[go: up one dir, main page]

JPS62296429A - Encapsulating metal mould for manufacture of semiconductor device - Google Patents

Encapsulating metal mould for manufacture of semiconductor device

Info

Publication number
JPS62296429A
JPS62296429A JP14049386A JP14049386A JPS62296429A JP S62296429 A JPS62296429 A JP S62296429A JP 14049386 A JP14049386 A JP 14049386A JP 14049386 A JP14049386 A JP 14049386A JP S62296429 A JPS62296429 A JP S62296429A
Authority
JP
Japan
Prior art keywords
semiconductor device
resin
pot
cavity
manufacture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14049386A
Other languages
Japanese (ja)
Inventor
Tetsuo Hoshino
星野 哲雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP14049386A priority Critical patent/JPS62296429A/en
Publication of JPS62296429A publication Critical patent/JPS62296429A/en
Pending legal-status Critical Current

Links

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To protect a semiconductor device from a defect of lack of filling or from a void by a method wherein a cavity is provided around a pot for the purpose of controlling heat to be applied to resin during a resin injecting process. CONSTITUTION:A cavity 7 is provided around a pot 1 belonging in an encapsulating mould 2. Air or the like is caused to flow into the cavity 7 for the control of beat to be applied to resin tablets 4 by a heater 5. Accordingly, the resin, to be supplied to a semiconductor device encapsulating section through a runner 6 when a plunger 3 is lowered, may be controlled in its degree of beat-caused setting. In this way, possibility is lowered of the appearance of a semiconductor device being poor after its encapsulation (due to insufficient filling or to void), which simultaneously allows the semiconductor device to be provided with improved reliability.

Description

【発明の詳細な説明】 3、発明の詳細な説明 〔産業上の利用分野〕 本発明は半導体装置製造用封入金型のポット回りの構造
に関するものである。
Detailed Description of the Invention 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a structure around a pot of an encapsulation mold for manufacturing semiconductor devices.

〔従来の技術〕[Conventional technology]

従来の半導体装置製造用封入金型のポット回りの構造は
第2図(A)および(B)にそれぞれ平面図及び断面図
で示す通りポット1を介して樹脂タブレット4にヒータ
ー5で発熱した熱を封入金型2を通して加えながらプラ
ンジャー3で押す。
The structure around the pot of the conventional encapsulation mold for manufacturing semiconductor devices is shown in FIGS. 2(A) and 2(B), respectively, as a plan view and a sectional view. is added through the enclosing mold 2 and pressed with the plunger 3.

押された樹脂は溶融しランナー6を通じ半導体封止部へ
到達する。
The pressed resin melts and reaches the semiconductor sealing portion through the runner 6.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ここで従来用いられて来た半導体装置製造用封入金型の
最大の欠点は封入金型の熱容量が大きい為樹脂に過度に
熱が伝わり、樹脂の硬化が進み過ぎランナー6から半導
体装置封止部に送られた樹脂の状態が変化し、未充填不
良またはボイド不良等が半導体装置に発生するというこ
とにあった。
The biggest drawback of the conventionally used encapsulation mold for manufacturing semiconductor devices is that the heat capacity of the encapsulation mold is large, so too much heat is transferred to the resin, and the resin hardens too much. The condition of the resin sent to the semiconductor device changes, resulting in unfilled or void defects occurring in the semiconductor device.

〔問題点を解決するための手段〕[Means for solving problems]

本発明による半導体製造用封入金型は、ポットの回りに
中空部を設はエアー等を流入するようにして構成される
The encapsulation mold for semiconductor manufacturing according to the present invention is constructed by providing a hollow part around the pot to allow air or the like to flow therein.

〔実施例〕〔Example〕

以下本発明について図面により詳述する。第1図(A>
および(B)は本発明の一実施例を示す平面図および断
面図である。同図において封入金型2中のポット1回り
に中空7を作りこの中空7に空気等を流入することによ
ってヒーター5がら樹脂4に伝わる熱を制限・制御でき
る。従ってプランジャー3を下降し樹脂4をランナー6
を通して半導体装置封止部に送られる樹脂の熱硬化度合
を制御できる。
The present invention will be explained in detail below with reference to the drawings. Figure 1 (A>
and (B) are a plan view and a sectional view showing one embodiment of the present invention. In the same figure, a hollow 7 is formed around a pot in an encapsulation mold 2, and by flowing air or the like into the hollow 7, the heat transmitted from the heater 5 to the resin 4 can be restricted and controlled. Therefore, the plunger 3 is lowered and the resin 4 is transferred to the runner 6.
It is possible to control the degree of thermosetting of the resin sent to the semiconductor device sealing part through the heat exchanger.

