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JPS6071425U - Mounting structure of upper apron in press machine - Google Patents

Mounting structure of upper apron in press machine

Info

Publication number
JPS6071425U
JPS6071425U JP16400983U JP16400983U JPS6071425U JP S6071425 U JPS6071425 U JP S6071425U JP 16400983 U JP16400983 U JP 16400983U JP 16400983 U JP16400983 U JP 16400983U JP S6071425 U JPS6071425 U JP S6071425U
Authority
JP
Japan
Prior art keywords
upper apron
press machine
adjustment
apron
adjustment member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16400983U
Other languages
Japanese (ja)
Other versions
JPH0233926Y2 (en
Inventor
土山　雄司
天野　忠
英明 高橋
木暮　恒夫
関田　勝治
一男 赤見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Amada Co Ltd
Original Assignee
Amada Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Amada Co Ltd filed Critical Amada Co Ltd
Priority to JP16400983U priority Critical patent/JPS6071425U/en
Priority to US06/651,754 priority patent/US4672831A/en
Priority to CA000463543A priority patent/CA1255201A/en
Priority to CH4514/84A priority patent/CH666202A5/en
Priority to DE3434470A priority patent/DE3434470C2/en
Priority to GB08423802A priority patent/GB2147836B/en
Priority to AU33331/84A priority patent/AU573758B2/en
Priority to FR848414556A priority patent/FR2552015B1/en
Priority to IT8422759A priority patent/IT1176751B/en
Priority to KR1019840005790A priority patent/KR890002647B1/en
Priority to SE8404750A priority patent/SE464281B/en
Publication of JPS6071425U publication Critical patent/JPS6071425U/en
Application granted granted Critical
Publication of JPH0233926Y2 publication Critical patent/JPH0233926Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Bending Of Plates, Rods, And Pipes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

添付図面は、この考案の実施例を示すもので、第１図、
第２図及び第３図は、第２調整部材を、−第１調整部材
の上方に近接して設けた、プレスブレーキのそれぞれ正
面図、側面図及び部分側面図である。第４図は他の実施
例の部分側面図である。　　　　　− 図中同一符号は同−物又は相等物を示す。３・・・左右
フレーム、５・・・上部エプロン、１１・・・開口部、
１３・・・円筒部、１５・・・軸受部材、１７・・・ね
じ溝、２５・・・第１調整部材、３１・・・第２調整部
材。 ・１ 拝「−一一一〜　−− ／〆 ｍ−へン 、７［゛The attached drawings show an embodiment of this invention.
2 and 3 are a front view, a side view, and a partial side view, respectively, of a press brake in which a second adjustment member is provided adjacently above the first adjustment member. FIG. 4 is a partial side view of another embodiment. - The same reference numerals in the figures indicate the same or equivalent items. 3... Left and right frames, 5... Upper apron, 11... Opening,
13... Cylindrical part, 15... Bearing member, 17... Thread groove, 25... First adjustment member, 31... Second adjustment member.・1 Hai ``-111~ -- /〆m-hen, 7 [゛

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] （１）　　上部エプロン５側の左右フレーム３の前面に
開口部１１を設け、該開口部の奥に、円筒部１３を設け
、該円筒部に円筒状の軸受部材１５を回動自在に装着す
るとともに、該軸受部材にねじ溝１７を設け、上部エプ
ロン５に、前記ねじ溝１７に螺合可能な第１調整部材２
５を設け、該第１調整部材と反対の方向に調整する第２
調整部材３１を前記第１調整部材２５の上下方向に近接
して、上部エプロン５に設けたことを特徴とするプレス
機械の上部エプロン板付調整装置。。(1) An opening 11 is provided in the front surface of the left and right frames 3 on the upper apron 5 side, a cylindrical portion 13 is provided at the back of the opening, and a cylindrical bearing member 15 is rotatably attached to the cylindrical portion. At the same time, the bearing member is provided with a thread groove 17, and the upper apron 5 is provided with a first adjustment member 2 that can be screwed into the thread groove 17.
5, and a second adjustment member adjusted in a direction opposite to the first adjustment member.
An adjustment device with an upper apron plate for a press machine, characterized in that an adjustment member 31 is provided on the upper apron 5 close to the first adjustment member 25 in the vertical direction. . （２）第２調整部材３１の内部を円筒状に形成し、該円
筒状の部に、第１調整部材２５を貫通して設けた実用新
案登録請求の範囲第１項記載のプレス機械の上部エプロ
ン取付調整装置。(2) The upper part of the press machine according to claim 1, in which the inside of the second adjusting member 31 is formed into a cylindrical shape, and the first adjusting member 25 is provided in the cylindrical portion through the first adjusting member 25. Apron mounting adjustment device.
JP16400983U 1983-09-21 1983-10-25 Mounting structure of upper apron in press machine Granted JPS6071425U (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP16400983U JPS6071425U (en) 1983-10-25 1983-10-25 Mounting structure of upper apron in press machine
US06/651,754 US4672831A (en) 1983-09-21 1984-09-18 Bending press
CA000463543A CA1255201A (en) 1983-09-21 1984-09-19 Bending press
DE3434470A DE3434470C2 (en) 1983-09-21 1984-09-20 Bending press
GB08423802A GB2147836B (en) 1983-09-21 1984-09-20 Be
AU33331/84A AU573758B2 (en) 1983-09-21 1984-09-20 Brake press
CH4514/84A CH666202A5 (en) 1983-09-21 1984-09-20 BENDING PRESS.
FR848414556A FR2552015B1 (en) 1983-09-21 1984-09-21 BENDING PRESS
IT8422759A IT1176751B (en) 1983-09-21 1984-09-21 PRESS TO FOLD METAL PIECES IN THE FORM OF A SHEET
KR1019840005790A KR890002647B1 (en) 1983-09-21 1984-09-21 Bending press
SE8404750A SE464281B (en) 1983-09-21 1984-09-21 BENDING PRESS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16400983U JPS6071425U (en) 1983-10-25 1983-10-25 Mounting structure of upper apron in press machine

Publications (2)

Publication Number Publication Date
JPS6071425U true JPS6071425U (en) 1985-05-20
JPH0233926Y2 JPH0233926Y2 (en) 1990-09-12

Family

ID=30359691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16400983U Granted JPS6071425U (en) 1983-09-21 1983-10-25 Mounting structure of upper apron in press machine

Country Status (1)

Country Link
JP (1) JPS6071425U (en)

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS525309A (en) * 1975-06-26 1977-01-17 Owens Corning Fiberglass Corp Method and apparatus for condensing fibrous material onto winding package

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS525309A (en) * 1975-06-26 1977-01-17 Owens Corning Fiberglass Corp Method and apparatus for condensing fibrous material onto winding package

Cited By (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7321233B2 (en) 1995-04-14 2008-01-22 Cascade Microtech, Inc. System for evaluating probing networks
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7492175B2 (en) 2001-08-21 2009-02-17 Cascade Microtech, Inc. Membrane probing system
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7550984B2 (en) 2002-11-08 2009-06-23 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7514944B2 (en) 2004-07-07 2009-04-07 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals

Also Published As

Publication number Publication date
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