JPS6138476A - Apparatus for detecting flaw of recording medium - Google Patents
Apparatus for detecting flaw of recording mediumInfo
- Publication number
- JPS6138476A JPS6138476A JP15983084A JP15983084A JPS6138476A JP S6138476 A JPS6138476 A JP S6138476A JP 15983084 A JP15983084 A JP 15983084A JP 15983084 A JP15983084 A JP 15983084A JP S6138476 A JPS6138476 A JP S6138476A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- flaw
- defect
- signal
- track
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims abstract description 41
- 230000007547 defect Effects 0.000 claims description 82
- 230000002950 deficient Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1207—Testing individual magnetic storage devices, e.g. records carriers or digital storage elements
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
【発明の詳細な説明】
(技術分野)
本発明は欠陥回避機能を持つ回転型データ記録装置の記
録媒体欠陥検出装置δに関する。DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to a recording medium defect detection device δ for a rotary data recording device having a defect avoidance function.
(従来技術)
一般に、回転型データ8C録装置、たとえば磁気ディス
ク装置は、記録密度が高くなるに伴い、1ビツトを記録
するに要する磁気ディスクの面積が ゛非常に
小さくなり、この磁気ディスク全面にわたって表面欠陥
を全く含まない(または非常に少4い)ディスクを安定
に製造することが困g・rbとなってきた。従来、この
ような表面欠陥を含むデータトラックを不良トラックと
して交替トランクf:設ける方法が用いられたが、近年
あらかじめデータ部の前に欠陥位置情報を記録しておき
、記録再生時にはその欠陥位置情報f、読取って磁気ヘ
ッドが欠陥位置に到達したときにその欠陥を回避(飛越
し)をする方法が提案されている。最近では1トラック
内に許される欠陥数が4〜7個程度と多くなっても使用
できるようになっている。(Prior Art) In general, in a rotating data 8C recording device, such as a magnetic disk device, as the recording density increases, the area of the magnetic disk required to record one bit becomes extremely small, and the entire surface of the magnetic disk is covered. It has become difficult to stably manufacture disks that contain no (or very few) surface defects. Conventionally, a method was used in which a data track containing such surface defects was treated as a defective track and a replacement trunk was provided, but in recent years, defect position information has been recorded in advance in front of the data section, and the defect position information is recorded during recording and playback. f. A method has been proposed in which the defect is avoided (jumped) when the magnetic head reaches the defective position during reading. Recently, the number of defects allowed in one track has increased to about 4 to 7 and can now be used.
しかし、実際にこの記録媒体の倹をを行う場合に、1ト
ラック内の平均読出し電圧の一定値(:iin常50〜
60%)を欠陥検出レベルとし、特性の悪いトランクで
最大欠陥許容数になる様に欠陥検出レベルを設定すると
、はとんどのトランクでは欠陥が検出されず、検出され
ても1個程度であり、あらかじめ確保されている欠陥回
避交替エリアの使用率が非常に悪いという欠点があった
。However, when actually saving the recording medium, a constant value of the average read voltage within one track (iin is usually 50 to
60%) is set as the defect detection level, and the defect detection level is set so that the maximum allowable number of defects is achieved for trunks with poor characteristics.In most trunks, no defects are detected, and even if defects are detected, only one defect is detected. However, there was a drawback that the utilization rate of the defect avoidance replacement area secured in advance was extremely low.
(発明の目的)
本発明の目的は、このような欠点を除き、検出された欠
陥数全欠陥検出レベル設定回路にフィードバックしてあ
らかじめ確保した欠陥回避交代エリアを有効に活用する
ことにより、装置全体としてのデータ読出の誤シ率をよ
シ小さくできるようにした記録媒体欠陥検出装置を提供
することにある。(Objective of the Invention) The object of the present invention is to eliminate such drawbacks and improve the entire system by feeding back the number of detected defects to the total defect detection level setting circuit and effectively utilizing the defect avoidance alternation area secured in advance. An object of the present invention is to provide a recording medium defect detection device that can greatly reduce the error rate of data reading.
