JPS60113428A - semiconductor manufacturing equipment - Google Patents
semiconductor manufacturing equipmentInfo
- Publication number
- JPS60113428A JPS60113428A JP21947083A JP21947083A JPS60113428A JP S60113428 A JPS60113428 A JP S60113428A JP 21947083 A JP21947083 A JP 21947083A JP 21947083 A JP21947083 A JP 21947083A JP S60113428 A JPS60113428 A JP S60113428A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- substrate
- chamber
- cassette
- processing chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000004065 semiconductor Substances 0.000 title claims description 13
- 239000000758 substrate Substances 0.000 claims description 137
- 238000001035 drying Methods 0.000 claims description 3
- 238000004140 cleaning Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 13
- 238000011084 recovery Methods 0.000 description 9
- 229920000642 polymer Polymers 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000032258 transport Effects 0.000 description 3
- 239000000428 dust Substances 0.000 description 2
- 235000007516 Chrysanthemum Nutrition 0.000 description 1
- 244000189548 Chrysanthemum x morifolium Species 0.000 description 1
- 210000001015 abdomen Anatomy 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は、半導体製造装置に係り、特に基板をドライプ
ロセスにて処理する半導体製造装置に関するものである
。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a semiconductor manufacturing apparatus, and particularly to a semiconductor manufacturing apparatus that processes a substrate by a dry process.
ドライエツチング装置、プラズマCV D![等の基板
をドライプロセスにて処理する半導体製造装置では、使
用経時により半導体製造装置の真空処理室内壁等にポリ
マーが堆積し、このポリマーは、基板の処理に悪影響を
及ぼす。そこで、この悪影響を除去するため、真空処理
室内は、定期的又は随時に基板の処理を中断してクリー
ニング処理される。このクリーニング処理時には、基板
電極が基板載置位置を除き電気的に絶縁されている場合
は、基板載置位置での基板電極の損傷を防止するため、
基板載置位置にはダミー基板が載置される。従来の半導
体製造装置での真空処理室のクリーニング処理における
基板載置位置へのタミー基板の載置は、次のようにして
なされている。Dry etching equipment, plasma CVD! In semiconductor manufacturing equipment that processes substrates by a dry process, polymers accumulate on the inner walls of the vacuum processing chamber of the semiconductor manufacturing equipment over time, and this polymer adversely affects the processing of the substrates. Therefore, in order to eliminate this negative influence, the inside of the vacuum processing chamber is cleaned periodically or at any time by interrupting substrate processing. During this cleaning process, if the substrate electrodes are electrically insulated except at the substrate mounting position, in order to prevent damage to the substrate electrodes at the substrate mounting position,
A dummy substrate is placed at the substrate placement position. In a conventional semiconductor manufacturing apparatus, a tummy substrate is placed at a substrate placement position in a cleaning process of a vacuum processing chamber in the following manner.
例えば、真空処理室にロード、アンロード用の真空予備
室が共役された半導体製造装置では、ロード用の真空予
備室を一旦、大気開放して処理される基板が収納されて
いる゛カセット(以下、基板供給カセットと略)を真空
予備室外に取り出し、これと交替にダミー基板が収納さ
れたカセット(以下、ダミー基板供給カセットと略)を
搬入する。この後ロード用の真空予備室を真空処理室の
圧力と同程度の圧力まで真空排気し、その後、真空予備
室と真空処理室とを連通させて真空処理室にダミー基板
を搬入し、このダミー基板を基板電極の基板載置位置に
載置する。一方、アンロード用の真空予備室からは処理
された基板を回収するカセット(以下、基板回収カセッ
トと略)を取り出し、これと交替にダミー基板を回収す
るカセット(以下、ダミー基板回収カセットと略)を搬
入し、その後、アンロード用の真空予備室は、真空処理
室の圧力と同程度の圧力まで真空排気される。For example, in semiconductor manufacturing equipment in which a vacuum preparatory chamber for loading and unloading is conjugated to a vacuum processing chamber, the vacuum preparatory chamber for loading is once opened to the atmosphere and the substrates to be processed are stored in the cassette (hereinafter referred to as "cassette"). , a substrate supply cassette) is taken out of the vacuum preliminary chamber, and a cassette containing a dummy substrate (hereinafter abbreviated as a dummy substrate supply cassette) is brought in in place of it. After that, the vacuum preparatory chamber for loading is evacuated to a pressure similar to that of the vacuum processing chamber, and then the vacuum preparatory chamber and the vacuum processing chamber are communicated, and the dummy substrate is carried into the vacuum processing chamber. The substrate is placed on the substrate placement position of the substrate electrode. On the other hand, a cassette for collecting processed substrates (hereinafter referred to as a substrate collection cassette) is taken out from the vacuum preliminary chamber for unloading, and a cassette for collecting dummy substrates (hereinafter referred to as a dummy substrate collection cassette) is taken out in turn. ), and then the vacuum preliminary chamber for unloading is evacuated to a pressure comparable to that of the vacuum processing chamber.
