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JPS5988395A - Apparatus for growing compound semiconductor crystal in vapor phase - Google Patents

Apparatus for growing compound semiconductor crystal in vapor phase

Info

Publication number
JPS5988395A
JPS5988395A JP19472682A JP19472682A JPS5988395A JP S5988395 A JPS5988395 A JP S5988395A JP 19472682 A JP19472682 A JP 19472682A JP 19472682 A JP19472682 A JP 19472682A JP S5988395 A JPS5988395 A JP S5988395A
Authority
JP
Japan
Prior art keywords
crystal
substrate
vapor phase
growing
compound semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19472682A
Other languages
Japanese (ja)
Other versions
JPH0321516B2 (en
Inventor
Kazuhisa Takahashi
和久 高橋
Kenji Ikeda
健志 池田
Jun Osawa
大沢 潤
Wataru Suzaki
須崎 渉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP19472682A priority Critical patent/JPS5988395A/en
Publication of JPS5988395A publication Critical patent/JPS5988395A/en
Publication of JPH0321516B2 publication Critical patent/JPH0321516B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45561Gas plumbing upstream of the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To grow a desired compound semiconductor crystal on a substrate in a vapor phase by feeding plural kinds of materials for growing a crystal and an atmospheric gas to a position just before the substrate in a growing furnace through separate ducts so as to inhibit the materials from reacting with each other until they reach the substrate. CONSTITUTION:A pipe 28 only for feeding an alkyl compound of a III group element, a pipe 29 only for feeding the hydride of a V group element and a pipe 27 only for feeding an atmospheric gas are separately installed in the section 20 for feeding materials for growing a crystal in a vapor phase growing apparatus. Those materials for growing a crystal are separately fed to a position just before a substrate crystal 13 in the growing furnace section 10 so as to inhibit the materials from reacting with each other until they reach the crystal 13. Using the apparatus, a desired compound semiconductor crystal can be grown on the substrate crystal 13 in a vapor phase.

Description

【発明の詳細な説明】 この発明はGaAe 、 GaAl!As 、工nP、
■nGaAgP等で代表される二種以上の元素から構成
される化合物半導体結晶の気相成長装置に関する。
[Detailed Description of the Invention] This invention is applicable to GaAe, GaAl! As, Engineering nP,
(2) It relates to a vapor phase growth apparatus for compound semiconductor crystals composed of two or more types of elements such as nGaAgP.

近年、GaAJ GaAIAe、工nP、工nGaAs
P等のnr−v族化合物半導体結晶を気相法により成長
させる方法として、Ga(OH3)3. AI!(OH
3)3.In (02Hs ) a等の■族元素のアル
キル化物と、AsH’、 、 PH’3等のV族元素の
水素化物とを結晶成長用材料として用いる気相成長法(
以下MO−OVD法と略記する)が注目されている。
In recent years, GaAJ GaAIAe, engineering nP, engineering nGaAs
As a method for growing an nr-v group compound semiconductor crystal such as P by a vapor phase method, Ga(OH3)3. AI! (OH
3)3. A vapor phase growth method using alkylated products of Group I elements such as In(02Hs)a and hydrides of Group V elements such as AsH', PH'3, etc. as materials for crystal growth (
(hereinafter abbreviated as MO-OVD method) is attracting attention.

第1図に従来用いられている横形MO−OVD装置の概
念構成図を示す。図において、αOは成長炉部で、01
は成長炉、(イ)はグラファイトサセプタ、03は基板
結晶、α→けグラファイトサセプタ(2)を高周波m力
により加熱するだめのコイルである。また、翰は結晶成
長用材料供給部で、PH3+ As13は常温で気体で
あり、通常それぞれ高圧ガスシリンダ(21a)。
FIG. 1 shows a conceptual block diagram of a conventionally used horizontal MO-OVD device. In the figure, αO is the growth furnace section, and 01
03 is a growth furnace, (A) is a graphite susceptor, and 03 is a coil for heating the substrate crystal and α→ graphite susceptor (2) by high-frequency force. Further, the fins are material supply parts for crystal growth, and PH3+As13 is a gas at room temperature, and each is usually a high-pressure gas cylinder (21a).

(21b)から供給される。(21b).

