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JPS5815351A - Error measuring circuit - Google Patents

Error measuring circuit

Info

Publication number
JPS5815351A
JPS5815351A JP56114186A JP11418681A JPS5815351A JP S5815351 A JPS5815351 A JP S5815351A JP 56114186 A JP56114186 A JP 56114186A JP 11418681 A JP11418681 A JP 11418681A JP S5815351 A JPS5815351 A JP S5815351A
Authority
JP
Japan
Prior art keywords
counter
output
input signal
gate circuit
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56114186A
Other languages
Japanese (ja)
Inventor
Yasuo Masuda
益田 康雄
Kazunori Hirabayashi
平林 和紀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP56114186A priority Critical patent/JPS5815351A/en
Publication of JPS5815351A publication Critical patent/JPS5815351A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00Arrangements for detecting or preventing errors in the information received
    • H04L1/24Testing correct operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)

Abstract

PURPOSE:To easily measure an error, by storing the same signal as an input signal to an ROM, and comparing and synchronizing the stored signal with the input signal, and resetting the ROM to a start address if any error is generated. CONSTITUTION:An ROM12 is operated with an output of a counter 11 and the content of memory of the ROM12 and an input signal are compared at a gate circuit 14a. An FF15 is operated with the output of the circuit 14a, and a counter 16 counting the output of the FF15 and an FF17 operated with the output of the counter 16 are provided. This counter 16 continuously compares and collates the memory content of the ROM12 and the input signal and takes synchronism. If any error is produced before the synchronism is taken, the ROM12 is reset to the start address and this operation is repeated until the synchronism is taken. Thus, error measurement of an arbitrary code can be performed by only replacing the ROMs.

Description

【発明の詳細な説明】 (1)発明の技術分野 この発明は、データ伝送回線における誤り測定をする場
合の誤シ測定回路についてのtのである。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to an error measurement circuit for measuring errors in a data transmission line.

(21従来技術 従来回路の一例を第1図に示す。図で、1はシフトレジ
スタ、2はデコーダ、3J1〜3cはゲート回路、4は
7リツプ70ツブ、5はセレクタ、68〜6cは端子で
ある。
(21 Prior Art An example of a conventional circuit is shown in FIG. 1. In the figure, 1 is a shift register, 2 is a decoder, 3J1 to 3c are gate circuits, 4 is a 7-lip 70-tube, 5 is a selector, and 68 to 6c are terminals. It is.

まず、入力信号を端子6bからセレクタ5を通ってシフ
トレジスタ10入力に伝達する。デコーダ2はシフトレ
ジスタ1t−介して同期パターンを取9出し、7リツプ
70ツ14をセットしてセレクタ50入力gaを切シ換
える。
First, an input signal is transmitted from the terminal 6b through the selector 5 to the input of the shift register 10. The decoder 2 takes out the synchronization pattern 9 through the shift register 1t, sets 7 rip 70 and 14, and switches the input ga of the selector 50.

一方、511ビットランダム符号の場合は、シフトレジ
スタ105番と9香からの出力をゲート回路5aからセ
レクタ5に入れる。
On the other hand, in the case of a 511-bit random code, the outputs from shift registers 105 and 9 are input to the selector 5 from the gate circuit 5a.

次に、端子6bからの入力と、シフトレジスタ1の出力
をゲート回路3bで比較し、さらにゲート回路3ct−
通シ、出力端子6Cからピッ)IEJ)信号−を堆り出
す。
Next, the input from the terminal 6b and the output of the shift register 1 are compared in the gate circuit 3b, and then the gate circuit 3ct-
A beep)IEJ) signal is output from the output terminal 6C.

すなわち、第1図の従来回路は入力信号が同期パターン
になりたかどうがをチェックし、同期パターンを見付け
ると、そこから測定をスタートさせるものである。
That is, the conventional circuit shown in FIG. 1 checks whether the input signal has a synchronous pattern, and when a synchronous pattern is found, starts measurement from there.