真空処理室のクリーニング処理が終了した後、真空処理
室とアンロード用の真空予備室とは連通し、基板電極の
基板載置位置に載置されたダミー基板は、真空処理室か
らアンロード用の真空予備室に搬出されグダミー基板回
収カセットに回収される。After the cleaning process in the vacuum processing chamber is completed, the vacuum processing chamber is communicated with the vacuum preliminary chamber for unloading, and the dummy substrate placed at the substrate mounting position of the substrate electrode is removed from the vacuum processing chamber for unloading. It is carried out to the vacuum preliminary room and collected in the Gudummy substrate collection cassette.
その後、ロード用の真空予備室には、基板供給カセット
がダミー基板供給カセットと交替して再び搬入され、ア
ンロード用の真空予備室には、処理された基板回収カセ
ットがダミー基板回収カセットと交替して再び搬入され
る。その後、ロード。Thereafter, the substrate supply cassette is replaced with a dummy substrate supply cassette and carried into the vacuum preparatory chamber for loading, and the processed substrate recovery cassette is replaced with a dummy substrate recovery cassette in the vacuum preparatory chamber for unloading. and then transported again. Then load.
アンロード用の真空予備室は真空処理室の圧力と同程度
の圧力まで真空排気され、再び通常の基板処理が実施さ
れる。The vacuum preliminary chamber for unloading is evacuated to a pressure comparable to that of the vacuum processing chamber, and normal substrate processing is performed again.
なお、真空処理室のクリーニング処理毎に上記の操作が
繰返して実施される。Note that the above operation is repeatedly performed every time the vacuum processing chamber is cleaned.
このような半導体製造装置では、次のような欠点があっ
た。Such semiconductor manufacturing equipment has the following drawbacks.
(1)真空処理室のクリーニング処理毎にロード。(1) Load every time the vacuum processing chamber is cleaned.
アンロード用の真空予備室の大気開放、真空排気を繰り
返し実施する必要があると共に、基板供給カセットとダ
ミー基板供給カセット、基板回収カセットとダミー基板
回収カセットを交換する必要があるため真空処理室のク
リーニング処理に要する時間が長くなり、スループット
(単位時間当りの基板処理枚数)が低下する。It is necessary to repeatedly open the vacuum preliminary chamber for unloading to the atmosphere and evacuate it, and it is also necessary to replace the substrate supply cassette and dummy substrate supply cassette, and the substrate recovery cassette and dummy substrate recovery cassette. The time required for the cleaning process becomes longer, and the throughput (the number of substrates processed per unit time) decreases.
(2)真空処理室のクリーニング処理毎にロード用の真
空予備室から基板供給カセットを大気側へ取り出すため
、基板供給カセットに収納された基板に塵埃が付着し歩
留りが低下する。(2) Since the substrate supply cassette is taken out from the loading vacuum preliminary chamber to the atmosphere side every time the vacuum processing chamber is cleaned, dust adheres to the substrates stored in the substrate supply cassette, reducing yield.
、 3 。, 3.