一方、工n(OH)  Ga(013)3は常温で液体
である2  B  31 ので、それぞれ容器(22a)、 (22b)に収容さ
れており、H2等のキャリヤガスにより気化させて供給
される。
On the other hand, Ga(013)3 is a liquid at room temperature, so it is stored in containers (22a) and (22b), respectively, and is supplied after being vaporized by a carrier gas such as H2. .

また、この時の蒸気圧を制御するために、これらの容器
(22a)、 (22b)はそれぞれ恒温槽r23a)
、 (23b)内に収められる。(ハ)はキャリヤガス
供給管である。
In addition, in order to control the vapor pressure at this time, these containers (22a) and (22b) are each placed in a constant temperature bath r23a).
, (23b). (C) is a carrier gas supply pipe.

これらPH3,AsH3とH2によって気化されたI 
n(02H5’> 3゜G3(CH3)3とはず囲気ガ
スとしでのH2と共に結晶成長材料供給部(ホ)におい
で互いに混合された後、材料ガス供給管(イ)を経て成
長炉部0(llへ供給される。
I vaporized by these PH3, AsH3 and H2
n(02H5'> 3゜G3(CH3)3) After being mixed together with H2 as an ambient gas in the crystal growth material supply section (E), it is passed through the material gas supply pipe (A) and sent to the growth furnace section 0. (Supplied to ll.

なお、C)Aは排気管である。Note that C) A is an exhaust pipe.

ところが、上述の従来のMO−OVD装置においては、
PAT3およびA nHa並びに:tn(a2n5)3
およびGa (CH3) aの結晶成長用材料が結晶成
長材料供給部(ホ)において互いに混合されるので、こ
れらの気体が成長炉θυ内の結晶さぜるべき基板結晶0
3に到達する迄に互いに反応してし1い、基板結晶α枠
上に所望の結晶を成長させる事が容易ではなかった。
However, in the conventional MO-OVD device described above,
PAT3 and A nHa and: tn(a2n5)3
Since the crystal growth materials of Ga(CH3)a and Ga(CH3)a are mixed with each other in the crystal growth material supply section (e), these gases are mixed into the substrate crystal 0 to be crystallized in the growth furnace θυ.
However, it was not easy to grow a desired crystal on the substrate crystal α frame.

この発明は従来のMO−OVD装置における上記の欠点
を克服するためになされたものであり、結晶成長用材料
を成長炉内の基板結晶直前まで互いに独立に供給するこ
とにより、これら結晶成長用材料が基板結晶に到達する
前に互いに反応してしまうことを防止し、従って基板結
晶上に所望の品質の結晶を成長することが出来るように
することを目的としている。
This invention was made in order to overcome the above-mentioned drawbacks of conventional MO-OVD equipment, and by supplying the crystal growth materials independently from each other up to just before the substrate crystal in the growth furnace, these crystal growth materials can be The purpose of this invention is to prevent the crystals from reacting with each other before reaching the substrate crystal, and thus to enable crystals of desired quality to be grown on the substrate crystal.

第2図にこの発明の一実施例になるMO−OVD装置の
概念構成図を示す。従来例と同一符号は同等部分を示し
説明を省略する。図において、@は雰囲気ガス専用供給
管、(ハ)は■族元素のアルキル化物専用供給管、(イ
)は■族元素の水素化物専用供給管である。第2図に示
したように結晶成長材料供給部翰において、■族元素の
アルキル化物専用供給管(社)とV族元素の水素化物専
用供給管翰とを別個に設けたことにより、これらの結晶
成長用材料を基板結晶a3の直前まで互いに独立に供給
することができ、従ってこれらの結晶成長用材料が基板
結晶α葎に到達する前に互いに反応してしまうことがな
く、従って所望の結晶を基板結晶03上に成長させるこ
とができる。
FIG. 2 shows a conceptual configuration diagram of an MO-OVD device according to an embodiment of the present invention. The same reference numerals as in the conventional example indicate equivalent parts, and the explanation will be omitted. In the figure, @ is a supply pipe exclusively for atmospheric gas, (c) is a supply pipe exclusively for alkylates of group II elements, and (a) is a supply pipe exclusively for hydrides of group II elements. As shown in Figure 2, in the crystal growth material supply section, a supply pipe exclusively for alkylates of group I elements and a supply pipe exclusively for hydrides of group V elements are provided separately. The crystal growth materials can be supplied independently of each other up to just before the substrate crystal a3, so that these crystal growth materials do not react with each other before reaching the substrate crystal α, and therefore the desired crystal cannot be formed. can be grown on the substrate crystal 03.

