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JPS60154444A - Image pick-up device of scanning type electron microscope etc. - Google Patents

Image pick-up device of scanning type electron microscope etc.

Info

Publication number
JPS60154444A
JPS60154444A JP59009752A JP975284A JPS60154444A JP S60154444 A JPS60154444 A JP S60154444A JP 59009752 A JP59009752 A JP 59009752A JP 975284 A JP975284 A JP 975284A JP S60154444 A JPS60154444 A JP S60154444A
Authority
JP
Japan
Prior art keywords
image
electron microscope
area
photographing
images
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59009752A
Other languages
Japanese (ja)
Inventor
Teruaki Ono
輝昭 大野
Shinjiro Katagiri
片桐 信二郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Naka Seiki Ltd
Original Assignee
Hitachi Naka Seiki Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Naka Seiki Ltd filed Critical Hitachi Naka Seiki Ltd
Priority to JP59009752A priority Critical patent/JPS60154444A/en
Publication of JPS60154444A publication Critical patent/JPS60154444A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/22Optical, image processing or photographic arrangements associated with the tube
    • H01J37/224Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔冗明の背景〕 走査形嵐子!g藏鏡等の像撮影装置は、電子顕微鏡によ
って写し出される画像をCRTに描画し、これをカメラ
で撮像するものでおる。しかし、この走査形電子顕微鏡
等の1永撮影装置は、たとえば同じ二次′電子像で形成
される2種類の異なった像を081面に分割して像形成
をし、これをカメラで一枚の写真に撮像することは容易
で通常に行なわれているものであるが、たとえば、08
1面において分割された一方の面に二次電子像を、また
他方の面にX線像を像表示することは、CR,Tのスキ
ャンの速度が異なってしまう関係からできず。
[Detailed Description of the Invention] [Redundant Background] Scanning Arashiko! An image capturing device such as a mirror draws an image produced by an electron microscope on a CRT, and captures the image with a camera. However, one-permanent imaging devices such as scanning electron microscopes divide two different types of images formed by the same secondary electron image into 081 planes and form images in one image using a camera. It is easy and common practice to take a picture of 08
Displaying a secondary electron image on one divided surface and an X-ray image on the other is not possible because the scanning speeds of CR and T are different.

したがり゛て、一枚の写真の一方の分割された面に二次
電子像を、また他方の面にX線像を撮像させることはで
きなかった。
Therefore, it was not possible to capture a secondary electron image on one divided surface of a single photograph and an X-ray image on the other divided surface.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、一枚の写真上にたとえば二次電子像あ
るいはX線像等のように条件の異なる像を分割撮影する
仁とのできる走査形電子顕微鏡等の像撮影装置を提供す
るにある。。
SUMMARY OF THE INVENTION An object of the present invention is to provide an image photographing device such as a scanning electron microscope that can separately photograph images with different conditions, such as a secondary electron image or an X-ray image, on a single photograph. be. .

〔発明2の概要〕 このような目的を達成するために、本発明は、CRTの
画像面に写し出された像を写真撮影する走査形電子顕微
鏡等の像撮影装置において、撮影領域設定回路を具備さ
せ、この撮影領域設定回路によシ撮影領域設定前の画像
を前記画像面の設定された区域に撮像させて写真撮影す
るようにしたものである。
[Summary of Invention 2] In order to achieve such an object, the present invention provides an image capturing device such as a scanning electron microscope that takes a photograph of an image projected on an image plane of a CRT, which is equipped with a photographing area setting circuit. Then, the photographing area setting circuit is configured to take an image before setting the photographing area in the set area of the image surface and take a photograph.

〔発明の実施例〕[Embodiments of the invention]

第1図は本発明による走査形電子顕微鏡等の像撮影装置
の一実施例を示す構成図である。同図において、走査信
号発生器1がおり、この走査信号発生器1からの信号は
、一方において、表示領域移動回路6を介して撮影用ブ
ラウン管2のたとえ□ばカソード等に入力されるように
なっておシ、また、他方において、電子線偏向コイル3
に入力されるようになっている。また、撮影領域設定回
路4があシ、この撮影領域設定回路4は撮影指令信号7
が入力されるとともに、撮影領域設定スイッチ5の切シ
換えによって、撮影領域をA領域(たとえばCRT上の
左半分の領域)あるいはB領域(たとえばCRT上の右
半分の領域)に設定できるようになっている。
FIG. 1 is a block diagram showing an embodiment of an image capturing apparatus such as a scanning electron microscope according to the present invention. In the figure, there is a scanning signal generator 1, and a signal from the scanning signal generator 1 is inputted to, for example, a cathode of a picture tube 2 via a display area moving circuit 6. On the other hand, the electron beam deflection coil 3
It is now entered into Furthermore, the photographing area setting circuit 4 is connected to the photographing command signal 7.
is input, and by switching the photographing area setting switch 5, the photographing area can be set to area A (for example, the left half area on the CRT) or area B (for example, the right half area on the CRT). It has become.