(3)基板供給カセットとダミー基板供給カセット。(3) Board supply cassette and dummy board supply cassette.
基板回収カセットとダミー基板回収カセットの交換が手
動で行われるため、基板の処理と真空処理室のクリーニ
ング処理との一連の処理を自動化できない。Since the substrate recovery cassette and the dummy substrate recovery cassette are replaced manually, it is not possible to automate the series of processes including substrate processing and vacuum processing chamber cleaning processing.
本発明の目的は、真空処理室のクリーニング処理に要す
る時間を短縮することで、スループットを向上できる半
導体製造装置を提供することにある。An object of the present invention is to provide a semiconductor manufacturing apparatus that can improve throughput by shortening the time required for cleaning a vacuum processing chamber.
本発明は、ロード、アンロード用の真空予備室が真空開
閉手段を介して共役された真空処理室にダミー基板供給
1回収用のカセットがセットされる他の真空予備室を真
空開閉手段を介して共役すると共に、真空開閉手段を介
してカセットと真空処理室に内設された基板電極との間
でダミー基板を搬送するダミー基板搬送装置を設けたこ
とを特徴とするもので、真空処理室のクリーニング処理
に要する時間を短縮しようとしたものである。The present invention provides a vacuum processing chamber in which a vacuum preliminary chamber for loading and unloading is conjugated via a vacuum opening/closing means, and another vacuum preliminary chamber in which a cassette for supplying and recovering dummy substrates is set via a vacuum opening/closing means. The device is characterized by being provided with a dummy substrate transfer device that transfers the dummy substrate between the cassette and the substrate electrode installed in the vacuum processing chamber via a vacuum opening/closing means. This is an attempt to shorten the time required for the cleaning process.
・ 4 ・ 〔発明の実施例〕 面 本発明の一実施例を図により説明する。・ 4 ・ [Embodiments of the invention] surface An embodiment of the present invention will be described with reference to the drawings.
△
図面で、対向電極(図示省略)と所定の放電空間を有し
基板電極10が内股された真空処理室頷には、この場合
、ロード用の真空予備室間とアンロード用の真空予備室
31とがそれぞれ真空開閉手段(図示省略)を介して共
役されている。真空予備室間には、二の場合、基板供給
専用のカセット伯がセットされカセット40から基板間
を取り出し真空開閉手段を介して真空予備室(資)から
真空処理室されている。真空予備室31には、この場合
、基板回収専用のカセット41がセットされ基板載置位
置11に載置され処理済みの基板間を真空開閉手段を介
して真空処理室(9)から真空予備室31に搬出した後
にカセット41に収納する公知の基板搬送装置(図示省
略)が内設されている。なお、真空処理室10には、真
空排気装[(図示省略)と処理ガス供給装!(図示省略
)とが連結され、真空予備室(資)、31には、真空排
気装置(図示省略)がそれぞれ連結されている。また、
真空予備室30.31には、真空大気開閉手段(図示省
略)が設けられ、真空予備室(9)外の基板(資)を真
空大気開閉手段を介して真空予備室(9)に搬入した後
にカセット40に収納する公知の基板搬入装置(図示省
略)とカセット41から基板50を取り出し真空大気開
閉手段を介して真空予備室31外へ搬出する公知の基板
搬出装置(図示省略)とがそれぞれ設けられている。ま
た、基板電極10の大きさは、この場合、7枚の基板間
がそれぞれの載置位置11に同時に載置可能な大きさで
あり、基板電極10は、この場合、真空処理室間外に設
けられた駆動装置N(図示省略)により回動駆動される
と共に電源(図示省略)と接続されている。△ In the drawing, the vacuum processing chamber, which has a counter electrode (not shown) and a predetermined discharge space and in which the substrate electrode 10 is housed, is divided into a vacuum preparatory chamber for loading and a vacuum preparatory chamber for unloading. 31 are respectively conjugated via vacuum opening/closing means (not shown). In the second case, a cassette dedicated to supplying substrates is set between the vacuum preparatory chambers, and the substrates are taken out from the cassette 40 and transferred from the vacuum preparatory chamber to the vacuum processing chamber via a vacuum opening/closing means. In this case, a cassette 41 dedicated to substrate recovery is set in the vacuum preparatory chamber 31, and the processed substrates placed in the substrate mounting