(31従来技術の問題点 第1図のような従来回路で511ビット以外6ビツトラ
ンダム符号が必要な場合には、デコーダ2の入力の切シ
換えやゲート回路3aの切)換えが必要にな、るので、
構成が複絨になるという間1題がある。
(31 Problems with the Prior Art) If a 6-bit random code other than 511 bits is required in the conventional circuit as shown in Figure 1, it is necessary to switch the input of the decoder 2 and the gate circuit 3a. , so,
There is one problem in that the composition will be made of multiple carpets.

(41発明の目的 この発明は、入力信号と同じ信号t−ROMに記憶して
おき、この信号と入力信号を比較し、誤りが発生しなけ
詐ば引続き比較照合して同期をとシ誤ルを測定するよう
にし、同期がと詐るまでに誤りが発生すnばROMを開
始番地にリセットして同期がとれるまでこの動作を繰ル
返すもので、ROMt−交換するだけで任意に符号の誤
り測定ができるようにするtのである。
(41 Purpose of the Invention This invention stores the same signal as the input signal in the t-ROM, compares this signal with the input signal, and if no error occurs, continues to compare and check to synchronize and synchronize. If an error occurs before synchronization is lost, the ROM is reset to the starting address and this operation is repeated until synchronization is achieved. This allows error measurements to be made.

(5)発明の実施例 この発明による実施例回路を第2図に、第2図の各部波
形例を第3図に示す。第2図で、11はカウンタ、12
はROM、13はセレクタ、14a〜14hijゲ一ト
回路、15Fiフリップフロップ、16はカウンタ、1
7は7リツプフロツプ、jam〜18cは端子である。
(5) Embodiment of the Invention A circuit according to an embodiment of the invention is shown in FIG. 2, and examples of waveforms of each part of FIG. 2 are shown in FIG. In Figure 2, 11 is a counter, 12
is a ROM, 13 is a selector, 14a to 14hij gate circuit, 15Fi flip-flop, 16 is a counter, 1
7 is a 7 lip flop, and jam to 18c are terminals.

まず、ビットランダム符号t−ROM12に記憶してお
く。そして、端子18aからのクロック信号でカウンタ
11を動作させ、ROM12の内容を読み出す。第3図
7は端子18aのクロック信号でToシ、第3図イはカ
ウンタ11の出力である。
First, the bit random code is stored in the t-ROM 12. Then, the counter 11 is operated with a clock signal from the terminal 18a, and the contents of the ROM 12 are read out. 7 is the clock signal of the terminal 18a, and FIG. 3A is the output of the counter 11.

また、第3図つはROM12の出力であり、第3図工は
端子18bの入力信号例である。
Further, FIG. 3 shows the output of the ROM 12, and FIG. 3 shows an example of the input signal to the terminal 18b.

ROM12の記憶内容の一例管次に示す。An example of the storage contents of the ROM 12 is shown below.

0ビット=2047ビツトランダム符号の前半。0 bit = the first half of a 2047-bit random code.

1ビット=−1047ビツトランダム符号の後手。1 bit = -1047 bits The second half of the random code.

2ビット=511ビットランダム符号、5ビット=繰ル
返し周期符号。
2 bits = 511 bit random code, 5 bits = repeated periodic code.

ROM12の出力はセークタ13を通夛、端子18bか
らの入力信号とともにゲート回路14aに入る。第5図
力はゲート回路14mの出力でちゃ、第5図つと第5図
工と比較し、不一致で「1」。
The output of the ROM 12 passes through the sector 13 and enters the gate circuit 14a together with the input signal from the terminal 18b. The 5th figure power is the output of the gate circuit 14m, and when it is compared with the 5th figure and the 5th figure, it is "1" because it does not match.

一致すると「0」Kなる。If they match, it becomes "0" K.

ゲート回路14mの出力は7リツプフロツプ15に入る
。第3図力はフリップ70ツブ15の出力波形である。
The output of the gate circuit 14m enters a seven-lip flop 15. The third figure shows the output waveform of the flip 70 knob 15.