第3図はこの発明の他の実施例を示す概念構成図である
。ここでは、■族元素のアルキル化物専用供給管に)と
V族元素の水素化物専用供給管翰とは二重管を構成する
ように配置されている。この場合には■族元素のアルキ
ル化物と■族元素の水素化物とけ成長炉αυ内でその流
れ方向に対して垂直な断面で互いに均一に混ざり合うの
で、基板結晶03上に成長する結晶がより一層均質にな
ることが期待できる。
FIG. 3 is a conceptual diagram showing another embodiment of the present invention. Here, the supply pipe exclusively for the alkylate of the group (Ⅰ) element and the supply pipe exclusively for the hydride of the group V element are arranged so as to constitute a double pipe. In this case, the alkylate of the group III element and the hydride of the group III element mix uniformly with each other in the cross section perpendicular to the flow direction in the growth furnace αυ, so that the crystals grown on the substrate crystal 03 are more We can expect it to become more homogeneous.

上記各実施例ともnI族元素のアルキル化物を2種およ
び■族元素の水素化物を2種間時に供給する構成を示し
たが、これは例えば、InGaABFのような化合物半
導体結晶の気相成長の場合を想定したもので、GaA3
または工nPのような化合物半導体結晶の場合には図示
は省略したが各高圧ガスシリンダ(21a)、 (21
b)および各斡器(22a)、 (22b)の出口にバ
ルブを設は供給材料気体を適当に選択すればよい。
In each of the above embodiments, a configuration was shown in which two types of alkylated products of group nI elements and two types of hydrides of group type elements were supplied at the same time. This is based on the assumption that GaA3
Alternatively, in the case of compound semiconductor crystals such as nP, each high pressure gas cylinder (21a), (21
b) and valves are provided at the outlets of each of the vessels (22a) and (22b), and the feed material gas may be appropriately selected.

なお、PH3やA sHsの代わりに(OH3) 3F
+ (OHa) 3Asのようなアルキル化物が用いら
れることがあるが、この場合にはこれら■族元素のアル
キル化物を■族元素のアルキル化物と独立に供給するこ
とにより同様の効果が得られる事はいう捷でもない。
In addition, instead of PH3 and A sHs, (OH3) 3F
+ (OHa)Alkylated products such as 3As are sometimes used, but in this case, the same effect can be obtained by supplying the alkylated products of these group Ⅰ elements independently of the alkylated products of group Ⅰ elements. It's not even true.

なお以上の説明では、GaAeや工nP等の■−■族化
合物半導体結晶の場合について示したが、Zn (02
T(5)21Cd(OH3) 2. Hg(OH3)2
等の■族元素のアルキル化物およびH2Te等の■族元
素の水素化物とを用いての0dTe、 Hg0(1,T
eといったII−Vl族化合物半導体結晶の気相成長の
場合にもこの発明は適用できる。
In the above explanation, the case of ■-■ group compound semiconductor crystals such as GaAe and nP was shown, but Zn (02
T(5)21Cd(OH3) 2. Hg(OH3)2
0dTe, Hg0(1,T
The present invention can also be applied to the case of vapor phase growth of II-Vl group compound semiconductor crystals such as e.

以上説明したように、この発明になる化合物半導体結晶
成長装置では結晶成長用材料気体を互いに別個の送給管
によって成長炉に送給し、成長炉中の基板直前で混合さ
せるようにしたので、品質のよい成長結晶を効率よく得
ることができる。
As explained above, in the compound semiconductor crystal growth apparatus according to the present invention, the material gases for crystal growth are fed to the growth furnace through separate feed pipes and mixed just before the substrate in the growth furnace. High quality grown crystals can be obtained efficiently.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の横形MO−OVD装置の一例を示す概1
危構成図、第2図はこの発明の一実施例を示す概念構成
図、第5図はこの発明の曲の実施例を示す概念構成図で
ある。 図において、01は成長炉部、(11)は成長炉、(ハ
)は基板、(2))は結晶成長用材料供給部、(至)は
1■族元素のアルキル化物専用供給管、(2)はV族元
素の水素化物専用供給管である。 なお、図中同一符号は同一または相当部分を示す。 出願人  工業技術院長  石 坂 誠 −第2図 第13図 11tL    lli
Figure 1 shows an example of a conventional horizontal MO-OVD device.
FIG. 2 is a conceptual diagram showing an embodiment of the present invention, and FIG. 5 is a conceptual diagram showing an embodiment of a song according to the invention. In the figure, 01 is the growth furnace part, (11) is the growth furnace, (c) is the substrate, (2)) is the crystal growth material supply part, (to) is the supply pipe exclusively for alkylated group 1 elements, ( 2) is a supply pipe exclusively for hydrides of group V elements. Note that the same reference numerals in the figures indicate the same or corresponding parts. Applicant: Makoto Ishizaka, Director, Agency of Industrial Science and Technology - Figure 2, Figure 13, 11tL lli

