JPS61280618A - Spin coating and spin coating device - Google Patents
Spin coating and spin coating deviceInfo
- Publication number
- JPS61280618A JPS61280618A JP10399885A JP10399885A JPS61280618A JP S61280618 A JPS61280618 A JP S61280618A JP 10399885 A JP10399885 A JP 10399885A JP 10399885 A JP10399885 A JP 10399885A JP S61280618 A JPS61280618 A JP S61280618A
- Authority
- JP
- Japan
- Prior art keywords
- volatile
- substrate
- spin coating
- solution
- volatile solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Coating Apparatus (AREA)
Abstract
Description
【発明の詳細な説明】
「技術分野」
本発明は、基材に揮発性溶液を滴下し、基材を回転させ
て揮発性溶液を拡散塗布させる回転塗布方法および回転
塗布装置に関する。DETAILED DESCRIPTION OF THE INVENTION TECHNICAL FIELD The present invention relates to a spin coating method and a spin coating device in which a volatile solution is dropped onto a substrate and the substrate is rotated to spread and coat the volatile solution.
「従来技術およびその問題点」
例えばマスクプロセスやウェハープロセスにおいて、マ
スクブランクやウェハーなどの基板にフォトレジストな
どのレジスト液を塗布するには、回転塗布方法が採用さ
れている。レジスト液の塗布においては、膜厚を均一化
させることがバターン寸法およびバターニング忠実性を
向上させるための必要条件となっている。ここで回転塗
布方法で成膜されるレジストの膜厚は、回転速度。"Prior Art and its Problems" For example, in a mask process or a wafer process, a spin coating method is employed to apply a resist solution such as a photoresist to a substrate such as a mask blank or a wafer. When applying a resist solution, uniform film thickness is a necessary condition for improving pattern dimensions and patterning fidelity. The thickness of the resist film formed by the spin coating method is determined by the rotation speed.
回転立上がり速度、回転時間、さらにレジスト液の濃度
や粘度、溶剤(シンナー)の揮発性、レジスト液と基板
表面とのぬれ性などの諸因子によって影響を受ける。ま
た、基板面内の膜厚を均一化させるためには、定性的に
次のようなことが満足されなければならない。すなわち
、基板表面に滴下されたレジスト液は、所定の回転速度
に従う遠心力で面内に広がり、上記諸因子で決まる平衡
膜厚に達するが、この平衡膜厚に達する前に著しく揮発
が進むと、その時点で成膜が完了し、基板中心から周辺
部に亘って膜厚分布ができる。このことは、回転速度が
大きいほど、また、レジスト液の揮発性が高く粘度が大
きいほど顕著になり、極端な場合、回転中心から周辺に
向って放射状にスジが発生し、レジスト膜面の平滑性が
損なわれる。さらに、基板形状がマスク基板のような角
形であると、そのコーナ一部での気流が乱れるため、揮
発がかなり促進され、コーナ一部での膜厚は異常に厚く
なる。以北のように、膜厚が不均一になると、面内での
パターン寸法にバラツキが生じたり、コンタクト露光方
式によるフォトリソグラフィープロセスではパターニン
グ忠実性が保証されない。It is influenced by various factors such as the rotation start-up speed, rotation time, the concentration and viscosity of the resist solution, the volatility of the solvent (thinner), and the wettability of the resist solution and the substrate surface. Furthermore, in order to make the film thickness uniform within the plane of the substrate, the following conditions must be qualitatively satisfied. In other words, the resist solution dropped onto the substrate surface spreads within the surface due to centrifugal force according to a predetermined rotational speed, and reaches an equilibrium film thickness determined by the above factors. However, if the resist solution significantly evaporates before reaching this equilibrium film thickness, At that point, the film formation is completed, and the film thickness is distributed from the center of the substrate to the periphery. This problem becomes more noticeable as the rotation speed increases, and as the resist solution becomes more volatile and has a higher viscosity. sexuality is impaired. Furthermore, if the substrate is rectangular like a mask substrate, the airflow at some of its corners will be disturbed, so volatilization will be considerably accelerated, and the film thickness at some of the corners will become abnormally thick. If the film thickness becomes non-uniform as described above, variations in pattern dimensions will occur within the plane, and patterning fidelity cannot be guaranteed in a photolithography process using a contact exposure method.