ケート回路14dには、フリップフロッグ15の出力と
、ゲート回路14hで反転した端子18aからのクロッ
ク信号とが入る。第5図キはゲート回路14dの出力波
形である。
The gate circuit 14d receives the output of the flip-flop 15 and the clock signal from the terminal 18a inverted by the gate circuit 14h. FIG. 5G shows the output waveform of the gate circuit 14d.

ゲート回路14eには、第3図力の反転出力と、ゲート
回路14hで反転した端子18aからのクロック信号が
入る。第3図りはゲート回路14eの出力波形であ″る
The gate circuit 14e receives the inverted output of the third diagram and the clock signal from the terminal 18a inverted by the gate circuit 14h. The third diagram shows the output waveform of the gate circuit 14e.

端子18bからの入力信号とROM12の読出し信号を
ゲート回fit4aで比較し、不一致のときは第3図り
のようにゲート回路14eの出力は「0」なので、カウ
ンタ16の出力は「0」である、入力信号とROM12
の読出し信号が一致すると、カウンタ16はカウントを
始める。ここでカウンタ16にセットしたカウントに達
すると。
The input signal from the terminal 18b and the read signal from the ROM 12 are compared by the gate circuit fit4a, and if they do not match, the output of the gate circuit 14e is "0" as shown in the third diagram, so the output of the counter 16 is "0". , input signal and ROM12
When the read signals match, the counter 16 starts counting. When the count set in the counter 16 is reached here.

カウンタ16の出力が7リツプフロツプ17に入る。な
お、カウンタ16はカウンタ11で代用することができ
、カウンタ16を省略することができる。第3図ケはス
リップ70ツブ17の出力である。第5図の場合は、第
3図り、ケからカウンタ16が3カウントにセットされ
ていることが分る。
The output of the counter 16 enters a 7-lip flop 17. Note that the counter 16 can be replaced by the counter 11, and the counter 16 can be omitted. Figure 3 shows the output of the slip 70 knob 17. In the case of FIG. 5, it can be seen from the third diagram that the counter 16 is set to 3 counts.

ゲート回路14fには、ゲート回路14dの出力と7リ
ツプ70ツブ17の出力が入)、フリップフロップ17
の出力が「1」になnば、誤シビットの測定を開始する
The gate circuit 14f receives the output of the gate circuit 14d and the output of the 7-lip 70-tub 17), and the flip-flop 17.
If the output becomes "1", measurement of erroneous sibits is started.

ゲート回路14gには、ゲート回路14dの出力と第3
図ケの反転出力が入シ、ゲート回路14dの出力が「1
」のときはゲート回路14bt介してリセット信号を送
る。
The gate circuit 14g has the output of the gate circuit 14d and the third
The inverted output shown in the figure is input, and the output of the gate circuit 14d is "1".
”, a reset signal is sent through the gate circuit 14bt.

第5図コは測定端子18Cの波形であ夛、第3図キに点
線で示すような誤9が発生すると、その誤シが第5図コ
に現nる。
FIG. 5C shows the waveform of the measurement terminal 18C. If an error 9 as shown by the dotted line in FIG. 3G occurs, that error will appear in FIG.

このように、第2図の回路はROM2に記憶した信号と
入力信号とを比較し、入力信号のあるビットとの間に課
夕がなけnば、WAり測定を開始させるようくし、もし
このビットの間に誤9があnば、誤り測定をスタートさ
せないようKするものである。そして、ROMzl交換
するだけで、任意に符号誤シの測定ができることKなる
In this way, the circuit of FIG. 2 compares the signal stored in ROM 2 with the input signal, and if there is no difference between a certain bit of the input signal, it starts the WA measurement. If there is an error 9 between bits, K is set so as not to start error measurement. Then, simply by exchanging the ROMzl, code errors can be measured arbitrarily.

(6)  発明の効果 この発明によnば、ROM12の交換によシ。(6) Effects of the invention According to this invention, the ROM 12 can be replaced.