Claims (1)

【特許請求の範囲】[Claims] (1)複数種の元素からなる化合物半導体結晶を、上記
それぞれの元素が含まれる複数種の気体を成 □長炉中
で加熱された基板上に供給」−1とれらの気体を反応さ
せて上記基板上に成長させる@置において、上記各気体
を上記成長炉中の上記基板の直することを特徴とする特
許請求の範囲第1項記載の化合物半導体結晶気相成長装
置。
(1) A compound semiconductor crystal consisting of multiple types of elements is grown with multiple types of gases containing each of the above elements. 2. The compound semiconductor crystal vapor phase growth apparatus according to claim 1, wherein each of the gases is removed from the substrate in the growth furnace when the substrate is grown on the substrate.
JP19472682A 1982-11-08 1982-11-08 Apparatus for growing compound semiconductor crystal in vapor phase Granted JPS5988395A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19472682A JPS5988395A (en) 1982-11-08 1982-11-08 Apparatus for growing compound semiconductor crystal in vapor phase

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19472682A JPS5988395A (en) 1982-11-08 1982-11-08 Apparatus for growing compound semiconductor crystal in vapor phase

Publications (2)

Publication Number Publication Date
JPS5988395A true JPS5988395A (en) 1984-05-22
JPH0321516B2 JPH0321516B2 (en) 1991-03-22

Family

ID=16329216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19472682A Granted JPS5988395A (en) 1982-11-08 1982-11-08 Apparatus for growing compound semiconductor crystal in vapor phase

Country Status (1)

Country Link
JP (1) JPS5988395A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6016898A (en) * 1983-07-08 1985-01-28 Matsushita Electric Ind Co Ltd Gaseous-phase growth device
JPS6163599A (en) * 1984-09-05 1986-04-01 Matsushita Electric Ind Co Ltd Vapor phase growth equipment
JPS6183700A (en) * 1984-09-28 1986-04-28 Hitachi Ltd Vapor phase epitaxial growth method and device
JPS6251209A (en) * 1985-08-30 1987-03-05 Hitachi Ltd Vapor growth apparatus
JPS62291020A (en) * 1986-06-10 1987-12-17 Matsushita Electric Ind Co Ltd Vapor growth device
JPS63257216A (en) * 1987-04-14 1988-10-25 Mitsubishi Electric Corp Semiconductor crystal manufacturing equipment
JPH04287312A (en) * 1991-03-18 1992-10-12 Fujitsu Ltd Device and method for vapor phase epitaxial growth
JP2011105564A (en) * 2009-11-19 2011-06-02 Nuflare Technology Inc Film forming apparatus and film forming method

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6016898A (en) * 1983-07-08 1985-01-28 Matsushita Electric Ind Co Ltd Gaseous-phase growth device
JPS6163599A (en) * 1984-09-05 1986-04-01 Matsushita Electric Ind Co Ltd Vapor phase growth equipment
JPS6183700A (en) * 1984-09-28 1986-04-28 Hitachi Ltd Vapor phase epitaxial growth method and device
JPS6251209A (en) * 1985-08-30 1987-03-05 Hitachi Ltd Vapor growth apparatus
JPS62291020A (en) * 1986-06-10 1987-12-17 Matsushita Electric Ind Co Ltd Vapor growth device
JPS63257216A (en) * 1987-04-14 1988-10-25 Mitsubishi Electric Corp Semiconductor crystal manufacturing equipment
JPH04287312A (en) * 1991-03-18 1992-10-12 Fujitsu Ltd Device and method for vapor phase epitaxial growth
JP2011105564A (en) * 2009-11-19 2011-06-02 Nuflare Technology Inc Film forming apparatus and film forming method

Also Published As

Publication number Publication date
JPH0321516B2 (en) 1991-03-22

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