このような構成において、作用を以下に述べる。In such a configuration, the operation will be described below.

まず、たとえば二次電子像をブラウン管2に撮像する。First, for example, a secondary electron image is captured on the cathode ray tube 2.

この場合の画像は第2図に示すように画像面8の全域に
像が形成される。この画像面には予め枠9が表示され、
この枠9内の画像Cのみが、後において写真に撮像され
る領域部となる。次に撮影領域設定スイッチ5をA側に
ONする。これによシブラウン管2に撮像されていた画
像Cは第3図に示すように、同一ブラウン管2の画像面
8におってAの領域に写し出される。そして撮影指令信
号7の出力を基に、図示しないカメラによって一枚の写
真の左半分の領域に、ブラウン管2の画像面の左半分の
領域大の画像が写し出される。
In this case, an image is formed over the entire image plane 8 as shown in FIG. A frame 9 is displayed in advance on this image surface,
Only the image C within this frame 9 will be the area that will be photographed later. Next, turn on the photographing area setting switch 5 to the A side. As a result, the image C captured on the cathode ray tube 2 is projected onto the area A on the image plane 8 of the same cathode ray tube 2, as shown in FIG. Then, based on the output of the photographing command signal 7, an image as large as the left half of the image plane of the cathode ray tube 2 is projected onto the left half of one photograph by a camera (not shown).

その後、撮影領域設定スイッチ5をOFFにさせ、たと
えばxm像をブラウン管2の画像面8に撮像する。この
場合の撮像にあっても画像面8に枠9が表示されておシ
、この枠9内に撮像されている像が写真に写し出す領域
となる。そして、撮影領域設定スイッチ5をB側にON
させる。これによシブラウン管2に撮像されていた画像
Cは第3図に示す同一ブラウン管2の画像面8にあって
Bの領域に写し出される。そして、撮影指令信号7の出
力を基に、前記カメラによって前記写真の右半分の領域
にブラウン管2の画像面の右半分の領域 lBの画像が
写し出される。
Thereafter, the photographing area setting switch 5 is turned off, and, for example, an xm image is photographed on the image plane 8 of the cathode ray tube 2. Even during imaging in this case, a frame 9 is displayed on the image plane 8, and the image captured within this frame 9 becomes the area to be displayed in the photograph. Then, turn on the shooting area setting switch 5 to the B side.
let As a result, the image C that had been captured on the cathode ray tube 2 is projected onto the area B on the image plane 8 of the same cathode ray tube 2 shown in FIG. Then, based on the output of the photographing command signal 7, the camera projects an image of the right half area 1B of the image plane of the cathode ray tube 2 onto the right half area of the photograph.

これによって、前記写真には左半分の領域および右半分
の領域それぞれに二次電子像およびX線像が重ね撮りさ
れる。
As a result, a secondary electron image and an X-ray image are superimposed on each of the left half region and right half region of the photograph.

このように、二次電子像およびX線像をそれぞれ別個に
独自のスキャン速度でCRTに撮像するこ”とができ、
また、写真撮影すべきCB’I”の所定の区画に前記各
像を順次撮像しそのつど写真撮影すれば一枚の写真上に
撮影条件の異なる2種の像を撮影することができるので
、二次電子像とX線像のように走査速度の異なる異種像
や倍率の異なる異種像、ステレオ像のように試料の傾斜
角が異なる異種像等が、一枚の写真に収められる。この
ような写真が得られれば、それら異種像間の比較が害鳥
になり、またステレオ視の容易化および写真の節約等の
効果を奏する。
In this way, the secondary electron image and the X-ray image can be captured separately on the CRT at their own scanning speeds.
Furthermore, if each of the above-mentioned images is sequentially photographed in a predetermined section of CB'I'' to be photographed, and a photograph is taken each time, two types of images under different photographing conditions can be photographed on one photograph. Different types of images with different scanning speeds such as secondary electron images and X-ray images, different types of images with different magnifications, different types of images with different tilt angles of the sample such as stereo images, etc. can be captured in a single photograph. If such photographs can be obtained, comparisons between these different types of images will be harmful, and the stereo viewing will be facilitated and photographs will be saved.

以上述べた実施例では、撮影領域設定前におけるブラウ
ン管2に撮像される画面には枠9が表示され、この枠外
にあっても像表示がなされたものであるが、枠9内のみ
像表示させ枠9外には像表示させないようにしてもよい
ことはいうまでもない。
In the embodiment described above, a frame 9 is displayed on the screen imaged on the cathode ray tube 2 before the photographing area is set, and images are displayed even outside this frame, but images are displayed only within the frame 9. It goes without saying that the image may not be displayed outside the frame 9.