切換え回路なしでいろいろな符号の誤り測定を、するこ
とができる。
Error measurements of various codes can be performed without a switching circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来回路の一例、 第2図はこの発明による実施−回路、 第3図は第2図の各部波形例。 1・・・・・・シフトレジスタ、2・・・・・・デコー
ダ、3a〜SC・・・・・・ゲート回路、4・・・・・
・フリツ170ツブ% 5・・・・・・セレクタ、6a
〜6C・・・・・・端子。 11・・・・・・カラ/り、12・・・・・・ROM、
1s・・・・・・セレクタ、14.1〜14h・・・・
・・ゲート回路、15・・・・・・7リツプフロツプ、
16・・・・・・カウンタ、17・・・・・・7うツブ
フロップ、18a〜18c・・・・・・端子。 代理人  弁理士  小俣欽司 第1図 第2図
FIG. 1 is an example of a conventional circuit, FIG. 2 is an implementation circuit according to the present invention, and FIG. 3 is an example of waveforms of each part of FIG. 2. 1...Shift register, 2...Decoder, 3a to SC...Gate circuit, 4...
・Fritsu 170% 5...Selector, 6a
~6C...terminal. 11...Color/Re, 12...ROM,
1s...Selector, 14.1~14h...
...Gate circuit, 15...7 lip-flop,
16...Counter, 17...7 flip flop, 18a to 18c...Terminal. Agent Patent Attorney Kinji Omata Figure 1 Figure 2

Claims (1)

【特許請求の範囲】 1、 第1のカウンタと、 第1のカウンタ出力で動作するROMと。 このROMのメモリ内容と入力信号とを比較するゲート
回路と、 このゲート回路の出力で動作する第1の7リツプ70ツ
ブと、 第1の7リツプフロツ7出力をカウントする第2のカウ
ンタと、 第2のカウンタ出力で動作する第2の7リツプ70ツブ
とを備え。 第2のカウンタで入力信号と前記ROMのメモリ内容の
一致を連続的に計数すると第2の7リツプ70ツブをセ
ットしてI!4シ測定を開始し、一致を連続的に計数で
き々いときは第1のカウンタと第2のカウンタをリセッ
トすることを特徴とする誤シ欄定回路。
[Claims] 1. A first counter, and a ROM that operates on the output of the first counter. a gate circuit that compares the memory contents of this ROM and an input signal; a first 7-rip 70 block that operates with the output of this gate circuit; a second counter that counts the output of the first 7-rip flop 7; It is equipped with a second 7-lip 70-tub which operates on the output of the second counter. When the second counter continuously counts the match between the input signal and the memory contents of the ROM, a second 7-lip 70-tub is set and I! 4. An erroneous column determining circuit, characterized in that it starts measuring 4 lines, and resets a first counter and a second counter when the coincidences are counted continuously.
JP56114186A 1981-07-21 1981-07-21 Error measuring circuit Pending JPS5815351A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56114186A JPS5815351A (en) 1981-07-21 1981-07-21 Error measuring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56114186A JPS5815351A (en) 1981-07-21 1981-07-21 Error measuring circuit

Publications (1)

Publication Number Publication Date
JPS5815351A true JPS5815351A (en) 1983-01-28

Family

ID=14631342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56114186A Pending JPS5815351A (en) 1981-07-21 1981-07-21 Error measuring circuit

Country Status (1)

Country Link
JP (1) JPS5815351A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4734676A (en) * 1984-06-29 1988-03-29 International Business Machines Corp. Method and device for detecting a particular bit pattern in a serial train of bits

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51123656A (en) * 1975-04-21 1976-10-28 Nec Corp An error signal ratio measuring device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51123656A (en) * 1975-04-21 1976-10-28 Nec Corp An error signal ratio measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4734676A (en) * 1984-06-29 1988-03-29 International Business Machines Corp. Method and device for detecting a particular bit pattern in a serial train of bits

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