[go: up one dir, main page]

JPS5966178U - Radiation measurement device - Google Patents

Radiation measurement device

Info

Publication number
JPS5966178U
JPS5966178U JP16170982U JP16170982U JPS5966178U JP S5966178 U JPS5966178 U JP S5966178U JP 16170982 U JP16170982 U JP 16170982U JP 16170982 U JP16170982 U JP 16170982U JP S5966178 U JPS5966178 U JP S5966178U
Authority
JP
Japan
Prior art keywords
vacuum
container
microchannel plate
probe
measurement device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16170982U
Other languages
Japanese (ja)
Other versions
JPH0329759Y2 (en
Inventor
雅良 島田
好夫 北
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP16170982U priority Critical patent/JPS5966178U/en
Publication of JPS5966178U publication Critical patent/JPS5966178U/en
Application granted granted Critical
Publication of JPH0329759Y2 publication Critical patent/JPH0329759Y2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はＭＣＰをセンサとして用いた放射線計測装置の
従来例を示す構成図、第２図は本考案−実施例の放射線
計測装置を示す構成図、第３図は、第２図の真空プロー
ブの詳細図である。 １・・・真空容器、２・・・入射放射線、３・・・マイ
クロチャネルプレート（ＭＣＰ）、４・・・前置増幅器
、５・・・波形整形回路、６・・・カウンタ、７・・・
データ処理装置、８・・・高圧電源、９・・・バイアス
電源、１０・・・真空ポンプ、１１・・・真空プローブ
、１１ａ・・・プローブ支え、１１ｂ、１１Ｃ・・・プ
ローブ電極、１２・・・真空プローブ用高圧電源、１３
・・・電流検出器、１４・・・抵抗、１５・・・高圧用
スイッチ・トランジスタ、１６・・・絶縁板。Fig. 1 is a block diagram showing a conventional example of a radiation measuring device using MCP as a sensor, Fig. 2 is a block diagram showing a radiation measuring device according to an embodiment of the present invention, and Fig. 3 is a vacuum probe of Fig. 2. FIG. DESCRIPTION OF SYMBOLS 1... Vacuum container, 2... Incident radiation, 3... Microchannel plate (MCP), 4... Preamplifier, 5... Waveform shaping circuit, 6... Counter, 7...・
Data processing device, 8... High voltage power supply, 9... Bias power supply, 10... Vacuum pump, 11... Vacuum probe, 11a... Probe support, 11b, 11C... Probe electrode, 12...・・High voltage power supply for vacuum probe, 13
...Current detector, 14...Resistor, 15...High voltage switch/transistor, 16...Insulating plate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 高真空に保たれた真空容器内に配置されたマイクロチャ
ネルプレートにより前記容器内へ入射した放射線を測定
する放射線計測装置において、前記真空容器内に真空プ
ローブを設け、この容器内の真空度が前記マイクロチャ
ネルプレートに絶縁破壊を起す真空度に所定の余裕幅を
見込んだ真空度まで低下したときに前記真空プローブか
らの信号により前記マイクロチャネルプレートに印加し
ている高電圧を遮断することを特徴とする放射線計測装
置。In a radiation measuring device that measures radiation incident into a vacuum container maintained at a high vacuum using a microchannel plate placed in the container, a vacuum probe is provided in the vacuum container, and the degree of vacuum in the container is The high voltage applied to the microchannel plate is cut off by a signal from the vacuum probe when the vacuum level falls to a level that allows a predetermined margin for the vacuum level that would cause dielectric breakdown in the microchannel plate. Radiation measuring device.
JP16170982U 1982-10-27 1982-10-27 Radiation measurement device Granted JPS5966178U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16170982U JPS5966178U (en) 1982-10-27 1982-10-27 Radiation measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16170982U JPS5966178U (en) 1982-10-27 1982-10-27 Radiation measurement device

Publications (2)

Publication Number Publication Date
JPS5966178U true JPS5966178U (en) 1984-05-02
JPH0329759Y2 JPH0329759Y2 (en) 1991-06-25

Family

ID=30355308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16170982U Granted JPS5966178U (en) 1982-10-27 1982-10-27 Radiation measurement device

Country Status (1)

Country Link
JP (1) JPS5966178U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257176A (en) * 1987-04-14 1988-10-25 Japan Atom Energy Res Inst Microchannel plate detector protection device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5129838A (en) * 1974-09-06 1976-03-13 Nippon Electric Co
JPS54119745A (en) * 1978-03-08 1979-09-17 Hitachi Ltd Air conditioner

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5129838A (en) * 1974-09-06 1976-03-13 Nippon Electric Co
JPS54119745A (en) * 1978-03-08 1979-09-17 Hitachi Ltd Air conditioner

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257176A (en) * 1987-04-14 1988-10-25 Japan Atom Energy Res Inst Microchannel plate detector protection device

Also Published As

Publication number Publication date
JPH0329759Y2 (en) 1991-06-25

Similar Documents

Publication Publication Date Title
JPS5966178U (en) Radiation measurement device
JPS5982007U (en) diagnostic device
JPS59104083U (en) voltage detector
JPS58101141U (en) Bathtub water level detection device
JPS6136556U (en) Filter contamination level sensor
JPS6041828U (en) Liquid level sensor device
JPS594461U (en) Solution concentration change detection device
JPS58183043U (en) display circuit
JPS5927037U (en) Pot with low liquid alarm
JPS58104973U (en) Simple solar cell characteristics checker
JPS63168599U (en)
JPS58146974U (en) Ionization chamber type radiation measuring device
JPS6065685U (en) Cathode ray tube maximum cathode current measurement circuit
JPS58144276U (en) portable surface electrometer
JPS6016298U (en) High voltage sensor
JPS58105156U (en) Semiconductor secondary electron detection device
JPS6088540U (en) Etching device
JPS58170552U (en) Liquid quality measurement sensor
JPS60149278U (en) Beam current detection circuit
JPS5874119U (en) Instrument mounting box
JPS60111282U (en) Electrical property measuring device for electronic components
JPS59117238U (en) Short circuit detection circuit for solar cells
JPS5952466U (en) Amplified instrument transformer
JPS58110846U (en) Automatic threshold voltage setting device for radiation measurement equipment
JPS5810369U (en) Gas chromatograph direct-coupled mass spectrometer