「発明の目的」
本発明の目的は、上記従来技術の問題点に鑑み、レジス
ト液などの揮発性溶液を塗布して均一な膜厚に成膜でき
るようにした回転塗布方法および回転塗布装置を提供す
ることにある。``Object of the Invention'' In view of the problems of the prior art described above, the object of the present invention is to provide a spin coating method and a spin coating device that can coat a volatile solution such as a resist solution to form a film with a uniform thickness. It is about providing.
「発明の構成」
本発明は、回転塗布中、揮発性溶液の揮発を積極的に抑
制させることにより、膜厚を均一化できることに着眼し
てなされたものである。"Structure of the Invention" The present invention has been made with an eye to the fact that the film thickness can be made uniform by actively suppressing the volatilization of a volatile solution during spin coating.
すなわち、本発明による回転塗布方法は、揮発性溶液を
基材に滴下し、この基材を回転させて前記揮発性溶液を
拡散塗布する際に、雰囲気を前記揮発性溶液の揮発成分
で充満させることを特徴とする。That is, in the spin coating method according to the present invention, a volatile solution is dropped onto a base material, and when the base material is rotated to spread and coat the volatile solution, the atmosphere is filled with volatile components of the volatile solution. It is characterized by
また、本発明による回転塗布装置は、所定ケース内に基
材を支持して回転させる機構が設けられており、前記ケ
ースを密閉する蓋体を備えていることを特徴とする。Further, the spin coating device according to the present invention is characterized in that a mechanism for supporting and rotating the base material is provided in a predetermined case, and a lid body is provided for sealing the case.
さらに、本発明による別の回転塗布装置は、所定ケース
内に、基材を支持して回転させる機構が設けられており
、揮発性溶液の揮発成分を前記ケース内に充満させる供
給手段を備えていることを特徴とする。Furthermore, another spin coating device according to the present invention is provided with a mechanism for supporting and rotating a base material in a predetermined case, and a supply means for filling the case with volatile components of a volatile solution. It is characterized by the presence of
したがって、本発明では、揮発性溶液の回転塗布の際、
雰囲気が揮発性溶液の揮発成分で充満あるいは飽和され
るので、揮発性溶液が充分に拡散塗布されて平衡膜厚に
達するまで揮発性溶液の成膜化を抑制することができる
。そして、揮発性溶液が平衡膜厚に達した時点で、揮発
成分で充満した雰囲気を解除し、成膜化することにより
、均一な膜厚を有する塗膜を得ることができる。Therefore, in the present invention, during spin coating of a volatile solution,
Since the atmosphere is filled or saturated with the volatile components of the volatile solution, it is possible to suppress the volatile solution from forming a film until the volatile solution is sufficiently diffused and applied to reach an equilibrium film thickness. Then, when the volatile solution reaches an equilibrium film thickness, the atmosphere filled with volatile components is removed and film formation is performed, whereby a coating film having a uniform film thickness can be obtained.
「発明の実施例」
第1図には本発明による回転塗布装置の一実施例が示さ
れている。この回転塗布装置11は、基台12上に設置
されたケース13内に、ターンテーブル14を備えてい
る。ターンテーブル14は、基台12内に設置されたモ
ータ15に連動する回転軸1Bによって所定の速度で回
転するようになっている。ターンテーブル14上面には
複数の溝17が形成され、マスクブランクなどの基板1
8を設置したとき、基板18を真空チャックするように
なっている。Embodiment of the Invention FIG. 1 shows an embodiment of a spin coating apparatus according to the present invention. This spin coating device 11 includes a turntable 14 in a case 13 installed on a base 12. The turntable 14 is configured to rotate at a predetermined speed by a rotating shaft 1B that is interlocked with a motor 15 installed within the base 12. A plurality of grooves 17 are formed on the top surface of the turntable 14, and a substrate 1 such as a mask blank is formed.
When the substrate 8 is installed, the substrate 18 is vacuum chucked.
そして本発明においては、ケース13の上面開口部にケ
ース13内を密閉するための蓋体21が着脱自在に取付
けられている。In the present invention, a lid 21 for sealing the inside of the case 13 is detachably attached to the upper opening of the case 13.
