関係。
FIG. 1: Relationship between etching rate and temperature using the etchant of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 1 酸化スズを主体とした透明導電膜をエツチン
グする場合に、少なくとも0.5g/以上のフツ
化アンモニウムを含む酸性水溶液から成ることを
特徴とする透明導電膜のエツチヤント。
1. An etchant for a transparent conductive film, which comprises an acidic aqueous solution containing at least 0.5 g of ammonium fluoride when etching a transparent conductive film mainly composed of tin oxide.
JP16619680A 1980-11-26 1980-11-26 Etchant for transparent electric conductive film Granted JPS5789479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16619680A JPS5789479A (en) 1980-11-26 1980-11-26 Etchant for transparent electric conductive film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16619680A JPS5789479A (en) 1980-11-26 1980-11-26 Etchant for transparent electric conductive film

Publications (2)

Publication Number Publication Date
JPS5789479A JPS5789479A (en) 1982-06-03
JPS6248757B2 true JPS6248757B2 (en) 1987-10-15

Family

ID=15826862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16619680A Granted JPS5789479A (en) 1980-11-26 1980-11-26 Etchant for transparent electric conductive film

Country Status (1)

Country Link
JP (1) JPS5789479A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3937442A1 (en) * 1989-11-10 1991-05-16 Nokia Unterhaltungselektronik METHOD FOR AREA REMOVAL OF LAYERS FROM A SUBSTRATE
JP2808480B2 (en) * 1990-07-18 1998-10-08 キヤノン株式会社 Method for manufacturing substrate for liquid crystal color display element
JP5262478B2 (en) * 2008-09-11 2013-08-14 東ソー株式会社 Etching solution for transparent electrodes

Also Published As

Publication number Publication date
JPS5789479A (en) 1982-06-03

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