(発明の構成)
本発明の構成は、データトラックの欠陥部分を交替トラ
ックに記憶させることによ少記録媒体の欠陥回避を行う
口伝データ記録装置の記録媒体欠陥検出装置において、
前・記データトラックの読出電圧が所定欠陥検出レベル
以下になった時欠陥信号として出力する欠陥検出回路と
、この欠陥検出回路からの欠陥信号を計数し欠陥数情報
として出力する欠陥計数回路と、前記データトラックの
読出電圧から1トラック内の平均読出電圧を検出する平
均出力レベル検出回路と、前記平均読出電圧と前記欠陥
数情報とから記録欠陥数が前6c: 1− トラック内
に許容される最大欠陥数となるように前記欠陥検出レベ
ルを設定する欠陥検出レベル設定回路とを備えることを
特徴とする。(Configuration of the Invention) The configuration of the present invention provides a recording medium defect detection device for an oral data recording device that avoids defects in a small recording medium by storing a defective portion of a data track in a replacement track.
a defect detection circuit that outputs a defect signal when the read voltage of the data track becomes less than a predetermined defect detection level; a defect counting circuit that counts the defect signal from the defect detection circuit and outputs it as defect number information; an average output level detection circuit that detects an average read voltage within one track from the read voltage of the data track, and a number of recording defects allowed within the previous 6c: 1- track from the average read voltage and the defect number information; The present invention is characterized by comprising a defect detection level setting circuit that sets the defect detection level so as to have a maximum number of defects.
(実施例) 次に図面によp本発明の詳細な説明する。(Example) Next, the present invention will be explained in detail with reference to the drawings.
第1図は本発明の実施例の媒体欠陥検出装置のブロック
図、第2図(al〜(f)は第1図の動作を示すタイム
チャートである。検査すべき記録媒体10の記録内容は
磁気ヘッド1によって読出され、増幅器2で増幅され、
第2図(alに示す様な読出し波形を出力する。この出
力波形よシ出力レベルを求めるために、整流回路3によ
シ整流しく第2図(b))、得られた整流波形をピーク
ホールド回路4に入力する。このピークホールド回路4
は整流出力のピーク電圧をホールド1.8g2図(C1
に示す様な読出出力レベルをイ!する。一方、平均出力
レベル検出回路8は、この読出出力レベル(第2図(C
))の1トラック内における平均値を求め、平均出力レ
ベルとして欠陥検出レベル設定回路9に入力する。FIG. 1 is a block diagram of a medium defect detection device according to an embodiment of the present invention, and FIGS. 2(a-1) to (f) are time charts showing the operation of FIG. is read by a magnetic head 1 and amplified by an amplifier 2,
A readout waveform as shown in Fig. 2 (al) is output. In order to obtain the output level from this output waveform, it is rectified by the rectifier circuit 3 (Fig. 2 (b)), and the obtained rectified waveform is peaked. Input to hold circuit 4. This peak hold circuit 4
holds the peak voltage of the rectified output 1.8g2 (C1
Set the readout output level as shown in ! do. On the other hand, the average output level detection circuit 8 detects this readout output level (FIG. 2(C)
)) within one track is determined and input to the defect detection level setting circuit 9 as the average output level.