したがって、この回転塗布装置11においては、基板1
8をターンテーブル14上に設置し、基板18の中心部
にレジスト液などの揮発性溶液を滴下し、ターンテーブ
ル14と共に基板18を所定速度で回転させると、揮発
性溶液は遠心力により基板18の外周部に向けて拡散塗
布される。その際、蓋体18でケース13内を密閉する
ことにより、ケース13内を揮発性溶液の揮発成分が充
満あるいは飽和した雰囲気とすることができる。このよ
うに、揮発性成分が充満あるいは飽和した雰囲気中では
、揮発性溶液の成膜化が抑制されるので、揮発性溶液は
充分に拡散塗布されて平衡膜厚に達する。そして。Therefore, in this spin coating device 11, the substrate 1
8 is placed on the turntable 14, a volatile solution such as a resist solution is dropped onto the center of the substrate 18, and when the substrate 18 is rotated together with the turntable 14 at a predetermined speed, the volatile solution is transferred to the substrate 18 by centrifugal force. It is spread and applied towards the outer periphery of the area. At this time, by sealing the inside of the case 13 with the lid 18, the inside of the case 13 can be made into an atmosphere filled with or saturated with volatile components of the volatile solution. In this way, in an atmosphere full or saturated with volatile components, the volatile solution is inhibited from forming a film, so that the volatile solution is sufficiently diffused and coated to reach an equilibrium film thickness. and.
揮発性溶液が平衡膜厚に達した後、蓋体19を外して揮
発成分を揮発させることにより、均一な膜厚の塗膜を得
ることができる。After the volatile solution reaches the equilibrium film thickness, the lid 19 is removed and the volatile components are volatilized, thereby making it possible to obtain a coating film with a uniform film thickness.
なお、前記実施例において、揮発性溶液の揮発成分(溶
剤)の気化器20を設け、パイプ21を通して、テニス
13内に揮発性成分を供給するようにしてもよい、さら
に、揮発性成分により充満された雰囲気を解除するため
、吸引器22を設け、パイプ23を通して、ケース13
内から揮発性成分を吸引除去するようにしてもよい。In the above embodiment, a vaporizer 20 for the volatile components (solvent) of the volatile solution may be provided to supply the volatile components into the tennis ball 13 through the pipe 21. In order to release the atmosphere, a suction device 22 is provided, and a pipe 23 is passed through the case 13.
Volatile components may be removed by suction from within.
実験例
第1図に示したような回転塗布装置を使用し、PMMA
系のポジ型EBレジストを用いてマスクブランク上に回
転塗布を行なった。このレジストの溶剤はECA(エチ
ルセロソルブアセテート)で、レジスト液の粘度は20
0cpであり、揮発性のある高粘度溶液の部類に属し、
高速回転塗布で面内均一な膜厚を得るのが難しいレジス
トの一つである。マスクブランクとしてはサイズ5イン
チ角のものを使用し、このマスクブランク上に上記レジ
スト液を滴下した後、4000rp■で回転させてレジ
スト液を拡散塗布させた。そして、雰囲気をECAの蒸
気で飽和させて回転塗布させた場合(以下、密閉系とす
る)と、雰囲気を開放した状態で回転塗布させた場合(
以下、開放系とする)とで、マスクブランクの面内の膜
厚分布を測定した。この結果を第2図に示す、なお、図
中、・・・×・・・は開放系の膜厚を表わし、→−は密
閉系の膜厚を表わしている。Experimental example: PMMA was coated using a spin coating device as shown in Figure 1.
A positive type EB resist of the same type was used for spin coating on a mask blank. The solvent for this resist is ECA (ethyl cellosolve acetate), and the viscosity of the resist liquid is 20
0 cp, belongs to the class of volatile high viscosity solutions,
It is one of the resists for which it is difficult to obtain a uniform in-plane film thickness by high-speed rotational coating. A mask blank having a size of 5 inches square was used, and after dropping the above resist solution onto the mask blank, it was rotated at 4000 rpm to spread and apply the resist solution. Then, there are cases in which the atmosphere is saturated with ECA vapor and spin coating is carried out (hereinafter referred to as a closed system), and cases in which spin coating is carried out in an open atmosphere (
(hereinafter referred to as an open system), the in-plane film thickness distribution of the mask blank was measured. The results are shown in FIG. 2. In the figure, .
第2図から明白なように、開放系に比べ、密閉系での面
内膜厚均一性は良好であり、マスクブランクの周辺2〜
3111輻を歿した面内において、膜厚は3800人±
20人であった。また、開放系で塗布した試料では、膜
厚が均一な領域が4.5″φよりも小さく、周辺に向い
膜厚が厚くなっており、特にコーナ一部ではスジ状の表
面凹凸が生じ、膜厚も中心部の2〜3倍になっていた。As is clear from Figure 2, the in-plane film thickness uniformity in the closed system is better than that in the open system, and
In the plane along the 3111 radius, the film thickness is 3800 ±
There were 20 people. In addition, in the sample coated in an open system, the area with uniform film thickness was smaller than 4.5″φ, and the film thickness became thicker toward the periphery, and especially in some corners, streak-like surface irregularities occurred. The film thickness was also 2 to 3 times that of the center.