position 11 are connected from the vacuum processing chamber (9) to the vacuum preparatory chamber via a vacuum opening/closing means. A known substrate transport device (not shown) is installed therein, which transports the substrate to the cassette 41 and then stores the substrate in the cassette 41. The vacuum processing chamber 10 includes a vacuum evacuation system [(not shown) and a processing gas supply system! (not shown) are connected to each other, and a vacuum evacuation device (not shown) is connected to each of the vacuum preparatory chambers (equipment) 31. Also,
The vacuum preliminary chamber 30.31 is provided with a vacuum atmosphere opening/closing means (not shown), and the substrate (material) outside the vacuum preliminary chamber (9) is carried into the vacuum preliminary chamber (9) via the vacuum atmosphere opening/closing means. A known substrate carrying-in device (not shown) that is later stored in the cassette 40 and a known substrate carrying-out device (not shown) that takes out the substrate 50 from the cassette 41 and carries it out of the vacuum preliminary chamber 31 via a vacuum atmosphere opening/closing means, respectively. It is provided. In addition, the size of the substrate electrode 10 is such that seven substrates can be placed simultaneously on their respective placement positions 11, and the substrate electrode 10 is placed outside the vacuum processing chamber in this case. It is rotationally driven by a provided drive device N (not shown) and is connected to a power source (not shown).
また、ダミー基板51を、この場合、供給並びに回収す
るカセット42がセットされる他の真空予備室nが真空
開閉手段(図示省略)を介して真空処理室間に、この場
合は、真空予備室(資)、31と直角に共役されている
。真空予備室(には、カセット42からダミー基板51
を取り出し、このダミー基板51を真空予備室32から
真空処理室間に搬入した後に基板電極10の基板載置位
置11に載置すると共に、基板載置位置11に載置され
ているダミー基板51を真空処理室間から真空開閉手段
を介して真空予備室nに搬出した後にカセット42に収
納する公知のダミー基板搬送装置(図示省略)が内設さ
れている。Further, the dummy substrate 51, in this case, is connected to another vacuum preliminary chamber n, in which the cassette 42 for supplying and recovering is set, between the vacuum processing chambers via a vacuum opening/closing means (not shown), in this case, the vacuum preliminary chamber. (capital), is conjugated at right angles to 31. The vacuum preliminary chamber (in which the dummy substrate 51 is removed from the cassette 42
The dummy substrate 51 is taken out from the vacuum preliminary chamber 32 and carried between the vacuum processing chambers, and then placed on the substrate placement position 11 of the substrate electrode 10, and the dummy substrate 51 placed on the substrate placement position 11 is A known dummy substrate transfer device (not shown) is provided for transporting the dummy substrate from between the vacuum processing chambers to the vacuum preparatory chamber n via the vacuum opening/closing means and then storing it in the cassette 42.
真空処理室間で所定処理操作に入る前に、少なくとも基
板電極10の基板載置位置数に対応した枚数、この場合
は、7枚のダミー基板51をカセット42に収納する。Before starting a predetermined processing operation between the vacuum processing chambers, a number of dummy substrates 51 corresponding to at least the number of substrate mounting positions of the substrate electrodes 10, in this case, seven dummy substrates 51 are stored in the cassette 42.