従来、この平均出力レベルの一定比率(通常50〜60
%程度)と、読出し出力レベルとを比較器で(、“・f
成される欠陥検出回路5に入力し、読出し出力レベルの
低下部分を欠陥信号(第2図(dl〜げ))としていた
が、本実施例では、欠陥検出レベル設定回路9は最初平
均出力レベルの一定比率を欠陥検出レベルとして欠陥検
出回路5に出力する。すなわち j:F 2図(C)の
E!のように、装置の読出し誤まり率以上の確率で読出
しエラーを起しうる位置を見つけ出すに必要な最低限の
レベル(E+)f、欠陥検出レベルとする。Conventionally, a fixed ratio of this average output level (usually 50 to 60
%) and the readout output level using a comparator (, "・f
However, in this embodiment, the defect detection level setting circuit 9 initially detects the average output level. A fixed ratio of the defect detection level is outputted to the defect detection circuit 5 as a defect detection level. That is, j:F E! in Figure 2 (C)! The defect detection level (E+) is the minimum level (E+)f required to find a position where a read error can occur with a probability greater than the read error rate of the device.
この欠陥検出回路5は、欠陥検出レベルE、以下となる
読出し出力レベルの点で、第2図(d)様な欠陥信号を
発生し、そのパルス数を欠陥計数回路7で計数して欠陥
数情報を得る。This defect detection circuit 5 generates a defect signal as shown in FIG. get information.
ここで1トラック内に許容される最大欠陥数を4と仮定
すれば、はとんどのトラックにおいて欠陥計数回路7の
欠陥数情報が4となることはない。Here, assuming that the maximum number of defects allowed in one track is 4, the defect number information of the defect counting circuit 7 will never be 4 in most tracks.
そこで、欠陥検出レベル設定回路9は、欠陥数情報が4
未満であるときには、その欠陥検出レベルを第2図(C
1のレベルE2の様に一回目より検出レベルを厳しく設
定する。その結果、欠陥信号は第2図(elの様に一回
目では見過されていた程度の軽い欠陥を発見することが
できる。この場合、欠陥数情報は3であシ、最大許容欠
陥数4に満たないので、欠陥検出レベル設定回路9は欠
陥検出レベルt=i2図(c)のレベルE3のごとくさ
らに厳しいレベルに設定する。その欠陥検出レベルE3
によシ、欠陥数情報は4となシ、最大許容欠陥数となる
ので、第2図(flに示すように、4ケ所の欠陥位置を
欠陥位置記憶回路6に蓄わえる。この欠陥部11・を情
報は欠陥回避を行なう際の情報としてそのトラックの先
頭部分に記録され、媒体欠陥検出試験は終了するO
(発明の効果)
本発明は、以上、説明した様に、発見された媒体欠陥を
欠陥計数回路で計数し、その結果によシ欠陥検出レベル
をより厳しいレベルにし、1トラック内に許容されるJ
ゆ大欠陥数に到るまで程度の軽い欠陥も発見することに
よシ、欠陥回避機能を最大限に利用し、装置全体の抗出
し誤り率を低くできる効果がある。Therefore, the defect detection level setting circuit 9 sets the defect number information to 4.
If the defect detection level is less than
The detection level is set more strictly from the first time, such as level E2 of No. 1. As a result, the defect signal can detect minor defects that were overlooked the first time, as shown in Figure 2 (el).In this case, the defect number information is 3, and the maximum allowable defect number is 4. Therefore, the defect detection level setting circuit 9 sets the defect detection level t=i2 to a more severe level as level E3 in FIG.
As a result, the defect number information is 4, which is the maximum allowable number of defects, so four defect positions are stored in the defect position storage circuit 6 as shown in FIG. 11. The information is recorded at the beginning of the track as information for defect avoidance, and the medium defect detection test is completed. Defects are counted by a defect counting circuit, and based on the result, the defect detection level is set to a stricter level, and the number of defects allowed within one track is increased.
By discovering even minor defects before reaching the number of major defects, the defect avoidance function can be utilized to the fullest and the overall error rate of the device can be lowered.
第1図は本発明の一実施例の媒体欠陥検出装置のブロッ
ク図、第21個(aJ〜(f)は;A1図の動作を示す
タイムチャートである。図においてFIG. 1 is a block diagram of a medium defect detection device according to an embodiment of the present invention, and the 21st pieces (aJ to (f) are time charts showing the operations of FIG. A1.