さらに、開放系では、例えばレジスト液中の濃度差等に
よるムラなどが発生しやすく、面内欠陥の発生する割合
が密閉系に比べて多い傾向にあった。Furthermore, in open systems, unevenness due to, for example, concentration differences in the resist solution is likely to occur, and the rate of occurrence of in-plane defects tends to be higher than in closed systems.
なお、以上の結果は、PMMA系のポジ型EBレジスト
のみでなく、一般に使用される他のEBレジストやフォ
トレジストについても同様であった。このように、膜厚
の面内均一化に及ぼす雰囲気の効果は、極めて大きいも
のであった。Note that the above results were similar not only to PMMA-based positive EB resists but also to other commonly used EB resists and photoresists. As described above, the effect of the atmosphere on the in-plane uniformity of the film thickness was extremely large.
「発明の効果」
以上説明したように、木発明によれば、回転塗布の際、
雰囲気を揮発性溶液の揮発成分で充満させるようにした
ので、揮発性溶液が基材上に充分に拡散塗布されて平衡
膜厚に達するまで、成膜化が抑制される。そして、この
ように揮発性溶液が平衡膜厚に達した後、雰囲気を開放
して成膜すれば1面内の膜厚分布が均一な塗膜を得るこ
とができる0本発明は、特に膜厚の均一性がパターニン
グ精度に重要な影響を与えるレジスト液の塗布に適して
いる。"Effects of the Invention" As explained above, according to the wood invention, during spin coating,
Since the atmosphere is filled with volatile components of the volatile solution, film formation is suppressed until the volatile solution is sufficiently diffused and coated onto the substrate to reach an equilibrium film thickness. After the volatile solution reaches the equilibrium film thickness in this way, by opening the atmosphere and forming the film, it is possible to obtain a coating film with a uniform film thickness distribution within one surface. It is suitable for applying resist liquid where thickness uniformity has an important effect on patterning accuracy.
第1図は木発明による回転塗布装置の一実施例を示す断
面図、第2図は本発明によって得られたレジスト膜の面
内膜厚分布と、従来方法によって得られたレジスト膜の
面内膜厚分布とを示す図表である。
図中、11は回転塗布装置、12は基台、13はケース
、14はターンテーブル、15はモータ、16は回転軸
、 1Bは基板、19は蓋体、20は気化器、21はパ
イプである。
第 1 図
09I8
差梳中1℃力゛うの距醸 しC声〕
第 Z 図
手続補正書
1、事件の表示
昭和60年特許願第103998号
2)発明の名称
回転塗布方法および回転塗布装置
3、補正をする者
事件との関係 特許出願人
住 所 東京都千代田区丸の内二丁目1番2号名称
(004)旭硝子株式会社
外1名
自発補正
6、補正により増加する発明の数 なし7、補
正の対象
(1)明細書の発明の詳細な説明の欄
(2)図面
8、補正の内容
(1)明細書第5頁第13行目の「平衡」を「所定の」
と訂正する。
(2)明細書第5頁第13行目の「揮発性溶液」を「揮
発成分」と訂正する。
(3)明細書第5頁第13〜14行目の「成膜化」を「
揮発」と訂正する。
(4)明細書第5頁第15行目の「平衡」を「所定の」
と訂正する。
(5)明細書第5頁第16行目の「成膜化する」を「揮
発成分を揮発よせる」と訂正する。
(8)図面の第2図を別紙の通りに訂正する。
以上Fig. 1 is a cross-sectional view showing an embodiment of the spin coating device according to the invention, and Fig. 2 shows the in-plane thickness distribution of the resist film obtained by the present invention and the in-plane thickness distribution of the resist film obtained by the conventional method. It is a chart showing film thickness distribution. In the figure, 11 is a spin coating device, 12 is a base, 13 is a case, 14 is a turntable, 15 is a motor, 16 is a rotating shaft, 1B is a substrate, 19 is a lid, 20 is a vaporizer, and 21 is a pipe. be. No. 1 Fig. 09I8 C voice indicating a distance of 1°C force during differential combing] Part Z Diagram procedural amendment 1, case description 1985 Patent Application No. 103998 2) Name of invention Spin coating method and spin coating device 3. Relationship with the case of the person making the amendment Patent applicant address 2-1-2 Marunouchi, Chiyoda-ku, Tokyo Name
(004) Voluntary amendment by one person other than Asahi Glass Co., Ltd. 6, Number of inventions increased by amendment None 7, Subject of amendment (1) Detailed description of the invention in the specification (2) Drawing 8, Contents of amendment (1) ) “Equilibrium” on page 5, line 13 of the specification is “predetermined”
I am corrected. (2) "Volatile solution" on page 5, line 13 of the specification is corrected to "volatile component." (3) “Film formation” on page 5, lines 13-14 of the specification is changed to “
"Volatilization," he corrected. (4) “Equilibrium” on page 5, line 15 of the specification is “predetermined”