カセット42へのダミー基板51の収納の仕方は、真空
予備室32外にカセット42を取り出してダミー基板5
1を収納しても良く、また、真空予備室nにカセット4
2をセットした後に、このカセット42に真空予備室I
、真空処理室(イ)を介し外部よりダミー基板51を収
納しても良い。その後、真空予備室(9)の真空大気開
閉手段が開放されカセッ1−40には、外部から真空大
気開閉手段を介し基板搬入装置により基板間が所定枚数
供給されて収納される。その後、真空大気開閉手段は閉
止され真空予備室(資)は真空排気装置で所定圧力に減
圧排気されている真空処理室加の圧力と同程度の圧力ま
で真空排気装置で真空排気される。その後、真空開閉手
段を開放する二とで真空処理室間と真空予備室加とは連
通し、カセット40の基板50は基板搬送装置で取り出
され真空開閉手段を介して真空予備室(資)から真空処
理室間へ搬入された後、基板載置位置11に載置される
。この場合、基板載置位置11への基板間の載置は、基
板搬送装置の、例えば、往復動と駆動装置暑こよる基板
電極10の回動との組合せにより行われる。このように
して基板載置位置11への基板間の載置が完了した後に
、真空開閉手段が閉止され真空処理室間と真空予備室間
とは遮断される。同様に真空処理室間と真空予備室31
.32も速断されている。この状態で真空処理室間には
、処理ガス供給装置から処理ガスが所定流量で供給され
、この処理ガスは真空処理室間でプラズマ化される。一
方、基板載置位置11に載置された基板間は基板電極1
0を駆動装置で回動駆動することで公転させられ、この
間、基板(資)はプラズマにより所定処理される。基板
(資)の処理完了後、真空開閉手段を開放することで真
空処理室間と真空予備室31とは連通し、基板載置位置
11に載置され処理済みの基板園は、真空開閉手段を介
して真空処理室間から真空予備室31へ基板搬送装置で
搬出された後にカセット411こ収納されて回収される
。The method of storing the dummy board 51 in the cassette 42 is to take out the cassette 42 outside the vacuum preliminary chamber 32 and place the dummy board 51 in the cassette 42.
Cassette 4 may be stored in the vacuum preliminary chamber n.
2, the vacuum preliminary chamber I is placed in this cassette 42.
, the dummy substrate 51 may be stored from the outside via the vacuum processing chamber (a). Thereafter, the vacuum atmosphere opening/closing means of the vacuum preliminary chamber (9) is opened, and a predetermined number of substrates are supplied from the outside via the vacuum atmosphere opening/closing means to the cassette 1-40 by the substrate loading device and stored therein. Thereafter, the vacuum atmosphere opening/closing means is closed, and the vacuum preparatory chamber (equipment) is evacuated by the vacuum evacuation device to a pressure comparable to that of the vacuum processing chamber, which is evacuated to a predetermined pressure by the vacuum evacuation device. Thereafter, by opening the vacuum opening/closing means, the vacuum processing chamber and the vacuum preliminary chamber are communicated with each other, and the substrate 50 of the cassette 40 is taken out by the substrate transfer device and exits from the vacuum preliminary chamber through the vacuum opening/closing means. After being carried into the vacuum processing chamber, it is placed on the substrate placement position 11. In this case, the substrates are placed on the substrate placement position 11 by a combination of, for example, the reciprocating movement of the substrate transfer device and the rotation of the substrate electrode 10 caused by the heat of the drive device. After the substrates have been placed on the substrate placement position 11 in this way, the vacuum opening/closing means is closed and the vacuum processing chambers and the vacuum preparatory chambers are cut off. Similarly, between the vacuum processing chambers and the vacuum preliminary chamber 31
.. 32 was also quickly terminated. In this state, a processing gas is supplied between the vacuum processing chambers at a predetermined flow rate from the processing gas supply device, and this processing gas is turned into plasma between the vacuum processing chambers. On the other hand, between the substrates placed at the substrate placement position 11, the substrate electrodes 1
0 is rotated by a drive device, and during this period, the substrate (material) is subjected to a predetermined treatment with plasma. After processing of the substrate (material) is completed, the vacuum opening/closing means is opened to communicate between the vacuum processing chambers and the vacuum preliminary chamber 31, and the processed substrate placed at the substrate mounting position 11 is opened by opening the vacuum opening/closing means. The cassette 411 is carried out from between the vacuum processing chambers to the vacuum preparatory chamber 31 by a substrate transfer device, and then stored and recovered.