また、撮影領域設定前における像表示と、撮影領域設定
後における像表示とは同一のブラウン管によって行なっ
たものでおるが、それらを別個のブラウン管に像表示さ
せるようにしてもよいことはかうまでもない。
Further, although the image display before setting the photographing area and the image display after setting the photographing area are performed by the same cathode ray tube, it is possible to display the images on separate cathode ray tubes. do not have.

さらに、撮影領域設定における区分は画像面の右半分お
よび左半分の2区分について述べたものであるが、この
区分は4等分または任意形状の区分でもよく、例えば観
察時に枠で区分した部分を撮影用ブラウン管の面上任意
位置にはめこむようにしてもよい。また観察用ブラウン
管の全面を撮影時に縮小して多数枚の画をもって一枚の
合成写真を作るようにしてもよいことはもちろんである
Furthermore, the division in the shooting area setting is described as two divisions, the right half and the left half of the image plane, but this division may be divided into four equal parts or any arbitrary shape. For example, when observing the area divided by a frame, It may be fitted in any position on the surface of the photographic cathode ray tube. It goes without saying that the entire surface of the observation cathode ray tube may be reduced in size during photographing, and a single composite photograph may be created from a large number of images.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、本発明による走査形電子顕微鏡等の
像撮影装置によれば、一枚の写真上にたとえば二次電子
像あるいはX線像等のように条件の異なる像を分割撮影
することができるようになる。
As described above, according to the image photographing device such as a scanning electron microscope according to the present invention, it is possible to separately photograph images with different conditions, such as a secondary electron image or an X-ray image, on a single photograph. You will be able to do this.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による走査形電子顕微鏡等の像撮影装置
の一実施例を示す構成図、第2図および第3図は本発明
による走査形電子顕微鏡等の像撮影装置の作用を示す説
明図である。 1・・・走査信号発生器、2・・・撮影用ブラウン管、
3・・・電子線偏向コイル、4・・・撮影領域設定回路
、5・・・撮影領域設定スイッチ、6・・・表示領域移
動回路。 代理人 弁理士 鵜沼辰之
FIG. 1 is a configuration diagram showing an embodiment of an image capturing apparatus such as a scanning electron microscope according to the present invention, and FIGS. 2 and 3 are explanations showing the operation of the image capturing apparatus such as a scanning electron microscope according to the present invention. It is a diagram. 1...Scanning signal generator, 2...Cathode ray tube for photography,
3... Electron beam deflection coil, 4... Imaging area setting circuit, 5... Imaging area setting switch, 6... Display area moving circuit. Agent Patent Attorney Tatsuyuki Unuma

Claims (1)

【特許請求の範囲】[Claims] 1、CRTの画像向に写し出された像を写真撮影する□
走査形電子顕微鏡等の□衡撮影装置において、撮影領域
設定回路を具備させ、この撮影領域設定回路により撮影
領域設定前の画像を前記画像面の設定された区域に撮像
させて写真撮影することを特徴とする走査形電子顕fj
i鏡等の像撮影装置。
1. Take a photo of the image projected on the CRT image □
A vertical photographing device such as a scanning electron microscope is equipped with a photographing area setting circuit, and the photographing area setting circuit is capable of capturing an image before setting the photographing area in a set area of the image surface to take a photograph. Features of scanning electron microscope fj
i Image capturing device such as a mirror.
JP59009752A 1984-01-23 1984-01-23 Image pick-up device of scanning type electron microscope etc. Pending JPS60154444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59009752A JPS60154444A (en) 1984-01-23 1984-01-23 Image pick-up device of scanning type electron microscope etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59009752A JPS60154444A (en) 1984-01-23 1984-01-23 Image pick-up device of scanning type electron microscope etc.

Publications (1)

Publication Number Publication Date
JPS60154444A true JPS60154444A (en) 1985-08-14

Family

ID=11729023

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59009752A Pending JPS60154444A (en) 1984-01-23 1984-01-23 Image pick-up device of scanning type electron microscope etc.

Country Status (1)

Country Link
JP (1) JPS60154444A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4880212A (en) * 1972-01-30 1973-10-27
JPS4956580A (en) * 1972-09-30 1974-06-01
JPS56141156A (en) * 1980-04-04 1981-11-04 Hitachi Ltd Sample image display device
JPS5769655A (en) * 1980-10-16 1982-04-28 Jeol Ltd Electron beam device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4880212A (en) * 1972-01-30 1973-10-27
JPS4956580A (en) * 1972-09-30 1974-06-01
JPS56141156A (en) * 1980-04-04 1981-11-04 Hitachi Ltd Sample image display device
JPS5769655A (en) * 1980-10-16 1982-04-28 Jeol Ltd Electron beam device

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