I am corrected. (5) "To form a film" on page 5, line 16 of the specification is corrected to "to evaporate volatile components." (8) Correct Figure 2 of the drawings as shown in the attached sheet. that's all
Claims (6)
て前記揮発性溶液を拡散塗布する回転塗布方法において
、回転塗布中に雰囲気を前記揮発性溶液の揮発成分で充
満させることを特徴とする回転塗布方法。(1) In a spin coating method in which a volatile solution is dropped onto a substrate and the substrate is rotated to spread and apply the volatile solution, the atmosphere is filled with volatile components of the volatile solution during spin coating. A rotary coating method characterized by:
はレジスト液である回転塗布方法。(2) The spin coating method according to claim 1, wherein the volatile solution is a resist solution.
記揮発成分はエチルセロソルブアセテートである回転塗
布方法。(3) The spin coating method according to claim 1 or 2, wherein the volatile component is ethyl cellosolve acetate.
において、前記基材はガラス、マスクブランクまたはウ
ェハーである回転塗布方法。(4) The spin coating method according to any one of claims 1 to 3, wherein the base material is glass, a mask blank, or a wafer.
が設けられ、基材を回転させることにより基材に滴下さ
れた揮発性溶液を拡散塗布する回転塗布装置において、
前記ケースを密閉する蓋体を備えていることを特徴とす
る回転塗布装置。(5) In a spin coating device in which a mechanism for supporting and rotating a base material is provided in a predetermined case, and by rotating the base material, a volatile solution dropped onto the base material is diffused and coated,
A rotary coating device comprising a lid for sealing the case.
が設けられ、基材を回転させることにより基材に付着さ
せた揮発性溶液を拡散塗布する回転塗布装置において、
前記揮発性溶液の揮発成分を前記ケース内に充満させる
供給手段を備えていることを特徴とする回転塗布装置。(6) A spin coating device in which a mechanism for supporting and rotating a base material is provided in a predetermined case, and the volatile solution attached to the base material is diffused and coated by rotating the base material,
A spin coating apparatus characterized by comprising a supply means for filling the case with volatile components of the volatile solution.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10399885A JPS61280618A (en) | 1985-05-17 | 1985-05-17 | Spin coating and spin coating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10399885A JPS61280618A (en) | 1985-05-17 | 1985-05-17 | Spin coating and spin coating device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61280618A true JPS61280618A (en) | 1986-12-11 |
Family
ID=14368960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10399885A Pending JPS61280618A (en) | 1985-05-17 | 1985-05-17 | Spin coating and spin coating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61280618A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63313160A (en) * | 1987-06-16 | 1988-12-21 | Dainippon Printing Co Ltd | Method for coating resist to substrate for photomask or the like |
US5658615A (en) * | 1993-03-25 | 1997-08-19 | Tokyo Electron Limited | Method of forming coating film and apparatus therefor |
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- 1985-05-17 JP JP10399885A patent/JPS61280618A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5068475A (en) * | 1973-10-19 | 1975-06-07 | ||
JPS5473572A (en) * | 1977-11-24 | 1979-06-12 | Hitachi Ltd | Spin coater |
JPS5649346A (en) * | 1979-06-23 | 1981-05-02 | Basf Ag | Manufacture of ppsubstituted aromatic carbamic ester |
JPS6010299A (en) * | 1983-06-29 | 1985-01-19 | 富士通株式会社 | Voice message length forecaster |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63313160A (en) * | 1987-06-16 | 1988-12-21 | Dainippon Printing Co Ltd | Method for coating resist to substrate for photomask or the like |
US5658615A (en) * | 1993-03-25 | 1997-08-19 | Tokyo Electron Limited | Method of forming coating film and apparatus therefor |
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