このようなカセット41への処理済みの基板間の回収は
、基板搬送装置の、例えば、往復動と駆動装置による基
板電極10の回動との組合せにより行われる。カセット
41への処理済みの基板50の回収が完了した後に、真
空開閉手段が閉止され真空処理室加と真空予備室31と
は遮断される。Such collection of processed substrates into the cassette 41 is performed by, for example, a combination of reciprocating motion of the substrate transport device and rotation of the substrate electrode 10 by a drive device. After the processed substrates 50 have been collected into the cassette 41, the vacuum opening/closing means is closed and the vacuum processing chamber and the vacuum preliminary chamber 31 are cut off.
上記した操作を繰り返し実施することでカセット旬から
は7枚毎基板50が取り出されて同時に処理された後に
カセット41に回収される。この間にポリマーが真空処
理室間の内壁等に堆積して基板間の処理に悪影響を及ぼ
しそうになった時点で上記した操作を中止し次のように
して真空処理室間のクリーニング処理を行う。By repeating the above-described operations, every seventh substrate 50 is taken out from the cassette, processed at the same time, and then collected into the cassette 41. During this time, when the polymer is deposited on the inner walls of the vacuum processing chambers and is about to adversely affect the processing between the substrates, the above-described operation is stopped and the cleaning processing between the vacuum processing chambers is performed as follows.
まず、真空予備室32を真空処理室部の圧力と同程度の
圧力まで減圧排気する。その後、真空開閉手段を開放す
ることで真空処理室部と真空予備室シとを連通させカセ
ット42からダミー基板51をダミー基板搬送装置で取
出し、このダミー基板51を真空開閉手段を介して真空
予備室nから真空処理室部に搬入した後に基板載置位置
11に載置する。First, the vacuum preliminary chamber 32 is depressurized and evacuated to a pressure comparable to that of the vacuum processing chamber. Thereafter, by opening the vacuum opening/closing means, the vacuum processing chamber and the vacuum preliminary chamber are communicated with each other, and the dummy substrate 51 is taken out from the cassette 42 by the dummy substrate transfer device. After being carried into the vacuum processing chamber section from chamber n, it is placed on the substrate placement position 11.
このような基板載置位1N、11へのダミー基板51の
載置は、ダミー基板搬送装置の、例えば、往復動と駆動
装置による基板電極10の回動との組合せにより行われ
る。このようにして基板載置位置11へのダミー基板5
1の載置が完了した後、真空開閉手段を閉止し真空処理
室部と真空予備室部とを遮断する。その後、この状態で
真空処理室部はクリーニング処理される。その後、真空
開閉手段を開放し真空処理室部と真空予備室nとを連通
させ上記した操作と逆操作醗こより基板載置位[11に
載置されたダミー基板51をカセット42に回収し真空
開閉手段を閉止する二とで真空処理室部のクリーニング
処理が全て終了する。The dummy substrate 51 is placed on the substrate placement positions 1N and 11 in this manner by a combination of, for example, the reciprocating movement of the dummy substrate transfer device and the rotation of the substrate electrode 10 by the drive device. In this way, the dummy substrate 5 is placed in the substrate mounting position 11.
1, the vacuum opening/closing means is closed to shut off the vacuum processing chamber and the vacuum preparatory chamber. Thereafter, the vacuum processing chamber section is subjected to cleaning processing in this state. Thereafter, the vacuum opening/closing means is opened, the vacuum processing chamber section and the vacuum preliminary chamber n are communicated, and the dummy substrate 51 placed on the substrate mounting position [11] is collected into the cassette 42 by the above-described operation and the reverse operation. By closing the opening/closing means, the entire cleaning process of the vacuum processing chamber is completed.
二のような真空処理室部のクリーニング処理の終了後、
上記した基板間の処理操作が再開される。After completing the cleaning process of the vacuum processing chamber as described in 2.
The inter-substrate processing operations described above are resumed.
また、その後、ポリマーが真空処理室部の内壁等に再び
堆積して基板間の処理に悪影響を及ぼしそうになった時
点で真空処理室部は上記した操作により再びクリーニン
グ処理される。Thereafter, when the polymer is deposited again on the inner wall of the vacuum processing chamber and is about to adversely affect the processing between the substrates, the vacuum processing chamber is cleaned again by the above-described operation.