Claims (1)
ことにより記録媒体の欠陥回避を行う回転データ記録装
置の記録媒体欠陥検出装置において、前記データトラッ
クの読出電圧が所定欠陥検出レベル以下になった時欠陥
信号として出力する欠陥検出回路と、この欠陥検出回路
からの欠陥信号を計数し欠陥数情報として出力する欠陥
計数回路と、前記データトラックの読出電圧から1トラ
ック内の平均読出電圧を検出する平均出力レベル検出回
路と、前記平均読出電圧と前記欠陥数情報とから記録欠
陥数が前記1トラック内に許容される最大欠陥数となる
ように前記欠陥検出レベルを設定する欠陥検出レベル設
定回路とを備えることを特徴とする記録媒体欠陥検出装
置。In a recording medium defect detection device for a rotary data recording device that avoids defects in a recording medium by storing a defective portion of a data track in a replacement track, a defect signal is generated when the read voltage of the data track becomes below a predetermined defect detection level. a defect detection circuit that counts the defect signals from this defect detection circuit and outputs it as defect number information; and an average output level that detects the average read voltage within one track from the read voltage of the data track. comprising a detection circuit and a defect detection level setting circuit that sets the defect detection level based on the average read voltage and the defect number information so that the number of recording defects becomes the maximum number of defects allowed in one track. A recording medium defect detection device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15983084A JPS6138476A (en) | 1984-07-30 | 1984-07-30 | Apparatus for detecting flaw of recording medium |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15983084A JPS6138476A (en) | 1984-07-30 | 1984-07-30 | Apparatus for detecting flaw of recording medium |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6138476A true JPS6138476A (en) | 1986-02-24 |
Family
ID=15702179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15983084A Pending JPS6138476A (en) | 1984-07-30 | 1984-07-30 | Apparatus for detecting flaw of recording medium |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6138476A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4829249A (en) * | 1986-02-12 | 1989-05-09 | Fuji Photo Film Co., Ltd. | Method of inspecting magnetic disks for surface defects |
US4904938A (en) * | 1987-06-10 | 1990-02-27 | Benares Limited | Method and apparatus for testing characteristics of a floppy disc and a floppy disc drive |
US5002074A (en) * | 1988-12-26 | 1991-03-26 | Nifco, Inc. | Automobile ashtray device |
US5004306A (en) * | 1988-12-14 | 1991-04-02 | Nifco, Inc. | Drawer device |
WO1993018414A1 (en) * | 1992-03-06 | 1993-09-16 | Maxtor Corporation | Data recording system incorporating flaw detection circuitry |
US5256965A (en) * | 1990-07-30 | 1993-10-26 | Seiko Seiki Kabushiki Kaisha | Quality inspecting method and apparatus for detecting defects in magnetic disks by dividing a plurality of concentric tracks into numbered sectors |
-
1984
- 1984-07-30 JP JP15983084A patent/JPS6138476A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4829249A (en) * | 1986-02-12 | 1989-05-09 | Fuji Photo Film Co., Ltd. | Method of inspecting magnetic disks for surface defects |
US4904938A (en) * | 1987-06-10 | 1990-02-27 | Benares Limited | Method and apparatus for testing characteristics of a floppy disc and a floppy disc drive |
US5004306A (en) * | 1988-12-14 | 1991-04-02 | Nifco, Inc. | Drawer device |
US5002074A (en) * | 1988-12-26 | 1991-03-26 | Nifco, Inc. | Automobile ashtray device |
US5256965A (en) * | 1990-07-30 | 1993-10-26 | Seiko Seiki Kabushiki Kaisha | Quality inspecting method and apparatus for detecting defects in magnetic disks by dividing a plurality of concentric tracks into numbered sectors |
WO1993018414A1 (en) * | 1992-03-06 | 1993-09-16 | Maxtor Corporation | Data recording system incorporating flaw detection circuitry |
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