〔発明の効果〕〔Effect of the invention〕

この様に半導体装置製造用封入金型のポット回りに中空
を作ることによって樹脂の熱硬化度合を制御でき、半導
体装置封止後の外観不良(未充填不良またはボイド不良
等)を低減し、更に半導体装置の信頼性を向上させるこ
とが可能となる。
In this way, by creating a hollow around the pot of an encapsulation mold for manufacturing semiconductor devices, the degree of thermosetting of the resin can be controlled, reducing appearance defects (such as unfilled defects or void defects) after encapsulating semiconductor devices, and further It becomes possible to improve the reliability of the semiconductor device.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(A)および(B)は夫々本発明の一実施例を示
す平面図および断面図である。第2図(A)および(B
)は従来例を示す平面図および断面図である。 1・・・・・・ポット、2・・・・・・封入金型、3・
・・・・・プランジャー、4・・・・・・樹脂タブレッ
ト、5・・・・・・ヒーター、予lて
FIGS. 1(A) and 1(B) are a plan view and a sectional view, respectively, showing an embodiment of the present invention. Figure 2 (A) and (B)
) are a plan view and a sectional view showing a conventional example. 1...Pot, 2...Enclosed mold, 3.
... Plunger, 4 ... Resin tablet, 5 ... Heater, pre-load

Claims (1)

【特許請求の範囲】[Claims] 樹脂注入時に樹脂に加わる熱を制御する中空をポット回
りに具備したことを特徴とする半導体装置製造用封入金
型。
An encapsulation mold for semiconductor device manufacturing, characterized by having a hollow space around the pot to control heat applied to resin during resin injection.
JP14049386A 1986-06-16 1986-06-16 Encapsulating metal mould for manufacture of semiconductor device Pending JPS62296429A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14049386A JPS62296429A (en) 1986-06-16 1986-06-16 Encapsulating metal mould for manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14049386A JPS62296429A (en) 1986-06-16 1986-06-16 Encapsulating metal mould for manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS62296429A true JPS62296429A (en) 1987-12-23

Family

ID=15269904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14049386A Pending JPS62296429A (en) 1986-06-16 1986-06-16 Encapsulating metal mould for manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS62296429A (en)

Similar Documents

Publication Publication Date Title
JPH04147814A (en) Mold for resin seal molding
JPH0336741A (en) Resin sealing device for resin sealed type semiconductor device
JPH05226396A (en) Manufacture of resin-molded semiconductor device
JP3727446B2 (en) Resin sealing mold for semiconductor devices
JPS62296429A (en) Encapsulating metal mould for manufacture of semiconductor device
JPH05243301A (en) Production of semiconductor device
JPS6124241A (en) Resin sealing metallic mold of semiconductor device
JP2666630B2 (en) Method for manufacturing semiconductor device
JP2609894B2 (en) Transfer resin encapsulation molding method for parts to be encapsulated, resin encapsulation molding die apparatus and film carrier used therefor
JPH0719785B2 (en) Resin molding method for semiconductor device
JP2000031177A (en) Resin sealing mold and resin sealing method therefor
EP0435091A2 (en) Isothermal injection molding process
JPS62125635A (en) Resin-sealed method for resin-sealed semiconductor device
JPS5839868Y2 (en) Resin sealing mold
JPS58201333A (en) Preparation of resin sealed type semiconductor device
JPH02205043A (en) Manufacture of resin-sealed semiconductor device
JPS6311722Y2 (en)
JPS63228631A (en) Metal mold apparatus for sealing semiconductor element with resin
JPH03222440A (en) Resin-sealed semiconductor device
JPS59181024A (en) Resin sealing device of semiconductor device
JPH0351111A (en) Resin sealing apparatus
JPS63237536A (en) Semiconductor manufacturing device
JPH04179242A (en) Sealing method for semiconductor element
JPH0458540A (en) Sealing metal mold for semiconductor device
JPH1027814A (en) Resin-sealed semiconductor device, method of resin-sealing that and resin-sealing metal mold