本実施例のような半導体製造装置では次のような効果が
得られる。A semiconductor manufacturing apparatus such as this embodiment provides the following effects.
(1) 真空処理室のクリーニング処理毎に従来技術の
ようにロード、アンロード用の真空予備室の大気開放、
真空排気を繰り返し実施する必要がないと共に、基板供
給カセットとダミー基板供給カセット、基板回収カセッ
トとダミー基板回収カセットを交換する必要もないため
、真空処理室のクリーニング処理に要する時間を短縮で
きスループットを向上できる。(1) Opening the vacuum preparatory chamber for loading and unloading to the atmosphere as in the conventional technology for each cleaning process in the vacuum processing chamber;
There is no need to repeatedly perform vacuum evacuation, and there is no need to replace the substrate supply cassette and dummy substrate supply cassette, and the substrate recovery cassette and dummy substrate recovery cassette, reducing the time required for cleaning the vacuum processing chamber and increasing throughput. You can improve.
(2)真空処理室のクリーニング処理毎にロード用の真
空予備室から処理される基板を大気側へ取り出す必要が
ないため、処理される基板への塵埃の付着が抑制され歩
留りを向上できる。(2) Since it is not necessary to take out the substrate to be processed from the loading vacuum preparatory chamber to the atmosphere side every time the vacuum processing chamber is cleaned, the adhesion of dust to the substrate to be processed is suppressed and the yield can be improved.
(3) 基板の処理と真空処理室のクリーニング処理と
の一連の処理を自動化できる。(3) A series of processes including substrate processing and vacuum processing chamber cleaning processing can be automated.
なお、この他・こ真空処理室にロード、アンロード兼用
の真空予備室が真空開閉手段を介して共役された半導体
製造装置でも同様の効果が得られる。In addition, similar effects can be obtained in a semiconductor manufacturing apparatus in which a vacuum preliminary chamber for loading and unloading is conjugated to the vacuum processing chamber via a vacuum opening/closing means.
また、真空処理室は、基板が1枚毎処理されるタイプの
ものであっても特lこ問題はない。更に、他の真空予備
室を、ダミー基板供給用のカセットとダミー基板回収用
のカセットとが別個にセットできるように真空処理室に
共役しても良い。Further, even if the vacuum processing chamber is of a type in which substrates are processed one by one, there is no particular problem. Further, another vacuum preliminary chamber may be coupled to the vacuum processing chamber so that a cassette for supplying dummy substrates and a cassette for recovering dummy substrates can be set separately.
本発明は、以上説明したように、ロード、アンロード用
の真空予備室が真空開閉手段を介して共役された真空処
理室にダミー基板供給1回収用のカセットがセットされ
る他の真空予備室を真空開閉手段を介して共役すると共
に、該真空室開閉手段を介してカセットと真空処理室に
内設された基板電極との間でダミー基板を搬送するダミ
ー基板搬送装置を設けたことで、真空処理室のクリーニ
ング処理に要する時間を短縮できるので、スループット
を向上できる効果がある。As explained above, the present invention provides another vacuum preparatory chamber in which a cassette for supplying and recovering dummy substrates is set in a vacuum processing chamber in which a vacuum preparatory chamber for loading and unloading is conjugated via a vacuum opening/closing means. By providing a dummy substrate transfer device that conjugates the dummy substrate through the vacuum opening/closing means and conveys the dummy substrate between the cassette and the substrate electrode installed in the vacuum processing chamber via the vacuum chamber opening/closing means, Since the time required for cleaning the vacuum processing chamber can be shortened, throughput can be improved.
図面は、本発明による半導体製造装置の一実施例を示す
真空処理室部の平面図である。
10・・・・・・基板電極、加・・・・・・真空処理室
、菊、31・・・真空予備室、羽・・・・・・他の真空
予備室、42・・四カセット、51・・・・・・ダミー
基板
代理人 弁理士 高 橋 明 夫The drawing is a plan view of a vacuum processing chamber section showing an embodiment of the semiconductor manufacturing apparatus according to the present invention. 10...Substrate electrode, processing...Vacuum processing chamber, chrysanthemum, 31...Vacuum preliminary chamber, vane...Other vacuum preliminary chamber, 42...Four cassettes, 51... Dummy board agent Patent attorney Akio Takahashi
Claims (1)
段を介して共役された真空処理室を有し、該真空処理室
に内設された基板電極に載置される基板をドライプロセ
スにて処理する装置において、ダミー基板供給1同収月
のカセットがセットされる他の真空予備室を真空開閉手
段を介して前記真空処理室に共役すると共に、真空開閉
手段を介してカセットとW配基板電極との間でダミー基
板を搬送するダミー′基板搬送装置を設けたことを特徴
とする半導体製造装置。1. It has a vacuum processing chamber in which a vacuum preliminary chamber for loading and unloading is conjugated via a vacuum opening/closing means, and the substrate placed on the substrate electrode installed in the vacuum processing chamber is subjected to a dry process. In the processing apparatus, another vacuum preliminary chamber in which cassettes for the same month of supply of dummy substrates are set is connected to the vacuum processing chamber through a vacuum opening/closing means, and the cassettes and W distribution boards are connected through a vacuum opening/closing means. 1. A semiconductor manufacturing apparatus comprising a dummy substrate transfer device for transferring a dummy substrate to and from an electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21947083A JPS60113428A (en) | 1983-11-24 | 1983-11-24 | semiconductor manufacturing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21947083A JPS60113428A (en) | 1983-11-24 | 1983-11-24 | semiconductor manufacturing equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60113428A true JPS60113428A (en) | 1985-06-19 |
Family
ID=16735933
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21947083A Pending JPS60113428A (en) | 1983-11-24 | 1983-11-24 | semiconductor manufacturing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60113428A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60246635A (en) * | 1984-05-22 | 1985-12-06 | Anelva Corp | Automatic substrate processing equipment |
JPS62132321A (en) * | 1985-12-04 | 1987-06-15 | Anelva Corp | Dry etching apparatus |
JPS62180086A (en) * | 1986-01-31 | 1987-08-07 | Kyocera Corp | Glow dicharge decomposition device |
JPS62214176A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPS62214178A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPS62214177A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPS63160335A (en) * | 1986-12-24 | 1988-07-04 | Kyocera Corp | Gas etching method |
JPH05304197A (en) * | 1992-04-27 | 1993-11-16 | Hitachi Ltd | Multi-chamber system |
US6090718A (en) * | 1996-12-17 | 2000-07-18 | Denso Corporation | Dry etching method for semiconductor substrate |
-
1983
- 1983-11-24 JP JP21947083A patent/JPS60113428A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60246635A (en) * | 1984-05-22 | 1985-12-06 | Anelva Corp | Automatic substrate processing equipment |
JPH0357611B2 (en) * | 1984-05-22 | 1991-09-02 | Anelva Corp | |
JPS62132321A (en) * | 1985-12-04 | 1987-06-15 | Anelva Corp | Dry etching apparatus |
JPS62180086A (en) * | 1986-01-31 | 1987-08-07 | Kyocera Corp | Glow dicharge decomposition device |
JPS62214176A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPS62214178A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPS62214177A (en) * | 1986-03-13 | 1987-09-19 | Hitachi Electronics Eng Co Ltd | Gaseous phase reactor |
JPH062951B2 (en) * | 1986-03-13 | 1994-01-12 | 日立電子エンジニアリング株式会社 | Gas phase reactor |
JPS63160335A (en) * | 1986-12-24 | 1988-07-04 | Kyocera Corp | Gas etching method |
JPH05304197A (en) * | 1992-04-27 | 1993-11-16 | Hitachi Ltd | Multi-chamber system |
US6090718A (en) * | 1996-12-17 | 2000-07-18 | Denso Corporation | Dry etching method for semiconductor substrate |
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